JPS6270775A - Ic simulator for ic tester - Google Patents

Abstract

PURPOSE:To make it possible to reduce bugs, by providing a frequency detection part, a voltage comparing part, a system control part and a wave form forming part, etc. CONSTITUTION:Input voltage and clock frequency measured by a voltage comparing part 500 and a frequency detection part 400 are transmission to a system control part 60 which in turn receives the setting of a condition on the basis of the control data stored in a memory part 300 to perform the selection of '0' and '1' due to the output pattern corresponding to an output terminal stored in the memory part 300 and transmits not only the output voltage level shown by control data and the indication of an output current to a wave forming part 700 but also a time constant for performing the shaping of an output voltage wave form to a wave form shaping circuit 900 to perform control. As mentioned above, the forming part 700 and the circuit 900 form an arbitrary voltage waveform and an arbitrary current waveform corresponding to the control of the control part 600. Said waveforms are guided to an IC tester through an input/output interface part 800 and an IC attachment 810.

Description

DETAILED DESCRIPTION OF THE INVENTION (Industrial Application Field) The present invention relates to an IC test system, and more particularly to an IC simulator for program debugging (search and discovery of defects) of an IC tester that tests an IC using a program. .

(Prior Art) When testing an IC using an IC tester, it is often necessary to input test methods and procedures (programs) into the IC tester. At that time, in order to check whether the created program is appropriate, conventionally debugging was performed using the IC that was actually subject to test and evaluation. As mentioned above, when debugging a program using the sample (IC) that is actually the target of evaluation, there may be an error in the created program, which will significantly change the measurement results.
There may be no problem if it is obvious that there is a program error, but if an incorrect value appears in the measurement results during debugging, it will be seen as a characteristic of the sample, making it difficult to identify potential errors in the program. The problem was that something could happen.

An object of the present invention is to solve the above-mentioned problems that inherently exist in using an IC to be evaluated by a program as a test stand when debugging the test 10 grams of an IC tester itself. , for program debugging, is intended to provide an IC simulator that outputs the same signal as the response signal that would be obtained from the IC under test when a test signal is applied to the IC under test.

(Means for Solving the Problems) The present invention has the following configuration to achieve the above object. That is, the IC simulator of the present invention includes: a storage unit that stores test data, expected output value pattern data, and control data; and a voltage comparison unit that compares and measures the voltage of the test input signal from the IC tester. , I
a frequency detection unit that measures a clock frequency of a test input signal from a C tester; and a frequency detection unit that measures a clock frequency of a test input signal from a C tester; a system control unit that extracts and configures output expected value data that should be obtained for the test input signal by comparing it with test input pattern data; and generates an output pulse waveform in response to the output expected value data; a waveform generation section; a waveform shaping section that shapes the output pulse waveform; an M from the system control section;
An IC input/output interface section that connects the frequency detection section, voltage comparison section, and waveform shaping section with an external connection terminal by #.

(Function) Since the IC simulator of the present invention has the above configuration, by storing various test input pattern data, corresponding output expected value pattern data, and control data, the IC simulator can be used for testing from the IC tester. When an input signal is applied to the IC, it performs various operations as a pseudo IC and generates an output signal similar to that of an actual IC. Therefore, by comparing the test results of the IC tester that receives this output signal with the operating conditions set in the IC simulator,
It is possible to know whether the C tester is performing correct test and evaluation operations. That is, if the two match, it means that the IC tester is performing the correct test and evaluation operation, but if they do not match, there is a defect (bug) in the test program. Therefore, by using the IC simulator of the present invention, it is possible to perform program debugging of an IC tester, and to perform actual
It is possible to solve the problems in the conventional technique of debugging the program of an IC tester, which is the main body that performs test and evaluation, using C as a test stand.

(Example) Embodiments of the present invention will be described below with reference to the drawings.

