JPS58744A - Inspecting method of bottle or the like - Google Patents
Inspecting method of bottle or the likeInfo
- Publication number
- JPS58744A JPS58744A JP56100041A JP10004181A JPS58744A JP S58744 A JPS58744 A JP S58744A JP 56100041 A JP56100041 A JP 56100041A JP 10004181 A JP10004181 A JP 10004181A JP S58744 A JPS58744 A JP S58744A
- Authority
- JP
- Japan
- Prior art keywords
- bottle
- light
- light source
- pattern
- camera
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims description 17
- 230000002950 deficient Effects 0.000 claims abstract description 13
- 238000007689 inspection Methods 0.000 abstract description 11
- 238000009792 diffusion process Methods 0.000 abstract description 3
- 230000003287 optical effect Effects 0.000 abstract description 2
- 238000005336 cracking Methods 0.000 abstract 1
- 230000001678 irradiating effect Effects 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 6
- 238000001514 detection method Methods 0.000 description 4
- 230000007547 defect Effects 0.000 description 3
- 238000003384 imaging method Methods 0.000 description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 238000007493 shaping process Methods 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- JEIPFZHSYJVQDO-UHFFFAOYSA-N iron(III) oxide Inorganic materials O=[Fe]O[Fe]=O JEIPFZHSYJVQDO-UHFFFAOYSA-N 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
- G01N21/9054—Inspection of sealing surface and container finish
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/0078—Testing material properties on manufactured objects
- G01N33/0081—Containers; Packages; Bottles
Landscapes
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Food Science & Technology (AREA)
- Medicinal Chemistry (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Cleaning In General (AREA)
Abstract
Description
【発明の詳細な説明】
この発明は一次元走査カメラを用いた瓶類の検査方法に
関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for inspecting bottles using a one-dimensional scanning camera.
一次元走査カメラを用いた瓶類の検査方法については、
この発明に係る出願人もこれまでにいくらかの出願を行
なっている。その１つに、検査すべき瓶の瓶口上方面に
光源を設け、この光源よりの光線を前記瓶口に照射し、
瓶口上表面で反射した光線を瓶口側方部に設けた一次元
走査カメラで受光して電気信号に変換し、この変換され
た電気信号のパターンと、あらかじめ設定した良品瓶の
信号パターンを比較することにより瓶の良否を判定する
ものがある〇
この瓶類の検査方法は、瓶口の上方面に汚れや、割欠損
がある場合にこれを確実に検出し、不良瓶と判定し得た
が瓶口の側部下方に汚れや、割欠損がある場合に１これ
を十分に検出し得す不良瓶であるにもかかわらず、良品
瓶であると判定してしまうおそれがあつ九。For information on how to inspect bottles using a one-dimensional scanning camera,
The applicant for this invention has also filed several applications so far. One method is to provide a light source above the mouth of the bottle to be inspected, and irradiate the bottle mouth with light from this light source.
The light beam reflected from the upper surface of the bottle mouth is received by a one-dimensional scanning camera installed on the side of the bottle mouth and converted into an electrical signal, and the pattern of the converted electrical signal is compared with the preset signal pattern of a good bottle. There is a method for determining the quality of a bottle by checking the quality of the bottle. This method of inspecting bottles reliably detects dirt or cracks on the upper surface of the bottle mouth and determines that the bottle is defective. If there is dirt or cracks on the lower side of the bottle mouth, there is a risk that the bottle will be judged to be a good bottle even though this can be detected sufficiently.
この発明の目的は、上配瓶類の検査方法の欠点を解消し
、瓶口側部下方に生じた汚れや、割欠損でも検出し得る
縁高精度な瓶類の検査方法を提供するＫｓする。The purpose of this invention is to eliminate the drawbacks of the inspection method for upper-bottomed bottles and to provide a highly accurate bottle inspection method that can detect dirt and cracks formed below the mouth side of the bottle. .
