JPS59142475A - Testing system of switch matrix - Google Patents
Testing system of switch matrixInfo
- Publication number
- JPS59142475A JPS59142475A JP1696283A JP1696283A JPS59142475A JP S59142475 A JPS59142475 A JP S59142475A JP 1696283 A JP1696283 A JP 1696283A JP 1696283 A JP1696283 A JP 1696283A JP S59142475 A JPS59142475 A JP S59142475A
- Authority
- JP
- Japan
- Prior art keywords
- resistance
- contacts
- intersection
- switch matrix
- contact
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
Description
【発明の詳細な説明】
（ａ） 発明の技術分野
本発明はスイッチマトリックスの入側出側に測定器及び
被測定物を接続し、各交点の接点を開閉し当該接点の動
作の正常性を試験するスイッチマトリックスの試験方法
に係り、測定器及び被測定物が接続されている交点以外
の交点の接点の動作の正常性を、該測定器及び被測定物
を接続替えしなくとも試験出来るスイッチマトリックス
の試験方式に関する。Detailed Description of the Invention (a) Technical Field of the Invention The present invention connects a measuring device and an object to be measured to the inlet and outlet sides of a switch matrix, opens and closes contacts at each intersection, and checks the normality of the operation of the contacts. A switch that can test the normal operation of contacts at intersections other than the intersection where the measuring instrument and the object to be measured are connected, without changing the connection of the measuring instrument and the object to be measured, according to the test method of the switch matrix to be tested. Concerning matrix testing methods.
（ｂ） 従来技術と問題点
従来スイッチマトリックスの入側ｉと出側ｊの交点の接
点の開閉を試験する時は出側ｊに例えば抵抗を接続し入
側ｉに例えば抵抗計を接続し、交点１ｅＪの接点を開閉
し核抵抗計の示す値で接点の動作の正常性を試験してい
た。又他の、例えば入側ｉ＋１と出側ｊ＋１の交点の接
点の開閉を試験する時は出側ｊ＋１に抵抗を接続し、入
側ｉ＋１に抵抗計を接続するよう接続替えして入側１＋
１と出側ｊ＋１の交点の接点を開閉して接点の動作の正
常性を試験していた。従ってスイッチマトリックスの全
接点の定期試験等においては抵抗及び抵抗計の接続替え
の手間がかかる欠点があった。(b) Prior art and problems When testing the opening/closing of a contact at the intersection of input side i and output side j of a conventional switch matrix, a resistor, for example, is connected to output side j, and a resistance meter, for example, is connected to input side i. The contact at the intersection point 1eJ was opened and closed, and the normality of the contact operation was tested using the value indicated by the nuclear resistance meter. In addition, when testing the opening/closing of a contact at the intersection of input side i+1 and output side j+1, for example, connect a resistor to output side j+1 and connect a resistance meter to input side i+1, then change the connections to test input side 1+.
The normality of the operation of the contact was tested by opening and closing the contact at the intersection of 1 and the output side j+1. Therefore, in periodic tests of all the contacts of the switch matrix, there is a drawback that it takes time and effort to change the connections of the resistors and resistance meters.
尚又スイッチマトリックスを使用した装置が運転中等で
入側ｉ＋１又は出側ｊ＋１に抵抗計及び抵抗が接続出来
ない場合は入側ｉ＋１と出側ｊ＋１の交点の接点の動作
は確認出来ない欠点があった。Furthermore, if a device using a switch matrix is in operation and a resistance meter and resistance cannot be connected to the input side i+1 or the output side j+1, there is a drawback that the operation of the contact at the intersection of the input side i+1 and the output side j+1 cannot be confirmed. Ta.
（ｃ）発明の目的
本発明の目的は上記の欠点に鑑み、マトリックススイッ
チの入側出側の２端子のみに測定器及び被測定物を接続
するだけで全接点の動作の正常性を試験出来るスイッチ
マトリックスの試験方式の提供にある。(c) Purpose of the Invention In view of the above-mentioned drawbacks, the purpose of the present invention is to test the normality of the operation of all contacts by simply connecting a measuring device and an object to be measured to only the two input and output terminals of the matrix switch. The objective is to provide a test method for switch matrices.
（ｄ） 発明の構成
本発明は上記の目的を達成するために、測定器及び被測
定物及び試験すべき交点とのパスを作るよう、該試験す
べき交点の接点を除きスイッチマトリックスの交点の接
点を閉とし、該試験すべき交点の接点を開閉し、当該接
点の動作の正常性を試験出来ることを特徴とする。(d) Structure of the Invention In order to achieve the above-mentioned object, the present invention creates a path between the measuring device, the object to be measured, and the intersection point to be tested by removing the contact points of the intersection point to be tested. It is characterized in that the normality of the operation of the contact can be tested by closing the contact and opening and closing the contact at the intersection to be tested.
