JPS59150313A - 物理量分布測定装置 - Google Patents

物理量分布測定装置

Info

Publication number
JPS59150313A
JPS59150313A JP1854183A JP1854183A JPS59150313A JP S59150313 A JPS59150313 A JP S59150313A JP 1854183 A JP1854183 A JP 1854183A JP 1854183 A JP1854183 A JP 1854183A JP S59150313 A JPS59150313 A JP S59150313A
Authority
JP
Japan
Prior art keywords
measurement
physical quantity
data
measuring device
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1854183A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0473089B2 (en:Method
Inventor
Yoshihiro Kobayashi
小林 喜広
Chikara Konagai
主税 小長井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP1854183A priority Critical patent/JPS59150313A/ja
Publication of JPS59150313A publication Critical patent/JPS59150313A/ja
Publication of JPH0473089B2 publication Critical patent/JPH0473089B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D1/00Measuring arrangements giving results other than momentary value of variable, of general application
    • G01D1/14Measuring arrangements giving results other than momentary value of variable, of general application giving a distribution function of a value, i.e. number of times the value comes within specified ranges of amplitude

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Indicating Measured Values (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
JP1854183A 1983-02-07 1983-02-07 物理量分布測定装置 Granted JPS59150313A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1854183A JPS59150313A (ja) 1983-02-07 1983-02-07 物理量分布測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1854183A JPS59150313A (ja) 1983-02-07 1983-02-07 物理量分布測定装置

Publications (2)

Publication Number Publication Date
JPS59150313A true JPS59150313A (ja) 1984-08-28
JPH0473089B2 JPH0473089B2 (en:Method) 1992-11-19

Family

ID=11974486

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1854183A Granted JPS59150313A (ja) 1983-02-07 1983-02-07 物理量分布測定装置

Country Status (1)

Country Link
JP (1) JPS59150313A (en:Method)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005300314A (ja) * 2004-04-09 2005-10-27 Toshiba Corp 測定データ管理装置、測定データ管理方法、及び測定データ管理プログラム
JP2014231994A (ja) * 2013-05-28 2014-12-11 日置電機株式会社 測定結果表示装置、測定システムおよび測定結果表示用プログラム
JP2016090289A (ja) * 2014-10-30 2016-05-23 株式会社小野測器 分布図表示装置及び方法
JP2018036284A (ja) * 2017-12-08 2018-03-08 日置電機株式会社 測定結果表示装置および測定結果表示用プログラム

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005300314A (ja) * 2004-04-09 2005-10-27 Toshiba Corp 測定データ管理装置、測定データ管理方法、及び測定データ管理プログラム
JP2014231994A (ja) * 2013-05-28 2014-12-11 日置電機株式会社 測定結果表示装置、測定システムおよび測定結果表示用プログラム
JP2016090289A (ja) * 2014-10-30 2016-05-23 株式会社小野測器 分布図表示装置及び方法
JP2018036284A (ja) * 2017-12-08 2018-03-08 日置電機株式会社 測定結果表示装置および測定結果表示用プログラム

Also Published As

Publication number Publication date
JPH0473089B2 (en:Method) 1992-11-19

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