JPH043820B2 - - Google Patents

Info

Publication number
JPH043820B2
JPH043820B2 JP25284085A JP25284085A JPH043820B2 JP H043820 B2 JPH043820 B2 JP H043820B2 JP 25284085 A JP25284085 A JP 25284085A JP 25284085 A JP25284085 A JP 25284085A JP H043820 B2 JPH043820 B2 JP H043820B2
Authority
JP
Japan
Prior art keywords
bottle
image
imaging
imaging system
bottle opening
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP25284085A
Other languages
Japanese (ja)
Other versions
JPS62113050A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP25284085A priority Critical patent/JPS62113050A/en
Publication of JPS62113050A publication Critical patent/JPS62113050A/en
Publication of JPH043820B2 publication Critical patent/JPH043820B2/ja
Granted legal-status Critical Current

Links

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明はびん口部検査装置、さらに詳しくは
直線ライン上を搬送されるびんに対してその側部
より照明を当て、びん口部をその天面より撮像
し、これを画像処理することにより欠けやビリ
(ガラス内部に形成される割れ)等の欠陥検査を
行なう検査装置に関する。
[Detailed Description of the Invention] [Field of Industrial Application] The present invention relates to a bottle opening inspection device, and more specifically, a bottle opening inspection device that illuminates a bottle conveyed on a straight line from the side and inspects the bottle opening. The present invention relates to an inspection device that inspects defects such as chips and burrs (cracks formed inside glass) by capturing an image from the top surface and processing the image.

〔従来の技術〕[Conventional technology]

従来、この種の検査装置として、フオトセンサ
をびん口部近傍に配置し、センサ位置でびんを回
転させてその全面を検査するもの、またはびん口
部を天面上部からリング状に照明し、同じく天面
上部からテレビカメラ等にて撮像し、その撮像画
像をもとに検査を行なうもの等が知られている。
Conventionally, this type of inspection equipment has either placed a photo sensor near the bottle mouth and rotated the bottle at the sensor position to inspect the entire surface of the bottle, or illuminated the bottle mouth in a ring shape from the top of the top, and There are known devices in which an image is captured from the upper part of the top surface using a television camera or the like, and an inspection is performed based on the captured image.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

しかしながら、前者の装置ではびんを回転させ
るための機構が必要であり、その処理速度が遅い
という問題がある(150BPM〔本/分〕程度)。ま
た、びん種別毎に回転、搬送機構の切換やセンサ
の位置調整等に手間が掛かる等の問題もある。
However, the former device requires a mechanism to rotate the bottles, and has the problem of slow processing speed (approximately 150 BPM [bottles/min]). Further, there are also problems such as the need for time and effort in switching the rotation and conveyance mechanism, adjusting the sensor position, etc. for each type of bottle.

一方、後者の装置では次のような問題がある。
つまり、びん口天面は必ずしも滑らかではなく、
また或る曲率を持つものが多いため、天面全体を
一様に照明することは困難であり、したがつて欠
陥を同一の条件下で検査することは難かしい。特
に、ガラス内部に形成された割れ、つまりビリは
天面上方からの照明では殆んど画像として捉えら
れないのが普通である。
On the other hand, the latter device has the following problems.
In other words, the top surface of the bottle mouth is not necessarily smooth;
Furthermore, since many of them have a certain curvature, it is difficult to uniformly illuminate the entire top surface, and therefore it is difficult to inspect for defects under the same conditions. In particular, cracks, or burrs, formed inside the glass are usually hardly visible when illuminated from above the top surface.

したがつて、この発明はびんを回転させるなど
の複雑な機構を必要とせず、またびん形状が変わ
つても容易に対処することができ、しかも高速な
検査が可能で、その上欠陥がびん口部のいずれに
あつても、また如何なる欠陥でも充分に検出する
ことができる検査装置を提供することを目的とす
る。
Therefore, this invention does not require a complicated mechanism such as rotating the bottle, can easily handle changes in bottle shape, can be inspected at high speed, and can detect defects in the bottle opening. It is an object of the present invention to provide an inspection device capable of sufficiently detecting any defects in any part.

