JPS5852689Y2 - Metal support for semiconductor devices - Google Patents

Metal support for semiconductor devices

Info

Publication number
JPS5852689Y2
JPS5852689Y2 JP1977049208U JP4920877U JPS5852689Y2 JP S5852689 Y2 JPS5852689 Y2 JP S5852689Y2 JP 1977049208 U JP1977049208 U JP 1977049208U JP 4920877 U JP4920877 U JP 4920877U JP S5852689 Y2 JPS5852689 Y2 JP S5852689Y2
Authority
JP
Japan
Prior art keywords
lead
element fixing
metal body
mounting hole
fixing part
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1977049208U
Other languages
Japanese (ja)
Other versions
JPS53143563U (en
Inventor
武則 横田
洋輔 岡本
正勝 武谷
Original Assignee
松下電器産業株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 松下電器産業株式会社 filed Critical 松下電器産業株式会社
Priority to JP1977049208U priority Critical patent/JPS5852689Y2/en
Publication of JPS53143563U publication Critical patent/JPS53143563U/ja
Application granted granted Critical
Publication of JPS5852689Y2 publication Critical patent/JPS5852689Y2/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/4912Layout
    • H01L2224/49171Fan-out arrangements

Description

【考案の詳細な説明】 本考案は、半導体装置の電極構造特にトランスファー・
モールド封止される半導体装置の金属電極支持体に関す
るものである。
[Detailed Description of the Invention] The present invention is directed to the electrode structure of a semiconductor device, especially the transfer
The present invention relates to a metal electrode support for a semiconductor device that is mold-sealed.

半導体装置、たとえばトランジスタやダイオードはモー
ルド作業の能率の良さや、安価であるという点から、ト
ランスファー・モールドしたものが多く用いられており
、高出力半導体装置においてもこの方式が用いられるよ
うになってきた。
Transfer molding is often used for semiconductor devices, such as transistors and diodes, due to the efficiency of molding and low cost, and this method has also come to be used in high-power semiconductor devices. Ta.

従来、たとえば電力用半導体装置用の金属支持体として
、熱放散が良くさらに製造が容易な構造が実公昭51−
43723号にて提案されている。
Conventionally, for example, as a metal support for a power semiconductor device, a structure that has good heat dissipation and is easy to manufacture has been developed.
It is proposed in No. 43723.

ここで示されている支持体は、素子固着部を他の外部リ
ードよりも厚く、他の外部リードを適数本連結細条にて
一体化したもので、導電性金属材料の打抜きにより作成
されたものである。
The support shown here has an element fixing part thicker than the other external leads, and integrates an appropriate number of other external leads with connecting strips, and is made by punching a conductive metal material. It is something that

本考案はこの種の半導体装置の電極において、特に半導
体装置の取付は時の応力が半導体素子に加わることをな
くし、また製造時の能率向上を目的とするものである。
The present invention aims to eliminate the stress applied to semiconductor elements during the mounting of semiconductor devices, and to improve efficiency during manufacturing.

以下、図面とともに本考案を詳細に説明する。Hereinafter, the present invention will be described in detail with reference to the drawings.

第1.2図は後述する導電性金属体より形成された導電
性金属支持体により組立封止された半導体装置を示し、
1はこの金属支持体、2はトランジスタ、ダイオード等
の作り込まれた半導体素子3が固着された素子固着部で
、この部分は他のリード部よりも厚くシ、放熱性を良好
なものとしている。
FIG. 1.2 shows a semiconductor device assembled and sealed with a conductive metal support formed from a conductive metal body, which will be described later.
1 is this metal support, and 2 is an element fixing part to which a semiconductor element 3 such as a transistor or diode is fixed.This part is thicker than other lead parts and has good heat dissipation. .

4は固着部2から延出された外部リードでたとえばトラ
ンジスタのコレクタリードである。
Reference numeral 4 denotes an external lead extending from the fixed portion 2, and is, for example, a collector lead of a transistor.

5,6は外部リード4に近接して平行に配置された外部
リードで4と同じ厚さを有し半導体素子2と金属細線7
,8で接続されており、たとえばトランジスタのベース
、エミッタリードを構成している。
5 and 6 are external leads arranged close to and parallel to the external lead 4, and have the same thickness as the external lead 4, and connect the semiconductor element 2 and the thin metal wire 7.
, 8, and constitute, for example, the base and emitter leads of a transistor.

これら外部り−ド5,6は固着部2、外部リード4と一
体に後述のごとく打抜き形成されたものである。
These outer leads 5 and 6 are integrally formed with the fixing portion 2 and the outer lead 4 by stamping as described below.

