JPS5911698A - Method of drying to measure heat resistant and flux resistant characteristics of printed circuit board part - Google Patents

Method of drying to measure heat resistant and flux resistant characteristics of printed circuit board part

Info

Publication number
JPS5911698A
JPS5911698A JP12147182A JP12147182A JPS5911698A JP S5911698 A JPS5911698 A JP S5911698A JP 12147182 A JP12147182 A JP 12147182A JP 12147182 A JP12147182 A JP 12147182A JP S5911698 A JPS5911698 A JP S5911698A
Authority
JP
Japan
Prior art keywords
flux
drying
circuit board
printed circuit
resistant
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12147182A
Other languages
Japanese (ja)
Inventor
海田 光弘
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Pioneer Corp
Original Assignee
Pioneer Corp
Pioneer Electronic Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pioneer Corp, Pioneer Electronic Corp filed Critical Pioneer Corp
Priority to JP12147182A priority Critical patent/JPS5911698A/en
Publication of JPS5911698A publication Critical patent/JPS5911698A/en
Pending legal-status Critical Current

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  • Electric Connection Of Electric Components To Printed Circuits (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 この発明はプリント配線基板の耐熱、耐フラツクス特性
を測定するための乾燥方法に関し、さらに詳しくは、試
験的な単口1イ」り作業が施された配線基板品を迅速に
特性測定可能状態にするための強制乾燥方法に関づる。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a drying method for measuring the heat resistance and flux resistance characteristics of a printed wiring board, and more specifically, to a drying method for measuring the heat resistance and flux resistance characteristics of a printed wiring board. Relates to a forced drying method for quickly making properties measurable.

プリント配線基板(以下、PC基板と略称づる)は多く
電気機器に使用されていること周知の通りであって、こ
のようなPC基板を完成させるためには必ず自動半11
]付り■程を経なりればならず、それがため、実装した
電子部品の特性に変化を来たづことがあり、イの変化の
状態を一1分に認識した上でlD C基板を使用する必
要がある。さらに詳しくは、半Ill付り1稈である自
動半Il1句り作業においては、PC基板はもとより、
これに実装したトランジスタなどの電子部品も短時間で
はあるが300℃に近い高温状態におかれることがあつ
ζ、その特性に変化を生じたり、甚しい場合には熱破損
することがある。
As is well known, printed wiring boards (hereinafter abbreviated as PC boards) are often used in electrical equipment, and in order to complete such PC boards, automatic semi-
] The characteristics of the mounted electronic components may change. Must be used. More specifically, in the automatic semi-Il1 cutting work, which is a single culm with a semi-Ill, not only PC boards but also
Electronic components such as transistors mounted thereon are also exposed to high temperatures close to 300° C. for a short period of time, causing changes in their characteristics and, in severe cases, thermal damage.

そこで、実際には完成しfCP C基板品として使用4
る前に、自動半田付′け作業と同一の条f1で単口J何
1ノされた測定用のP C基板品について特性測定する
のであるが、その測定は特にフラックスが完全に乾燥し
た状態になった後に行う必要があり、そのために、半田
付は後、4日〜5日間程自然放置されている。フラック
スが十分に乾燥硬化していない状態では液状であるため
、スイッチや、ボリウムなどの接点部品にあってはフラ
ックスが接点部分に入っても1河動ハがフラックスを移
動さけて比′触不良は生じないが、乾燥後はフラックス
が硬くなり接触不良などの問題を生じる。したがって、
単1」付けの影響があっlζか古かの結果を知るIcめ
に最低4[1・−5目以上の日数を要し、甚だ非能率的
な1′[業であった。
Therefore, it was actually completed and used as an fCP C board product4.
Before soldering, the characteristics of a PC board product for measurement that has been soldered with a single solder in the same strip f1 as in the automatic soldering work are measured, but the measurements are performed especially when the flux is completely dry. Therefore, the soldering must be done after the soldering process has been completed.For this reason, the soldering is left to stand for about 4 to 5 days. If the flux is not sufficiently dried and hardened, it is in liquid form, so even if flux enters the contact parts of switches, volume controls, etc., one river movement will avoid moving the flux, resulting in poor contact. However, after drying, the flux becomes hard and causes problems such as poor contact. therefore,
Due to the influence of adding 1', it took at least 4[1.-5 days or more to know whether the result was lζ or old, making it an extremely inefficient process.

