JPS59113777U - Contact device for IC tester - Google Patents

Contact device for IC tester

Info

Publication number
JPS59113777U
JPS59113777U JP744683U JP744683U JPS59113777U JP S59113777 U JPS59113777 U JP S59113777U JP 744683 U JP744683 U JP 744683U JP 744683 U JP744683 U JP 744683U JP S59113777 U JPS59113777 U JP S59113777U
Authority
JP
Japan
Prior art keywords
tester
contact device
movable
movable pieces
held
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP744683U
Other languages
Japanese (ja)
Other versions
JPH0125341Y2 (en
Inventor
鈴木　釼平
清田　耕三
Original Assignee
株式会社アドバンテスト
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社アドバンテスト filed Critical 株式会社アドバンテスト
Priority to JP744683U priority Critical patent/JPS59113777U/en
Publication of JPS59113777U publication Critical patent/JPS59113777U/en
Application granted granted Critical
Publication of JPH0125341Y2 publication Critical patent/JPH0125341Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図は従来の接触装置を説明するための断面図、第２
図はこの考案の一実施例を示す斜視図、第３図及び第４
図はこの考案に使用する可動片の一例を説明するための
正面図、第５図は第４図に示した可動片を利用した場合
のこの考案の接触装置の構造を示す正面図、第６図は可
動片を二列並べた場合のこの考案による接触装置の実施
例を示す正面図、第７図及び第８図はこの考案の他の実
施例を示す正面図である。Fig. 1 is a sectional view for explaining a conventional contact device, Fig. 2 is a sectional view for explaining a conventional contact device;
The figures are perspective views showing one embodiment of this invention, Figures 3 and 4.
The figure is a front view for explaining an example of the movable piece used in this invention, FIG. 5 is a front view showing the structure of the contact device of this invention when the movable piece shown in FIG. 4 is used, and FIG. The figure is a front view showing an embodiment of the contact device according to this invention in which movable pieces are arranged in two rows, and FIGS. 7 and 8 are front views showing other embodiments of this invention.

Claims (1)

【実用新案登録請求の範囲】 Ａ　一端が絶縁板に植設された複数の可動片によって構
成され、この可動片の遊端が延長方向と直交する方向に
可動され、その可動によって被試料ＩＣの端子に接離す
るようにしたＩＣ試験器用接触装置において、 Ｂ　上記可動片は絶縁板によって構成した挾持手段によ
り一端が挾持され、−この挟持手段により複数の可動片
を一列に配列して保持するようにしたＩＣ試験器用接触
装置。[Claims for Utility Model Registration] A: It is composed of a plurality of movable pieces whose one end is embedded in an insulating plate, and the free ends of the movable pieces are movable in a direction perpendicular to the extension direction, and by the movement, the IC to be sampled is In a contact device for an IC tester which is adapted to come into contact with and separate from a terminal, B: one end of the movable piece is held by a holding means constituted by an insulating plate, and the plurality of movable pieces are arranged and held in a line by this holding means; A contact device for an IC tester.
JP744683U 1983-01-21 1983-01-21 Contact device for IC tester Granted JPS59113777U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP744683U JPS59113777U (en) 1983-01-21 1983-01-21 Contact device for IC tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP744683U JPS59113777U (en) 1983-01-21 1983-01-21 Contact device for IC tester

Publications (2)

Publication Number Publication Date
JPS59113777U true JPS59113777U (en) 1984-08-01
JPH0125341Y2 JPH0125341Y2 (en) 1989-07-28

Family

ID=30138977

Family Applications (1)

Application Number Title Priority Date Filing Date
JP744683U Granted JPS59113777U (en) 1983-01-21 1983-01-21 Contact device for IC tester

Country Status (1)

Country Link
JP (1) JPS59113777U (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55177657U (en) * 1979-06-08 1980-12-19

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55177657U (en) * 1979-06-08 1980-12-19

Also Published As

Publication number Publication date
JPH0125341Y2 (en) 1989-07-28

Similar Documents

Publication Publication Date Title
JPS59113777U (en) Contact device for IC tester
JPS59139976U (en) jack
JPS597576U (en) terminal connection device
JPS5851591U (en) Contact structure
JPS5826669U (en) Tester rod for electronic components without lead wires
JPS60160471U (en) Check device for flat cables
JPS6099738U (en) switching device
JPS5920580U (en) electrical connectors
JPS5968383U (en) Electric wire symbol piece
JPS58162585U (en) jack
JPS5942880U (en) Watsusha massager
JPS5974635U (en) switch push button device
JPS60136151U (en) semiconductor socket
JPS5871977U (en) Electronic watch battery holding device
JPS6115735U (en) Contact needle for electrical property measurement equipment for semiconductor devices
JPS5896648U (en) Reed switch connection structure
JPS5835227U (en) contact switching device
JPS60161539U (en) Tool damage inspection device
JPS60123856U (en) electromagnetic relay
JPS58185678U (en) lattice frame device
JPS6133533U (en) Tuner device
JPS58131568U (en) Terminal block
JPS5996743U (en) test switch device
JPS586324U (en) Disconnect contact device
JPS5888724U (en) switch