JPS5896206A - 表面荒さの評価装置 - Google Patents

表面荒さの評価装置

Info

Publication number
JPS5896206A
JPS5896206A JP19445581A JP19445581A JPS5896206A JP S5896206 A JPS5896206 A JP S5896206A JP 19445581 A JP19445581 A JP 19445581A JP 19445581 A JP19445581 A JP 19445581A JP S5896206 A JPS5896206 A JP S5896206A
Authority
JP
Japan
Prior art keywords
surface roughness
reflected light
sample
light
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP19445581A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6253042B2 (en, 2012
Inventor
Shoji Madokoro
間所 昭次
Shiro Hagiwara
萩原 梓郎
Shintaro Ushijima
牛島 真太郎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Oki Electric Industry Co Ltd
Original Assignee
Oki Electric Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oki Electric Industry Co Ltd filed Critical Oki Electric Industry Co Ltd
Priority to JP19445581A priority Critical patent/JPS5896206A/ja
Publication of JPS5896206A publication Critical patent/JPS5896206A/ja
Publication of JPS6253042B2 publication Critical patent/JPS6253042B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/30Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP19445581A 1981-12-04 1981-12-04 表面荒さの評価装置 Granted JPS5896206A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19445581A JPS5896206A (ja) 1981-12-04 1981-12-04 表面荒さの評価装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19445581A JPS5896206A (ja) 1981-12-04 1981-12-04 表面荒さの評価装置

Publications (2)

Publication Number Publication Date
JPS5896206A true JPS5896206A (ja) 1983-06-08
JPS6253042B2 JPS6253042B2 (en, 2012) 1987-11-09

Family

ID=16324847

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19445581A Granted JPS5896206A (ja) 1981-12-04 1981-12-04 表面荒さの評価装置

Country Status (1)

Country Link
JP (1) JPS5896206A (en, 2012)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1015869A4 (en) * 1996-09-19 2000-07-05 Molecular Dynamics Inc MICRO IMAGING SYSTEM

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01103118U (en, 2012) * 1987-12-26 1989-07-12

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5830608A (ja) * 1981-08-18 1983-02-23 Oki Electric Ind Co Ltd 表面荒さ評価装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5830608A (ja) * 1981-08-18 1983-02-23 Oki Electric Ind Co Ltd 表面荒さ評価装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1015869A4 (en) * 1996-09-19 2000-07-05 Molecular Dynamics Inc MICRO IMAGING SYSTEM

Also Published As

Publication number Publication date
JPS6253042B2 (en, 2012) 1987-11-09

Similar Documents

Publication Publication Date Title
US4966457A (en) Inspecting apparatus for determining presence and location of foreign particles on reticles or pellicles
JP4988223B2 (ja) 欠陥検査装置およびその方法
US3851169A (en) Apparatus for measuring aerosol particles
KR960012329B1 (ko) 조사를 이용한 표면상태 검사방법 및 그 장치
US3229564A (en) Reflectometer
US4227809A (en) Method of detecting flaws on the surface of metal
JP2003501623A (ja) 縦方向に動かされる繊維複合体にある異物の検出方法及び装置
US5907396A (en) Optical detection system for detecting defects and/or particles on a substrate
JP3106790B2 (ja) 薄膜特性値測定方法及び装置
JPS5896206A (ja) 表面荒さの評価装置
JPS6129453B2 (en, 2012)
JPS6361601B2 (en, 2012)
JPH03115844A (ja) 表面欠点検出方法
JP3106521B2 (ja) 透明基板の光学的検査装置
RU2035721C1 (ru) Способ контроля прозрачности плоских светопропускающих материалов
JPH08128806A (ja) 光学式変位センサ
JP2666032B2 (ja) 散乱光と散乱角度分布の測定方法
JPH0725618Y2 (ja) 変位測定装置
JPH0419457Y2 (en, 2012)
JPS569717A (en) Optical filter device using liquid crystal
JPS62197751A (ja) 物体の欠陥検査装置
SU872955A1 (ru) Способ измерени толщины сло и устройство дл его осуществлени
JPH09236408A (ja) 焦点位置検出装置
CN120051720A (zh) 具有谐振器的光学显微镜
SU130700A1 (ru) Способ определени качества поверхности, например бумаги