JP2000228490A - Power semiconductor module - Google Patents

Power semiconductor module

Info

Publication number
JP2000228490A
JP2000228490A JP2811599A JP2811599A JP2000228490A JP 2000228490 A JP2000228490 A JP 2000228490A JP 2811599 A JP2811599 A JP 2811599A JP 2811599 A JP2811599 A JP 2811599A JP 2000228490 A JP2000228490 A JP 2000228490A
Authority
JP
Japan
Prior art keywords
module
metal base
base
fixing
power semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2811599A
Other languages
Japanese (ja)
Inventor
Masahiro Ito
昌弘 伊藤
Shigeyasu Takatsuchi
重靖 高槌
Takashi Saito
高 斎藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Hitachi Power Semiconductor Device Ltd
Original Assignee
Hitachi Ltd
Hitachi Haramachi Electronics Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd, Hitachi Haramachi Electronics Ltd filed Critical Hitachi Ltd
Priority to JP2811599A priority Critical patent/JP2000228490A/en
Publication of JP2000228490A publication Critical patent/JP2000228490A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/44Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001Core members of the connector
    • H01L2224/45099Material
    • H01L2224/451Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
    • H01L2224/45117Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 400°C and less than 950°C
    • H01L2224/45124Aluminium (Al) as principal constituent
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/13Discrete devices, e.g. 3 terminal devices
    • H01L2924/1301Thyristor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/13Discrete devices, e.g. 3 terminal devices
    • H01L2924/1304Transistor
    • H01L2924/1305Bipolar Junction Transistor [BJT]
    • H01L2924/13055Insulated gate bipolar transistor [IGBT]

Abstract

PROBLEM TO BE SOLVED: To suppress the amount of warpage in a module, and to improve the dissipation of heat by providing at least one mounting hole for fixing the module on mounting at a part other than the periphery part of the module, and by directly fixing a base material with a bolt. SOLUTION: A semiconductor element 4 is jointed to an insulating board 3 by solder 15, bonding connection is made by an A1 wire 6 on the electrode of the semiconductor element 4 and the insulating board 3, and the insulating board 3 is connected to a metal base 101 by solder 2. Then, a mounting hole 102 for fixing a module is formed at a position other than the periphery part of the metal base 101, a case 11 made of organic resin is jointed to the metal base 101 where the insulating board 3 is jointed by adhesive 13, and at the same time a cylindrical case 103 made of the organic resin is jointed to the position of the mounting hole 102 other than the periphery part of the metal base 101, thus reducing the amount of warpage without changing the inside layout or the like of the module, and improving the dissipation of heat.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、パワー半導体モジ
ュールに関する。
[0001] The present invention relates to a power semiconductor module.

【0002】[0002]

【従来の技術】従来からIGBT,ダイオード,GT
O,トランジスタ等のパワー半導体素子を絶縁容器内に
封入したパワー半導体モジュールが知られている。これ
らの素子はその耐圧や電流容量に応じて、各種インバー
タ装置などに応用されている。中でもIGBTは大電流
の高周波動作が可能であり、電圧制御素子のため制御が
容易であるなどの利点を有している。また、モジュール
使用上の簡便性の点から多くの場合はモジュールのベー
ス部分と電流通電部分が電気的に絶縁された内部絶縁型
の構造となっている。
2. Description of the Related Art Conventionally, IGBT, diode, GT
2. Description of the Related Art Power semiconductor modules in which power semiconductor elements such as O and transistors are sealed in an insulating container are known. These elements are applied to various inverter devices and the like according to their withstand voltage and current capacity. Among them, the IGBT is capable of high-frequency operation with a large current, and has advantages such as easy control because of a voltage control element. In many cases, the module has an internal insulation structure in which the base portion and the current-carrying portion are electrically insulated from the viewpoint of simplicity in using the module.

【0003】IGBTモジュールの構造を、製造プロセ
スに従って図5にて説明する。一般的には半導体素子4
を半田15によって絶縁基板3に接合し、電極引き出し
のために半導体素子4と絶縁基板3の電極上にAlワイ
ヤー6などでボンディング接続される。絶縁基板3には
アルミナやAlNセラミックに銅パターンを接続したも
のが使用される。この絶縁基板3はモジュールの底面を
支え、放熱板である平面な金属ベース1に半田2により
接合される。金属ベースの周囲にはモジュールをインバ
ータ等に実装する際にモジュールを固定するための取付
け穴16が設けられている。モジュールの外部端子と絶
縁基板3との接続は、外部端子と一体化した銅リード7
及び8でなされ、絶縁基板3上の電極部に半田5によっ
て接合される。この外部端子は一般的に端子ブロックと
呼ばれる。更に、有機樹脂製ケース11を有機樹脂製の
接着剤13により金属ベース1に接続する。この中に半
導体素子4を外雰囲気より遮断し、モジュール内部の絶
縁性確保とワイヤボンディング配線保護などの為にゲル
9を注入し硬化させる。そして、モジュール内部の気密
性確保のためにゲル9上にエポキシ樹脂10を充填し硬
化させる。以上がIGBTモジュールの一般的製造プロ
セス及び構造である。尚、この種のモジュール構造とし
て関連するものに、特許平6−243654 号公報を挙げるこ
とができる。
The structure of an IGBT module will be described with reference to FIG. Generally semiconductor element 4
Is bonded to the insulating substrate 3 by the solder 15, and the semiconductor element 4 and the electrodes of the insulating substrate 3 are connected by bonding with the Al wires 6 or the like to lead the electrodes. As the insulating substrate 3, one obtained by connecting a copper pattern to alumina or AlN ceramic is used. The insulating substrate 3 supports the bottom surface of the module, and is joined to the flat metal base 1 serving as a heat sink by solder 2. Around the metal base, there are provided mounting holes 16 for fixing the module when mounting the module on an inverter or the like. The connection between the external terminals of the module and the insulating substrate 3 is made by copper leads 7 integrated with the external terminals.
And 8 are joined to the electrode portion on the insulating substrate 3 by the solder 5. This external terminal is generally called a terminal block. Further, the organic resin case 11 is connected to the metal base 1 by an organic resin adhesive 13. In this, the semiconductor element 4 is cut off from the outside atmosphere, and a gel 9 is injected and cured for securing insulation inside the module and protecting wire bonding wiring. Then, an epoxy resin 10 is filled on the gel 9 and hardened to ensure airtightness inside the module. The above is the general manufacturing process and structure of the IGBT module. Japanese Patent Application Laid-Open No. 6-243654 can be mentioned as a module related to this type of module structure.

