JPS59115637A - Automatic checking method of fm tuner - Google Patents
Automatic checking method of fm tunerInfo
- Publication number
- JPS59115637A JPS59115637A JP57230498A JP23049882A JPS59115637A JP S59115637 A JPS59115637 A JP S59115637A JP 57230498 A JP57230498 A JP 57230498A JP 23049882 A JP23049882 A JP 23049882A JP S59115637 A JPS59115637 A JP S59115637A
- Authority
- JP
- Japan
- Prior art keywords
- tuner
- signal
- output
- wave
- propriety
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/20—Monitoring; Testing of receivers
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- Monitoring And Testing Of Transmission In General (AREA)
- Circuits Of Receivers In General (AREA)
Abstract
Description
【発明の詳細な説明】
この発明は、１：へ４千−ｌ−ノの自動検査に関し、特
に周波数のｌ１１１調を甲＜Ｌ、’Ｕ検査のスピードを
高めたＦ Ｍブー？−ノの自動検査方法に関Ｊる＝Ｌ）
の−（ある。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to the automatic inspection of 1: to 4,000-l-no, and in particular to the FM boo? -Regarding automatic inspection method =L)
-(There is.
Ｆ Ｍデー２−）の製造に際しては、その受信周波数の
検査が必要であり、かかる作業の自動化が行な゛わねで
いる。ぞして、従来一般に行なわれている自動検査方法
は、ＩＭヂコーブのチコーニジグあるいはジグノルジ」
−ネレータを変化させることによって周波数をスィーブ
さけ、この時のＦ Ｍチューブの出力のレベル変化に対
重るピーク点を兄つ（）る方法が用いられている。When manufacturing FM data 2-), it is necessary to inspect the receiving frequency, and automation of this work is not yet possible. Therefore, the automatic inspection method that has been commonly used in the past is IM Dicove's Chiconi Jig or Gignolji.
- A method is used in which the frequency is swept by changing the generator, and the peak point that overlaps with the level change of the FM tube output at this time is increased.
しかしながら、このような方法は、アンテナ入力レベル
が低い場合には真の同調点にＪ３いて最大となる１個の
ピークとなるが、アンｊプ入力が高くなるとりイトピー
クの方が人ぎくなって、第１図に示づようにピークが２
個となってしまう。この結果、２個のピークに対す′る
周波数の平均を取らなＧ′Ｊればならず、時間がかかる
と共に自動化しＩｃ場合には、かかる演算処理のため構
成が複刹１どなって大幅／ｉ−：ｌミー：ｌストアツブ
題を有している。However, with this method, when the antenna input level is low, a single peak will be produced which is the maximum at the true tuning point, but as the amplifier input becomes high, the peak will become more noisy. , the peak is 2 as shown in Figure 1.
It becomes an individual. As a result, it is necessary to average the frequencies of the two peaks, which is time consuming and, if automated, would require a significant increase in the complexity of the configuration due to such arithmetic processing. /i-:lmy:lstoresubtitle.
この発明の目的は、簡単かつ短時間に自動検査が行なえ
る方法を提供することである。An object of the present invention is to provide a method that allows automatic inspection to be performed simply and in a short time.
以下、図面を用いてこの発明によるＦＭブコーナの自動
検査方法を詳細に説明する。EMBODIMENT OF THE INVENTION Hereinafter, the automatic inspection method of the FM corner according to this invention will be explained in detail using drawings.
第２図はこの発明によるＦＭヂコーナの白動検杏プノ法
の 実施例を示すブ１」ツク図である。同図において１
は被検査デユープーであって、１！！述づるシダフルジ
Ｉネ１ノータ２から出力されるＦ Ｍ変調波信号ヲノノ
ーブル３を介してアンアノ入力としている。４は白チｂ
調整検査器であって、被検台ヂ″Ｌ−ノ１の出力レベル
を測定しく良否の判別を行なうと共に、ジグノルジ１ネ
レータ２に対りる変調のＡン・オン制御と搬送周波数の
スィーブ制御をＨコなつくいく）。４１ｄ３、ジグノル
ジ１ネレータ２にお（プる信号周波数は 定である。FIG. 2 is a block diagram showing an embodiment of the white motion test method of the FM corner according to the present invention. In the same figure, 1
is the Dupuu to be inspected, and 1! ! The FM modulated wave signal outputted from the cedar full digital I/N node 2 described above is inputted via the FM modulated wave signal No. 3. 4 is white b
It is an adjustment tester that measures the output level of the test table ``L-no 1'' and determines whether it is good or bad, and also controls the modulation A-ON control and the carrier frequency sweep control for the Gignorge 1 Generator 2. 41d3, Signal frequency is constant to Gignorge 1 Generator 2.