この発明の瓶類の検査方法は、上記目的を達成するため
に、瓶口の上方部に館１の光源を設け、瓶口の斜横方向
に第２の光源を設け、第１の光源よシの光線を瓶口上表
面に照射し、第２の光源よりの光Ｉｌを瓶口側部に照射
し、この瓶口上表面に照射され反射される光線と、瓶口
側部に照射され、反射される光線を瓶口の横方向近傍に
設けられる一次元走査カメラで受光して電気信号に変換
し、この変換された電気信号のパターンとあらかじめ設
定した良品瓶の信号パターンとを比較することＫより、
瓶の良否を判定するようにしている。In order to achieve the above-mentioned object, the bottle inspection method of the present invention provides a light source 1 above the bottle mouth, a second light source provided diagonally horizontally to the bottle mouth, and a second light source that is disposed above the bottle mouth. The light ray from the second light source is irradiated onto the top surface of the bottle mouth, and the light ray from the second light source is irradiated onto the side of the bottle mouth. A one-dimensional scanning camera installed horizontally near the mouth of the bottle receives the light beam, converts it into an electrical signal, and compares the pattern of the converted electrical signal with a preset signal pattern for a good bottle. Than,
I try to judge whether the bottle is good or bad.
以下、図面に示す実施例により、この発明の詳細な説明
する。Hereinafter, the present invention will be described in detail with reference to embodiments shown in the drawings.
第１図はこの発明の一実施例を示す概略図である０
第１図において、１は検査すべき瓶であって、検査管な
すため（図示外のコンベア上に載置されて移送される。FIG. 1 is a schematic diagram showing an embodiment of the present invention. In FIG. .
２はたとえばハロゲンランプで構成される光源である。2 is a light source composed of, for example, a halogen lamp.
光源２は瓶１の瓶口３の上方に設けられる光源ボックス
４内に収納されている０５は光拡散板、６は遮光板であ
る０光源２を出た光線は瓶口３の上表面に照射され、そ
の瓶口３の上表面で反射される。その反射光２ａは、瓶
口３の横方向近傍に設けられるイメージセンサカメラ７
に入力される。The light source 2 is housed in a light source box 4 provided above the bottle mouth 3 of the bottle 1. 05 is a light diffusion plate, and 6 is a light blocking plate. It is irradiated and reflected on the upper surface of the bottle mouth 3. The reflected light 2a is reflected by an image sensor camera 7 provided in the lateral vicinity of the bottle mouth 3.
is input.
また８は２と同じ）・ロゲンラ／プで構成される光源で
あって、瓶口３の斜下横方向に設けられる光源ボックス
９内に収納されている。光源８ｆｉ１１また光線は光拡
散板１０を経て、瓶口３の側面に照射され、その表面で
反射される。反射された光線８ａはイメージセンサカメ
ラに入力される。In addition, 8 is the same as 2). It is a light source composed of a logene lamp, and is housed in a light source box 9 provided diagonally below and laterally of the bottle mouth 3. The light source 8fi11 also passes through the light diffusing plate 10, irradiates the side surface of the bottle mouth 3, and is reflected on the surface. The reflected light beam 8a is input to an image sensor camera.
イメージセンサカメラ７（以下単にカメラという）は九
とえばＣＣＤ素子（電荷結合素子）が多数個配列されて
おり、これらＣＣＤ素子に光が当るとその光信号を電気
信号に変換して撮倫信号を取出す一次元走査の可能なカ
メラであり、これ自体は周知の−のである。The image sensor camera 7 (hereinafter simply referred to as camera) has a large number of CCD elements (charge-coupled devices) arranged, and when light hits these CCD elements, the optical signal is converted into an electrical signal and a photographic signal is generated. This is a camera capable of one-dimensional scanning to extract images, and is itself well known.
