JPS5910561Y2 - Continuous film thickness measurement device - Google Patents

Continuous film thickness measurement device

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Publication number
JPS5910561Y2
JPS5910561Y2 JP3670878U JP3670878U JPS5910561Y2 JP S5910561 Y2 JPS5910561 Y2 JP S5910561Y2 JP 3670878 U JP3670878 U JP 3670878U JP 3670878 U JP3670878 U JP 3670878U JP S5910561 Y2 JPS5910561 Y2 JP S5910561Y2
Authority
JP
Japan
Prior art keywords
film
sensor head
thickness
roller
arm
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP3670878U
Other languages
Japanese (ja)
Other versions
JPS54140753U (en
Inventor
渉男 中久保
治 関谷
Original Assignee
帝人株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 帝人株式会社 filed Critical 帝人株式会社
Priority to JP3670878U priority Critical patent/JPS5910561Y2/en
Publication of JPS54140753U publication Critical patent/JPS54140753U/ja
Application granted granted Critical
Publication of JPS5910561Y2 publication Critical patent/JPS5910561Y2/en
Expired legal-status Critical Current

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Description

【考案の詳細な説明】 本考案はフイルム等の帯状物の厚さを連続的に測定する
装置の改良に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an improvement in an apparatus for continuously measuring the thickness of a strip such as a film.

一般にフイルムの厚さを測定するには非接触式又は接触
式のいずれかの方式が採用されるが、接触式においては
通常支持基体上にフイルムを走行させ該走行フイルム上
に上下動可能なセンサーヘッドを接触し、その変動量を
取り出すことによってフイルムの厚さを測定することが
行なわれている。
Generally, either a non-contact method or a contact method is used to measure the thickness of a film. In the contact method, the film is usually run on a support base, and a sensor that can move up and down on the running film is used. The thickness of the film is measured by touching the head and taking out the amount of variation.

第1図はこのような測定装置の側面図を示すものである
FIG. 1 shows a side view of such a measuring device.

図において2は基台1の前端部に設けた一対の対面する
引取ローラ、3は基台1の後端部に設けた一対の供給ロ
ーラで、幅方向の一点の厚さを連続的に測定すべきフイ
ルムFは供給ローラ3と引き取りローラ2との間を張力
を付与されて所定速度で走行する。
In the figure, 2 is a pair of facing take-up rollers installed at the front end of the base 1, and 3 is a pair of supply rollers installed at the rear end of the base 1, which continuously measure the thickness at one point in the width direction. The film F to be processed runs at a predetermined speed between a supply roller 3 and a take-up roller 2 under tension.

4は両ローラ2と3の間でフイルム走行面の上方位置に
配設された検出器で、中間部の上下面を板ばね5,6を
介して上下方向に回動可能に支持され、先端に球状のセ
ンサーヘッド7を設けた可動アーム8と、該可動アーム
8の後部でその移動量を電気的に取り出す厚み変換素子
9からなり、検出器4から取り出された信号は所要回路
を経て指示計或は記録計等に送られフイルム厚さ或はそ
の変動量が表示される。
4 is a detector disposed above the film running surface between both rollers 2 and 3; It consists of a movable arm 8 equipped with a spherical sensor head 7, and a thickness conversion element 9 that electrically extracts the amount of movement at the rear of the movable arm 8, and the signal extracted from the detector 4 is transmitted through the required circuits to provide an indication. The film is sent to a meter or recorder, and the film thickness or its variation is displayed.

10は可動レバー8の後端部を支持するコイルばねであ
る。
10 is a coil spring that supports the rear end of the movable lever 8.

11はセンサーヘッド7に対面してフイルム走行面の下
方位置に配設した定盤で、その頂部はセンサーヘッド7
の位置を基準面として支持するために短形状の平行面1
2が形或されている。
11 is a surface plate disposed below the film running surface facing the sensor head 7;
A rectangular parallel surface 1 is used to support the position of as a reference plane.
2 is taking shape.