〔問題点を解決するための手段〕[Means for solving problems]

所定の方向に搬送され略円形状のびん口部をも
つびんの搬送方向に対して所定の角度をもつ両側
部から該びん口部を照明する1対の照明手段と該
びん口部をその上部から撮像する撮像手段とから
なる第1の撮像系と、該撮像系と同様に構成され
その照明手段による光の照射軸が第1撮像系のそ
れと略90度異なる第2の撮像系と、撮像信号の2
値化手段および特徴量抽出手段ならびにびん口部
の光で直接照射される部分をマスクするマスク手
段をもつ画像処理装置とを設ける。
A pair of illumination means for illuminating the bottle opening from both sides at a predetermined angle with respect to the direction of conveyance of a bottle having a substantially circular bottle opening that is transported in a predetermined direction; a first imaging system consisting of an imaging means for taking an image from the first imaging system; a second imaging system which is configured similarly to the imaging system and whose light irradiation axis by the illumination means differs by approximately 90 degrees from that of the first imaging system; Signal 2
An image processing device having a value converting means, a feature extracting means, and a masking means for masking a portion of the bottle opening that is directly irradiated with light is provided.

〔作用〕[Effect]

上記画像処理装置により第1,第2撮像系から
の撮像信号をそれぞれ2値化し、適宜な特徴量を
抽出してびん口部の光で直接照射される部分をマ
スクし、マスクされない部分の特徴量、例えば面
積値から欠けやビリ等の欠陥を高速かつ高速度に
検出する。
The image processing device binarizes the imaging signals from the first and second imaging systems, extracts appropriate feature quantities, masks the part of the bottle mouth that is directly irradiated with light, and features the parts that are not masked. Defects such as chips and cracks can be detected at high speed based on quantity, for example, area value.

〔実施例〕〔Example〕

第1図はこの発明の実施例を示す概要図で、同
図イはその上面図、ロはその側面図である。な
お、同図において、1は画像処理装置、21,2
2はテレビカメラの如き撮像装置、3はびん、4
1〜44は照明器である。
FIG. 1 is a schematic diagram showing an embodiment of the present invention, in which A is a top view and B is a side view. In addition, in the figure, 1 is an image processing device, 21, 2
2 is an imaging device such as a television camera, 3 is a bottle, 4
1 to 44 are illuminators.

動作を説明する。 Explain the operation.

まず、びん3は搬送ラインLN上を矢印Rの方
向に直接搬送される。その搬送途中には搬送方向
に対して照射軸が例えば45度となるような1対の
照明器41と42、43と44が2組設けられ、
これによりびん口部Bの側面が照明される。した
がつて、照明器41と42および照明器43と4
4によつて形成される光の照射方向は互いに直交
し、光が直接当たる部分(この部分は光が直接反
射して欠陥検査ができないので、マスク部と呼ぶ
ことにする。)と当たらない部分(この部分は正
常ならば反射がなく、欠陥があるときのみ反射が
得られるので、この部分を欠陥検査エリアAと呼
ぶことにする。)とが互いに90度ずれることにな
るため、両者の欠陥検査エリアを合わせることに
より、びん口部全体を検査することができる。テ
レビカメラ21,22はそれぞれの位置に対応し
て1つずつ設けられ、びん口部Bを撮像する。画
像処理装置1はテレビカメメラ21,22からの
撮像信号を順次処理し、欠陥検査を行なう。
First, the bottle 3 is directly transported in the direction of arrow R on the transport line LN. Two pairs of illuminators 41 and 42, and 43 and 44, whose irradiation axes are at an angle of, for example, 45 degrees with respect to the transport direction, are provided during the transport.
As a result, the side surface of the bottle opening B is illuminated. Therefore, illuminators 41 and 42 and illuminators 43 and 4
The irradiation directions of the light formed by 4 are orthogonal to each other, and there is a part that is directly hit by the light (this part is called a mask part because the light is directly reflected and cannot be inspected for defects) and a part that is not hit by the light. (If this part is normal, there will be no reflection, and reflection will be obtained only when there is a defect, so this part will be referred to as defect inspection area A.) By combining the inspection areas, the entire bottle opening can be inspected. One television camera 21, 22 is provided corresponding to each position, and images the bottle opening B. The image processing device 1 sequentially processes imaging signals from television cameras 21 and 22 and performs defect inspection.

第2図はびん口部を照明する照明器とびん口部
からの反射光との関係を説明するための参照図で
ある。なお、同図イは上面図、同ロは側面図であ
る。
FIG. 2 is a reference diagram for explaining the relationship between the illuminator that illuminates the bottle mouth and the light reflected from the bottle mouth. Note that A in the figure is a top view and B is a side view.