第１図において光源２、および８より光線を瓶口３に照
射すると、瓶口３の横からみた発光部のパターンは、良
品瓶の場合第２図の斜線で示したものとなる。このよう
な発光部ノ（ターンの生じる瓶を矢印の方向に移動させ
ると、カメラ７の走査線１１は、瓶１の移動につれて、
瓶の位置ｌい、から走査動作を開始し、位置′ろまでの
間一定間隔でサンプリング動作を行なう。そして位置′
いから位置′ろまでの関において各走査回毎に、発光幅
に対応したビット信号出力を導出する０第２図に示した
のｔ′ｉａ品瓶の場合の発光パターンであるが１．瓶口
に汚れや、割欠損がめると発光パターンが変化するので
、この変化をカメラ７で抽出して不良風の検査を行なう
。In FIG. 1, when the bottle neck 3 is irradiated with light beams from the light sources 2 and 8, the pattern of the light-emitting portion when viewed from the side of the bottle neck 3 becomes the pattern shown by diagonal lines in FIG. 2 in the case of a good bottle. As the bottle 1 moves in the direction of the arrow, the scanning line 11 of the camera 7 changes as the bottle 1 moves.
The scanning operation is started from the bottle position 1, and sampling operations are performed at regular intervals until the bottle is at the position 1. and position′
The light emission pattern for the t'ia product bottle shown in FIG. If dirt or cracks appear on the mouth of the bottle, the light emitting pattern will change, so this change is extracted with the camera 7 and inspected for defects.
良品瓶と不良風の具体的な判別は以下の方法によ抄行な
う。The specific distinction between good bottles and bad bottles is made by the following method.
（１） Ｄ Ｉ Ｂ Ｃが設定値を外れたら不良風とす
る。(1) If D I B C is out of the set value, it is considered a bad wind.
ＤＩＢＣとは、第２図に示すように、各走査回毎の１番
目の暗部の幅をいう。各走査は走査線１１の検査箱＠に
わたり、たとえば上方から下方に行なわれるので最初の
暗部のビット数を計数することによりＤＩＢＣを求める
。良品瓶の場合のＤＩＢＣはほぼ一定の値であるが、第
１発光部が消滅するような不良風では、非常に大となる
。それゆえＤＩＢＣが一定の幅を外れたら不良風とする
。DIBC refers to the width of the first dark area in each scanning cycle, as shown in FIG. Each scan is performed across the inspection box @ of the scanning line 11, for example from top to bottom, so DIBC is determined by counting the number of bits in the first dark area. In the case of a good bottle, the DIBC is approximately a constant value, but in the case of a defective wind that causes the first light emitting part to disappear, it becomes extremely large. Therefore, if DIBC deviates from a certain range, it is considered a bad wind.
５ −
（２） Ｌ Ｉ Ｂ Ｃが設定値を外れたら不良風とす
る。5-(2) If LIBC deviates from the set value, it is considered a bad wind.
ＬＩＢＣとは、各走査毎の１番目の明部（発光部）の幅
をいう。ＬＩＢＣｉｉ最初の明部のビット数を計数する
ことにより求める。良品瓶の場合ＬＩＢＣもほぼ一定の
値を示すが不良風の場合、明部が非常に細くなったり、
異常発光で木くなる。それゆえＬＩＢＣが一定の幅を外
れたら不良風とする。LIBC refers to the width of the first bright part (light emitting part) for each scan. LIBCii is determined by counting the number of bits in the first bright part. In the case of good bottles, the LIBC also shows an almost constant value, but in the case of bad bottles, the bright part becomes very thin,
It becomes a tree due to abnormal light emission. Therefore, if LIBC deviates from a certain range, it is considered a bad wind.
（３） Ｄ ２ Ｂ Ｃが設定値を外れたら不良風とす
る。(3) If D 2 B C deviates from the set value, it is considered a bad wind.
Ｄ２ＢＣとは走査回毎の２番目の暗部の幅をいう。D2BC refers to the width of the second dark area in each scanning cycle.
