JPS59173853A - Testing device - Google Patents

Abstract

PURPOSE:To enable correct and quick inputting of normal time signal data by commanding writing of normal time signal data used to judge the propriety in each checking step in a memory by utilizing the diagnostic program itself. CONSTITUTION:After completion of inputting of the diagnostic program in a memory MEM, the testing device is connected to a normal device to be tested, and a switch SW is connected to a data taking mode side. In the data taking mode, a microprocessor CPU reads out the diagnostic program, and performs the display of checking position and the generation of controlling output to the first check step. The signal taken in through the program PRO is written in the diagnostic program as normal time signal data in the check step.

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a test device for diagnosing a failure state of a peripheral circuit controlled by a microprocessor in a device using a microprocessor.

Generally, this type of test equipment is plugged into the device in place of the microprocessor used in the device under test, and generates a series of check control outputs in place of the microprocessor, and The signal state of the peripheral circuit corresponding to the circuit is checked by comparing it with pre-stored normal signal data, and the presence or absence of a failure in the peripheral circuit is detected. That is, for each check step, the test device automatically captures the signal at the check point via a probe or the like, and compares the signal state with a normal value to determine pass/fail. Therefore, a worker can easily find a fault location in a peripheral circuit simply by applying the probe to the 101st designated position according to the instructions of the test device.

Here, signal data for comparison is stored in a part of each check step of the diagnostic program.

However, in the above-mentioned test equipment, the normal signal data for each check step of the diagnostic program is coupled and inputted based on the circuit diagram after the diagnostic program is completed, and is input for each check step at a time. Since data must be input, the input work is troublesome and errors in inputting signal data may occur.

SUMMARY OF THE INVENTION An object of the present invention is to eliminate the above-mentioned drawbacks of the conventional apparatus and to realize a test apparatus with a simple configuration that can input signal data for comparison accurately and quickly.

The test device of the present invention is a test device that performs check operations according to a diagnostic program, and uses this diagnostic program to capture normal signal data at each check step. By connecting the device to the device and setting the operation mode to data acquisition mode, it displays the check points according to each check step of the diagnostic program, generates control output according to the check points, and displays the information that appears at the check point at this time. The signal is captured and stored as normal signal data in the check step.

Hereinafter, the test apparatus of the present invention will be explained using the drawings.

FIG. 1 is a configuration diagram showing an embodiment of the testing apparatus of the present invention. In the figure, CPt1 is a microprocessor that controls the operation of the entire test equipment, MEM is a memory that stores a diagnostic program and signal data during normal operation, and DIS displays display data in the diagnostic program and instructs where to apply the probe. In the display section, SW is a switch that changes the operating mode, RUC is a latch that temporarily holds the control output for the chinchic, OUT is an output terminal that sends out this control output, and IN is an input terminal that takes in the signal state corresponding to the control output. , PRO is a probe. Here, the peripheral circuit is generally configured mainly around an IC, and the display section D
The IC number is used to display the IS.

In the test apparatus of the present invention configured as described above, the normal test mode is set by connecting the switch SW to the test@mode side, and the check is performed according to the procedure stored in the diagnostic program. For example, if the diagnostic program is to check from IC No. 1 to l1fl, data such as "U-I P-10"1 is stored as display data in the first check step. This is [No. 1 IC
Attach the probe PRO to the 10th pin]
After displaying this data on the display section DIS, the microprocessor CPU reads out the output signal data in the check step and outputs an output signal corresponding to this data via the latch RUC. At the same time, the state of the signal in the first IC is captured via the probe PRO and compared with the normal signal data stored in the termination memory MEM to determine whether it is good or bad. Depending on the results, advance the program to the next step.

In other words, as a result of the comprehensive check for the first IC, if this IC is normal, proceed to the check step for the second IC, and if it is not normal, perform a more detailed check for the first IC. Check.

Now, in a test apparatus operating in this manner, writing of signal data during normal operation is performed as follows. After inputting the diagnostic program to the memory MEM,
Connect this test device to a normal device under test, and connect switch SW to the data acquisition mode side. In the data acquisition mode, the microprocessor CPU first reads out the diagnostic program in the same way as in the test mode described above, and displays the check points and generates a control output for the first check step. Here, the difference from the test mode described above is that the signal taken in via the probe PRO is written into the diagnostic program as normal signal data in the check step.

In this way, if the normal signal data used in each check step is imported using the diagnostic program itself, the position of the signal to be imported for each check step will be sequentially displayed on the display section DIS. , Probe PRO' according to the display @lIDl5
By simply hitting the button, you can easily and accurately capture signal data during normal operation.

FIG. 2 is a block diagram showing another embodiment of the testing device of the present invention. In the figure, the same parts as in FIG. 1 are designated by the same reference numerals. CPU2 is a microprocessor used in the device under test. The test equipment shown in the figure is a microprocessor CI'tJ2 used in the equipment under test for one input/output of the microprocessor CPU.
The diagnostic program is interpreted and executed by the microprocessor CPU, and the control output is generated by the microprocessor CPU 2 that is compatible with the device under test.

In this way, the microprocessor CPU2 compatible with the device under test can generate control outputs tailored to the device under test, so a common diagnostic program can be used even for devices using different microprocessors. can do.

In addition, in the above explanation, the case where the IC number was used to indicate the check location was exemplified, but this display is
The check location is not limited to the number C, but by using a symbol displayed on the printed board, etc., it is possible to find the check point without referring to a document or the like.

Claims (1)

[Claims] A check operation is performed according to a diagnostic program in which a plurality of check steps are arbitrarily combined, and display data indicating a check point is displayed for each check step, and an output signal for checking is generated for the check point and appears at the check point at this time. In a test device that is designed to judge pass/fail by comparing signals with normal signal data that has been captured and stored, one of the operating modes is a data capture mode, and in this data capture mode, Connect this device to a normal device under test, display the display data for each check step in the diagnostic program, generate check output signals corresponding to the check points, and capture the signals that appear at the check points. A test device configured to store the signal data as normal signal data in the check step.