9は半導体素子3の周囲を包囲した封止用のエポキシ樹
脂等でトランスファ・モールドされたものである。
Reference numeral 9 denotes a semiconductor element 3 which is transfer-molded with epoxy resin or the like for sealing around the semiconductor element 3.

10は金属支持体1をシャーシ等にネジ止するための取
付孔である。
10 is a mounting hole for screwing the metal support 1 to a chassis or the like.

さて、つぎに電極支持体1の作成ならびに第1゜2図に
示す半導体装置の組立を説明する。
Next, the preparation of the electrode support 1 and the assembly of the semiconductor device shown in FIGS. 1-2 will be explained.

第3図は電極支持体1を形成する状態を示すもので、一
つの打抜きパターンを示す。
FIG. 3 shows the state in which the electrode support 1 is formed, and shows one punching pattern.

第3図において11は多数の電極支持体1を打抜き形成
するための帯状の導電性金属体で、鋼などの熱および電
気の伝導性が良く延性に富む材料よりなり、この金属体
11の長手方向の中心線Oに対して一方および他方の側
にそれぞれ複数の素子固着部、取付孔、外部リードの一
端部が形成されている。
In FIG. 3, reference numeral 11 denotes a strip-shaped conductive metal body for punching and forming a large number of electrode supports 1, and is made of a material such as steel that has good thermal and electrical conductivity and is rich in ductility. A plurality of element fixing portions, mounting holes, and one end portion of the external lead are formed on one side and the other side with respect to the center line O in the direction.

第4図において第1図と対応するものには類似番号を付
す。
Components in FIG. 4 that correspond to those in FIG. 1 are given similar numbers.

すなわち、この帯状の導電性金属体11の長手方向の中
心線Oに対して一方の外側部に素子固着部2、取付孔1
0、固着部2から延出されたリード部4の一部4 a
、4 aに近接したリード部の一端部5a、5aがプレ
ス打抜きにより形成されている。
That is, an element fixing portion 2 and a mounting hole 1 are provided on one outer side of the strip-shaped conductive metal body 11 with respect to the center line O in the longitudinal direction.
0. Part 4 a of the lead part 4 extending from the fixed part 2
, 4a, one end portions 5a, 5a of the lead portions are formed by press punching.

さらに中心線Oに対して他方の外側部に、上記一方の外
側部と対称形状の素子固着部2′、取付孔10’、リー
ド部の一部4a、一端部5 a 、6 aが形成されて
いる。
Further, on the other outer side with respect to the center line O, an element fixing part 2' having a shape symmetrical to the one outer side, a mounting hole 10', a part 4a of the lead part, and one end parts 5a and 6a are formed. ing.

そしてこれらのものは第3図から明らかなごとく多数個
連らなって形成されており、さらに中心線O付近は単な
る平板状となっており、後のプレス打抜きにより一点鎖
線のごとく打抜かれ、第1図の金属支持体2が形成され
る。
As is clear from Fig. 3, a large number of these objects are formed in a row, and the area near the center line O is simply a flat plate. A metal support 2 as shown in FIG. 1 is formed.

すなわち、平板状の部分は、4 a 、4 a’につな
がるリード線4.4’一端部5 a 、5 a’、6
a 、6 a’につながるリード部5゜5’、6.6’
が、半導体素子の固着、トランスファ・モールド工程の
ち打抜き形成されるものである。
In other words, the flat plate-shaped portion includes one end of the lead wire 4.4' connected to 4a, 4a', 5a, 5a', 6
a, 6 Lead parts connected to a'5゜5',6.6'
is formed by stamping after the fixation of the semiconductor element and the transfer molding process.

この平板状部分において、第3図に示す20の部分(斜
線部)が打抜き除去され、中心線Oの両側においてそれ
ぞれ第1図の金属支持体が形成されることになる。
In this flat plate-shaped portion, 20 portions (hatched portions) shown in FIG. 3 are punched out and removed, and the metal supports shown in FIG. 1 are formed on both sides of the center line O, respectively.

さらに、第3図の構造において注目すべきことは、素子
固着部2側においてこれと組み合されるノード部4,5
.6およびその一部4 a 、5 a 、6 aと、素
子固着部2′側においてこれと組み合されるリード部4
’、 5’、 6’およびその一部4 a’、5 a’
、6 a’を、中央部すなわち平板状部にて交互に配置
している点である。
Furthermore, what should be noted in the structure of FIG. 3 is that the node parts 4 and 5 combined with the element fixing part 2
.. 6 and parts thereof 4 a , 5 a , 6 a and the lead part 4 combined with this on the element fixing part 2' side
', 5', 6' and part thereof 4 a', 5 a'
, 6a' are arranged alternately in the central portion, that is, the flat plate-like portion.

