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Toray Industries Inc
Original Assignee
Toray Industries Inc
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Publication date
Application filed by Toray Industries IncfiledCriticalToray Industries Inc
Priority to JP48050317ApriorityCriticalpatent/JPS5858645B2/ja
Publication of JPS502554ApublicationCriticalpatent/JPS502554A/ja
Publication of JPS5858645B2publicationCriticalpatent/JPS5858645B2/ja
Multi-beam scanning method, apparatus and multi-beam light source device achieving improved scanning line pitch using large light emitting points interval