JPH0125341Y2 - - Google Patents

Description

[Detailed description of the invention] "Industrial Application Field" This invention relates to a contact device for an IC tester that connects the terminals of the IC to the terminals of the IC tester by contacting the terminals of the IC.

``Conventional technology'' In an IC (semiconductor integrated circuit) test system, ICs are sequentially supplied to a measurement section equipped with an IC tester, connected to the IC tester one after another, and the ICs are brought into an operating state to ensure that the IC is working properly. The IC is tested to see if it operates properly and determines whether the IC is good or bad.

In order to connect the IC to the IC tester in this way,
Conventionally, as shown in FIG. 1, a plurality of contacts 2 which are brought into contact with terminals 5 of an IC 4 are attached to a holder 1 in a row, and one end of the contacts 2 is moved by a drive means 3 in the left-right direction in the figure. A contact device is used in which the contactor 2 is brought into contact with and separated from the terminal 5 of the IC 4 by being moved.

In this case, the contact 2 is soldered to the printed circuit board 1a, and an insulating plate 7 in which a hole 6 surrounding the mounting position of the contact 2 is formed is attached to the upper side of the printed circuit board 1a, and an adhesive is applied to the hole 6. 8 is filled to reinforce the contactor 2.

"Problem to be solved by the invention" However, in the conventional contact device described above, the contact 2 is soldered to the printed circuit board 1a and fixed with the adhesive 8, so only a part of the contact 2 is Even if it becomes defective, the entire contact device including the holder 1 must be replaced, and the contact 2 is plated with gold to ensure good contact and maintain stable springiness over a long period of time. It is very uneconomical as it requires expensive and expensive products, and there are many, up to several dozen.

Therefore, this invention allows only some of the contacts to be easily replaced, and also allows the terminals of the IC tester to be easily and reliably connected to the contacts.

"Means for Solving the Problem" In this invention, each of the plurality of contacts has a contact part that can be brought into contact with the terminal of an IC by being moved in a predetermined direction, and an extension to this contact part. It has a shape that has a pinched part formed by the pinched part and a bottom plate part bent almost perpendicularly to the pinched part, and a plurality of insulators sandwiching the pinched parts of the plurality of contacts. A holder is provided, and the holder allows the plurality of contacts to be arranged in a line with the contact portions and bottom plate portions of the plurality of contacts facing opposite sides of the plurality of insulators. and hold it.

"Function" In the IC tester contact device of this invention configured as described above, the bottom plate facing one side of the insulator constituting the holder of each contact is
By contacting the terminals of the IC tester, the IC
The terminals of the tester can be easily and reliably connected to the contacts, and if some of the contacts become defective, it can be fixed by separating the multiple insulators that make up the holder. Only the contact that has become defective can be easily replaced.

In addition, each contact is not only held between multiple insulators, but also its bottom plate is locked to the insulator, so there is no chance of the contact shaking or falling out of the holder. do not have.

Embodiment FIG. 2 shows an example of the contact device of this invention, in which a plurality of contacts 2 are arranged in a line and held in a holder 9 made of insulators 9a, 9b, and 9c.

In this example, as shown in FIG. 3, the contactor 2 is formed with contact portions 2a and 2b that sandwich and contact the terminals of the IC, and that extend from the contact portions 2a and 2b. It has a shape having pinched parts 2c, 2d which are bent, and a bottom plate part 2e which is bent almost perpendicularly to the pinched parts 2c, 2d.

Although the reference numbers of the above-mentioned parts of the contact 2 are omitted in FIG. 2, the bottom plate 2e of the contact 2 faces the lower surface side of the insulator 9b, and the sandwiched part 2c is insulated. The insulators 9a, 9b and 9c are tightened together with bolts and nuts with the sandwiched part 2d being interposed between the bodies 9a and 9b and the insulators 9b and 9c. , the held parts 2c and 2d are insulators 9a and 9b.
It is held by the holder 9 by being held between the holder 9 and between the holder 9b and 9c.

Since the contactor 2 has the bottom plate portion 2e facing the lower surface side of the insulator 9b, when connecting the terminals of the IC tester to the contactor 2, connect the terminals of the IC tester to the contactor 2. It is sufficient to directly contact the bottom plate portion 2e, and the terminals of the IC tester can be easily and reliably connected to the contacts 2 without requiring soldering or connection using a connector.

Further, when a part of the contactor 2 becomes defective, by temporarily separating the insulators 9a, 9b, and 9c, only the defective contactor can be easily replaced.

Furthermore, the contactor 2 has insulators 9a, 9b and 9
In addition to being held by c, the bottom plate part 2
Since the contact 2 is locked to the insulator 9b, the contact 2 will not rattle or come off from the holder 9.

In the example shown in FIGS. 2 and 3, the clamped portions 2c and 2d of the contactor 2 have outwardly projecting portions, and correspondingly, the insulators 9a, 9c, and 9b have concave portions and convex portions. This is the case when a section is formed.

In the example shown in FIGS. 4 and 5, the clamped portions 2c and 2d of the contactor 2 have portions that protrude inwardly, and the insulators 9a, 9c and 9b correspond to this.
In this case, the same effect as the example shown in FIGS. 2 and 3 is produced, and the same effect can be obtained.

FIG. 6 shows that two holders 9 each holding contacts 2 arranged in one row are arranged with a gap 12 in between, corresponding to the arrangement of IC terminals in two rows. In this case, by replacing the gap piece 12, it is possible to accommodate ICs having different dimensions between terminals.

Note that, as shown in FIGS. 7 and 8, the contactor 2 may have only one contact portion that contacts the terminal on one side of the IC.

"Effect of the invention" As mentioned above, according to this invention, each contact is shaped to have a pinched part and a bottom plate part in addition to the contact part, and the bottom plate part is made to face one side of the insulator. Since a plurality of contacts are arranged and held in a row with the sandwiched part being sandwiched between a plurality of insulators, the terminals of the IC tester can be easily and reliably connected to the contacts. When some of the contacts become defective, only the defective contacts can be easily replaced, and the contacts can be held stably and reliably.

[Brief explanation of the drawing]

FIG. 1 is a sectional view showing an example of a conventional contact device;
FIG. 2 is a perspective view showing an example of the contact device of this invention, FIG. 3 is a front view showing the contact, and FIG. 4 is a front view showing a contact of another example of the contact device of this invention. FIG. 5 is a front view showing another example of the contact device of this invention, and FIGS. 6, 7, and 8 are front views showing still other examples of the contact device of this invention. 2 is a contact, 2a and 2b are contact parts, 2c and 2d
2e is a bottom plate portion, 9 is a holder, 9a,
9b and 9c are insulators.

Claims (1)

[Scope of utility model registration claims] By being moved in a prescribed direction, respectively
A plurality of contacts each having a contact portion that is brought into contact with a terminal of an IC, a clamped portion extending from the contact portion, and a bottom plate portion bent approximately perpendicularly to the clamped portion. and a plurality of insulators sandwiching the clamped portions of the plurality of contacts, and the contact portions and the bottom plate portions of the plurality of contacts are on opposite sides of the plurality of insulators. A contact device for an IC tester, comprising: a holder that holds the plurality of contacts arranged in a line in a state facing the front surface of the IC tester.