JPS59113777U - Ｉｃ試験器用接触装置 - Google Patents

Ｉｃ試験器用接触装置

Info

Publication number
JPS59113777U
JPS59113777U JP744683U JP744683U JPS59113777U JP S59113777 U JPS59113777 U JP S59113777U JP 744683 U JP744683 U JP 744683U JP 744683 U JP744683 U JP 744683U JP S59113777 U JPS59113777 U JP S59113777U
Authority
JP
Japan
Prior art keywords
tester
contact device
movable
movable pieces
held
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP744683U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0125341Y2 (enrdf_load_stackoverflow
Inventor
鈴木　釼平
清田　耕三
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP744683U priority Critical patent/JPS59113777U/ja
Publication of JPS59113777U publication Critical patent/JPS59113777U/ja
Application granted granted Critical
Publication of JPH0125341Y2 publication Critical patent/JPH0125341Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
JP744683U 1983-01-21 1983-01-21 Ｉｃ試験器用接触装置 Granted JPS59113777U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP744683U JPS59113777U (ja) 1983-01-21 1983-01-21 Ｉｃ試験器用接触装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP744683U JPS59113777U (ja) 1983-01-21 1983-01-21 Ｉｃ試験器用接触装置

Publications (2)

Publication Number Publication Date
JPS59113777U true JPS59113777U (ja) 1984-08-01
JPH0125341Y2 JPH0125341Y2 (enrdf_load_stackoverflow) 1989-07-28

Family

ID=30138977

Family Applications (1)

Application Number Title Priority Date Filing Date
JP744683U Granted JPS59113777U (ja) 1983-01-21 1983-01-21 Ｉｃ試験器用接触装置

Country Status (1)

Country Link
JP (1) JPS59113777U (enrdf_load_stackoverflow)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55177657U (enrdf_load_stackoverflow) * 1979-06-08 1980-12-19

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55177657U (enrdf_load_stackoverflow) * 1979-06-08 1980-12-19

Also Published As

Publication number Publication date
JPH0125341Y2 (enrdf_load_stackoverflow) 1989-07-28

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