13はローラ2と3の間にフイルムの走行を案内するた
めに設けたガイド板である。
Reference numeral 13 denotes a guide plate provided between rollers 2 and 3 to guide the running of the film.

しかして、かかる装置によってフイルムFの幅方向の一
点の厚さを連続的に測定する場合、フイルムFは供給ロ
ーラ3から引取ローラ2の間で張力を付与され、フイル
ム走行面より僅かに突出した定盤11の頂部平行面12
とこれに対面し上方位置からフイルム面を自重およびコ
イルばね10の作用で平行面12に向って押圧力を与え
るアーム8により、センサーヘッド7がフイルFを押圧
しフイルムFはこれらセンサーヘッド7と平行面12と
の相方に接しながら走行する。
Therefore, when the thickness of a single point in the width direction of the film F is continuously measured using such a device, tension is applied to the film F between the supply roller 3 and the take-up roller 2, and the film F slightly protrudes from the film running surface. Top parallel surface 12 of surface plate 11
The sensor head 7 presses the film F by the arm 8 which faces this and applies a pressing force from above to the parallel surface 12 using its own weight and the action of the coil spring 10. It travels while touching the parallel surface 12.

この際のセンサーヘッド7の平行面12からの高さがフ
イルム厚となるので、この位置変位をアーム後端部の変
位から相対的に取り出しフイルム厚さを測定しているが
、かかる装置では測定誤差が多く再現性に乏しい欠点が
あった。
The height of the sensor head 7 from the parallel surface 12 at this time is the film thickness, so this positional displacement is taken out relative to the displacement of the rear end of the arm and the film thickness is measured. There were many errors and poor reproducibility.

本考案はこのような問題点について種々検討を重ねた結
果、センサーヘッド7に対応する定盤11の頂点が平行
面12に形或されているためフイルムFとは下面で面接
触、上面で点接触となり、フイルムFに形或された凹凸
状のわずかな変形や歪の山部の高さをそのままひろって
しまうこと、又平行面12に塵等が滞まり基準面(零点
)が変動することなどにより測定誤差が生じることが判
明し、かかるフイルム下面の面接触を点接触(厳密には
点接触とは言い難いが球状面と接する場合を言う)に変
更すれば測定誤差が少なく精度の高い測定が安定して行
えることを見い出した。
As a result of various studies regarding these problems, the present invention was developed as a result of the fact that the apex of the surface plate 11 corresponding to the sensor head 7 is shaped into a parallel surface 12, so that the lower surface is in surface contact with the film F, and the upper surface is in contact with the film F. Contact may occur, resulting in slight deformation of the irregularities formed on the film F, or the height of the peaks of distortion remaining unchanged, or dust etc. remaining on the parallel surface 12, causing the reference plane (zero point) to fluctuate. It has been found that measurement errors occur due to such factors, and if the surface contact on the bottom surface of the film is changed to point contact (strictly speaking, it cannot be called point contact, but refers to contact with a spherical surface), measurement errors will be reduced and accuracy will be high. We found that measurements can be performed stably.

このような改良によって測定精度は著しく向上したが、
しばしば不規則なノイズが現われ再現性も十分でない欠
点があった。
Although these improvements have significantly improved measurement accuracy,
It has the disadvantage that irregular noise often appears and the reproducibility is not sufficient.

本考案者は更にこの点につき検討を重ねた結果測定時に
おけるフイルムに付着した塵埃がその原因であることを
突きとめ本考案に至ったものである。
After further study on this point, the inventor of the present invention discovered that the cause of the problem was dust attached to the film during measurement, and came up with the present invention.

