JPS59180896A - プログラマブル素子 - Google Patents

プログラマブル素子

Info

Publication number
JPS59180896A
JPS59180896A JP58053618A JP5361883A JPS59180896A JP S59180896 A JPS59180896 A JP S59180896A JP 58053618 A JP58053618 A JP 58053618A JP 5361883 A JP5361883 A JP 5361883A JP S59180896 A JPS59180896 A JP S59180896A
Authority
JP
Japan
Prior art keywords
voltage
circuit
bit string
output
test cell
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58053618A
Other languages
English (en)
Japanese (ja)
Other versions
JPS633400B2 (enrdf_load_stackoverflow
Inventor
Koji Ueno
上野　公二
Toshio Fukumoto
福本　敏男
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP58053618A priority Critical patent/JPS59180896A/ja
Publication of JPS59180896A publication Critical patent/JPS59180896A/ja
Publication of JPS633400B2 publication Critical patent/JPS633400B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0751—Error or fault detection not based on redundancy
    • G06F11/0754—Error or fault detection not based on redundancy by exceeding limits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Logic Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP58053618A 1983-03-31 1983-03-31 プログラマブル素子 Granted JPS59180896A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58053618A JPS59180896A (ja) 1983-03-31 1983-03-31 プログラマブル素子

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58053618A JPS59180896A (ja) 1983-03-31 1983-03-31 プログラマブル素子

Publications (2)

Publication Number Publication Date
JPS59180896A true JPS59180896A (ja) 1984-10-15
JPS633400B2 JPS633400B2 (enrdf_load_stackoverflow) 1988-01-23

Family

ID=12947890

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58053618A Granted JPS59180896A (ja) 1983-03-31 1983-03-31 プログラマブル素子

Country Status (1)

Country Link
JP (1) JPS59180896A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6134800A (ja) * 1984-07-25 1986-02-19 Nec Corp 読出し専用半導体記憶装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6134800A (ja) * 1984-07-25 1986-02-19 Nec Corp 読出し専用半導体記憶装置

Also Published As

Publication number Publication date
JPS633400B2 (enrdf_load_stackoverflow) 1988-01-23

Similar Documents

Publication Publication Date Title
US4365319A (en) Semiconductor memory device
US4418403A (en) Semiconductor memory cell margin test circuit
EP0055129B1 (en) Semiconductor memory device
US5293386A (en) Integrated semiconductor memory with parallel test capability and redundancy method
US4969124A (en) Method for vertical fuse testing
EP0031386B1 (en) Semiconductor memory device
KR900008637B1 (ko) 여분의 회로부를 가지는 반도체 메모리 장치
CN113330519A (zh) 用于软封装后修复的设备和方法
US4862416A (en) Semiconductor memory device with redundant memory cell
JPH07226100A (ja) 半導体メモリ装置
US7688655B2 (en) Semiconductor memory device and test method therefor
KR100354276B1 (ko) 반도체 기억 장치
US4654830A (en) Method and structure for disabling and replacing defective memory in a PROM
US4752914A (en) Semiconductor integrated circuit with redundant circuit replacement
JP2000311496A (ja) 冗長アドレス設定回路及びこれを内蔵した半導体記憶装置
US6707735B2 (en) Semiconductor memory device
WO1982002793A1 (en) Semiconductor memory redundant element identification circuit
US20040170067A1 (en) Semiconductor memory device permitting control of internal power supply voltage in packaged state
JPH0793997A (ja) スタティック型半導体記憶装置
US4731760A (en) On-chip test circuitry for an ECL PROM
JPS59180896A (ja) プログラマブル素子
JP3898390B2 (ja) 半導体記憶装置
JPS58125299A (ja) 冗長度を有するメモリ装置
US4817033A (en) Signal detecting circuit
JP2973419B2 (ja) 半導体メモリ装置