すなわち、リード部は左から5’、5.4’、4.6’
。6の順で等間隔に配置されており、素子固着部2と2
′は中心線Oの垂直方向に対して少しづれた配置構成と
なっている。
In other words, the lead parts are 5', 5.4', 4.6' from the left.
. They are arranged at equal intervals in the order of 6, and the element fixing parts 2 and 2
' is arranged slightly offset with respect to the vertical direction of the center line O.

このように電極支持体の作成に対し、中心線の両側の支
持体の各リード部を交互に配置することにより、導電性
金属体11からの材料取り効率が極めて高くなり、導電
性金属体11の幅も小さくすることができ、材料の使用
効率化、コストダウンに大きく寄与する。
By alternately arranging the lead portions of the supports on both sides of the center line when creating the electrode support, the efficiency of material removal from the conductive metal body 11 is extremely high, and the conductive metal body 11 The width can also be made smaller, which greatly contributes to more efficient use of materials and cost reduction.

特にこの構造はリード部の間隔を大きくとることのでき
る大型の半導体装置に有効である。
This structure is particularly effective for large-sized semiconductor devices in which the lead portions can be spaced widely.

なお、第4図は第3図のIV−IV“線の構造断面図で
ある。
Note that FIG. 4 is a structural cross-sectional view taken along the line IV-IV" in FIG. 3.

第4図から明らかなごとく、中央部分のリード部に相当
する部分は薄く、素子固着部2,2′の部分は肉厚部を
構成し、両端の取付孔10.10’形成部は中肉厚部と
なっている。
As is clear from FIG. 4, the central portion corresponding to the lead portion is thin, the element fixing portions 2 and 2' constitute thick-walled portions, and the portions forming mounting holes 10 and 10' at both ends are medium-thick. It is a thick part.

次に、第1図に示す半導体装置の組立方法を説明する。Next, a method for assembling the semiconductor device shown in FIG. 1 will be explained.

まず、第3図に示すごとき導電性金属体11を打抜いた
のち、メッキ処理を施し、素子固着部2,2′に半導体
素子3を固着する。
First, a conductive metal body 11 as shown in FIG. 3 is punched out and then plated to fix the semiconductor element 3 to the element fixing portions 2, 2'.

そして、素子とリード部の端部5 a、5 a’、5
a。
Then, the ends 5a, 5a', 5 of the element and the lead part
a.

6a′に金属細線を接続し、樹脂によるトランスファ・
モールドを施す。
Connect a thin metal wire to 6a' and transfer using resin.
Apply the mold.

しかるのち、平板状部分の不要部分20を打抜き、さら
にリード部4,5.6に半田メッキを施し、第3図の連
結部分21.21’を切断分離して第1図の半導体装置
が完成する。
After that, unnecessary parts 20 of the flat plate-shaped part are punched out, and the lead parts 4, 5.6 are further plated with solder, and the connecting parts 21 and 21' shown in Fig. 3 are cut and separated to complete the semiconductor device shown in Fig. 1. do.

第5図は本考案の他の実施例にかかる電極支持体を作成
する素子を示す。
FIG. 5 shows an element for making an electrode support according to another embodiment of the present invention.

すなわち、第3図のものはリード部4.4’、5.5’
、6.6’が連結部分30にて連結されている。
That is, the lead portions 4.4' and 5.5' in FIG.
, 6.6' are connected at a connecting portion 30.

以上述べた第1,2図の半導体装置をシャーシ等へ取付
けた状態を第6図に示す。
FIG. 6 shows a state in which the semiconductor device shown in FIGS. 1 and 2 described above is attached to a chassis or the like.

すなわち、第6図はシャーシ40へ取付孔10よりビス
50にて固定したものである。
That is, FIG. 6 shows the case fixed to the chassis 40 through the mounting hole 10 with screws 50.

このとき、本考案によれば、ビス50等の締付力によっ
て多少、取付孔10の形成部が歪んでも素子固着部2が
厚く形成されているため、締付応力は素子固着部2まで
伝わらず、よって素子がわれたり、はがれたりすること
がない。
At this time, according to the present invention, even if the forming part of the mounting hole 10 is slightly distorted by the tightening force of the screw 50 etc., the tightening stress will not be transmitted to the element fixing part 2 because the element fixing part 2 is formed thick. Therefore, the element will not break or peel off.

また、素子固着部が最も厚く形成されているため、素子
が瞬間的に大きく発熱しても、素子固着部の熱容量が大
きく、素子の熱破壊が防止できる。
Furthermore, since the element fixing part is formed to be the thickest, even if the element instantaneously generates a large amount of heat, the heat capacity of the element fixing part is large, and thermal destruction of the element can be prevented.