すなわち、同図イの如くびん口部Bを所定方向
の両側部から照明すると、同図ロに示すように、
光が直接当たる部分(マスク部)では直接反射光
Lpを生じるが、それと直交する部分(欠陥検査
エリア)Aでは正常ならば反射光は殆んどなく、
欠けやビリなどの欠陥Fがあるときのみ欠陥断面
部で上方に向かう反射光Lfを生じることがわか
る。
That is, when the bottle opening B is illuminated from both sides in a predetermined direction as shown in FIG.
Directly reflected light in the area directly exposed to light (mask area)
Lp is generated, but in the part (defect inspection area) A perpendicular to it, there is almost no reflected light if it is normal.
It can be seen that only when there is a defect F such as a chip or a crack, upward reflected light L f is generated at the defect cross section.

第3図は画像処理装置の具体例を示すブロツク
図である。こゝに、10はアナログ/デイジタル
(A/D)変換部、11は画像位置検出部、12
はマスク発生部、13は画像メモリ、14は欠陥
画像検出部、15はマイクロプロセツサの如き演
算処理部である。
FIG. 3 is a block diagram showing a specific example of an image processing apparatus. Here, 10 is an analog/digital (A/D) converter, 11 is an image position detector, and 12 is an analog/digital (A/D) converter.
13 is a mask generation section, 13 is an image memory, 14 is a defective image detection section, and 15 is an arithmetic processing section such as a microprocessor.

こゝで、びん口部Bの画像が第4図の如く示さ
れる場合の処理動作について説明する。
The processing operation when the image of the bottle opening B is shown as shown in FIG. 4 will now be described.

まず、テレビカメメラ21,22からのアナロ
グ画像はA/D変換部10により、その濃淡レベ
ルに応じた白、黒または明、暗2値の画像に変換
され、画像メモリ13に記憶される。第4図はこ
のときの画像データをアナログ的に示したもので
ある。このとき、照明器による光の照射方向が図
示の如くであるとすると、画像位置検出部11で
は撮像画面Gの第1象限、第3象限におい
て、それぞれ暗から明,明から暗への変化点位置
Cd,Clと各水平走査線HS毎の明部(反射部)の
画像幅データを抽出する。なお、このときの明画
像幅データは、第4図にW1,W3の如く示され
る。演算処理部15は画像位置検出部11からの
明画像幅データを積算してその面積2分位置DI
を求めるとともに、この水平走査線位置(DI)
における画像の変化点位置データCd,Clから明部
画像の中心位置Ppを求める。マスク発生部12は
演算処理部15からの中心位置データにもとづい
て第4図の如き四角形のマスク領域MAを形成す
る。欠換画像検出部14はこのマスク領域MAを
除く領域、すなわち欠陥検査エリアAにおける画
像面積を抽出する。このとき、正常ならば欠陥検
出部14による面積抽出値は略零であるが、欠け
やビリ等の欠陥Fがあるときは、その部分からの
反射光による面積値が抽出される。したがつて、
演算処理部15によりこの面積値データを所定の
設定値と比較する等すれば、欠陥があるか否かを
判別することができる。
First, analog images from the television cameras 21 and 22 are converted by the A/D converter 10 into white, black, or bright/dark binary images according to their gray level, and are stored in the image memory 13. FIG. 4 shows the image data at this time in analog form. At this time, assuming that the direction of light irradiation from the illuminator is as shown in the figure, the image position detection unit 11 detects the points of change from dark to bright and from bright to dark in the first and third quadrants of the image capture screen G, respectively. position
C d , C l and the image width data of the bright area (reflection area) for each horizontal scanning line HS are extracted. The bright image width data at this time are shown as W 1 and W 3 in FIG. 4. The arithmetic processing unit 15 integrates the bright image width data from the image position detection unit 11 and calculates the area 2 minutes position DI.
In addition to finding this horizontal scanning line position (DI)
The center position P p of the bright image is determined from the change point position data C d and C l of the image at . The mask generating section 12 forms a rectangular mask area MA as shown in FIG. 4 based on the center position data from the arithmetic processing section 15. The defective image detection unit 14 extracts the image area in the area excluding the mask area MA, that is, the defect inspection area A. At this time, if it is normal, the area extraction value by the defect detection unit 14 is approximately zero, but if there is a defect F such as a chip or a crack, the area value based on the reflected light from that part is extracted. Therefore,
If the arithmetic processing unit 15 compares this area value data with a predetermined set value, it can be determined whether or not there is a defect.

その後、光の照射方向を変えて上記と同様の処
理を行ない、両者の判定結果を総合しびん口部全
体の検査を終了する。このとき、第4図の第2象
限,第4象限がマスク部となり、第1象限
,第3象限が欠陥検査エリアとなることは云
う迄もない。
Thereafter, the same process as above is performed by changing the direction of light irradiation, and the results of both judgments are combined to complete the inspection of the entire bottle opening. At this time, it goes without saying that the second and fourth quadrants in FIG. 4 become the mask portion, and the first and third quadrants become the defect inspection areas.