従来行われている特+’l測定用のP C基根品は第1
図に示されているように、P C基板1に予め特I11
を測定した電子部品2を実装し、フラックス塗布を行い
、これを80℃〜100℃の環境においてプリヒートづ
る。その後、自動?I’ III何り装置により半田付
けづるのであって、この半田付は時に銅箔部分は250
℃〜260℃に達づる。崖I11イJ1)完了後、自然
冷I41シてフラックスが完全に硬化づるまでの411
〜5日間自然放置し、その後、各種の特性を測定する。
The conventional PC base product for special +'l measurement is the first one.
As shown in the figure, a special I11 is pre-installed on the PC board 1.
The measured electronic component 2 is mounted, flux applied, and preheated in an environment of 80°C to 100°C. Then automatic? Soldering is done using a device similar to I'III, and sometimes the copper foil part is soldered at a temperature of 250 mm.
℃ to reach 260℃. Cliff I11a J1) After completion, natural cooling I41 and 411 until the flux is completely hardened.
Leave to stand for ~5 days, and then measure various characteristics.

そこで、この発明は半fJ] (E+ 4:J 後の自
然/lり置の時間を短縮して特性測定結果をり、0時間
のうらに知ることができるようにしJ、うとづるもので
、そのために、フラックスの乾燥が最も能率的に進行し
、かつ、電子部品の1−1性に影響を与えない温庶、湿
度の環境、さらには、その環境に放置される時間を種々
実験の結果、電子部品として最も熱に弱い1〜ランジス
タの耐熱温度を上限とし、その渇]σが50℃へ・60
℃であることから、この温度範囲で湿1肛。
Therefore, this invention shortens the time of natural/l placement after half fJ] (E+ 4:J) so that the characteristic measurement results can be obtained after 0 hours. For this purpose, various experiments have shown that the flux should be kept in a warm and humid environment in which drying progresses most efficiently and that does not affect the 1-1 properties of electronic components, as well as the length of time it is left in that environment. , the upper limit is the heat-resistant temperature of 1 to transistor, which is the most sensitive to heat as an electronic component;
℃, so there is no humidity in this temperature range.

時間をイれぞ゛れ40%へ、50%、20〜30時間と
定め−(フラックスを確実、かつ、迅速に乾燥さU特性
測定を行い得るJ、うにしたしのである。
The time difference was set to 40%, 50%, and 20 to 30 hours.

以下、この発明の実施例を第3図、第4図に示−!l−
1) C基板品の側面図、および、「作業進行一時間」
の進行図に沿って説明する。先ず、銅箔により形成され
た回路に対して端子が1Φ人された電r部品は気温25
°C1湿度(Rl−1) 65%の環境下て初明測定を
行い、これの銅箔面11に7ラツクス塗布を行ってゆっ
くりとブリ上−1−シ、基板10の銅箔面11の温度を
85℃に保ち、銅箔面11にフラックス塗布を行って、
ざらに基板10の銅箔面11の温度を85℃の状態に保
持覆る。
Examples of this invention are shown in FIGS. 3 and 4 below. l-
1) Side view of the C board product and “1 hour of work progress”
This will be explained along the progression chart. First, an electric component with a terminal of 1Φ for a circuit formed of copper foil has a temperature of 25%.
First light measurement was carried out in an environment with humidity (Rl-1) of 65%, and 7 lux was applied to the copper foil surface 11 of the substrate 10. Maintaining the temperature at 85°C, apply flux to the copper foil surface 11,
The temperature of the copper foil surface 11 of the substrate 10 is roughly maintained at 85° C. and covered.

そして、自動半1’ll (=lけ装置ににり電子部品
12の端子13を銅箔による回路14に半田付りづる。
Then, the terminals 13 of the electronic component 12 are soldered to the circuit 14 made of copper foil using an automatic semi-automatic device.

