JPS59121944A - 半導体素子の検査装置 - Google Patents
半導体素子の検査装置Info
- Publication number
- JPS59121944A JPS59121944A JP22766982A JP22766982A JPS59121944A JP S59121944 A JPS59121944 A JP S59121944A JP 22766982 A JP22766982 A JP 22766982A JP 22766982 A JP22766982 A JP 22766982A JP S59121944 A JPS59121944 A JP S59121944A
- Authority
- JP
- Japan
- Prior art keywords
- current
- polarity
- identification mark
- semiconductor element
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 35
- 238000012360 testing method Methods 0.000 title claims abstract description 15
- 230000003287 optical effect Effects 0.000 claims abstract description 29
- 230000002950 deficient Effects 0.000 claims description 11
- 238000007689 inspection Methods 0.000 claims description 11
- 239000011347 resin Substances 0.000 abstract description 7
- 229920005989 resin Polymers 0.000 abstract description 7
- 238000000034 method Methods 0.000 abstract description 6
- 238000010586 diagram Methods 0.000 description 2
- 239000013307 optical fiber Substances 0.000 description 2
- 239000008188 pellet Substances 0.000 description 2
- 235000010469 Glycine max Nutrition 0.000 description 1
- 244000068988 Glycine max Species 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000003908 quality control method Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP22766982A JPS59121944A (ja) | 1982-12-28 | 1982-12-28 | 半導体素子の検査装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP22766982A JPS59121944A (ja) | 1982-12-28 | 1982-12-28 | 半導体素子の検査装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59121944A true JPS59121944A (ja) | 1984-07-14 |
| JPS6160571B2 JPS6160571B2 (enrdf_load_stackoverflow) | 1986-12-22 |
Family
ID=16864471
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP22766982A Granted JPS59121944A (ja) | 1982-12-28 | 1982-12-28 | 半導体素子の検査装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59121944A (enrdf_load_stackoverflow) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117761514A (zh) * | 2023-12-29 | 2024-03-26 | 扬州江新电子有限公司 | 一种高压封装极性测试电路及其测试方法 |
-
1982
- 1982-12-28 JP JP22766982A patent/JPS59121944A/ja active Granted
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117761514A (zh) * | 2023-12-29 | 2024-03-26 | 扬州江新电子有限公司 | 一种高压封装极性测试电路及其测试方法 |
| CN117761514B (zh) * | 2023-12-29 | 2024-05-31 | 扬州江新电子有限公司 | 一种高压封装极性测试电路及其测试方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6160571B2 (enrdf_load_stackoverflow) | 1986-12-22 |
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| WILDENBERGER et al. | Manufacturing methods and technology program automatic in-process microcircuit evaluation[Final Report, 22 Sep. 1977- 15 Aug. 1980] |