KR100250597B1 - Method for testing function of computer and apparatus thereof - Google Patents

Abstract

PURPOSE: A method and an apparatus for testing a computer function are provided to process an image signal of a computer and test an operating state of the computer by discriminating a function of a testing target PC through an image signal outputted therefrom. CONSTITUTION: An analog/digital converter(111) converts an image signal into a digital signal in response to a synchronous signal wherein a testing target computer outputs the image signal to a monitor. A reference image signal generator generates a reference image signal corresponding to the image signal. An active pattern matching means(112) compares the digital signal from the analog/digital converter(111) with the reference image signal from the reference image signal generator. A storage means stores a comparison result of the active pattern matching means(112) in response to a timing signal. The first timing generator generates the first timing signal in response to the synchronous signal.

Description

Computer function test method and apparatus for performing the same

The present invention relates to a computer function test method and an apparatus for performing the same. More particularly, the present invention relates to a computer inspection method capable of processing an image signal of a computer and to inspect an operating state of the computer, and an apparatus for performing the same.

Currently, when manufacturing a personal computer (hereinafter, referred to as a PC), it is necessary to check whether various functions of the completed PC, such as a VGA card, a video overlay function, and a video display function, are performed before shipping the assembled PC. Inspection work is essential. Then, in order to check the function of the PC as described above, a program for checking the function of the PC when the PC is manufactured is stored in advance.

In order to inspect the function of the manufactured PC, an operator must directly drive the inspection program, and the operator inspects the function of the PC by visually confirming the processing result output on the monitor after operating the inspection program. Done.

However, in the above method, since the operation of the computer is directly inspected by the operator, the accuracy and efficiency of the inspection are determined according to the proficiency of the operator's inspection work, thereby improving the objectivity, reliability, and productivity of the inspection. have.

Accordingly, the present invention has been made in view of the above circumstances, and a first object of the present invention is to provide a computer function test method that is more objective and reliable for function test of a computer.

It is a second object of the present invention to provide a computer function test apparatus that makes the function test of a computer more objective and reliable.

1 is a diagram showing an inspection of a PC to be inspected and a connection state thereof by using a computer function test apparatus according to an embodiment of the present invention.

FIG. 2 is a block diagram showing the second or third functional test apparatus of FIG.

3 is an operation flowchart of the computer function test apparatus shown in FIG.

* Explanation of symbols for main parts of the drawings

100: computer function test device 110: first test device

120: second inspection device 130: third inspection device

111: A / D converter 113: active pattern matching circuit

112: clock and timing signal generating circuit section 114, 115, 116: memory

117: interface control unit 200: the inspection target PC

300: control PC

According to another aspect of the present invention, there is provided a computer function test method comprising: a signal conversion step of converting an image signal output from a test target computer to a monitor into a digital signal in response to a synchronization signal; A reference signal generation step of generating a reference video signal corresponding to the video signal output from the inspection target computer to the monitor; A signal contrast step of comparing the digital signal from the signal conversion step and the reference video signal from the reference signal generation step; And a storage step of storing the comparison result of the signal comparison step in response to the timing signal.

Advantageously, the method further comprises: generating a first timing signal in response to said synchronization signal; And a first storing step of storing the digital signal generated by the signal converting step in response to the first timing signal. More preferably, the signal conversion step includes a clock signal generation step of generating a predetermined clock signal in response to the synchronization signal; And generating the digital signal in response to the clock signal from the clock signal generating step. The signal comparing step may further include generating a second timing signal in response to the synchronization signal; Generating a third timing signal in response to the synchronization signal; Storing the reference video signal from the reference signal generation step in response to a second timing signal generated by the second timing signal generation step; And reading the reference video signal stored by the third timing signal generating step in response to the third timing signal generated by the third timing signal generating step, and converting the read reference video signal and the digital signal by the signal converting step. It consists of the steps to prepare. Preferably, the storing step may further include generating a fourth timing signal for generating a fourth timing signal in response to the synchronization signal; Storing the contrast result signal generated by the contrast step in response to a fourth timing signal generated by the fourth timing signal generation step; And a third storing step for outputting the contrast result signal stored by the step of output command from the outside.

