JPS5860851U - Sample holder in electron microscope - Google Patents

Sample holder in electron microscope

Info

Publication number
JPS5860851U
JPS5860851U JP15659281U JP15659281U JPS5860851U JP S5860851 U JPS5860851 U JP S5860851U JP 15659281 U JP15659281 U JP 15659281U JP 15659281 U JP15659281 U JP 15659281U JP S5860851 U JPS5860851 U JP S5860851U
Authority
JP
Japan
Prior art keywords
sample holder
electron microscope
sample
optical axis
tilting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15659281U
Other languages
Japanese (ja)
Inventor
畑 喬雄
Original Assignee
日本電子株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本電子株式会社 filed Critical 日本電子株式会社
Priority to JP15659281U priority Critical patent/JPS5860851U/en
Publication of JPS5860851U publication Critical patent/JPS5860851U/en
Pending legal-status Critical Current

Links

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例を示す平面断面図、第2図は
第1図のA−A断面図、第3図は本考案の動作を説明す
るための図である。 1:試料ホルダー、2:鏡体、3:上磁極、4:下磁極
、5:開口部、6:試料、7:回転棒、8:穴、9:嫡
子、13,14:偏向コイル。
FIG. 1 is a plan sectional view showing an embodiment of the present invention, FIG. 2 is a sectional view taken along the line AA in FIG. 1, and FIG. 3 is a diagram for explaining the operation of the present invention. 1: sample holder, 2: mirror body, 3: upper magnetic pole, 4: lower magnetic pole, 5: opening, 6: sample, 7: rotating rod, 8: hole, 9: legitimate child, 13, 14: deflection coil.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 試料を光軸と直交する方向から挿入するための試料ホル
ダーと、該試料ホルダーを固定した状態でm記試料表面
を水平状態から電子線の光軸と略平行な位置まで傾動さ
せるための手段とからなる電子顕微鏡における試料装置
A sample holder for inserting the sample from a direction perpendicular to the optical axis; and means for tilting the m sample surface from a horizontal state to a position substantially parallel to the optical axis of the electron beam with the sample holder fixed. A sample device in an electron microscope consisting of:
JP15659281U 1981-10-21 1981-10-21 Sample holder in electron microscope Pending JPS5860851U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15659281U JPS5860851U (en) 1981-10-21 1981-10-21 Sample holder in electron microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15659281U JPS5860851U (en) 1981-10-21 1981-10-21 Sample holder in electron microscope

Publications (1)

Publication Number Publication Date
JPS5860851U true JPS5860851U (en) 1983-04-23

Family

ID=29949126

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15659281U Pending JPS5860851U (en) 1981-10-21 1981-10-21 Sample holder in electron microscope

Country Status (1)

Country Link
JP (1) JPS5860851U (en)

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