このように構成されｌこ装置において、ジグノルジ１ネ
レータ２（３１１、自動調整検査器４からの指令により
ＦＭ変調波を発生して被検査デユープ１に供給ｒする１
、被検査ブ１−す１は、ジグノルジ１ネレ−タ２から供
給さねるイ；じ」に７・ＩＬ〕Ｉ同調が取られ、その時
点にｃｌ：ｊ Ｇ−Ｊる出力信号が自動調整検査器４に
供給さ４′ξ−（良否の検査が行なわれる。次に自動調
整検査器４は、シグプルジ１．ネ１ノータ２に対して搬
送１周波数を変える指令をりえて同様な検査を繰返１こ
とにより検査を完了する。In this apparatus configured as described above, a generator 2 (311) generates an FM modulated wave according to a command from the automatic adjustment tester 4 and supplies it to the duplex 1 to be tested.
, the tested block 1 is tuned to 7.IL]I when it is supplied from the generator 2, and at that point the output signal of cl:j G-J is automatically adjusted. 4'ξ- (pass/fail inspection is performed.Next, the automatic adjustment inspection device 4 issues a command to change the conveyance 1 frequency to the signal generator 1. Repeat 1 completes the test.
この場合、被検査ヂューナとしてのＦＭチューブ−がチ
、、ｌ−ニジグを行なう場合、搬送波は一定の周波数の
正弦波信号によってＦＭ変調されている。In this case, when the FM tube as the tuner to be tested performs jig, the carrier wave is FM modulated by a sine wave signal of a constant frequency.
ぞして、このＦ Ｍ変調波の周波数スペク１〜ルは、一
般に周知のよ゛）に搬送波を挾んでυ−ｆドビークが２
個存在づる。従−）て、チコーニジグの時にこの２個の
平均を取ら（プればならず、時間がかかる問題が４１じ
ていたわ（′Ｊである。これに対し、この発明において
番ま、自動調整検査器４が作動してジグ犬ルジ［ネレー
タ２を制御することにＪ、す、搬送波だＧプをＦＭデー
Ｌ−す１に送出して、まず、ヂ」−−ニジグを取らＵる
。その後、変調をオン制御することにより、一定の周波
数の１弦波信号によりＦＭ変調した「Ｍ変調波を被検査
ブーｌ−す１に供給してその出力を測定することにより
良否の判別を行なう。このようにり゛れば、変調刃るオ
フ哨においては、搬送波だ番プが被検査デユープ１に供
給される関係上、リイドピークが存イ「しなくなってチ
ューニング時間が大幅に短縮されることになる。そして
、チコーニジグが取られたならば、変調Ａンの状態下に
お（ブる被検査ブＪ−〕−１の出力レベルを判別づるこ
とよって良否の判別が行なわねるｌこめに、全体どして
検査０４間も短縮されることになる。Therefore, as is generally known, the frequency spectrum of this FM modulated wave has a υ-f peak of 2 with the carrier wave in between.
Individual existence. Therefore, when making a Chiconi jig, I had to average these two values, which was a time-consuming problem ('J).In contrast, in this invention, the automatic adjustment The tester 4 operates to control the jig generator 2, which sends a carrier wave to the FM data L-1, and first picks up the jig. After that, by turning on the modulation, an FM-modulated wave modulated by a 1-single wave signal of a constant frequency is supplied to the booth under test 1, and its output is measured to determine pass/fail. If this is done, in off-duty monitoring with modulation, since the carrier wave number is supplied to the duplex 1 to be inspected, there will be no lead peak, and the tuning time will be greatly shortened. Then, if the Chiconi jig is removed, it is impossible to determine whether the test is good or bad by determining the output level of the test target J--1 under the condition of the modulation A. , the inspection period 04 is also shortened overall.
以」説明したＪ、うに、この発明によるＦＭチ、Ｊ−す
の自動検査方法は、まず搬送波のみをＦＭチ：ｌ−すに
供給してチューニングを行なわＶることにより、リーイ
ドピークの発生しない状態で迅速なブー１−ニジグを行
なわしξ、次にＦ Ｍ変調波をＦＭチコ−−すに供給し
てその時点にお″（）る出力レベルから良否の判別を行
４Ｔうものであるために、リイドビークの影響を受りな
い状態です早いチューニングが行なえるために、全体と
しての検査時間が大幅に短縮される優れた効果を有する
。The automatic inspection method for FM channels according to the present invention described hereinafter first supplies only a carrier wave to the FM channel and performs tuning, thereby achieving a state in which lead peaks do not occur. This is because a quick boost is performed at ξ, then an FM modulated wave is supplied to the FM transmitter, and pass/fail is determined based on the output level at that point. In addition, since it is not affected by lead beak and can be tuned quickly, it has the excellent effect of significantly shortening the overall inspection time.