すなわち、本考案は一方向に往復動可能に取付けられた
アームの先端に球状のセンサーヘッドを設けるとともに
該センサーヘッドと支持基体の間にフイルムを接触走行
させセンサーヘッドの動きをアーム後端部に配設した厚
み変換子を介して走行フイルムの厚さを連続的に測定す
る装置において、支持基体のフイルム接触部を球面状に
形戊するとともに、支持基体の上流側に固定もしくは回
転可能なローラとその固定受台とを対面して設けかつ前
記ローラの周面と固定受台の上面に非金属性のシートを
取り付けたことを特徴とするものである。
That is, in the present invention, a spherical sensor head is provided at the tip of an arm that is attached to be able to reciprocate in one direction, and a film is run in contact between the sensor head and a support base to transfer the movement of the sensor head to the rear end of the arm. In a device that continuously measures the thickness of a running film through a thickness converter provided, the film contacting part of the support base is shaped into a spherical shape, and a roller that is fixed or rotatable on the upstream side of the support base is used. and its fixed pedestal are provided facing each other, and a non-metallic sheet is attached to the circumferential surface of the roller and the upper surface of the fixed pedestal.

以下、本考案を図面によって説明する。Hereinafter, the present invention will be explained with reference to the drawings.

第2図および第3図は本考案の実施例を示す平面図と側
面図である。
2 and 3 are a plan view and a side view showing an embodiment of the present invention.

図において14は定盤でその頂部にはアーム8の先端に
固定された球状のセンサーヘッド7に対応してほぼ同径
の半球状体15がフイルムFのガイド板13よりやや突
出するように設けられている。
In the figure, reference numeral 14 denotes a surface plate, on the top of which a hemispherical body 15 of approximately the same diameter is provided so as to slightly protrude from the guide plate 13 of the film F, corresponding to the spherical sensor head 7 fixed to the tip of the arm 8. It is being

16は基台1の後部にピン17によって回動自在に結合
した一対のスイングアームで、その中央部には円形のロ
ーラ18が支持ボルト19を介して固定されており、該
ローラ18の周面ばシート状の羅紗23が張り付けられ
ている,,20はローラ18に対面して基台1に設けた
ローラ18の受台であり、該受台20は第4図に示すよ
うに上部に形或された台形状の溝21とこの溝21に挿
入された台形状の支持ブロック22を含んで構威され、
支持ブロック22には溝21からほぼ上面全域が突出す
るようにローラ18と同様な羅紗24が張り付けられて
いる。
A pair of swing arms 16 are rotatably connected to the rear part of the base 1 by a pin 17, and a circular roller 18 is fixed to the center thereof via a support bolt 19. 20 is a pedestal for the roller 18 provided on the base 1 facing the roller 18, and the pedestal 20 has a shape on the top as shown in FIG. It includes a trapezoidal groove 21 and a trapezoidal support block 22 inserted into the groove 21,
A rag 24 similar to the roller 18 is attached to the support block 22 so that almost the entire upper surface thereof protrudes from the groove 21.

25は基台1の後端下方位置に回動可能に支持した軸、
26は軸25の両端側に固定した一対の偏心カムでスイ
ングアーム16の下面に固着したピン16′を支持しス
イングアーム16の下端位置を規制するものである。
25 is a shaft rotatably supported at a position below the rear end of the base 1;
A pair of eccentric cams 26 are fixed to both ends of the shaft 25 and support a pin 16' fixed to the lower surface of the swing arm 16 to regulate the lower end position of the swing arm 16.

27は軸25を回動させるためのレバーである。27 is a lever for rotating the shaft 25.

その他の符号は第1図と同じである。Other symbols are the same as in FIG.

しかして、かかる装置によってフイルム厚さを測定する
に際しては、スイングアーム16を開きこのスイングア
ーム16と受台の間およびセンサーヘッドと定盤の間を
経て引取ローラ2にフイルムを通した後、スイングアー
ム16を閉じ図示しない駆動手段により引取ローラ2を
回転させフイルムFを走行させる。
When measuring the film thickness using such a device, the swing arm 16 is opened, the film is passed between the swing arm 16 and the pedestal, and between the sensor head and the surface plate, and then passed through the take-up roller 2. The arm 16 is closed and the take-up roller 2 is rotated by a drive means (not shown) to cause the film F to travel.