FIG. 1 is a block diagram showing the configuration of an embodiment of the present invention. First, input pattern data, output pattern data, and control data are input to the external input/output section 100 from an external storage medium such as a magnetic tape or directly from the keyboard. Here, the input pattern data and output pattern data are the input pattern data that is input to the IC when testing the IC, and the voltage that depends on the input pattern data is applied to the input terminal of the IC.
It is the expected output value pattern data of the IC that can appear at the output terminal, and the control data is the data for distinguishing the input terminal, output terminal, and clock terminal corresponding to the terminal number of c, and the frequency Data for determining the voltage and current value that can be generated by the waveform generation unit corresponding to the output terminal from the conditions of the input clock frequency and input signal voltage measured by the detection unit 400 and the voltage comparison unit 500, and the waveform shaping circuit 900. is the data used to determine the time constant etc. when shaping the waveform.

The above data undergoes interface matching in the external input/output interface unit 2°O, and is delivered to the storage unit 300 and stored therein.

Next, the operation of the simulator of the present invention when executing an IC test will be explained. A test input voltage is applied to the simulator of the present invention from an IC socket of an IC tester via an IC attachment 810. As mentioned above, since various information corresponding to the terminal number is stored in the storage unit 300 in advance, the system control unit 6
00, the input terminal is connected to the voltage comparison unit 500 according to the information.
, among which the clock terminal is simultaneously sent to the frequency detection section 400,
Connection can be made via the input/output interface section 800. As a result, the input voltage and clock frequency measured by the voltage comparison section 500 and the frequency detection section 400 are transmitted to the system control section 600.
0 is determined by the control data stored in the storage unit 300, and the output voltage indicated by the control data is determined by selecting “0” or “1” using the output button corresponding to the output terminal stored in the storage unit 300. Control is performed by transmitting level and output current instructions to the waveform generation section 700 and a time constant for shaping the output voltage waveform to the waveform shaping circuit 900. As described above, under the control of the system control unit 600, the waveform generation unit 700,
A waveform shaping circuit 900 creates an arbitrary voltage waveform or current waveform corresponding to an output terminal, and the waveform is guided into the IC tester through an input/output interface section 800 and an IC controller 810. To the IC tester, the waveform looks exactly like the output of the actual sample (IC). At this time, the input/output interface unit 800 connects the output terminal of the IC attachment 810 to the waveform shaping circuit 900 via the storage unit 300 and the system control unit 600.

(Effects of the Invention) As explained above, by using the IC simulator according to the present invention without using an actual sample IC when debugging a test program of an IC tester, measurement results that differ from characteristic values input into the IC simulator in advance can be obtained. If this occurs, it is obvious that there is a programming error, so bugs can be reduced, and the problem of the prior art in which the characteristics of the device under test cannot be accurately measured due to programming errors can be solved.

[Brief explanation of drawings]

FIG. 1 is a block diagram showing the configuration of an IC simulator of the present invention.・100...External input/output section, 200...
...External input/output interface section, 300...
...Storage unit, 400...Frequency detection unit, 50
0... Voltage comparison section, 600... System control section, 700... Waveform generation section, 80
0... Input/output interface section, 810.
...IC attachment, 900...Waveform shaping circuit. Representative Patent Attorney Yoshi Yahata Hironedasho's 1C simulator stratification diagram 7

Claims (1)

[Claims] A storage unit that stores test input pattern data, expected output pattern data, and control data; a voltage comparison unit that compares and measures voltages of test input signals from the IC tester; test input signals from the IC tester. a frequency detection unit that measures the clock frequency of the voltage comparison unit and the frequency detection unit; and the stored test input pattern data based on the control data stored in the storage unit in response to the measurement results of the voltage comparison unit and the frequency detection unit; a system control unit that extracts expected output value data that should be obtained for the test input signal by comparing the data; a waveform generation unit that receives the expected output value data and generates an output pulse waveform; A waveform shaping section that shapes a waveform; and an IC input/output interface section that connects the frequency detection section, voltage comparison section, and waveform shaping section to external connection terminals under control from the system control section. IC for IC tester featuring
simulator.