上記（１）の場合と同様、良品瓶のＤ２ＢＣはほぼ一定
となるが、不良風の場合に非常に小さくなったり大きく
なった抄するので、Ｄ２ＢＣも一定の＠を外れ九ら不良
風とする。As in the case of (1) above, the D2BC of a good bottle is almost constant, but in the case of a bad wind, it becomes very small or large, so the D2BC also deviates from the constant @ and is assumed to be a bad wind. .
（４） Ｌ ２ Ｂ Ｃが設定値を外れたら不良風とす
る０Ｌ２ＢＣとは走査回毎の２番目の明部の幅をいい、
上記（２）と同様の理由でＬ２ＢＣが一定の幅を外れた
ら不良風とする。(4) If L 2 B C deviates from the set value, it is considered a defect. 0L2BC refers to the width of the second bright part in each scan.
For the same reason as (2) above, if L2BC deviates from a certain range, it is considered a bad wind.
（５） ＡＢＳ （Ｌｌ −Ｌ２ ） ＢＣが設定値を
外れたら不良風とする。(5) ABS (Ll - L2) If BC is out of the set value, it is considered a faulty wind.
ＡＢＳ（Ｌｌ−Ｉ？りＢＣとは、各走査毎における１
６−
番目の明部と２番目の明部の幅差をいう。上述したＬＩ
ＢＣとＬ２ＢＣのビット数の差を計算するととＫよりＡ
ＢＳ（Ｌｌ−Ｌ２）ＢＣが求められる。良品風の場合、
ＬＩＢＣとＬ２ＢＣの差がほとんど一定値を示すが、不
良風の場合、一方の明部の幅が太くなったり、細くなっ
たりするので、その差が非常に大となる。それゆえＡＢ
Ｓ（Ｌｌ−Ｌ２）ＢＣが一定の設定幅を越えたら不良風
と判定する。ABS (Ll-I? BC) means 1 in each scan.
It refers to the width difference between the 6th bright area and the 2nd bright area. LI mentioned above
When calculating the difference in the number of bits between BC and L2BC, A is larger than K.
BS(Ll-L2)BC is calculated. In the case of quality products,
The difference between LIBC and L2BC shows almost a constant value, but in the case of bad wind, the width of one bright part becomes thicker or thinner, so the difference becomes very large. Therefore AB
If S(Ll-L2)BC exceeds a certain set range, it is determined to be a bad wind.
（６） Ｌ Ｉ Ｂ Ｃｉが設定値を外れたら不良風と
する０ＬＩＢＣｉとは、１番目の明部の面積をいう。Ｌ
ＩＢＣｉｉｉＬＩＢＣを１瓶の検査の全走査分の累積計
数すること釦より求めることができる。やはり良品風の
場合、ＬＩＢＣＩはほぼ一定の値を示すが、不蔑瓶の場
合、極端に大きな値となったり、小さな値となったりす
る。それゆえＬＩＢＣｌが一定の設定値幅を外れたら不
良風とする。(6) If LIBCi deviates from the set value, it is considered a bad wind. 0LIBCi refers to the area of the first bright part. L
IBCiiiLIBC can be obtained by cumulatively counting all the scans of one vial test using the button. After all, in the case of Ryohinkaze, the LIBCI shows a nearly constant value, but in the case of Fushubin, it becomes an extremely large value or a small value. Therefore, if LIBCl deviates from a certain set value range, it is assumed to be a failure.
（７） Ｌ ２ Ｂ Ｃｉが設定値を外れ−たら不良風
とする。(7) If L 2 B Ci deviates from the set value, it is considered a defective wind.
Ｌ２ＢＣ１とは２番目の明部の面積をいう。Ｌ２ＢＣ１
４ＬＩＢＣ１と同様にして求めることができ、同様の理
由により、Ｌ２ＢＣｉが一定の設定値幅を外れたら不良
風とする。L2BC1 refers to the area of the second bright area. L2BC1
It can be obtained in the same manner as 4LIBC1, and for the same reason, if L2BCi deviates from a certain set value range, it is determined to be a bad wind.