（ｅ） 発明の実施例 以下本発明の実施例につき図に従って説明する。(e) Examples of the invention Embodiments of the present invention will be described below with reference to the drawings.
第１図は本発明の実施例の抵抗及び抵抗針を各々スイッ
チマトリックスの入側及び出側に接続した場合の接点を
閉とする状況を示すブロック図、第２図は本発明の実施
例の抵抗及び抵抗計をスイッチマトリックスの入側に接
続した場合の接点を閉とする状況を示すブロック図であ
る。FIG. 1 is a block diagram showing the situation in which the contacts are closed when the resistor and resistance needle of the embodiment of the present invention are respectively connected to the inlet and outlet sides of the switch matrix, and FIG. 2 is the block diagram of the embodiment of the present invention. FIG. 3 is a block diagram showing a situation in which the contacts are closed when a resistor and a resistance meter are connected to the input side of the switch matrix.
図中１０はスイッチマトリックス、２０は抵抗計、３０
は抵抗を示す。In the figure, 10 is a switch matrix, 20 is a resistance meter, 30
shows resistance.
第１図において抵抗３０と抵抗計２０が、接続されてい
るスイッチマトリックス１０の入側１と出側１の交点１
，１以外の例えば交点３，３の接点の動作の正常性を試
験する場合は、抵抗計２０゜抵抗３０と交点３，３（第
１図の○印）のパスを作るよう交点１，３及び交点３，
１の接点（第１図の◎印）を閉とする。このようにして
交点３゜３の接点を開閉し、抵抗計２０にて抵抗３０の
値を測定すれば交点３，３の接点の動作の正常性は、抵
抗引２０と抵抗３０を入側３と出側３に接続替えしなく
とも試験出来又入側３又は出側３に抵抗計２０及び抵抗
３０を接続出来なくとも試験出来る。次に第２図の如く
例えば入側１に抵抗計２０を入側２に抵抗３０を接続し
て交点３ 、３ （第２図の○印）の接点の動作の正常
性を試験する場合は、抵抗計２０．抵抗３０．交点３，
３のパスを作るよう交点１，３及び交点２，２及び交点
３゜２の接点（第２図の◎印）を閉とし、交点３，３の
接点を開閉し、抵抗計２０にて抵抗３０の値を測定すれ
ば交点３，３の接点の動作の正常性を、抵抗計２０と抵
抗３０を入側３と出側３に接続替えしなくとも、又出側
に抵抗計２０及び抵抗３゜を接続出来なくとも試験出来
る。従って抵抗計２０及び抵抗３０は接続替えし表くと
も、又スイッチマ） ＩＪワックス０を使用した装置が
運転中等で、スイッチマトリックス１０の試験すべき例
えば交点３，３の接点に対応した入側出側の３，３に抵
抗計２０及び抵抗３０が接続出来なくとも交点３．３の
接点の動作の正常性が試験出来る。従って上記の方法で
スイッチマトリックスの入側出側の２端子のみに抵抗計
２０抵抗３０を接続するだけで全交点の接点の試験が出
来る。In FIG. 1, the resistor 30 and the resistance meter 20 are connected to the intersection 1 of the input side 1 and the output side 1 of the switch matrix 10.
, 1, for example, when testing the normality of the operation of the contacts at intersections 3 and 3, use a resistance meter 20° and a resistance 30 and intersection 3,
Contact point 1 (marked with ◎ in Figure 1) is closed. In this way, by opening and closing the contacts at the intersection 3°3 and measuring the value of the resistance 30 with the resistance meter 20, the normal operation of the contacts at the intersections 3 and 3 can be determined by connecting the resistance pull 20 and the resistance 30 to the input side 3. The test can be performed without changing the connection to the input side 3 or the output side 3, and the test can be performed even if the resistance meter 20 and the resistor 30 cannot be connected to the input side 3 or the output side 3. Next, as shown in Figure 2, for example, when connecting a resistance meter 20 to input side 1 and a resistor 30 to input side 2 to test the normal operation of the contacts at intersections 3 and 3 (marked with ○ in Figure 2), , resistance meter 20. Resistance 30. Intersection 3,
Close the contacts at intersections 1 and 3, intersections 2 and 2, and intersection 3°2 (marked with ◎ in Figure 2) to create a path of 3, open and close the contacts at intersections 3 and 3, and measure the resistance with the resistance meter 20. By measuring the value of 30, you can check the normality of the operation of the contacts at the intersections 3 and 3 without having to change the connection of the ohmmeter 20 and the resistor 30 to the input side 3 and the output side 3. You can test even if you cannot connect 3°. Therefore, even if the resistance meter 20 and the resistance 30 are connected, the switch matrix 10 may be connected to the input side corresponding to the contact point to be tested, for example, intersection 3, 3. Even if the resistance meter 20 and the resistor 30 cannot be connected to the output terminals 3 and 3, the normal operation of the contact at the intersection 3.3 can be tested. Therefore, using the method described above, it is possible to test the contacts at all intersections by simply connecting the resistance meter 20 and the resistor 30 to only the two terminals on the input and output sides of the switch matrix.
