JPS5879947U - Sample tilting device such as electron microscope - Google Patents
Sample tilting device such as electron microscopeInfo
- Publication number
- JPS5879947U JPS5879947U JP17518981U JP17518981U JPS5879947U JP S5879947 U JPS5879947 U JP S5879947U JP 17518981 U JP17518981 U JP 17518981U JP 17518981 U JP17518981 U JP 17518981U JP S5879947 U JPS5879947 U JP S5879947U
- Authority
- JP
- Japan
- Prior art keywords
- holding member
- wire
- axis
- sample holding
- sample
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は従来装置を示す断面図、第２図及び第３図は各
々この断面図におけるＡ−Ａ’断面及びＢ−Ｂ’断面を
示すための図、第４図は従来装置の欠点を説明するため
の図、第５図ａ及び第５図すは本考案の一実施例を示す
ための図、第６図はこの一実施例装置の作用効果を説明
するための図である。
１：試料筒、３：支持筒、４：中間体、５：軸、６：試
料保持部材、７：軸、８：ワイヤー、９：テコ体、１２
：移動軸、１３：ワイヤー、１６：テコ体、１９ニガイ
ド。Fig. 1 is a sectional view showing the conventional device, Figs. 2 and 3 are views showing the AA' section and B-B' section respectively in this sectional view, and Fig. 4 shows the drawbacks of the conventional device. Figures 5a and 5 are diagrams for explaining an embodiment of the present invention, and Figure 6 is a diagram for explaining the operation and effect of the device of this embodiment. 1: Sample cylinder, 3: Support cylinder, 4: Intermediate body, 5: Shaft, 6: Sample holding member, 7: Shaft, 8: Wire, 9: Lever body, 12
: Moving axis, 13: Wire, 16: Lever body, 19 Ni guide.
Claims (1)
を第１の軸のまわりに傾動可能に保持する中間体と、該
中間体を光軸上で前記第１の軸に対して直交する第２の
軸のまわりに傾動可能に保持する手段と、前記試料保持
部材の傾斜角を変化させるため試料保持部材の前記第１
の軸から離れた一端にその一端が連結され略光軸に沿う
方向に移動可能ｈｅされた第１のワイヤーと、該第１の
ワイヤーによって与えられるモーメントに抗するように
試料保持部材に常時モーメントを与えるための弾性体と
、前記中間体の傾斜角を変化させるため中間体の第２の
軸から離れた一端にその一端が連結され略光軸に沿う方
向に移動可能にされた第２のワイヤーと、該第２のワイ
ヤーによって与えられるモーメントに抗するように中間
体に常時モーメントを与える弾性体とを備えた装置にお
いて、前記第１のワイヤーの試料保持部材との連結位置
が試料保持部材平面と平行な面内にあり且つ該保持部材
の中央を中心とする円の円弧に略沿って自由に移動でき
゛るように構成したことを特徴とする電子顕微鏡等の試
料傾斜装置。a sample holding member for holding a sample; an intermediate body that holds the sample holding member so as to be tiltable about a first axis; means for holding the sample holding member tiltably about a second axis; and means for holding the sample holding member tiltably about a second axis;
A first wire, one end of which is connected to one end remote from the axis of the optical axis, is movable in a direction substantially along the optical axis, and a moment is constantly applied to the sample holding member so as to resist the moment imparted by the first wire. an elastic body for changing the inclination angle of the intermediate body; and a second elastic body, one end of which is connected to one end of the intermediate body remote from the second axis and movable in a direction substantially along the optical axis. In an apparatus comprising a wire and an elastic body that constantly applies a moment to the intermediate body so as to resist the moment applied by the second wire, the first wire is connected to the sample holding member at a position where the first wire is connected to the sample holding member. 1. A specimen tilting device for an electron microscope, etc., characterized in that it is configured to be able to freely move substantially along an arc of a circle that is in a plane parallel to a plane and centered at the center of the holding member.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17518981U JPS5879947U (en) | 1981-11-25 | 1981-11-25 | Sample tilting device such as electron microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17518981U JPS5879947U (en) | 1981-11-25 | 1981-11-25 | Sample tilting device such as electron microscope |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5879947U true JPS5879947U (en) | 1983-05-30 |
| JPH0338758Y2 JPH0338758Y2 (en) | 1991-08-15 |
Family
ID=29967461
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17518981U Granted JPS5879947U (en) | 1981-11-25 | 1981-11-25 | Sample tilting device such as electron microscope |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5879947U (en) |
-
1981
- 1981-11-25 JP JP17518981U patent/JPS5879947U/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0338758Y2 (en) | 1991-08-15 |
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