〔発明の効果〕〔Effect of the invention〕

この発明によれば、びんを直線搬送させ、びん
口側面より照明し、天面上方からテレビカメラ等
により撮像して検査を行なうに当たり、1対2組
の照明器をその照射軸が互いに直交するように配
置し、直接反射して欠陥検出ができない領域を互
いに補ない合つてびん口部全体を検査できるよう
にしたので、びんを回転させる等の特別な機構が
不要となり、その結果、搬送機構が容易になると
ともにシステム全体の構成が簡略化される利点が
もたらされる。また、直線搬送させるだけである
から、びん形状が変わつてもその切換作業が容易
であるという利点もある。さらに、びん口部をそ
の側面部より照射し、欠陥部断面による反射光を
利用するようにしているので、びん口部の平滑度
やその曲率に関係なく検査ができ、高精度の検査
が可能となる。また、直接反射部の画像中心を求
めてこれをマスクし、このマスク領域以外の検査
エリアで画像の面積値を抽出して欠陥があるか否
かを判定するようにしているため特に複雑な演算
処理を必要とせず、高速処理が可能となる。
According to this invention, when inspecting a bottle by transporting the bottle in a straight line, illuminating it from the side of the bottle mouth, and capturing an image from above the top surface using a television camera, etc., two sets of illuminators are arranged so that their irradiation axes are orthogonal to each other. As a result, a special mechanism such as rotating the bottle is not required, and as a result, the conveyance mechanism This has the advantage that it becomes easy to use, and the configuration of the entire system is simplified. Further, since the bottle is simply conveyed in a straight line, there is an advantage that even if the bottle shape changes, it is easy to change the bottle shape. Furthermore, since the bottle mouth is illuminated from the side surface and the light reflected from the cross section of the defect is used, inspection can be performed regardless of the smoothness or curvature of the bottle mouth, making it possible to perform highly accurate inspections. becomes. In addition, since the center of the image of the direct reflection part is found and masked, and the area value of the image is extracted in the inspection area other than this masked area to determine whether there is a defect, it requires particularly complex calculations. High-speed processing is possible without the need for processing.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明の実施例を示す概要図、第2
図はびん口部を照明する照明器とびん口部からの
反射光との関係を説明するための参照図、第3図
は画像処理装置の具体例を示すブロツク図、第4
図はこの発明による画像処理方法を説明するため
の参照図である。 符号説明、1……画像処理装置、21,22…
…テレビカメラ、3……びん、41〜44……照
明器、10……A/D変換部、11……画像位置
検出部、12……マスク発生部、13……画像メ
モリ、14……欠陥画像検出部、15……演算処
理部、A……欠陥検査エリア、B……びん口部、
P……マスク部、MA……マスクエリア、Pp……
画像中心位置、Cd,Cl……変化点位置、W1,W3
……明画像幅データ、F……欠陥、G……撮像画
面。
Figure 1 is a schematic diagram showing an embodiment of this invention, Figure 2 is a schematic diagram showing an embodiment of this invention.
The figure is a reference diagram for explaining the relationship between the illuminator that illuminates the bottle mouth and the light reflected from the bottle mouth. Figure 3 is a block diagram showing a specific example of the image processing device.
The figure is a reference diagram for explaining the image processing method according to the present invention. Description of symbols, 1... Image processing device, 21, 22...
...TV camera, 3...Bottles, 41-44...Illuminator, 10...A/D conversion section, 11...Image position detection section, 12...Mask generation section, 13...Image memory, 14... Defect image detection unit, 15... Arithmetic processing unit, A... Defect inspection area, B... Bottle mouth part,
P...Mask part, MA...Mask area, P p ...
Image center position, C d , C l ... Change point position, W 1 , W 3
... Bright image width data, F ... Defect, G ... Imaging screen.