（ｆ） 発明の効果
以上詳細に説明せる如く本発明によれば、スイッチマト
リックスの入側出側の２端子のみに測定器及び被測定物
を接続するだけで全交点の接点の開閉動作の正常性の試
験が出来ると共にマトリックススイッチを使用し、た装
置が運転中等でマトリックススイッチの端子に測定器及
び被測定物を接続出来ないものがあっても全交点の接点
の開閉動作の正常性を試験出来る効果がある。(f) Effects of the Invention As explained in detail above, according to the present invention, normal opening and closing operations of the contacts at all intersections can be achieved by simply connecting the measuring instrument and the object to be measured to only the two terminals on the input and output sides of the switch matrix. By using a matrix switch, you can test the normality of the opening/closing operation of the contacts at all intersections even if there are devices that cannot connect measuring instruments or objects to be measured to the terminals of the matrix switch due to operation etc. There is a possible effect.
第１図は本発明の実施例の抵抗及び抵抗計を各々スイッ
チマトリックスの入側及び出側に接続した場合の接点を
閉とする状況を示すブロック図、第２図は本発明の実施
例の抵抗及び抵抗計をスイッチマトリックスの入側に接
続した場合の接点を閉とする状況を示すブロック図であ
る。
図中１０はスイッチマトリックス、２ｏは抵抗計、３０
は抵抗を示す。
茅 （閉
事 ２ 口FIG. 1 is a block diagram showing a situation in which the contacts are closed when a resistor and an ohmmeter according to an embodiment of the present invention are connected to the inlet and outlet sides of a switch matrix, respectively. FIG. 3 is a block diagram showing a situation in which the contacts are closed when a resistor and a resistance meter are connected to the input side of the switch matrix. In the figure, 10 is a switch matrix, 2o is a resistance meter, and 30
shows resistance. Kaya (closing 2 mouths)
Claims (1)
を接続し、各交点の接点を開閉し当該接点の動作の正常
性を試験するスイッチマトリックスの試験方法において
、該測定器及び該被測定物及び試験すべき交点とのパス
を作るよう、該試験すべき交点の接点を除きスイッチマ
トリックスの交点の接点を閉とし該試験すべき交点の接
点を開閉し当該接点の動作の正常性を試験することを特
徴とするスイッチマトリックスの試験方式。In a switch matrix testing method, in which a measuring device and a device under test are connected to the input and output sides of a switch matrix, and the contacts at each intersection are opened and closed to test the normality of the operation of the contacts, the measuring device and the device under test are connected to the input and output sides of the switch matrix. In order to create a path with the intersection to be tested, the contacts at the intersection of the switch matrix are closed except for the contacts at the intersection to be tested, and the contacts at the intersection to be tested are opened and closed to test the normality of the operation of the contacts. A test method for switch matrices characterized by the following.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1696283A JPS59142475A (en) | 1983-02-04 | 1983-02-04 | Testing system of switch matrix |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1696283A JPS59142475A (en) | 1983-02-04 | 1983-02-04 | Testing system of switch matrix |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS59142475A true JPS59142475A (en) | 1984-08-15 |
Family
ID=11930727
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1696283A Pending JPS59142475A (en) | 1983-02-04 | 1983-02-04 | Testing system of switch matrix |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59142475A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102520348A (en) * | 2011-12-21 | 2012-06-27 | 北京航天测控技术有限公司 | General switch detector |
| CN112485661A (en) * | 2020-11-24 | 2021-03-12 | 中国电子科技集团公司第二十九研究所 | High-power switch array testing device |
-
1983
- 1983-02-04 JP JP1696283A patent/JPS59142475A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102520348A (en) * | 2011-12-21 | 2012-06-27 | 北京航天测控技术有限公司 | General switch detector |
| CN112485661A (en) * | 2020-11-24 | 2021-03-12 | 中国电子科技集团公司第二十九研究所 | High-power switch array testing device |
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