（８） Ｍ ＣＩが設定値を外れたら不良風とする。(8) If MCI deviates from the set value, it is considered a bad wind.
ＭＣＩとは、１瓶の全走査で、モード１が生じる走査回
数をいう。なおここにモードとは、１走査で明部、す彦
わち撮像信号パルスが何個中じるかをいい、たとえば第
２図における位置′はでは明部が１個生じるので、モー
ド１といい、位置１〜匂ように、明部が２個生じる場合
をモード２という。ＭＣＸは、全走査でモード１の生じ
る走査回数を計数することにより求められる。ＭＣＩす
なわちモードｌの生じる回数も良品風では一定であるに
対し、不良風の場合はパラつくので、ＭＣ１計数の結果
設定幅を外れたら不良風とする。MCI refers to the number of scans in which mode 1 occurs in all scans of one bottle. Note that mode here refers to the number of bright areas, that is, how many imaging signal pulses are included in one scan.For example, at position ' in Figure 2, one bright area occurs, so it is called mode 1. The case where two bright areas occur, as shown in position 1 to odor, is called mode 2. MCX is determined by counting the number of scans in which mode 1 occurs in all scans. The number of occurrences of MCI, that is, mode 1, is constant in the case of non-defective winds, but fluctuates in the case of bad winds, so if the result of MC1 counting is outside the set range, it is determined to be a bad wind.
（９） Ｍ Ｃ２が設定値を外れたら不良風とする。(9) If MC2 deviates from the set value, it is considered a defective wind.
α０）ＭＣ３が設定値を外れたら不良風とする。α0) If MC3 deviates from the set value, it is considered a bad wind.
上記（８）と同様に、ＭＣ２、ＭＣ３すなわちモード２
、モード３４良品瓶の場合、全走査で一定回数生じるの
で、やはシ設定幅管外れたら不良風とするＯ
α１）ＭＣ４が生じたら不良風とする。Similarly to (8) above, MC2, MC3, or mode 2
In the case of a non-defective bottle in mode 34, this occurs a certain number of times in all scans, so if the set width tube comes off, it is determined to be a bad wind.O α1) If MC4 occurs, it is determined to be a bad wind.
第２図で明らかなようＫ、良品風の場合、モード４が生
じることはない。それゆえ一定値以上のＭＣ４が生じた
ら不良風とする。As is clear from FIG. 2, mode 4 does not occur in the case of K and good quality. Therefore, if MC4 exceeding a certain value occurs, it is considered a bad wind.
この他ＭＣ２とＭＣ３０合計値、ＭＣＩからＭＣ２、Ｍ
Ｃ３ｔ−減じ良値等も、良品風の場合当然はぼ一定値と
なるので、検査瓶が設定幅を外れたら不良風とする。ま
た第２図に示す位置′にのようにモードｌからモード２
あるいはモード３にチェンジする位置、もしくは位置′
へのようにモード２あるいはモード３からモード１にチ
ェンジする位置は良品風の場合一定である。それゆえこ
のモードチェンジする位置をチェックすることにより不
良風を検出することもできる。In addition, MC2 and MC30 total value, MCI to MC2, M
C3t-subtracted good value etc. will naturally be a constant value in the case of good quality, so if the inspection bottle deviates from the set range, it is determined to be bad. Also, from mode l to mode 2 as shown in Figure 2,
Or the position to change to mode 3, or the position'
The position at which mode 2 or mode 3 changes to mode 1 is constant in the case of non-defective products. Therefore, by checking the position of this mode change, it is also possible to detect a defective wind.
以上の各方法による良品風パターンと検査瓶パターンと
の比較（より、各方法単独であるいは組合せで瓶の良否
を判別する。Comparison of the non-defective pattern by each of the above methods and the inspection bottle pattern (Thus, each method alone or in combination is used to determine the quality of the bottle.