According to the method, the function of the PC can be inspected by contrasting the video signal output from the test target PC with the reference image data when the function test of the test target PC is performed.

According to an aspect of the present invention, there is provided a VGA card inspection apparatus, comprising: A / D conversion means for converting an image signal output from a inspection target computer to a monitor into a digital signal in response to a synchronization signal; Reference video signal generating means for generating a reference video signal corresponding to the video signal output from the inspection target computer to the monitor; Active pattern matching means for contrasting the digital signal from the A / D conversion means and the reference video signal from the reference video signal generating means; And storage means for storing the contrast result from the active pattern matching means in response to the timing signal.

Advantageously, the apparatus further comprises: first timing signal generating means for generating a first timing signal in response to the synchronization signal; And first storage means for storing the digital signal generated by the A / D conversion means in response to the first timing signal generated by the timing signal generating means. Further, the A / D conversion means includes clock signal generation means for generating a predetermined clock signal in response to the synchronization signal, and from the inspection target PC in response to the clock signal from the clock signal generation means. Converts the video signal into the digital signal. In addition, the inspection target computer stores predetermined inspection data in a storage device therein, and processes the inspection data during a function inspection and outputs the image signal according to the processing result. More preferably, second timing signal generating means for generating a second timing signal in response to the synchronization signal; And second storage means for storing the reference video signal in response to the second timing signal generated by the second timing signal generating means, wherein the active pattern matching means comprises the digital signal and the The reference video signal is read from the second storage means in order to contrast the reference video signal. Advantageously, said active pattern matching means comprises third timing generating means for generating a third timing signal in response to said synchronization signal, in response to said third timing signal from said third timing generating means. And contrast the digital signal from the A / D conversion means and the reference video signal from the reference video signal generating means. Advantageously, the apparatus further comprises: fourth timing generating means for generating a fourth timing signal in response to the synchronization signal; Third storage means for storing a contrast result signal generated by the active pattern matching means in response to a fourth timing signal generated by the second timing generating means; And interface means for outputting the contrast result signal stored by the third storage means when an output command from outside is generated. The reference image signal generating means is an inspection control computer for generating a reference image signal corresponding to an image signal generated from the inspection target computer when the image signal is generated from the inspection target computer. And storing the inspection data of the inspection target computer in a storage device. Also more preferably, the device examines each of the R, G, and B-signals from the computer under test.

According to the apparatus, when the function of the inspection target PC is inspected, the video signal output from the inspection target PC and the reference image data are contrasted with each other to inspect the function of the manufactured PC.

Hereinafter, the present invention will be described in more detail with reference to the accompanying drawings.

FIG. 1 is a diagram illustrating a test and connection state of a VGA card of a test target PC using a test apparatus of a VGA card according to an exemplary embodiment of the present invention.

In FIG. 1, the computer inspection apparatus 100 according to the present invention is electrically connected to an image signal output terminal of an inspection target PC 200 and outputs R, G, and B-signals output from the inspection target PC 200; And a synchronization signal. In order to process the R, G, and B-signals and the synchronization signal, respectively, the computer function test apparatus 100 outputs from the test target PC 200, preferably, first, second and third test apparatuses. It consists of 110, 120, and 130.

The first test apparatus 110 of the computer function test apparatus 100 is electrically connected to the R-signal output terminal and the synchronous signal output terminal of the test target PC 200 to receive the R-signal and the synchronous signal that are input. Process. The second test apparatus 120 of the computer function test apparatus 100 is electrically connected to the G-signal output terminal and the sync signal output terminal of the test target PC 200 to receive the G-signal and the sync signal that are input. Process.

In addition, the third test device 130 of the computer function test device 100 is electrically connected to the B-signal output terminal and the synchronous signal output terminal of the test target PC 200, and the test target PC 200 Process the input B-signal and the sync signal.

The first, second, and third inspection apparatuses 110, 120, and 130 of the computer function inspection apparatus 100 are electrically connected to the control PC 300 to control commands from the control PC 300. The inspection result data of the first, second, and third VGA inspection apparatuses 110, 120, and 130 are provided to the control PC 300.

