JPS59155823A - Inspecting device of external appearance of substrate - Google Patents
Inspecting device of external appearance of substrateInfo
- Publication number
- JPS59155823A JPS59155823A JP58030056A JP3005683A JPS59155823A JP S59155823 A JPS59155823 A JP S59155823A JP 58030056 A JP58030056 A JP 58030056A JP 3005683 A JP3005683 A JP 3005683A JP S59155823 A JPS59155823 A JP S59155823A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- power source
- light
- board
- inspected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/02—Viewing or reading apparatus
- G02B27/022—Viewing apparatus
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Supply And Installment Of Electrical Components (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は実装基板の検査を目視により行なうための基板
外観検査装置に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a board appearance inspection apparatus for visually inspecting a mounted board.
一般に、プリント基板に抵抗、コンデンサ、集積回路等
の各部品が装着された実［１板の不良を発見するための
検査は、不良のない完全な見本基板と被検査基板を目視
により比較して、半田付状態の不良、部品の実装ミス等
を発見している。しかし、見本基板と被検査基板の双方
を目視により直接児比べるということは、視線を前記２
つの基′板の間で゛何度も移動させることになるため検
査員の視覚の疲労が大きいばかりでなく、検査効率や検
査精度を高めることもむずかしかった。In general, inspection to detect defects in a printed circuit board on which components such as resistors, capacitors, and integrated circuits are mounted is performed by visually comparing a complete sample board with no defects and the board to be inspected. , defects in soldering, component mounting errors, etc. have been discovered. However, direct visual comparison of both the sample board and the board to be tested means that the line of sight is
Not only did the inspector have to move the board over and over again, causing visual fatigue, but it was also difficult to improve inspection efficiency and accuracy.
このような難点を改善する一例として、２台のテレビカ
メラにより見本基板と被検査基板を撮像し、これらの映
像信号を同−ＣＲＴ上に表示させて比較することが行な
われている。しかし、この方法は非常に高価な装置を必
要とすることや、ＣＲＴによる画像には電子線が移動す
るためどうしてもちらつきがあり、これを長時間注視す
るということが視線の移動とはまた別の検査員の視覚の
疲労の原因になっている。As an example of improving these difficulties, two television cameras are used to capture images of a sample board and a board to be inspected, and these video signals are displayed on the same CRT for comparison. However, this method requires very expensive equipment, and images captured by CRT inevitably flicker due to the movement of the electron beam, and the need to gaze at this for a long time is different from the movement of the line of sight. This causes visual fatigue for inspectors.
（発明の目的）
本発明の目的は」−記従来の難点を改良し、検査員の疲
労が少なく、しがも低価格にて実現できる実装基板め不
良を発見するための基板外観検査装置を提供しようとす
るにある。(Objective of the Invention) The object of the present invention is to provide a board appearance inspection device for detecting defects in mounted boards, which improves the drawbacks of the conventional system, reduces inspector fatigue, and can be realized at a low cost. That's what we're trying to offer.
以下、図面を参照して本発明の一実施例の構成を説明す
る。Hereinafter, the configuration of an embodiment of the present invention will be described with reference to the drawings.
見本基板１のみを照明する第１の光源２の２つの電源端
子２ａ、２ｂの内一方２ａは′光量調整用の第１の可変
抵抗３を介して電源４に接続されており、他方の電源端
子２ｂは光源切り替えスイッチ５及び両光源点燈用の連
動スイッチ６を並列に介して電源４へ接続されている。Of the two power supply terminals 2a and 2b of the first light source 2 that illuminates only the sample board 1, one 2a is connected to a power supply 4 via a first variable resistor 3 for adjusting the amount of light; The terminal 2b is connected to the power source 4 via a light source changeover switch 5 and an interlocking switch 6 for turning on both light sources in parallel.
また、被検査基板７のみを照明する第２の光源８の２つ
の電源端子８ａ、８ｂの内〜方８ａは光量調整用の第２
の可変抵抗９を介して電源４に接続されており、他方の
電源端子８ｂは光源切り替えスイッチ５及び両光源点燈
用の連動スイッチ６を並列に介して電源４へ接続されＴ
いる。ハーフミラ−１０の取り付は角度は被検査基板７
の像の反射光が検査員の視覚１１に達するように、また
、ミラー１２の取り付（シ角度は、前記ハーフミラ−１
０を透過した見本基板１の像のミラーにお（〕る反射光
と前記ハーフミラ−１０における被検査基板の像の反射
光とが平行になるように夫々ｗｌ整されている。また、
見本基板１と被検査基板７を設置する高さは、見本基板
１の像がハーフミラ−１ｏに達するまでの光路の距離と
被検査基板７の像がハーフミラ−１０に達するまでの光
路の距離とが等しくなるように、まＩＣ％児本基本基板
１検査基板７を設置づ−る向きは、ハーフミラ−１０上
において前記２つの基板の像が完全に一致するように夫
々調整して配置されている。また、図面にては省略した
が実際には第１及び第２の光源２，８は互いに他を干渉
しないように、また、光源２．８以外の光の影響を受け
ないように囲いがしである。In addition, one of the two power supply terminals 8a and 8b of the second light source 8 that illuminates only the substrate 7 to be inspected is connected to a second power supply terminal 8a for adjusting the light amount.