Claims (1)

【特許請求の範囲】 1 所定の方向に搬送され略円形状のびん口部を
もつびんの搬送方向に対して所定の角度をもつ両
側部から該びん口部を照明する1対の照明手段と
該びん口部をその上部から撮像する撮像手段とか
らなる第1の撮像系と、該第1撮像系と同様に構
成されその照明手段による光の照射軸が第1撮像
系のそれと略90度異なる第2の撮像系とを備え、
該第1,第2撮像系からの撮像信号を画像処理装
置にて順次処理することによりびん口部の欠陥を
検査する検査装置であつて、 該画像処理装置は少なくとも、 前記撮像信号を所定のレベルで2値化する2値
化手段と、 該2値化画像から所定の特徴量を抽出する特徴
量抽出手段と、 該特徴量にもとづいて前記びん口部の光で直接
照射される部分をマスクするマスク設定手段と、 を有し、びん口部のマスク領域以外の部分の特徴
量からその欠陥を検査することを特徴とするびん
口部検査装置。
[Scope of Claims] 1. A pair of illumination means for illuminating the bottle opening from both sides at a predetermined angle with respect to the conveyance direction of a bottle that is conveyed in a predetermined direction and has a substantially circular bottle opening; a first imaging system consisting of an imaging means for taking an image of the bottle opening from above; and a first imaging system configured similarly to the first imaging system, the axis of light irradiation by the illumination means being approximately 90 degrees from that of the first imaging system. and a different second imaging system,
An inspection device that inspects defects in a bottle opening by sequentially processing imaging signals from the first and second imaging systems in an image processing device, the image processing device at least processing the imaging signals into a predetermined format. a binarization means for binarizing the binarized image; a feature extracting means for extracting a predetermined feature from the binarized image; and a feature extracting means for extracting a predetermined feature from the binarized image; 1. A bottle mouth inspection device, comprising: mask setting means for masking, and inspecting defects from feature amounts of a portion of the bottle mouth other than the masked area.
JP25284085A 1985-11-13 1985-11-13 Bottle mouth inspection system Granted JPS62113050A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP25284085A JPS62113050A (en) 1985-11-13 1985-11-13 Bottle mouth inspection system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP25284085A JPS62113050A (en) 1985-11-13 1985-11-13 Bottle mouth inspection system

Publications (2)

Publication Number Publication Date
JPS62113050A JPS62113050A (en) 1987-05-23
JPH043820B2 true JPH043820B2 (en) 1992-01-24

Family

ID=17242916

Family Applications (1)

Application Number Title Priority Date Filing Date
JP25284085A Granted JPS62113050A (en) 1985-11-13 1985-11-13 Bottle mouth inspection system

Country Status (1)

Country Link
JP (1) JPS62113050A (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5486692A (en) * 1994-10-19 1996-01-23 Emhart Glass Machinery Investments Inc. Glassware inspection machine comprising diffused light sources and two-dimensional cameras
JP4227272B2 (en) * 1999-08-11 2009-02-18 株式会社エヌテック Inspection device for articles using light of different wavelengths
US6903814B1 (en) 2003-03-05 2005-06-07 Owens-Brockway Glass Container Inc. Container sealing surface inspection
JP4288104B2 (en) * 2003-05-22 2009-07-01 株式会社エヌテック Inspection method for top of container
JP2007187615A (en) * 2006-01-16 2007-07-26 Kirin Techno-System Corp Illumination device for inspection

Also Published As

Publication number Publication date
JPS62113050A (en) 1987-05-23

Similar Documents

Publication Publication Date Title
JPH04166751A (en) Method and apparatus for inspecting defect in bottle and the like
GB2180932A (en) Bottle mouth defect inspection apparatus
US7317524B2 (en) Method and device for detecting surface defects on the neck ring of a transparent or translucent container of revolution
JPH0634573A (en) Bottle inspector
JPH043820B2 (en)
JP3155106B2 (en) Bottle seal appearance inspection method and apparatus
JPH07104290B2 (en) Bottle inspection equipment
JPS59135353A (en) Surface flaw detecting apparatus
JPH04265847A (en) Surface defect inspecting apparatus
JPH0634575A (en) Bottle inspection method
JPH06160289A (en) Inner face inspection equipment for circular vessel
JP4723894B2 (en) Glass bottle thread inspection device and inspection method
JP3682249B2 (en) Glass bottle thread inspection device
JPH0299806A (en) Inspection of surface defect
JPH04270951A (en) Method for inspecting bottle
JPH0968504A (en) Method and device for inspection of appearance of bottle mouth
JPH0324447A (en) Bottle-mouth inspecting method
JPS63222246A (en) Defect inspector for bottle mouth thread part
JPH07104289B2 (en) Bottle mouth inspection device
JPS6027064B2 (en) Label front and back inspection device
JPH0432340B2 (en)
JP2000055827A (en) Method and device for inspecting mouth part of glass container, etc.
JPS61283857A (en) Surface defect detection
JPH06100551B2 (en) Defect detection method
JPH0564857B2 (en)