The control PC 300 is electrically connected to the test target PC. Preferably, the control PC 300 and the test target PC 200 use a series port or a parallel port of an external connection terminal (not shown). The test target PC 200 provides the control PC 300 with information about an image signal output from the test target PC 200 when the test program is driven. In addition, the control PC 300 stores data about the inspection program stored in the inspection target PC 200.

The first, second, and third inspection apparatuses 110, 120, and 130 of the computer function inspection apparatus 100 have their interiors except that the signals to be processed are R, G, and B-signals. The configuration and operation are the same. Therefore, in the present embodiment, only the first inspection device 110 among the first, second, and third inspection devices 110, 120, and 130 will be described, and the remaining second and third inspection devices 120 and 130 will be described. ) Will be omitted.

FIG. 2 is a block diagram showing the first inspection apparatus 110 of FIG. 1, wherein the first VGA inspection apparatus 110 includes an A / D converter 111, an active pattern matching circuit 112, and clock and timing control. The signal generating circuit section 113, the first, second, and third memories 114, 115, and 116, and the interface control section 117 are included.

The clock and timing control signal generation circuit unit 113 generates a clock and first, second, third, and fourth timing control signals in response to the synchronization signal from the inspection target PC 200. A clock and first, second, third, and fourth timing control signals to the A / D converter 111, the active pattern matching circuitry 112, the clock and timing control signal generation circuitry 113, and the first, To the second and third memories 114, 115, and 116, respectively.

The A / D converter 111 converts an analog R-signal input from the inspection target PC 200 into a digital signal in response to a clock signal from the clock and timing signal generator circuit 112 and converts it into a digital-R- signal. Generates a signal and provides the generated digital-R-signal to the first memory 114 and the active pattern matching circuitry 112, respectively.

The first memory 114 stores the digital-R-signal from the A / D converter 111 in response to the first timing control signal from the clock and timing control signal generator circuit 113.

The second memory 114 stores reference image data input from the control PC 300 through the interface controller 117 in response to a second timing control signal from the clock and timing control signal generation circuit 113. Save it.

The active pattern matching circuitry 113 stores digital-R- stored in the first and second memories 114 and 115 in response to a third timing control signal from the clock and timing control signal generation circuitry 113, respectively. The signal and the reference image data are read, a contrast result signal is generated by comparing the read-out digital-R-signal and the reference image data, and the generated contrast result signal is provided to the third memory 116.

The third memory 116 stores the contrast result signal from the active pattern matching circuit 113 in response to a fourth timing control signal from the clock and timing control signal generation circuit 113.

The interface controller 117 controls the digital-R-signal of the A / D converter 111, the comparison result of the active pattern matching circuit 112, under the control of the control PC 300, and the first and second operations. 2, and the data stored in the third memory (114, 115, and 116) to the control PC 300 or the control command signal from the control PC 300 to the digital of the A / D converter 111 R-signals, contrast results of the active pattern matching circuitry 112, and the first, second, and third memories 114, 115, and 116.

Hereinafter, the operation of the computer function test apparatus having the above configuration will be described in more detail with reference to FIG.

3 is an equivalent flowchart of the RGB signal inspection apparatus of the computer function inspection apparatus of FIG.

In order to test the function of the PC 200 using the computer function test apparatus shown in FIG. 2, first, as shown in FIG. 1, an operator first, second, and The third inspection apparatus 110, 120, and 130 are connected to the video signal output terminal of the inspection target PC 200 through a connector and a jig (not shown). That is, the R-signal and the synchronization signal output from the inspection target PC 200 are transmitted to the first inspection apparatus 110, the G-signal and the synchronization signal are supplied to the second inspection apparatus 120, and the B-signal is It is supplied to the third inspection device 130.

The first, second, and third inspection apparatuses 110, 120, and 130 of the computer function inspection apparatus 100 are interconnected with the control PC 300 to control from the control PC 300. Command and reference image data, and data generated by the first, second, and third inspection apparatuses 110, 120, and 130 of the computer function inspection apparatus 100 are mutually transmitted. Preferably, the reference image data stored in the control PC 300 may include the first memory installed in the first, second, and third inspection apparatuses at the time of initialization of the control PC 300. 114). That is, the first, second and third inspection devices 110, 120, and 130 are connected to a good computer (not shown), and the first memory 114 receives an image signal input from the good computer. ) And the data stored in the first memory 114 is provided to the control PC 300 as a reference image signal.

