JPS5862575A - 半導体集積回路の試験方法 - Google Patents

半導体集積回路の試験方法

Info

Publication number
JPS5862575A
JPS5862575A JP56161725A JP16172581A JPS5862575A JP S5862575 A JPS5862575 A JP S5862575A JP 56161725 A JP56161725 A JP 56161725A JP 16172581 A JP16172581 A JP 16172581A JP S5862575 A JPS5862575 A JP S5862575A
Authority
JP
Japan
Prior art keywords
integrated circuit
capacitor
circuit
large capacity
charging
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56161725A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0228833B2 (enrdf_load_stackoverflow
Inventor
Kazuo Saito
一男 斉藤
Masanori Tokunaga
徳永　政則
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electronics Corp
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electronics Corp, Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electronics Corp
Priority to JP56161725A priority Critical patent/JPS5862575A/ja
Publication of JPS5862575A publication Critical patent/JPS5862575A/ja
Publication of JPH0228833B2 publication Critical patent/JPH0228833B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP56161725A 1981-10-09 1981-10-09 半導体集積回路の試験方法 Granted JPS5862575A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56161725A JPS5862575A (ja) 1981-10-09 1981-10-09 半導体集積回路の試験方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56161725A JPS5862575A (ja) 1981-10-09 1981-10-09 半導体集積回路の試験方法

Publications (2)

Publication Number Publication Date
JPS5862575A true JPS5862575A (ja) 1983-04-14
JPH0228833B2 JPH0228833B2 (enrdf_load_stackoverflow) 1990-06-26

Family

ID=15740690

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56161725A Granted JPS5862575A (ja) 1981-10-09 1981-10-09 半導体集積回路の試験方法

Country Status (1)

Country Link
JP (1) JPS5862575A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6350072U (enrdf_load_stackoverflow) * 1986-09-20 1988-04-05

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6350072U (enrdf_load_stackoverflow) * 1986-09-20 1988-04-05

Also Published As

Publication number Publication date
JPH0228833B2 (enrdf_load_stackoverflow) 1990-06-26

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