The other power supply terminal 8b is connected to the power supply 4 through a variable resistor 9, and the other power supply terminal 8b is connected to the power supply 4 through a light source changeover switch 5 and an interlocking switch 6 for turning on both light sources in parallel.
There is. The mounting angle of the half mirror 10 is set to the board 7 to be inspected.
The mounting angle of the mirror 12 is set so that the reflected light of the image of the half mirror 1 reaches the visual field 11 of the inspector.
The reflected light of the image of the sample substrate 1 that has passed through the mirror 10 and the reflected light of the image of the substrate to be inspected on the half mirror 10 are adjusted so that they are parallel to each other.
The height at which the sample substrate 1 and the substrate to be inspected 7 are installed is determined by the distance of the optical path until the image of the sample substrate 1 reaches the half mirror 1o and the distance of the optical path until the image of the substrate to be inspected 7 reaches the half mirror 10. In addition, the directions in which the IC% basic board 1 and the test board 7 are installed are adjusted and arranged so that the images of the two boards completely match each other on the half mirror 10. There is. Although not shown in the drawings, in reality, the first and second light sources 2 and 8 are enclosed so that they do not interfere with each other and are not affected by light other than the light sources 2.8. It is.
上記構成にＪ５いて、次にその動作を図面を参照して説
明する。The operation of J5 in the above configuration will now be explained with reference to the drawings.
両光源点燈用の連動スイッチ６をＯＮすると第１及び第
２の光源２，８が同時に点焙じ見本基板１及び被検査基
板７の双方に照明がなされるため、見本基板１の像はミ
ラー１２で反射された後ハーフミラ−１０を介して、被
検査基板７の像はハーフミラ−１０で反射されて夫々検
査員の視覚１７に達する。この状態において、まず、見
本基板１及び被検査基板７の像が完全に重なっているか
を確認し、完全に重なるように基板の向き、ミラーの角
度を微調整したら両光源点燈用の連動スイッチ６をＯＦ
Ｆにする。When the interlocking switch 6 for both light sources is turned on, the first and second light sources 2 and 8 illuminate both the sample board 1 and the board 7 to be inspected at the same time, so the image of the sample board 1 is mirrored. After being reflected by the half mirror 12, the image of the substrate 7 to be inspected is reflected by the half mirror 10 and reaches the visual field 17 of the inspector. In this state, first check whether the images of the sample board 1 and the board to be inspected 7 are completely overlapped, and after finely adjusting the orientation of the board and the angle of the mirror so that they overlap completely, switch the interlocking switch for both light sources. 6 OF
Make it F.
次に、光源切り替えスイッチ５の可動端子を固定端子Ｌ
側に接続すると第１の光源２が点燈し見本基板１のみ
に照明がなされ、見本基板１の像がミラー１２で反射さ
れハーフミラ−１０を透過して検査員の視覚１１に達す
る。次に、前記光源切り替えスイッチ５の可動端子を固
定端子Ｌ 側に接続すると第１の光源２が消燈するとと
もに第２の光源８が点燈して被検査基板７のみに照明が
なされ、被検査基板７の像がハーフミラ−１０で反射さ
れて検査員の視覚１１に達する。つまり、両光源点燈用
−の連動スイッチ６をＯＦＦにして光源切り替えスイッ
チ５の切り替えを繰り返し行なうことによって見本基板
１及び被検査基板７の像が交互に検査員の視覚１１へ送
られ、検査員は前記２つの像を比較して半田付状態の不
良や部品の実装ミスを発見することができる。Next, connect the movable terminal of the light source changeover switch 5 to the fixed terminal L.
