JPS5880253A - イオン電流測定装置 - Google Patents
イオン電流測定装置Info
- Publication number
- JPS5880253A JPS5880253A JP57183784A JP18378482A JPS5880253A JP S5880253 A JPS5880253 A JP S5880253A JP 57183784 A JP57183784 A JP 57183784A JP 18378482 A JP18378482 A JP 18378482A JP S5880253 A JPS5880253 A JP S5880253A
- Authority
- JP
- Japan
- Prior art keywords
- ion
- voltage
- chamber
- periodically
- measuring device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 150000002500 ions Chemical class 0.000 claims description 85
- 238000010884 ion-beam technique Methods 0.000 claims description 25
- 230000000737 periodic effect Effects 0.000 claims description 11
- 238000009826 distribution Methods 0.000 claims description 6
- 206010011224 Cough Diseases 0.000 claims description 4
- 238000009825 accumulation Methods 0.000 claims description 3
- 230000001419 dependent effect Effects 0.000 claims 1
- 230000010287 polarization Effects 0.000 claims 1
- 102220125763 rs886044063 Human genes 0.000 claims 1
- 238000005259 measurement Methods 0.000 description 7
- 238000010586 diagram Methods 0.000 description 4
- 230000003321 amplification Effects 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 238000003199 nucleic acid amplification method Methods 0.000 description 2
- 238000003860 storage Methods 0.000 description 2
- 238000011144 upstream manufacturing Methods 0.000 description 2
- 230000037303 wrinkles Effects 0.000 description 2
- DILISPNYIVRDBP-UHFFFAOYSA-N 2-[3-[2-(2-hydroxypropylamino)pyrimidin-4-yl]-2-naphthalen-2-ylimidazol-4-yl]acetonitrile Chemical compound OC(CNC1=NC=CC(=N1)N1C(=NC=C1CC#N)C1=CC2=CC=CC=C2C=C1)C DILISPNYIVRDBP-UHFFFAOYSA-N 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 102220217298 rs1060503025 Human genes 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 239000013589 supplement Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR8119760A FR2514905A1 (fr) | 1981-10-21 | 1981-10-21 | Dispositif de mesure d'un courant ionique produit par un faisceau d'ions |
| FR819760 | 1981-10-21 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5880253A true JPS5880253A (ja) | 1983-05-14 |
Family
ID=9263243
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57183784A Pending JPS5880253A (ja) | 1981-10-21 | 1982-10-21 | イオン電流測定装置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US4517462A (cg-RX-API-DMAC7.html) |
| EP (1) | EP0077739B1 (cg-RX-API-DMAC7.html) |
| JP (1) | JPS5880253A (cg-RX-API-DMAC7.html) |
| DE (1) | DE3275019D1 (cg-RX-API-DMAC7.html) |
| FR (1) | FR2514905A1 (cg-RX-API-DMAC7.html) |
Families Citing this family (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE4322101C2 (de) * | 1993-07-02 | 1995-06-14 | Bergmann Thorald | Ionenquelle für Flugzeit-Massenspektrometer |
| US5689111A (en) * | 1995-08-10 | 1997-11-18 | Analytica Of Branford, Inc. | Ion storage time-of-flight mass spectrometer |
| US5654544A (en) * | 1995-08-10 | 1997-08-05 | Analytica Of Branford | Mass resolution by angular alignment of the ion detector conversion surface in time-of-flight mass spectrometers with electrostatic steering deflectors |
| US5847385A (en) * | 1996-08-09 | 1998-12-08 | Analytica Of Branford, Inc. | Mass resolution by angular alignment of the ion detector conversion surface in time-of-flight mass spectrometers with electrostatic steering deflectors |
| US6815669B1 (en) | 1999-07-21 | 2004-11-09 | The Charles Stark Draper Laboratory, Inc. | Longitudinal field driven ion mobility filter and detection system |
| US7005632B2 (en) * | 2002-04-12 | 2006-02-28 | Sionex Corporation | Method and apparatus for control of mobility-based ion species identification |
| US7129482B2 (en) * | 1999-07-21 | 2006-10-31 | Sionex Corporation | Explosives detection using differential ion mobility spectrometry |
| US7098449B1 (en) | 1999-07-21 | 2006-08-29 | The Charles Stark Draper Laboratory, Inc. | Spectrometer chip assembly |
| US6806463B2 (en) | 1999-07-21 | 2004-10-19 | The Charles Stark Draper Laboratory, Inc. | Micromachined field asymmetric ion mobility filter and detection system |
