JPS5862252U - 表面検査装置 - Google Patents
表面検査装置Info
- Publication number
- JPS5862252U JPS5862252U JP15637281U JP15637281U JPS5862252U JP S5862252 U JPS5862252 U JP S5862252U JP 15637281 U JP15637281 U JP 15637281U JP 15637281 U JP15637281 U JP 15637281U JP S5862252 U JPS5862252 U JP S5862252U
- Authority
- JP
- Japan
- Prior art keywords
- output
- surface inspection
- comparator
- detection section
- activated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15637281U JPS5862252U (ja) | 1981-10-22 | 1981-10-22 | 表面検査装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15637281U JPS5862252U (ja) | 1981-10-22 | 1981-10-22 | 表面検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5862252U true JPS5862252U (ja) | 1983-04-26 |
JPH0125311Y2 JPH0125311Y2 (enrdf_load_stackoverflow) | 1989-07-28 |
Family
ID=29948915
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15637281U Granted JPS5862252U (ja) | 1981-10-22 | 1981-10-22 | 表面検査装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5862252U (enrdf_load_stackoverflow) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5434290A (en) * | 1977-08-22 | 1979-03-13 | Omron Tateisi Electronics Co | Defect inspecting apparatus |
JPS5535276A (en) * | 1978-09-04 | 1980-03-12 | Nippon Steel Corp | Edge pin-hole detector |
JPS5557137A (en) * | 1978-10-19 | 1980-04-26 | Agfa Gevaert Nv | Method and device for checking about linear defects of moving sheet material |
-
1981
- 1981-10-22 JP JP15637281U patent/JPS5862252U/ja active Granted
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5434290A (en) * | 1977-08-22 | 1979-03-13 | Omron Tateisi Electronics Co | Defect inspecting apparatus |
JPS5535276A (en) * | 1978-09-04 | 1980-03-12 | Nippon Steel Corp | Edge pin-hole detector |
JPS5557137A (en) * | 1978-10-19 | 1980-04-26 | Agfa Gevaert Nv | Method and device for checking about linear defects of moving sheet material |
Also Published As
Publication number | Publication date |
---|---|
JPH0125311Y2 (enrdf_load_stackoverflow) | 1989-07-28 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
SE8802865L (sv) | Foerfarande foer avbildning av ett snabbroerligt objekt medelst ett videofoerfarande | |
JPS5862252U (ja) | 表面検査装置 | |
JPS5863614U (ja) | 表面検査装置の照明制御装置 | |
JPS5891746U (ja) | 縮小投影露光装置 | |
JPS59144410U (ja) | 熱間鋼板の平面形状測定装置 | |
JPS5824037U (ja) | サ−モグラフイ装置 | |
JPS59120049U (ja) | 薄板金属製造設備のノズルギヤツプ測定装置 | |
JPS60125594U (ja) | レ−ザ追尾装置 | |
JPS59135407U (ja) | イメ−ジセンサによる巾寸法測定装置 | |
JPS608804U (ja) | 表面検査装置 | |
JPS59149121U (ja) | スチ−ルカメラ自動合焦装置 | |
JPS58115208U (ja) | Ct装置 | |
JPS60109029U (ja) | レ−ザ被照射検出装置 | |
JPS58135168U (ja) | 特殊効果装置 | |
JPH02115152U (enrdf_load_stackoverflow) | ||
JPS6054954U (ja) | 微粒子検出装置 | |
JPS5872609U (ja) | フイルムの厚み測定装置 | |
JPS5921744U (ja) | レンズの比像面照度測定装置 | |
JPS5985952U (ja) | スラブプロフイル計 | |
JPS5985960U (ja) | 速度ベクトル検出装置 | |
JPS5834281U (ja) | 走査透過電子顕微鏡用暗視野像検出装置 | |
JPS58113037U (ja) | スクリ−ン内蔵型画像投影機 | |
JPS6035207U (ja) | ごみ山の高さ検出装置 | |
JPS60172476U (ja) | 画像表示装置 | |
JPS5864172U (ja) | テレビカメラのバツクフオ−カス調整装置 |