各方法による検出、判別は第３図に示す電子回路で行な
われる。第３図において、１２はカメラ７の検出回路部
であって、第２図に示す走査線１１による各走査毎に対
応する発光部に応じて撮像信 ９−
号を導出する。１３Ｆｉ検出回路部で１２の出力を受け
て波形整形する回路、１４＃′ｉ波形整形回路１３より
の撮像信号を受けて、所定のプログラムにしたがい、上
述の（１）からαＤの方法等による諸種の計算、判定を
行なうコンピュータ部、１５＃′ｉ検出され九各データ
、設定値を記憶しておくメモリである。メモリ１５は、
ＤＩＢＣおよびその設定値Ｐ１ＬＩＢＣおよびその設定
値Ｑ、Ｄ２ＢＣおよびその設定値Ｒ，Ｌ２ＢＣおよびそ
の設定値Ｓ、ＡＢＳ（Ｌｌ−Ｌ２）ＢＣおよびその設定
値Ｔ、ＬＩＢＣ１およびその設定値Ｕ、Ｌ２ＢＣｉおよ
びその設定値■、ＭＣ１およびその設定値Ｗ、ＭＣ２お
よびその設定値Ｘ。Detection and discrimination by each method are performed by an electronic circuit shown in FIG. In FIG. 3, 12 is a detection circuit section of the camera 7, which derives an imaging signal 9- according to the corresponding light emitting section for each scan by the scanning line 11 shown in FIG. 13Fi detection circuit section receives the output of 12 and shapes the waveform; 14#'i receives the imaging signal from the waveform shaping circuit 13, and performs various processing from (1) to αD method, etc., according to a predetermined program. 15#'i is a computer section that performs calculations and judgments, and a memory that stores detected data and setting values. The memory 15 is
DIBC and its setting value P1LIBC and its setting value Q, D2BC and its setting value R, L2BC and its setting value S, ABS (Ll-L2)BC and its setting value T, LIBC1 and its setting value U, L2BCi and its setting Value ■, MC1 and its set value W, MC2 and its set value X.
ＭＣ３およびその設定値Ｙ、ＭＣ４およびその設定値２
を記憶する領域、さらＫは一般計算用の汎用レジスタＡ
、Ｂ、Ｃ，Ｄ＄を含んでいる。上記（１）〜α１）の各
方法は、第３図に示す電子回路によって、実行される。MC3 and its setting value Y, MC4 and its setting value 2
, and K is a general-purpose register A for general calculations.
, B, C, and D$. Each method (1) to α1) above is executed by the electronic circuit shown in FIG.
なおこの発明を実施するのに、１個のカメラと２個の光
源の１ユニツトで、九とえは瓶を１回転してやることに
より、検査瓶の全瓶口をチェック−１０−
できるが、第４図に示すように、瓶１を載置して移動す
るコンベア４０の近傍にカメラ４１、光源４２．４３の
１ユニツトを配置し、さら［１瓶間隔ずらしてカメラ４
４、光源４５．４６の１ユニツトを配置し、続いて瓶１
會９０°回転させる手段の後にカメラ４７、光源４８．
４９の１ユニツト、さらにカメラ５０、光源５１．５２
の１ユニツトを配置し、これらの４ユニツトで、検査瓶
１の全瓶口を検査してもよい。第４図においてはカメラ
４１によに瓶１の瓶口の半内部分を、カメラ４４で他の
残りの半内部分の検査を行なう。このカメラ４１，４４
で、瓶１の瓶口のほとんどを検査し得るが、厳密にはカ
メラに対し瓶口の端部すなわち接線方向の検査がラフに
なるので、カメラ４１゜４４で検査した瓶をさら［９０
°回転させてカメラ４７．５０で再び半円部ずつ検査し
ている。これＫより瓶１の瓶口に生じている傷、汚れ轡
をほとんど完全に検出することができる０
以上のようにこの発明の瓶類検査方法によれば、瓶口の
上方に第１の光源を般社るとともに、瓶口の斜横方向に
第２の光源を設け、第１の光源よりの光線を瓶口上表面
に照射し、第２の光源よりの光線を瓶口側部に照射する
よう圧したので、従来瓶口上方にのみ光源をおく方法で
は検出し得なかった、瓶口側部下方に生じた汚れや、割
欠損本不良瓶として検出し得るし、さらに従来は困難で
あつ丸鉄さび、汚れも検出できるという利点がある。In addition, to carry out this invention, it is possible to check all bottle openings of an inspection bottle by rotating the bottle once using one unit consisting of one camera and two light sources. As shown in Figure 4, one unit of a camera 41 and a light source 42,43 is placed near the conveyor 40 on which the bottles 1 are placed and moved,
4. Place 1 unit of light source 45.46, then place bottle 1
After the means for rotating the camera 47 by 90 degrees, a light source 48 .