When the above connection is completed, the user drives the inspection target PC 200, and the inspection target PC 200 executes the inspection program stored therein. As the inspection target PC 200 is driven, the inspection target PC 200 generates an image signal according to the execution of the inspection program, and the image signal generated by the inspection target PC 200 is the computer. It is input to the function test apparatus 100. The image signal from the test subject PC 200 input to the computer function test apparatus 100 is provided to the first, second, and third test apparatuses 110, 120, and 130. Preferably, the R-signal and the synchronization signal to the first inspection device 110, the G-signal and the synchronization signal to the second inspection device 120, and the B-signal and the synchronization to the third inspection device 130 Signals are input respectively.

The R-signal input to the first inspection device 110 is input to the A / D converter 111, and the synchronization signal is input to the clock and timing control signal generation circuit unit 112 (S1).

When the synchronization signal is inputted to the clock and timing control signal generation circuit section 112 from the inspection target PC 200 by the step 1, the clock and timing control signal generation circuit section 112 is connected to the input speed of the synchronization signal. Generates a corresponding clock and first, second, third, and fourth timing signals, provides the generated clock signal to the A / D converter 111, and generates the first, second, and third signals. The third and fourth timing signals are provided to the first, second, and third methods 114, 115, and 116, and the active pattern matching circuit 112, respectively (S2, S3).

When a clock signal is input to the A / D converter 111 from the clock and timing signal generation circuit 112 by the step 3, the A / D converter 111 is transferred from the inspection target PC 200. The digital-R-signal is generated by converting the R-signal of the analog form from the inspection target PC 200 into a digital signal according to a clock signal provided by the clock and timing signal generating circuit unit 112. The generated digital-R-signal is provided to the first memory 114 and the active pattern matching circuit 113, respectively (S4).

When the digital-R-signal from the A / D converter 111 is input to the first memory 114 by the step 4, the first memory 114 includes the clock and timing signal generation circuit unit ( The digital-R-signal 1132 is stored in response to the first timing signal from 112 (S5).

On the other hand, the inspection target PC 200 generates a processing result signal indicating the output video signal according to the function inspection program therein, and provides the generated processing result signal to the control PC 300. . Then, the control PC 300 generates the reference video signal based on the processing result signal, and provides the generated reference video signal to the second memory 115 through the interface controller 117 to provide the It is stored in the second memory 115 (S6).

Subsequently, the active pattern matching circuit 113 reads the digital-R-signal and the reference image data stored in the second memories 114 and 115, respectively, in response to the third timing signal, and the digital-R A contrast result signal is generated in comparison with the signal and the reference image signal data, and the generated contrast result signal is output to the third memory 116 (S7).

The third memory 116 receives the contrast result in response to the fourth timing signal from the clock and timing signal generation circuit 112 when the contrast result signal from the active pattern matching circuit 113 is input. The signal is stored, and when the output command is input from the control PC 300, the stored contrast result signal is output through the interface controller 117 (S8).

Then, the contrast result signal output to the interface control unit 117 is input to the control PC 300, the contrast result signal input to the control PC 300 is operated by the automation device driving information can be inspected unattended In addition, since it can be displayed on the monitor by a simple operation of the operator, it is possible to determine in real time whether the inspection target PC 200 function normally by checking the contrast result displayed by the operator.

Therefore, according to the method and configuration, it is possible to inspect the function of the manufactured PC by comparing the video signal and the reference image data output from the inspection target PC with each other when the function of the manufactured PC.

According to the present invention, it is possible to determine the function of the inspection target PC through the video signal output from the inspection target PC at the time of the functional inspection of the manufactured PC, thereby performing a more accurate and reliable inspection during the functional inspection of the manufactured PC You can do it.

Although this invention was demonstrated concretely by the said Example, this invention is not restrict | limited by this, A deformation | transformation and improvement are possible within the normal knowledge of a person skilled in the art.