第１図はりイドビーク特性を示Ｊ図、第２図はこの発明
によるＦＭチューナの自動検査方法の一実施１例を示づ
ブロック図である。
１・・・被検査ヂューナ、２・・・ジグプルジェネレー
タ、４・・・自動調整検査器。
第１図
第２図FIG. 1 is a diagram showing beam ID beak characteristics, and FIG. 2 is a block diagram showing an example of an embodiment of an automatic inspection method for an FM tuner according to the present invention. 1... Tuner to be inspected, 2... Jig pull generator, 4... Automatic adjustment inspection device. Figure 1 Figure 2
Claims (1)
判別をｔ−ｒなう１Ｍ１ノーナの自動検査において、ま
ず始めに搬送波のみをＦ Ｍ Ｉ：１１．− ）に供給
Ｌ／てチー１−−ジグを？−１イｆわけることにより、
サイドピークの影響を一′ノλづ′に迅速なデーｌ−ユ
ングをＩ’ｊ ％わけ、次に「Ｍ変ａ＋！Ｊ波を１ハ給
してイの時点にお（）るＦ Ｍ ’ＴＩ−−ノの出力１
ノベルを測定１７【良−１・の判別をｔｊ＜ヱ゛うこと
を特徴とするＦ二Ｍ ｆ、１−ノの自動検イ１ ／Ｊ
ン人 。[Claims] In automatic inspection of the 1M1 node, which measures the output of the 1-N4 boolean and determines whether it is good or bad, first, only the carrier wave is FMI:11. -) Supply L/te Chi 1--Jig? -1 By dividing the
Divide the influence of the side peak into I'j% by 1' no λ, and then ``M change a+! 'TI--No output 1
Measuring novels 17 [F2M f, 1-no automatic inspection 1 /J characterized by determining tj<ヂ゛ for good-1.
people.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57230498A JPS59115637A (en) | 1982-12-22 | 1982-12-22 | Automatic checking method of fm tuner |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57230498A JPS59115637A (en) | 1982-12-22 | 1982-12-22 | Automatic checking method of fm tuner |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59115637A true JPS59115637A (en) | 1984-07-04 |
| JPH0324821B2 JPH0324821B2 (en) | 1991-04-04 |
Family
ID=16908708
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57230498A Granted JPS59115637A (en) | 1982-12-22 | 1982-12-22 | Automatic checking method of fm tuner |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59115637A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6168545U (en) * | 1984-04-17 | 1986-05-10 | ||
| JPH01132145U (en) * | 1988-03-02 | 1989-09-07 |
-
1982
- 1982-12-22 JP JP57230498A patent/JPS59115637A/en active Granted
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6168545U (en) * | 1984-04-17 | 1986-05-10 | ||
| JPH036047Y2 (en) * | 1984-04-17 | 1991-02-15 | ||
| JPH01132145U (en) * | 1988-03-02 | 1989-09-07 | ||
| JPH0513071Y2 (en) * | 1988-03-02 | 1993-04-06 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0324821B2 (en) | 1991-04-04 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US5164665A (en) | IC tester | |
| US6657452B2 (en) | Configuration for measurement of internal voltages of an integrated semiconductor apparatus | |
| JPS59115637A (en) | Automatic checking method of fm tuner | |
| US5210587A (en) | Optical distance measuring apparatus | |
| US4004230A (en) | Critical parameter receiver tester | |
| US5059893A (en) | Ac evaluation equipment for an ic tester | |
| US5053981A (en) | Method of measuring electrical characteristics of electronic circuit | |
| US2952848A (en) | Method and means for testing the calibration of radar systems | |
| US3818339A (en) | Amplitude comparison circuit | |
| CN107228859A (en) | Optical system and automated optical detection equipment | |
| US3769580A (en) | Delay line attenuation tester | |
| JPS61286768A (en) | Test apparatus | |
| JP2864603B2 (en) | Inspection device for semiconductor storage device | |
| JP3159347B2 (en) | IC test equipment | |
| JPH05346456A (en) | Circuit and method for monitoring address signal | |
| JPS63177437A (en) | Testing method for semiconductor integrated circuit device | |
| RU2008628C1 (en) | Random vibration test facility | |
| JPS6058562A (en) | Measuring apparatus of electrical equipment | |
| JPS63103985A (en) | Inspecting device for integrated circuit element | |
| SU981906A1 (en) | Device for checking linear integrated circuit parameters | |
| JPS6270775A (en) | Ic simulator for ic tester | |
| JPH0658964A (en) | Intermodulation measuring apparatus for transmitter | |
| JPS62168326A (en) | Stroboscopic electron beam device | |
| JPH0643244A (en) | Cosmic rays measuring device | |
| CS229596B1 (en) | Arrangement of calibrating source for the amplitude modulated signal |