1 unit of 49, further camera 50, light source 51.52
One unit of the test bottle 1 may be arranged, and all the openings of the test bottle 1 may be tested using these four units. In FIG. 4, a camera 41 inspects the inner half of the mouth of the bottle 1, and a camera 44 inspects the other half. This camera 41, 44
Most of the bottle opening of bottle 1 can be inspected using this method, but strictly speaking, inspection of the end of the bottle opening, that is, the tangential direction to the camera, will be rough.
It was rotated by 47° and the semicircular portion was inspected again using the camera 47.50. According to the bottle inspection method of the present invention, as described above, the first light source is placed above the bottle mouth. At the same time, a second light source is provided diagonally horizontally of the bottle mouth, the light beam from the first light source is irradiated on the upper surface of the bottle mouth, and the light ray from the second light source is irradiated on the side of the bottle mouth. Because of the increased pressure, it is possible to detect dirt below the side of the bottle mouth, which could not be detected with the conventional method of placing a light source only above the bottle mouth, as well as defects such as broken or defective bottles. It has the advantage of being able to detect rust and dirt on round iron.
！１図はこの発明の一実施例を示す概略図、第２図は第
１図実施例において良品瓶につき瓶口の側方から瓶口を
見た状態を示す図、第３図は第１図実施例の電子回路ブ
ロック図、第４図はこの発明の適用例を示す概略図であ
る。
ｌＦｉ瓶、２．８Ｆｉランプ、３は瓶口、４．９Ｖｉ光
源ボツクス、５．１０は光拡散板、６Ｆｉ迩光板、７．
４１．４４．４７．５０はカメラ、１２は検出回路、１
３Ｆ１波形整形回路、１４＃ｉコンピユータ、１５Ｆｉ
メモリ、４０Ｆｉコンベア、４２．４３．４５．４６．
４８．４９．５１．５ｚＦｉ光源である。
出願人 サントリー株式会社! Figure 1 is a schematic diagram showing one embodiment of the present invention, Figure 2 is a diagram showing a good bottle in the embodiment of Figure 1, as seen from the side of the bottle mouth, and Figure 3 is a diagram similar to Figure 1. FIG. 4, an electronic circuit block diagram of the embodiment, is a schematic diagram showing an example of application of the present invention. 1Fi bottle, 2.8Fi lamp, 3 is bottle mouth, 4.9Vi light source box, 5.10 is light diffusion plate, 6Fi light plate, 7.
41.44.47.50 is a camera, 12 is a detection circuit, 1
3F1 waveform shaping circuit, 14#i computer, 15Fi
Memory, 40Fi conveyor, 42.43.45.46.
48.49.51.5zFi light source. Applicant Suntory Ltd.