| US6815668B2 (en) * | 1999-07-21 | 2004-11-09 | The Charles Stark Draper Laboratory, Inc. | Method and apparatus for chromatography-high field asymmetric waveform ion mobility spectrometry |
| US6690004B2 (en) * | 1999-07-21 | 2004-02-10 | The Charles Stark Draper Laboratory, Inc. | Method and apparatus for electrospray-augmented high field asymmetric ion mobility spectrometry |
| US6495823B1 (en) | 1999-07-21 | 2002-12-17 | The Charles Stark Draper Laboratory, Inc. | Micromachined field asymmetric ion mobility filter and detection system |
| DE60111524T2 (de) * | 2000-04-27 | 2006-07-13 | Loma Linda University, Loma Linda | Nanodosimeter auf einzelionendetektierung basierend |
| EP1405065B1 (en) * | 2001-06-30 | 2012-04-11 | Dh Technologies Development Pte. Ltd. | System for collection of data and identification of unknown ion species in an electric field |
| US7091481B2 (en) * | 2001-08-08 | 2006-08-15 | Sionex Corporation | Method and apparatus for plasma generation |
| US7274015B2 (en) * | 2001-08-08 | 2007-09-25 | Sionex Corporation | Capacitive discharge plasma ion source |
| US6727496B2 (en) * | 2001-08-14 | 2004-04-27 | Sionex Corporation | Pancake spectrometer |
| US7122794B1 (en) * | 2002-02-21 | 2006-10-17 | Sionex Corporation | Systems and methods for ion mobility control |
| US6919570B2 (en) * | 2002-12-19 | 2005-07-19 | Advanced Electron Beams, Inc. | Electron beam sensor |
| CA2551991A1 (en) * | 2004-01-13 | 2005-07-28 | Sionex Corporation | Methods and apparatus for enhanced sample identification based on combined analytical techniques |
| WO2006060807A1 (en) * | 2004-12-03 | 2006-06-08 | Sionex Corporation | Method and apparatus for enhanced ion based sample filtering and detection |
| WO2007014303A2 (en) | 2005-07-26 | 2007-02-01 | Sionex Corporation | Ultra compact ion mobility based analyzer system and method |
| ATE498983T1 (de) * | 2006-02-24 | 2011-03-15 | Ericsson Telefon Ab L M | Technik zum konfigurieren von streckenschicht- entitäten für ein handover |
| US8217344B2 (en) | 2007-02-01 | 2012-07-10 | Dh Technologies Development Pte. Ltd. | Differential mobility spectrometer pre-filter assembly for a mass spectrometer |
| US7723706B2 (en) * | 2008-06-19 | 2010-05-25 | Varian Semiconductor Equipment Associates, Inc. | Horizontal and vertical beam angle measurement technique |
| EP2483710A4 (en) | 2009-10-01 | 2016-04-27 | Univ Loma Linda Med | Detector for ionization by ion-induced impact and uses thereof |
| IL202219A (en) * | 2009-11-19 | 2013-03-24 | Filt Air Ltd | Method of bipolar ion generation and aerodynamic ion generator |
| JP5952844B2 (ja) | 2011-03-07 | 2016-07-13 | ローマ リンダ ユニヴァーシティ メディカル センター | 陽子コンピューター断層撮影スキャナーの較正に関するシステム、装置、及び方法 |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2612607A (en) * | 1947-04-05 | 1952-09-30 | William E Stephens | Mass spectrometer |
| US2659822A (en) * | 1947-04-22 | 1953-11-17 | George H Lee | Mass spectrometer |
| US3258591A (en) * | 1961-12-22 | 1966-06-28 | Pulse type mass spectrometer wherein ions are separated by oscillations in an electrostatic field | |
| US3551675A (en) * | 1967-08-02 | 1970-12-29 | Gulf Energy & Environ Systems | Method and apparatus for modulating the density of a beam of particles and determining the velocity distribution of the particles |
-
1981
- 1981-10-21 FR FR8119760A patent/FR2514905A1/fr active Granted
-
1982
- 1982-10-18 US US06/434,835 patent/US4517462A/en not_active Expired - Fee Related
- 1982-10-19 EP EP82401921A patent/EP0077739B1/fr not_active Expired
- 1982-10-19 DE DE8282401921T patent/DE3275019D1/de not_active Expired
- 1982-10-21 JP JP57183784A patent/JPS5880253A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| EP0077739A1 (fr) | 1983-04-27 |
| US4517462A (en) | 1985-05-14 |
| FR2514905A1 (fr) | 1983-04-22 |
| DE3275019D1 (en) | 1987-02-12 |
| FR2514905B1 (cg-RX-API-DMAC7.html) | 1983-12-02 |
| EP0077739B1 (fr) | 1987-01-07 |
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