このどき、基板10の銅箔面11は260℃に達してい
るが、?VIll (=Iす1りただちに自然冷7J1
シ、一旦冷却しIこところて′、50℃〜65℃の温度
−Fで、湿麿(Rl−1) 50%〜40%の影響下に
20時間以上、3()時間、好ましくは、24時間以上
、30時間の相聞放置する。
Nowadays, the copper foil surface 11 of the board 10 has reached 260°C, but? VIll (=I immediately naturally cooled 7J1
Once cooled, at a temperature of 50° C. to 65° C., under the influence of 50% to 40% Rl-1, for 20 hours or more, preferably 3 hours, Leave the matter unattended for at least 24 hours or 30 hours.

その後、常温まで冷却して基(fIioに固定された電
子部品12の電気的特性を測定する。
Thereafter, it is cooled to room temperature and the electrical characteristics of the electronic component 12 fixed to the substrate (fIio) are measured.

以−りの説明から明らかなように、この発明のプリン1
〜基板品の耐熱、耐ノラツクス特性を測定するたの乾燥
方法は、電子部品は熱破壊されず、しかも、フラックス
は最も短時間で乾燥づる環境中にPC基板品を放置づる
ので、特性測定までの時間を短縮することができる。
As is clear from the following explanation, the pudding 1 of this invention
~The drying method used to measure the heat resistance and anti-Norax properties of circuit board products does not damage electronic components due to heat, and since the PC board products are left in an environment where flux dries in the shortest time, it is easy to measure the properties. time can be reduced.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はPC基板品の側面図、第2図は従来の乾燥方法
に伴う一連の作業を示づ進行説明図、第33図はこの発
明を実施づる対象のl) C基板品の側面図、第4図は
この発明による乾燥方法に(!11つ一連の作業を示づ
進行説明図である。 5−
Fig. 1 is a side view of a PC board product, Fig. 2 is a progress explanatory diagram showing a series of operations involved in a conventional drying method, and Fig. 33 is a side view of a C board product to which this invention is applied. , FIG. 4 is a progress explanatory diagram showing a series of 11 operations in the drying method according to the present invention. 5-

Claims (1)

【特許請求の範囲】 プリン1へ基板に電子部品を実装して半田付t′J’ 
L。 た場合の電子部品の耐熱、耐フラツクス特性を測定する
だめの乾燥方法において、半田イリリ後、自然冷却シl
ζプリント配線基板品を調度50℃〜65℃で、かつ、
湿度50%〜40%の雰囲気中にほぼ20時間以」−放
置し、その後、実装した電子部品の電気的特性を測定で
きるJ:うにした乾燥方法。
[Claims] Electronic components are mounted on the board of the printer 1 and soldered t'J'
L. In the drying method used to measure the heat resistance and flux resistance characteristics of electronic components, after soldering, a natural cooling sill is used.
ζPrinted wiring board products at a temperature of 50℃ to 65℃, and
J: A drying method in which the electrical characteristics of the mounted electronic components can be measured after being left in an atmosphere with a humidity of 50% to 40% for approximately 20 hours or more.
JP12147182A 1982-07-13 1982-07-13 Method of drying to measure heat resistant and flux resistant characteristics of printed circuit board part Pending JPS5911698A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12147182A JPS5911698A (en) 1982-07-13 1982-07-13 Method of drying to measure heat resistant and flux resistant characteristics of printed circuit board part

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12147182A JPS5911698A (en) 1982-07-13 1982-07-13 Method of drying to measure heat resistant and flux resistant characteristics of printed circuit board part

Publications (1)

Publication Number Publication Date
JPS5911698A true JPS5911698A (en) 1984-01-21

Family

ID=14811967

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12147182A Pending JPS5911698A (en) 1982-07-13 1982-07-13 Method of drying to measure heat resistant and flux resistant characteristics of printed circuit board part

Country Status (1)

Country Link
JP (1) JPS5911698A (en)

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