DE3275019D1 - Apparatus to measure the ionic current produced by an ion beam - Google Patents

Apparatus to measure the ionic current produced by an ion beam

Info

Publication number
DE3275019D1
DE3275019D1 DE8282401921T DE3275019T DE3275019D1 DE 3275019 D1 DE3275019 D1 DE 3275019D1 DE 8282401921 T DE8282401921 T DE 8282401921T DE 3275019 T DE3275019 T DE 3275019T DE 3275019 D1 DE3275019 D1 DE 3275019D1
Authority
DE
Germany
Prior art keywords
measure
ion beam
current produced
ionic current
ionic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8282401921T
Other languages
German (de)
English (en)
Inventor
Robert La Coudouniere Boyer
Claude Duval
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Application granted granted Critical
Publication of DE3275019D1 publication Critical patent/DE3275019D1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
DE8282401921T 1981-10-21 1982-10-19 Apparatus to measure the ionic current produced by an ion beam Expired DE3275019D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8119760A FR2514905A1 (fr) 1981-10-21 1981-10-21 Dispositif de mesure d'un courant ionique produit par un faisceau d'ions

Publications (1)

Publication Number Publication Date
DE3275019D1 true DE3275019D1 (en) 1987-02-12

Family

ID=9263243

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8282401921T Expired DE3275019D1 (en) 1981-10-21 1982-10-19 Apparatus to measure the ionic current produced by an ion beam

Country Status (5)

Country Link
US (1) US4517462A (cg-RX-API-DMAC7.html)
EP (1) EP0077739B1 (cg-RX-API-DMAC7.html)
JP (1) JPS5880253A (cg-RX-API-DMAC7.html)
DE (1) DE3275019D1 (cg-RX-API-DMAC7.html)
FR (1) FR2514905A1 (cg-RX-API-DMAC7.html)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4322101C2 (de) * 1993-07-02 1995-06-14 Bergmann Thorald Ionenquelle für Flugzeit-Massenspektrometer
US5689111A (en) * 1995-08-10 1997-11-18 Analytica Of Branford, Inc. Ion storage time-of-flight mass spectrometer
US5654544A (en) * 1995-08-10 1997-08-05 Analytica Of Branford Mass resolution by angular alignment of the ion detector conversion surface in time-of-flight mass spectrometers with electrostatic steering deflectors
US5847385A (en) * 1996-08-09 1998-12-08 Analytica Of Branford, Inc. Mass resolution by angular alignment of the ion detector conversion surface in time-of-flight mass spectrometers with electrostatic steering deflectors
US6815669B1 (en) 1999-07-21 2004-11-09 The Charles Stark Draper Laboratory, Inc. Longitudinal field driven ion mobility filter and detection system
US7005632B2 (en) * 2002-04-12 2006-02-28 Sionex Corporation Method and apparatus for control of mobility-based ion species identification
US7129482B2 (en) * 1999-07-21 2006-10-31 Sionex Corporation Explosives detection using differential ion mobility spectrometry
US7098449B1 (en) 1999-07-21 2006-08-29 The Charles Stark Draper Laboratory, Inc. Spectrometer chip assembly
US6806463B2 (en) 1999-07-21 2004-10-19 The Charles Stark Draper Laboratory, Inc. Micromachined field asymmetric ion mobility filter and detection system
US6815668B2 (en) * 1999-07-21 2004-11-09 The Charles Stark Draper Laboratory, Inc. Method and apparatus for chromatography-high field asymmetric waveform ion mobility spectrometry
US6690004B2 (en) * 1999-07-21 2004-02-10 The Charles Stark Draper Laboratory, Inc. Method and apparatus for electrospray-augmented high field asymmetric ion mobility spectrometry
US6495823B1 (en) 1999-07-21 2002-12-17 The Charles Stark Draper Laboratory, Inc. Micromachined field asymmetric ion mobility filter and detection system
DE60111524T2 (de) * 2000-04-27 2006-07-13 Loma Linda University, Loma Linda Nanodosimeter auf einzelionendetektierung basierend
EP1405065B1 (en) * 2001-06-30 2012-04-11 Dh Technologies Development Pte. Ltd. System for collection of data and identification of unknown ion species in an electric field
US7091481B2 (en) * 2001-08-08 2006-08-15 Sionex Corporation Method and apparatus for plasma generation
US7274015B2 (en) * 2001-08-08 2007-09-25 Sionex Corporation Capacitive discharge plasma ion source
US6727496B2 (en) * 2001-08-14 2004-04-27 Sionex Corporation Pancake spectrometer
US7122794B1 (en) * 2002-02-21 2006-10-17 Sionex Corporation Systems and methods for ion mobility control
US6919570B2 (en) * 2002-12-19 2005-07-19 Advanced Electron Beams, Inc. Electron beam sensor
CA2551991A1 (en) * 2004-01-13 2005-07-28 Sionex Corporation Methods and apparatus for enhanced sample identification based on combined analytical techniques
WO2006060807A1 (en) * 2004-12-03 2006-06-08 Sionex Corporation Method and apparatus for enhanced ion based sample filtering and detection
WO2007014303A2 (en) 2005-07-26 2007-02-01 Sionex Corporation Ultra compact ion mobility based analyzer system and method
ATE498983T1 (de) * 2006-02-24 2011-03-15 Ericsson Telefon Ab L M Technik zum konfigurieren von streckenschicht- entitäten für ein handover
US8217344B2 (en) 2007-02-01 2012-07-10 Dh Technologies Development Pte. Ltd. Differential mobility spectrometer pre-filter assembly for a mass spectrometer
US7723706B2 (en) * 2008-06-19 2010-05-25 Varian Semiconductor Equipment Associates, Inc. Horizontal and vertical beam angle measurement technique
EP2483710A4 (en) 2009-10-01 2016-04-27 Univ Loma Linda Med Detector for ionization by ion-induced impact and uses thereof
IL202219A (en) * 2009-11-19 2013-03-24 Filt Air Ltd Method of bipolar ion generation and aerodynamic ion generator
JP5952844B2 (ja) 2011-03-07 2016-07-13 ローマ リンダ ユニヴァーシティ メディカル センター 陽子コンピューター断層撮影スキャナーの較正に関するシステム、装置、及び方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2612607A (en) * 1947-04-05 1952-09-30 William E Stephens Mass spectrometer
US2659822A (en) * 1947-04-22 1953-11-17 George H Lee Mass spectrometer
US3258591A (en) * 1961-12-22 1966-06-28 Pulse type mass spectrometer wherein ions are separated by oscillations in an electrostatic field
US3551675A (en) * 1967-08-02 1970-12-29 Gulf Energy & Environ Systems Method and apparatus for modulating the density of a beam of particles and determining the velocity distribution of the particles

Also Published As

Publication number Publication date
EP0077739A1 (fr) 1983-04-27
US4517462A (en) 1985-05-14
FR2514905A1 (fr) 1983-04-22
JPS5880253A (ja) 1983-05-14
FR2514905B1 (cg-RX-API-DMAC7.html) 1983-12-02
EP0077739B1 (fr) 1987-01-07

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee