JPS5877226A - Luquid phase epitaxial growth device - Google Patents

Luquid phase epitaxial growth device

Info

Publication number
JPS5877226A
JPS5877226A JP56174573A JP17457381A JPS5877226A JP S5877226 A JPS5877226 A JP S5877226A JP 56174573 A JP56174573 A JP 56174573A JP 17457381 A JP17457381 A JP 17457381A JP S5877226 A JPS5877226 A JP S5877226A
Authority
JP
Japan
Prior art keywords
chamber
gate
growth
temperature
epitaxial growth
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56174573A
Other languages
Japanese (ja)
Other versions
JPH0620057B2 (en
Inventor
Seiichi Yamada
精一 山田
Akihiko Sato
昭彦 佐藤
Yoshiharu Shigyo
執行 義春
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP17457381A priority Critical patent/JPH0620057B2/en
Publication of JPS5877226A publication Critical patent/JPS5877226A/en
Publication of JPH0620057B2 publication Critical patent/JPH0620057B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02612Formation types
    • H01L21/02617Deposition types
    • H01L21/02623Liquid deposition
    • H01L21/02628Liquid deposition using solutions

Abstract

PURPOSE:To improve productivity by shortening the preparatory processing time for epitaxial growth by a method wherein desired gas is supplied and a spare chamber controlled at about 300 deg.C is also provided at a part of the inlet and outlet of a growth chamber applied heating control here through a gate. CONSTITUTION:A gas supply pipe 9 and a gas exhaust pipe 11 are provided at the one end section of a quartz tube 1 for epitaxial growth surrounded by temperature controllig heaters 2 and the side wall of the other end respectively and a gate 3 freely sliding up and down is also slided at the opening section of the exhaust pipe 11. Next, while sliding the gate 3 in the same way, a spare chamber 4 having a gas supply pipe 10 and a gas exhaust pipe 12 at the front end and the heel of the side wall respectivly is positioned and the first slide 8 sliding a boat 5 by penetrating a cap 6 closing the opening section and the second slide 7 sliding a substrate and a source solution reservoir are provided. Before growing an epitaxial layer on the substrate composed in this way, the temperature in the spare chamber 4 is firstly raisen at about 300 deg.C. After that, the gate 3 is opened to move the substrate or the like in the quartz tube 1.

Description

【発明の詳細な説明】 本発明は液相エピタキシャル成長装置に関する。[Detailed description of the invention] The present invention relates to a liquid phase epitaxial growth apparatus.

半導体装置、特に発光菓子、半導体レーザー等の製造に
おけるエピタキシャル層の形成において、液相エピタキ
シャル成長装置が使用さnている。
Liquid phase epitaxial growth apparatuses are used in the formation of epitaxial layers in the manufacture of semiconductor devices, particularly light-emitting confectionery, semiconductor lasers, and the like.

Y なりち、従来のエピタキシャル成長装置では、たと
えば、化合物半導体からなる発光素子基板を成長ソース
の入ったボートに固定し、常温で水素置換されている成
長室にボートを挿入する。次に1時間はどこの状態てボ
ートを水素置換させた後、成長室をベーク温度に上昇さ
せ定時間放置後、プリヒート温度に上昇させ定時間放置
する。その後、0.1〜0.5G/分で降温させながら
反応液を入れたボートを移動させながら基板上に不純物
を成長させる。成長終了でボートを取り出すため成長室
温度を常温まで降温させる。このサイクル運転中、成長
室には水素が流されている。
In a conventional epitaxial growth apparatus, for example, a light emitting element substrate made of a compound semiconductor is fixed to a boat containing a growth source, and the boat is inserted into a growth chamber that is replaced with hydrogen at room temperature. Next, after replacing the boat with hydrogen for one hour, the growth chamber was raised to the baking temperature and left for a certain period of time, and then raised to the preheat temperature and left for a certain period of time. Thereafter, impurities are grown on the substrate while moving the boat containing the reaction solution while lowering the temperature at a rate of 0.1 to 0.5 G/min. When growth is complete, the temperature of the growth chamber is lowered to room temperature in order to take out the boat. During this cycle operation, hydrogen is flowing into the growth chamber.

この方法における問題点は、成長に必要な正味の処理工
程部分は、ベーク工程、ブリヒート工程及び成長工程で
あり、他の常温からベーク温度への昇温工程とボートを
取り出すための常温への降温1楊は、成長には不用であ
るが成長室が水素雰囲気のため(300C以上の高温で
ボートを取り出そうとすれば爆発する。)従来方式では
、省略できなかった。そのためlサイクルに8時間もか
かってしまう。
The problem with this method is that the net processing steps required for growth are a baking process, a preheating process, and a growth process; Although the 1st column is not needed for growth, it could not be omitted in the conventional method because the growth chamber is in a hydrogen atmosphere (attempting to take out the boat at a high temperature of 300 C or higher would cause an explosion). Therefore, one cycle takes 8 hours.

したがって、本発明の目的は、処理時間が短かい生産性
の高い液相エピタキシャル成長装置を提供することにあ
る。
Accordingly, an object of the present invention is to provide a liquid phase epitaxial growth apparatus with short processing time and high productivity.

このような目的を達成するために本発明は、所望のガス
を供給されるとともに加熱制御される成長室と、前記成
長室内に入れられる被処理物お1びソースを制御するス
ライド群と、成長室の出入口側を塞ぐキャップと、から
なる液相エピタキシャル成長装置において、前記成長室
の出入口側の一部にゲートを隔てて低温の予備室を配設
してなるものであり、以下実施例により本発明を説明す
る。
In order to achieve such an object, the present invention provides a growth chamber that is supplied with a desired gas and whose heating is controlled, a group of slides that control the processing object and the source placed in the growth chamber, and A liquid-phase epitaxial growth apparatus comprising a cap that closes the entrance and exit side of the chamber, and a low-temperature preliminary chamber is disposed in a part of the entrance and exit side of the growth chamber with a gate in between. Describe the invention.

第1図は本発明の一実施例による液相エピタキシャル成
長装置を示す概略図であり、第2図は同じく処理時の温
度経緯な示すグラフである。
FIG. 1 is a schematic diagram showing a liquid phase epitaxial growth apparatus according to an embodiment of the present invention, and FIG. 2 is a graph showing the temperature profile during processing.

第4図において、lは被処理物である基板を収容してエ
ピタキシャル成長を行なう石英管によって形成される成
長室でるる。成長室lの外肯には、温度制御用のモータ
2が配設されている。成長室lの一端は出入口を形作り
、この出入口からはボート5が成長室l内に挿脱される
。また、ボート5およびボート5上に取り付けられる基
板およびソースを入れた溶液溜は、第1スライド8およ
び、、第2スライド7等のスライド群で制御される。ま
た、成長室1の出入口はキャップ6で気密的に取り付け
られる。また、成長室lの出入口側にはゲート3を隔て
て予備室4が配設されている。この予備室4はゲート3
を閉じた後、キャップ6を敗り外した際には、水素爆発
が生じない300t:’前後以下の温度となるように制
御され、この状態下でボート5は予備室4と大気中との
間のロード。
In FIG. 4, l denotes a growth chamber formed by a quartz tube that accommodates a substrate to be processed and performs epitaxial growth. A motor 2 for temperature control is disposed at the outer edge of the growth chamber l. One end of the growth chamber 1 forms an entrance and exit port through which the boat 5 is inserted into and removed from the growth chamber 1. Further, the boat 5 and the solution reservoir containing the substrate and source mounted on the boat 5 are controlled by a group of slides such as the first slide 8 and the second slide 7. Further, the entrance/exit of the growth chamber 1 is airtightly attached with a cap 6. Further, a preliminary chamber 4 is provided on the entrance/exit side of the growth chamber 1 with a gate 3 in between. This spare room 4 is gate 3
When the cap 6 is removed after the cap 6 is closed, the temperature is controlled to be around 300 t:', which prevents hydrogen explosion, and under this condition, the boat 5 is connected to the preliminary chamber 4 and the atmosphere. Load between.

アンロードがなされる。さらに、成長室1および予備室
4にはそゎぞれガス供給管9.10および排気管11.
12が配設され、成長室lおよび予備室4を所定のガス
雰囲気とするようになっている。
Unloading is done. Further, the growth chamber 1 and the preparatory chamber 4 are provided with gas supply pipes 9, 10 and exhaust pipes 11, respectively.
12 is arranged to create a predetermined gas atmosphere in the growth chamber 1 and the preparatory chamber 4.

このような装置においては、エピタキシャル成長する際
は、先ず、ソースと基板をセラ)したボート5を水素あ
るいはチッ素でノく−ジされている予備室4に入れ、第
2図に示す宜1時間だけ水素置換する。
In such an apparatus, when performing epitaxial growth, first, the boat 5 containing the source and substrate is placed in the preparatory chamber 4 which is insulated with hydrogen or nitrogen, and then kept for 1 hour as shown in FIG. Only hydrogen is replaced.

つぎに、ゲート3を開き、温度T、に管理され、かつ水
素雰囲気となっている成長室IK第1スライド8によっ
てボート5を移動させる。そして、ゲート3を開いた状
態で成長室lの温度を第2図に示すようにT、のベーク
からT、のプリヒートに移行させ、12時間までの間に
基板上に所望のエピタキシャル層を成長させる。
Next, the gate 3 is opened, and the boat 5 is moved by the first slide 8 of the growth chamber IK, which is controlled at a temperature T and has a hydrogen atmosphere. Then, with the gate 3 open, the temperature of the growth chamber 1 is changed from baking at T to preheating at T as shown in Figure 2, and a desired epitaxial layer is grown on the substrate within 12 hours. let

エピタキシャル層の形成が終了すると、ボート5を予備
室4に移し、ゲート3を閉じる。この際、予備室4と成
長室lの降温化(ガス、冷却水等による強制冷却)を図
る。成長室lはベーク温度まで降下させ、予備室4はa
ooc前後以下に降下させる。予備室4が300C前後
以ドに逼すると、キャップ6を外して処理した基板およ
び溶液溜等を敗り出しくアンロード)、新な基板および
溶液溜を入れ(ロード)、次の作業を再び開始する。
When the formation of the epitaxial layer is completed, the boat 5 is moved to the preliminary chamber 4 and the gate 3 is closed. At this time, the temperature of the preliminary chamber 4 and the growth chamber 1 is lowered (forcibly cooled by gas, cooling water, etc.). The growth chamber l is lowered to the bake temperature, and the preliminary chamber 4 is lowered to the baking temperature.
Descend to around ooc or below. When the temperature in the preliminary chamber 4 reaches around 300C or higher, the cap 6 is removed and the processed substrate and solution reservoir are removed (unloaded), a new substrate and solution reservoir are inserted (loaded), and the next operation is repeated. Start.

このような実施例によれば、予備室を設け、この予備室
では従来の成長室と同様に温度差の激しい降温、昇温を
行なうが、エピタキシャル成長な行なう成長室は高い温
度(Tt以上)に維持管理される。この結果、昇温、降
温時間が短縮できるため、lサイクルの作業時間が従来
の8時間から4時間と半分に短縮でき、生産性を2倍に
高めることができる。
According to such an embodiment, a preparatory chamber is provided, and in this preparatory chamber, the temperature is lowered and raised with large temperature differences as in the conventional growth chamber, but the growth chamber in which epitaxial growth is performed is heated to a high temperature (above Tt). Maintained and managed. As a result, the temperature rising and cooling times can be shortened, so the working time for one cycle can be halved from the conventional 8 hours to 4 hours, and productivity can be doubled.

なお、本発明は前記実施例に限定される′ものではなく
、本発明の技術思想に基いて変形が可能である。
It should be noted that the present invention is not limited to the above-mentioned embodiments, but can be modified based on the technical idea of the present invention.

以上のように、本発明によれば処理時間が短い生産性の
高い液相エピタキシャル成長装置を提供することができ
る。
As described above, according to the present invention, it is possible to provide a liquid phase epitaxial growth apparatus with high productivity and short processing time.

【図面の簡単な説明】[Brief explanation of the drawing]

@1図は本発明の液相エピタキシャル成長装置の概略図
、第2図は同じく温度経緯を示すグラフである。 符号の説明 l・・・成長室、2・・・ヒータ、3・・・ゲート、4
・・・予備室、5・・・ボート、6・・・キャップ、7
・・・譲2スライド、8・・・第1スライド。
@Figure 1 is a schematic diagram of the liquid phase epitaxial growth apparatus of the present invention, and Figure 2 is a graph showing the temperature history. Explanation of symbols l...Growth chamber, 2...Heater, 3...Gate, 4
... Spare room, 5... Boat, 6... Cap, 7
... 2nd slide, 8... 1st slide.

Claims (1)

【特許請求の範囲】 1、所望のガスを供給されるとともに加熱制御される成
長室と、前記成長室内に入れられる被処理物およびソー
スを制御するスライド群と、成長室の出入口側を塞ぐキ
ャップと、からなる液相エピタキシャル成長装置におい
て、前記成長室の出入口側の一部にゲートを隔てて低温
の予備室を配設してなることを特徴とする液相エピタキ
シャル成長装置。 2、前記予備室は300t:’前後に管理されることを
特徴とする特許請求の範囲第1項記載の液相エピタキシ
ャル成長装置。
[Scope of Claims] 1. A growth chamber that is supplied with a desired gas and whose heating is controlled; a slide group that controls the processing object and source placed in the growth chamber; and a cap that closes the entrance and exit side of the growth chamber. A liquid phase epitaxial growth apparatus comprising: a low-temperature preliminary chamber disposed in a part of the entrance/exit side of the growth chamber with a gate in between. 2. The liquid phase epitaxial growth apparatus according to claim 1, wherein the preliminary chamber is controlled at around 300t:'.
JP17457381A 1981-11-02 1981-11-02 Liquid phase epitaxial growth system Expired - Lifetime JPH0620057B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17457381A JPH0620057B2 (en) 1981-11-02 1981-11-02 Liquid phase epitaxial growth system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17457381A JPH0620057B2 (en) 1981-11-02 1981-11-02 Liquid phase epitaxial growth system

Publications (2)

Publication Number Publication Date
JPS5877226A true JPS5877226A (en) 1983-05-10
JPH0620057B2 JPH0620057B2 (en) 1994-03-16

Family

ID=15980916

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17457381A Expired - Lifetime JPH0620057B2 (en) 1981-11-02 1981-11-02 Liquid phase epitaxial growth system

Country Status (1)

Country Link
JP (1) JPH0620057B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0166782A1 (en) * 1983-12-14 1986-01-08 Fujitsu Limited Apparatus for measuring ultrasonic characteristic values of a medium
US4648276A (en) * 1984-01-27 1987-03-10 Klepper John R Apparatus for measuring the characteristics of an ultrasonic wave medium
JPS6332917A (en) * 1986-07-28 1988-02-12 Hitachi Ltd Method and apparatus for liquid phase epitaxial growth
US4755364A (en) * 1986-05-29 1988-07-05 Rockwell International Corporation Liquid phase epitaxy apparatus and method

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0166782A1 (en) * 1983-12-14 1986-01-08 Fujitsu Limited Apparatus for measuring ultrasonic characteristic values of a medium
EP0166782B1 (en) * 1983-12-14 1992-05-06 Fujitsu Limited Apparatus for measuring ultrasonic characteristic values of a medium
US4648276A (en) * 1984-01-27 1987-03-10 Klepper John R Apparatus for measuring the characteristics of an ultrasonic wave medium
US4755364A (en) * 1986-05-29 1988-07-05 Rockwell International Corporation Liquid phase epitaxy apparatus and method
JPS6332917A (en) * 1986-07-28 1988-02-12 Hitachi Ltd Method and apparatus for liquid phase epitaxial growth

Also Published As

Publication number Publication date
JPH0620057B2 (en) 1994-03-16

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