JPS5862547A - 欠点検出装置 - Google Patents

欠点検出装置

Info

Publication number
JPS5862547A
JPS5862547A JP16185881A JP16185881A JPS5862547A JP S5862547 A JPS5862547 A JP S5862547A JP 16185881 A JP16185881 A JP 16185881A JP 16185881 A JP16185881 A JP 16185881A JP S5862547 A JPS5862547 A JP S5862547A
Authority
JP
Japan
Prior art keywords
signal
level
counter
output
scanning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16185881A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0350216B2 (enrdf_load_stackoverflow
Inventor
Kazuo Mikasa
三笠 一男
Kenji Hagino
健次 萩野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
Original Assignee
Tateisi Electronics Co
Omron Tateisi Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tateisi Electronics Co, Omron Tateisi Electronics Co filed Critical Tateisi Electronics Co
Priority to JP16185881A priority Critical patent/JPS5862547A/ja
Publication of JPS5862547A publication Critical patent/JPS5862547A/ja
Publication of JPH0350216B2 publication Critical patent/JPH0350216B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/93Detection standards; Calibrating baseline adjustment, drift correction

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP16185881A 1981-10-09 1981-10-09 欠点検出装置 Granted JPS5862547A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16185881A JPS5862547A (ja) 1981-10-09 1981-10-09 欠点検出装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16185881A JPS5862547A (ja) 1981-10-09 1981-10-09 欠点検出装置

Publications (2)

Publication Number Publication Date
JPS5862547A true JPS5862547A (ja) 1983-04-14
JPH0350216B2 JPH0350216B2 (enrdf_load_stackoverflow) 1991-08-01

Family

ID=15743289

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16185881A Granted JPS5862547A (ja) 1981-10-09 1981-10-09 欠点検出装置

Country Status (1)

Country Link
JP (1) JPS5862547A (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPH0350216B2 (enrdf_load_stackoverflow) 1991-08-01

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