JPS59176978U - Light emitting device inspection equipment - Google Patents

Light emitting device inspection equipment

Info

Publication number
JPS59176978U
JPS59176978U JP1983071229U JP7122983U JPS59176978U JP S59176978 U JPS59176978 U JP S59176978U JP 1983071229 U JP1983071229 U JP 1983071229U JP 7122983 U JP7122983 U JP 7122983U JP S59176978 U JPS59176978 U JP S59176978U
Authority
JP
Japan
Prior art keywords
light emitting
emitting device
device inspection
inspection equipment
emitting element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1983071229U
Other languages
Japanese (ja)
Inventor
美樹 山本
Original Assignee
日本電気株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本電気株式会社 filed Critical 日本電気株式会社
Priority to JP1983071229U priority Critical patent/JPS59176978U/en
Publication of JPS59176978U publication Critical patent/JPS59176978U/en
Pending legal-status Critical Current

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  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例を示す回路構成図で、1は被
検査発光素子、2は受光センサ、3は定電流パルス発生
回路、4はセンスアンプ、5はタイミング信号発生回路
、6はサンプルホールド回路、7はAD変換器を示す。 第2図A−Eは第1図の回路の各部動作波形を示すもの
で、第1図の符号A〜Eと第2図の各信号符号A−Eは
対応している。
FIG. 1 is a circuit configuration diagram showing an embodiment of the present invention, in which 1 is a light emitting element to be tested, 2 is a light receiving sensor, 3 is a constant current pulse generation circuit, 4 is a sense amplifier, 5 is a timing signal generation circuit, 6 indicates a sample hold circuit, and 7 indicates an AD converter. 2A to 2E show operating waveforms of each part of the circuit in FIG. 1, and the symbols A to E in FIG. 1 correspond to the respective signal symbols A to E in FIG. 2.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 電流設定信号に対応して被検査発光素子を定電流パルス
駆動する定電流パルス発生回路と、前記発光素子が発生
させる光を受光し増幅するセンスアンプ部と、前記セン
スアンプ部の出力を規定のタイミングでサンプルホール
ドした後アナログ・ディジタル変換を行うことを特徴と
する発光素子検査装置。
a constant current pulse generation circuit that drives a light emitting element under test with constant current pulses in response to a current setting signal; a sense amplifier section that receives and amplifies the light generated by the light emitting element; A light emitting device inspection device characterized by performing analog-to-digital conversion after sample-holding at timing.
JP1983071229U 1983-05-13 1983-05-13 Light emitting device inspection equipment Pending JPS59176978U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1983071229U JPS59176978U (en) 1983-05-13 1983-05-13 Light emitting device inspection equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1983071229U JPS59176978U (en) 1983-05-13 1983-05-13 Light emitting device inspection equipment

Publications (1)

Publication Number Publication Date
JPS59176978U true JPS59176978U (en) 1984-11-27

Family

ID=30201378

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1983071229U Pending JPS59176978U (en) 1983-05-13 1983-05-13 Light emitting device inspection equipment

Country Status (1)

Country Link
JP (1) JPS59176978U (en)

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