また帯状の導電性金属体11の中央部にリード部を配置
しているため、導電性金属体11を圧延によって形成す
る際、最も薄く圧延する必要のあるリード部に相当する
中央部分を1個所圧延するだけで一対の半導体装置の電
極支持体を作成することができる。
In addition, since the lead part is arranged in the center of the strip-shaped conductive metal body 11, when forming the conductive metal body 11 by rolling, the central part corresponding to the lead part that needs to be rolled thinnest is placed at one place. Electrode supports for a pair of semiconductor devices can be created simply by rolling.

しかもリード部を導電性金属体の中央部においてそれぞ
れ交互に配置しているため金属性材料の幅を小さくする
ことができ、特に厚さを薄く圧延する中央部の幅が小さ
くなるため圧延が容易となる。
Moreover, since the lead parts are arranged alternately in the center of the conductive metal body, the width of the metal material can be reduced, and rolling is particularly easy because the width of the center part where the thickness is to be reduced is small. becomes.

以上のように本考案にかかる半導体装置用電極支持体は
製造が容易で、材料の効率的利用がはかれ、半導体装置
の信頼性が向上する実用的効果の大なるものである。
As described above, the electrode support for a semiconductor device according to the present invention is easy to manufacture, allows efficient use of materials, and has great practical effects in improving the reliability of the semiconductor device.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本考案にかかる支持体を用いて組立られた半導
体装置の平面図、第2図は第1図のIIII’線断面図
、第3図は本考案の一実施例における帯状の導電性金属
体の平面図、第4図は第3図のIV−IV’線断面図、
第5図は同地の実施例における金属体の平面図、第6図
は第1図の装置をシャーシに取付けた断面図である。 1.1′・・・・・・電極支持体、2.2′・・・・・
・素子固着部、4.4’。 5.5’、6.6’・・・・・・リード部、10,10
’・・・・・・取付孔、O・・・・・・中心線。
FIG. 1 is a plan view of a semiconductor device assembled using a support according to the present invention, FIG. 2 is a sectional view taken along line III' in FIG. FIG. 4 is a cross-sectional view taken along the line IV-IV' in FIG. 3;
FIG. 5 is a plan view of a metal body in the same embodiment, and FIG. 6 is a sectional view of the device shown in FIG. 1 attached to a chassis. 1.1'... Electrode support, 2.2'...
・Element fixing part, 4.4'. 5.5', 6.6'... Lead part, 10, 10
'...Mounting hole, O...Center line.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 帯状の導電性金属体を打抜いて形成された半導体素子固
定部、取付孔形成部、リード部を有し、上記取付孔形成
部ならびにリード部を、上記固着部の一方、他方よりそ
れぞれ延出形威し、上記固着部の厚さを上記取付孔形成
部およびリード部の厚さよりも大きくシ、上記金属体の
長手方向の中心線に対して一方の側に第1の素子固着部
を、他方の側に第2の素子固着部を形成し、上記第1、
第2の固着部より延出されたリード部を上記金属体の中
央部にそれぞれ交互に配置することを特徴とする半導体
装置用金属支持体。
It has a semiconductor element fixing part, a mounting hole forming part, and a lead part formed by punching out a strip-shaped conductive metal body, and the mounting hole forming part and the lead part extend from one side and the other of the fixed part, respectively. The thickness of the fixing part is larger than the thickness of the mounting hole forming part and the lead part, and the first element fixing part is arranged on one side with respect to the center line in the longitudinal direction of the metal body. A second element fixing portion is formed on the other side, and the first,
A metal support for a semiconductor device, characterized in that lead parts extending from the second fixing part are arranged alternately in the center of the metal body.
JP1977049208U 1977-04-18 1977-04-18 Metal support for semiconductor devices Expired JPS5852689Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1977049208U JPS5852689Y2 (en) 1977-04-18 1977-04-18 Metal support for semiconductor devices

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1977049208U JPS5852689Y2 (en) 1977-04-18 1977-04-18 Metal support for semiconductor devices

Publications (2)

Publication Number Publication Date
JPS53143563U JPS53143563U (en) 1978-11-13
JPS5852689Y2 true JPS5852689Y2 (en) 1983-12-01

Family

ID=28934369

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1977049208U Expired JPS5852689Y2 (en) 1977-04-18 1977-04-18 Metal support for semiconductor devices

Country Status (1)

Country Link
JP (1) JPS5852689Y2 (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS513739U (en) * 1974-06-25 1976-01-12
JPS51121171A (en) * 1975-03-31 1976-10-22 Western Electric Co Magnetic reed contact

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS513739U (en) * 1974-06-25 1976-01-12
JPS51121171A (en) * 1975-03-31 1976-10-22 Western Electric Co Magnetic reed contact

Also Published As

Publication number Publication date
JPS53143563U (en) 1978-11-13

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