Claims (16)

a) a signal conversion step of converting an image signal output from the inspection target computer to the monitor into a digital signal in response to a synchronization signal; b) a reference signal generation step of generating a reference video signal corresponding to the video signal output from the inspection target computer to the monitor; c) a signal contrast step of contrasting the digital signal from the signal conversion step and the reference video signal from a reference signal generation step; And d) storing the comparison result of the signal comparison step in response to the timing signal. The method of claim 1, further comprising: e) generating a first timing signal in response to the synchronization signal; And f) storing said digital signal generated by step a) in response to said first timing signal. The method of claim 1, wherein step a) comprises: a-1) generating a predetermined clock signal in response to the synchronization signal; And a-2) generating said digital signal in response to said clock signal from step a-1). The method of claim 1, wherein the inspection target computer stores predetermined inspection data in a storage device therein, and processes the inspection data during a function inspection and outputs the image signal according to the processing result. To check computer function. The method of claim 1, wherein step c) comprises: c-1) generating second and third timing signals in response to the synchronization signal; c-2) storing the reference video signal from step b) in response to the second timing signal generated by step c-1); And c-3) reading the reference video signal stored by step c-3) in response to the third timing signal generated by step c-1), and reading the reference video signal and the digital signal according to step a). Computer function test method comprising the steps of preparing for. 2. The method of claim 1, wherein step d) comprises: d-1) generating a fourth timing signal in response to the synchronization signal; d-2) storing the contrast result signal generated by step c) in response to the fourth timing signal generated by step d-1); And d-3) outputting the contrast result signal stored by step d-2) upon an output command from the outside. A / D conversion means for converting an image signal output from the inspection target computer to the monitor into a digital signal in response to a synchronization signal; Reference video signal generating means for generating a reference video signal corresponding to the video signal output from the inspection target computer to the monitor; Active pattern matching means for contrasting the digital signal from the A / D conversion means and the reference video signal from the reference video signal generating means; And storage means for storing the contrast result from the active pattern matching means in response to the timing signal. 8. The apparatus of claim 7, further comprising: first timing signal generating means for generating a first timing signal in response to the synchronization signal; And first storage means for storing the digital signal generated by the A / D conversion means in response to the first timing signal generated by the timing signal generation means. Device. 8. The A / D conversion means according to claim 7, wherein the A / D conversion means comprises clock signal generation means for generating a predetermined clock signal in response to the synchronization signal, and wherein the A / D conversion means is in response to the clock signal from the clock signal generation means. And a digital signal converting video signal from the inspection target PC into the digital signal. The method of claim 7, wherein the inspection target computer stores predetermined inspection data in a storage device therein, and processes the inspection data during a function inspection and outputs the image signal according to the processing result. Computer function test device. 8. The apparatus of claim 7, further comprising: second timing signal generating means for generating a second timing signal in response to the synchronization signal; And second storage means for storing the reference video signal in response to the second timing signal generated by the second timing signal generating means, wherein the active pattern matching means comprises the digital signal and the And read out the reference video signal from the second storage means to contrast a reference video signal. 8. The apparatus of claim 7, wherein the active pattern matching means comprises third timing generating means for generating a third timing signal in response to the synchronization signal, wherein the third timing signal from the third timing generating means. Responsive to said digital signal from said A / D conversion means and said reference video signal from said reference video signal generating means. 8. The apparatus of claim 7, further comprising: fourth timing generating means for generating a fourth timing signal in response to the synchronization signal; Third storage means for storing a contrast result signal generated by the active pattern matching means in response to a fourth timing signal generated by the second timing generating means; And interface means for outputting the contrast result signal stored by the third storage means when an output command from outside is generated. The inspection control computer according to claim 7, wherein the reference image signal generating means is an inspection control computer for generating a reference image signal corresponding to an image signal generated from the inspection target computer when the image signal is generated from the inspection target computer. And the computer stores the inspection data of the inspection target computer in a storage device therein. 8. The apparatus of claim 7, wherein the apparatus is connected to an external inspection control computer and controlled by the inspection control computer. 8. The apparatus of claim 7, wherein the apparatus inspects R, G, and B-signals from the inspection target computer, respectively.

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