Claims (1)
第２の光源を設け、前記第１の光源よシの光線を前記瓶
口上表面に照射し、前記第２の光源よ抄の光線を前記瓶
口の側部に照射し、前記瓶口上表面に照射され反射され
る光線と、前記瓶口側部に照射され、反射される光線を
瓶口の横近傍に設けられる一次元走査カメラで受光して
電気信号に変換し、この変換された電気信号のパターン
とあらかじめ設定した良品瓶の信号パターンを比較する
ことにより瓶の良否を判定す為瓶類の検査方法。A first light source is provided on the upper surface of the bottle mouth, a second light source is provided on a substantially oblique side of the bottle mouth, a light beam from the first light source is irradiated onto the upper surface of the bottle mouth, and the second light source is provided on the upper surface of the bottle mouth. A light beam from a light source is irradiated onto the side of the bottle mouth, and a light ray that is irradiated and reflected on the upper surface of the bottle mouth and a light ray that is irradiated and reflected on the side of the bottle mouth are provided near the side of the bottle mouth. A method of inspecting bottles that detects light with a one-dimensional scanning camera and converts it into an electrical signal, and then compares the pattern of the converted electrical signal with a preset signal pattern for non-defective bottles to determine the quality of the bottle.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56100041A JPS58744A (en) | 1981-06-26 | 1981-06-26 | Inspecting method of bottle or the like |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56100041A JPS58744A (en) | 1981-06-26 | 1981-06-26 | Inspecting method of bottle or the like |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58744A true JPS58744A (en) | 1983-01-05 |
| JPH0432340B2 JPH0432340B2 (en) | 1992-05-29 |
Family
ID=14263430
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56100041A Granted JPS58744A (en) | 1981-06-26 | 1981-06-26 | Inspecting method of bottle or the like |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58744A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0697592A1 (en) * | 1994-08-19 | 1996-02-21 | Owens-Brockway Glass Container Inc. | Inspection of transparent containers |
| WO2012172695A1 (en) * | 2011-06-15 | 2012-12-20 | キリンテクノシステム株式会社 | Method and device for inspecting glass bottle |
| JP2014224807A (en) * | 2013-04-19 | 2014-12-04 | キリンテクノシステム株式会社 | Container inspection method and container inspection device |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5198587U (en) * | 1975-02-06 | 1976-08-07 | ||
| JPS51108881A (en) * | 1975-03-20 | 1976-09-27 | Yamamura Glass Co Ltd | GARASUBINNOCHOBUKENSAHOHOTO SONOSOCHI |
| JPS52139483A (en) * | 1976-05-18 | 1977-11-21 | Mitsubishi Electric Corp | Tester for glass bottle or the like |
-
1981
- 1981-06-26 JP JP56100041A patent/JPS58744A/en active Granted
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5198587U (en) * | 1975-02-06 | 1976-08-07 | ||
| JPS51108881A (en) * | 1975-03-20 | 1976-09-27 | Yamamura Glass Co Ltd | GARASUBINNOCHOBUKENSAHOHOTO SONOSOCHI |
| JPS52139483A (en) * | 1976-05-18 | 1977-11-21 | Mitsubishi Electric Corp | Tester for glass bottle or the like |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0697592A1 (en) * | 1994-08-19 | 1996-02-21 | Owens-Brockway Glass Container Inc. | Inspection of transparent containers |
| WO2012172695A1 (en) * | 2011-06-15 | 2012-12-20 | キリンテクノシステム株式会社 | Method and device for inspecting glass bottle |
| JPWO2012172695A1 (en) * | 2011-06-15 | 2015-02-23 | キリンテクノシステム株式会社 | Inspection method and apparatus for glass bottle |
| US9147241B2 (en) | 2011-06-15 | 2015-09-29 | Kirin Techno-System Company, Limited | Glass bottle inspection method and apparatus |
| JP2014224807A (en) * | 2013-04-19 | 2014-12-04 | キリンテクノシステム株式会社 | Container inspection method and container inspection device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0432340B2 (en) | 1992-05-29 |
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