この走行によりフイルムFは先ず静止状態(回転しない
)のローラ18と受台20の間をこれらにより適度な接
圧を受けて接触走行し、静電気等で付着した塵埃を羅紗
23, 24で除去され、更にこれらの間を通過する際
の抵抗によって適切な張力を付与される。
As a result of this running, the film F first runs in contact with the stationary roller 18 (not rotating) and the pedestal 20 under moderate contact pressure, and the dust attached due to static electricity etc. is removed by the cloths 23 and 24. , and an appropriate tension is applied by the resistance when passing between them.

次にこのように上下面の塵埃を払拭され適度な張力を与
えられたフイルムFはセンサーヘッド7に送られ該セン
サーヘッド7の移動を変換素子9により取り出しその厚
さを測定されるが、この場合第3図に示すようにフイル
ム下面も上面と同様に点接触となるためわずかな歪等も
正確に検出でき精度が良くかつ再現性の優れたフイルム
厚さの測定が可能となる。
Next, the film F whose upper and lower surfaces have been cleaned of dust and given appropriate tension is sent to the sensor head 7, and the movement of the sensor head 7 is detected by the conversion element 9 and its thickness is measured. In this case, as shown in FIG. 3, since the lower surface of the film is in point contact like the upper surface, even the slightest distortion can be detected accurately and the film thickness can be measured with high precision and excellent reproducibility.

ここでローラ18は測定中は回転しないかもしくは同方
向にわずかに回転可能に固定するか又は走行フイルムと
逆方向に回転するように取付けることが必要である。
Here, it is necessary that the roller 18 not rotate during the measurement, or be fixed so that it can rotate slightly in the same direction, or be installed so that it rotates in the opposite direction to the running film.

次に上に述べた本考案の装置と従来の装置とによるフイ
ルム厚さの測定記録を示したものが第5図イ,o,ハで
あり、イは定盤頂部が平行面で除塵装置を有しないもの
、口は定盤頂部が半球状で除塵装置を有しないもの、ハ
は定盤頂部が半球状で除塵装置(第3図に示す羅紗張り
のローラ18と受台20を設けたもの)を有する本考案
により同一フイルムを同経路で3回測定したものの1部
を拡大したものである。
Next, Figure 5 A, O, and C show the measurement records of film thickness using the device of the present invention and the conventional device described above. One with no dust removal device, one with a hemispherical top of the surface plate and no dust removal device, and one with a hemispherical top of the surface plate and a dust removal device (equipped with a roller 18 lined with cloth and a pedestal 20 as shown in Fig. 3). ) is an enlarged view of a portion of measurements taken on the same film three times along the same route using the present invention.

ここでイ,口に示すA, Bはそれぞれフイルムの歪
等と付着塵埃などの影響による誤差とみられるが、八の
本考案ではこれらの影響は殆どなく再限性かつ精度のよ
い測定が行えることを示している。
Here, A and B shown in A and B appear to be errors due to the effects of film distortion, etc., and adhering dust, respectively, but with the present invention in Section 8, these effects are almost absent and measurements can be made with good reproducibility and precision. It shows.

尚、以上に述べた実施例ではセンサーヘッドを上下方向
に回動するようにしたものであるが、直線状に上下動で
きるようにアームを垂直に移動するよう規制したもので
もよい。
In the embodiments described above, the sensor head is configured to rotate in the vertical direction, but the arm may be regulated to move vertically so as to be able to move vertically in a straight line.

又、測定すべきフイルムの厚さ或は銘柄、測定条件等に
よりローラと受台との接触圧を調整できるよう偏心カム
を設けスイングアームの支持位置を可変可能にしたが、
これは必ずしも必須のものではない。
In addition, an eccentric cam was installed so that the contact pressure between the roller and the pedestal could be adjusted depending on the thickness or brand of the film to be measured, measurement conditions, etc., and the support position of the swing arm could be varied.
This is not necessarily required.