When connected to the side, the first light source 2 is turned on and only the sample substrate 1 is illuminated, and the image of the sample substrate 1 is reflected by the mirror 12 and transmitted through the half mirror 10 to reach the visual field 11 of the inspector. Next, when the movable terminal of the light source changeover switch 5 is connected to the fixed terminal L side, the first light source 2 is turned off and the second light source 8 is turned on, illuminating only the board 7 to be inspected. The image of the inspection substrate 7 is reflected by the half mirror 10 and reaches the visual field 11 of the inspector. That is, by turning off the interlocking switch 6 for both light sources and repeatedly switching the light source changeover switch 5, the images of the sample board 1 and the board to be inspected 7 are alternately sent to the inspector's vision 11, and the The operator can compare the two images and find defects in soldering or component mounting errors.
また、光源切り替えスイッチ５の（り替えを手動ではな
くスイッチング回路等により複数回自動的に行なえば検
査の能率はより向上し、しかも切り替えを高速に行なえ
ば見本基板１と被検査基板７とで異なる部分、即ち毎回
表示される部分に対する１回おきに表示される部分を検
査員の視覚１１により容易に確認することができるため
、検査員は極端に押杆を集中していなくとも被検査基板
７の不良を比較的楽に発見することが可能である。In addition, if the light source changeover switch 5 is changed automatically several times using a switching circuit or the like instead of manually, inspection efficiency will be further improved, and if the changeover is done quickly, the sample board 1 and the board to be tested 7 can be Since the inspector can easily check the different parts, that is, the parts that are displayed every other time compared to the parts that are displayed every time, with his or her visual system 11, the inspector does not have to concentrate his or her attention on the board to be inspected. 7 defects can be discovered relatively easily.
以上に詳述した通り、本発明に係る基板外観検査装置は
、検査員が視線を移動させることなく見本基板１ど被検
査基板７を見比べることができ、また、ＣＲＴのように
電子線が移動するようならうつぎのある画面を観察する
のではなくミラーを介して光学的に結ばれた（象を観察
するため、検査員の視覚の疲労が少なくて済み、検査効
率や検査精度を高めることができる。また、テレビカメ
ラやＣＲＴ等の高価な′ＪＡ置は不要であり、検査装置
の費用を低く抑えることが可能である。As described in detail above, the board appearance inspection apparatus according to the present invention allows the inspector to compare the sample board 1 and the board to be inspected 7 without moving his/her line of sight, and the electron beam moves like a CRT. If so, instead of observing a fixed screen, it is possible to connect optically through a mirror (by observing the elephant, the visual fatigue of the inspector is reduced, and inspection efficiency and accuracy can be increased. In addition, expensive equipment such as a television camera or CRT is not required, and the cost of the inspection equipment can be kept low.
図面は本発明の一実施例を示ザ図である。
図中、１は見本基板、２は第１の光源、４は電源、５は
光源切り替えスイッチ、６は両光源点燈用の連動スイッ
チ、７は被検査基板、８は第２の光源、１０はハーフミ
ラ−１１２はミラーである。
特許出願人
ブラザー工業株式会着
取締役社長 河嶋勝二The drawings illustrate one embodiment of the present invention. In the figure, 1 is a sample board, 2 is a first light source, 4 is a power supply, 5 is a light source changeover switch, 6 is an interlocking switch for turning on both light sources, 7 is a board to be inspected, 8 is a second light source, 10 The half mirror 112 is a mirror. Patent applicant Brother Industries, Ltd. President Katsuji Kawashima
Claims (1)
る光源装置と、見本基板及び被検査基板の内の一方の像
を反射するハーフミラ−と、反射光が前記ハーフミラ−
を透過するように他方の基板の像を反１１Ｊ するミラ
ーとを有することを特徴とする基板外観検査装置。1. A light source device that illuminates the sample substrate and the substrate to be inspected alternately or simultaneously; a half mirror that reflects an image of one of the sample substrate and the substrate to be inspected;
1. A substrate appearance inspection apparatus, comprising: a mirror that mirrors an image of the other substrate so that the image of the other substrate is transmitted through the substrate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58030056A JPS59155823A (en) | 1983-02-24 | 1983-02-24 | Inspecting device of external appearance of substrate |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58030056A JPS59155823A (en) | 1983-02-24 | 1983-02-24 | Inspecting device of external appearance of substrate |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS59155823A true JPS59155823A (en) | 1984-09-05 |
Family
ID=12293163
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58030056A Pending JPS59155823A (en) | 1983-02-24 | 1983-02-24 | Inspecting device of external appearance of substrate |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59155823A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4821307A (en) * | 1987-02-10 | 1989-04-11 | Flint Iii Paul L | Image splitter for two-way imaging apparatus |
-
1983
- 1983-02-24 JP JP58030056A patent/JPS59155823A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4821307A (en) * | 1987-02-10 | 1989-04-11 | Flint Iii Paul L | Image splitter for two-way imaging apparatus |
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