更に受台は交換を簡単に行えるように挿出入可能な支持
ブロックに羅紗を張ったものを示したがかかるものに限
定されるものではない。
Furthermore, although the pedestal is shown as having a support block covered with rags that can be inserted and removed so that it can be easily replaced, the present invention is not limited to such a pedestal.

フイルム上の塵埃を除去し適度な張力を付与する材料と
して厚地の羅紗が弾力性もあり除塵および保護効果が大
きく非常に好ましいが、このほかフエルト等一般に利用
可能な布状物或はこの他フイルムに疵を与えないような
ものであれば何でも使用できる。
As a material for removing dust on the film and applying appropriate tension, thick rags is highly preferable due to its elasticity and great dust removal and protection effects, but in addition, commonly available cloth-like materials such as felt, or other films may also be used. Any material can be used as long as it does not cause any damage to the surface.

以上に説明の如く、本考案によればフイルム厚さの連続
測定が非常に精度よく行えその効果は極めて大である。
As explained above, according to the present invention, continuous measurement of film thickness can be carried out with very high accuracy, and its effects are extremely large.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の実施例を示す側面図、第2図と第3図は
本考案の実施例を示す平面図および側面図、第4図は要
部斜視図、第5図イ,口は従来の装置による測定記録図
、第5図ハは本考案の装置による測定記録図である。 14は定盤、15は半球体、16はスイングアーム、1
8はローラ、19は受台、22は支持ブロック、23〜
24は羅紗、26は偏心カム。
Fig. 1 is a side view showing a conventional embodiment, Figs. 2 and 3 are a plan view and a side view showing an embodiment of the present invention, Fig. 4 is a perspective view of the main part, and Fig. 5 A. FIG. 5C shows a measurement record obtained by the conventional apparatus, and FIG. 5C shows a measurement record obtained by the apparatus of the present invention. 14 is a surface plate, 15 is a hemisphere, 16 is a swing arm, 1
8 is a roller, 19 is a pedestal, 22 is a support block, 23-
24 is rasa, 26 is eccentric cam.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 一方向に往復動可能に取付けられたアームの先端に球状
のセンサーヘッドを設けるとともに該センサーヘッドに
対面して支持基体を配設し、センサーヘッドと支持基体
の間にフイルムを接触走行させセンサーヘッドの動きを
アーム後端部に配設した厚み変換素子を介して走行フィ
ルの厚さを連続的に測定する装置において、支持基体の
フイルム接触部を球面状に形戊するとともに、支持基体
の上流側に固定もしくは回転可能なローラとその固定受
台とを対面して設けかつ前記ローラの周面と受台の上面
に非金属性のシートを張り付けたことを特徴とするフイ
ルム厚さの連続測定装置。
A spherical sensor head is provided at the tip of an arm that is attached to be able to reciprocate in one direction, and a support base is provided facing the sensor head.A film is run in contact between the sensor head and the support base, and the sensor head In this device, the thickness of the traveling film is continuously measured using a thickness conversion element installed at the rear end of the arm. Continuous measurement of film thickness, characterized in that a fixed or rotatable roller and its fixed pedestal are provided facing each other, and a non-metallic sheet is pasted on the circumferential surface of the roller and the top surface of the pedestal. Device.
JP3670878U 1978-03-24 1978-03-24 Continuous film thickness measurement device Expired JPS5910561Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3670878U JPS5910561Y2 (en) 1978-03-24 1978-03-24 Continuous film thickness measurement device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3670878U JPS5910561Y2 (en) 1978-03-24 1978-03-24 Continuous film thickness measurement device

Publications (2)

Publication Number Publication Date
JPS54140753U JPS54140753U (en) 1979-09-29
JPS5910561Y2 true JPS5910561Y2 (en) 1984-04-03

Family

ID=28898383

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3670878U Expired JPS5910561Y2 (en) 1978-03-24 1978-03-24 Continuous film thickness measurement device

Country Status (1)

Country Link
JP (1) JPS5910561Y2 (en)

Also Published As

Publication number Publication date
JPS54140753U (en) 1979-09-29

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