【0004】これらのモジュール裏面の反り量は、金属
ベース1とモジュール側面を形成する有機樹脂製ケース
11を別の有機樹脂製の接着剤13によって接合してモ
ジュールを構成するため、金属ベース1と有機樹脂製ケ
ース11の熱膨張係数(以下αと略す。)差によってき
まる。一般的に、金属ベース1に比べ有機樹脂ケース1
1のαが大きいため、金属ベース1と有機樹脂製ケース
11接着後はモジュールの熱変動により高温の場合は有
機樹脂製ケース11が膨張して裏面が凹方向に、低温の
場合は有機樹脂製ケース11が収縮して裏面が凸に変形
する。モジュール裏面の反り量はモジュールが大型化す
ると大きくなる傾向にある。従来この反り量を低減させ
る為、金属ベース1にあらかじめモジュール完成後に反
る反対の方向に反りを付けておき、モジュール完成後の
反り量を低減させる方法。モジュール実装時に、モジュ
ールをフィン12などにボルト14で機械的に固定する
際の締付トルクを強くして実装時の反り量を低減させる
方法。金属ベース1の厚さを充分に厚くして剛性を持た
せることで反り量を低減させる方法があった。またモジ
ュール中央部に穴をもうけて、モジュールにかかるスト
レスを低減させる構造として特許平9−27590号,特許平
7−169906 号がある。
[0004] The amount of warpage of the back of the module is determined by joining the metal base 1 and the organic resin case 11 forming the side surface of the module with another organic resin adhesive 13 to form a module. It is determined by a difference in thermal expansion coefficient (hereinafter abbreviated as α) of the organic resin case 11. In general, organic resin case 1
Since α of 1 is large, after bonding the metal base 1 and the organic resin case 11, the organic resin case 11 expands and expands when the temperature is high due to the heat fluctuation of the module, and the rear surface is concave when the temperature is low. The case 11 shrinks and the rear surface is deformed to be convex. The amount of warpage on the back surface of the module tends to increase as the size of the module increases. Conventionally, in order to reduce the amount of warpage, a method is used in which the metal base 1 is previously warped in the opposite direction after the module is completed to reduce the amount of warpage after the module is completed. A method of increasing the tightening torque when mechanically fixing the module to the fins 12 or the like with the bolts 14 at the time of mounting the module to reduce the amount of warpage at the time of mounting. There has been a method of reducing the amount of warpage by increasing the thickness of the metal base 1 sufficiently to provide rigidity. Also, a hole is made in the center of the module to reduce the stress applied to the module.
No. 7-169906.

【0005】[0005]

【発明が解決しようとする課題】上記従来技術において
は、以下のような問題点がある。
The above prior art has the following problems.

【0006】金属ベース1にあらかじめ反りを付けてモ
ジュール完成後の反り量を低減する方法では、金属ベー
ス1の反り量が一定でないとモジュールでの反り量制御
が難しい。また、モジュールを放熱フィン12などにボ
ルト14で機械的に固定する際の締付けトルクを強くす
る方法は、金属ベース1周辺部の取付け穴16の機械的
強度を充分に確保する必要があり、結果としてモジュー
ル面積の増加や、金属ベース1を厚くしなければならな
い。また、この方法は、モジュール裏面の反りが凹の場
合だと周辺部のボルト締付け力を強くしても、モジュー
ル中央部では、金属ベース1と放熱フィン12との密着
性の改善効果はほとんどない。金属ベース1を充分に厚
くして剛性を持たせる方法では、金属ベース1の反り量
は抑えることができるが、金属ベース1が厚くなった分
モジュールの熱抵抗が大きくなる。さらに、モジュール
の重量も増加する。このため使用可能な最大損失や実装
方法などが制限されることになる。
In the method in which the metal base 1 is warped in advance to reduce the warpage after completion of the module, it is difficult to control the warpage in the module unless the warpage of the metal base 1 is constant. In addition, the method of increasing the tightening torque when mechanically fixing the module to the radiation fins 12 or the like with the bolts 14 requires that the mechanical strength of the mounting holes 16 around the metal base 1 be sufficiently ensured. As a result, the module area must be increased and the metal base 1 must be thickened. In addition, according to this method, if the warpage on the back surface of the module is concave, even if the bolt tightening force at the peripheral portion is increased, there is almost no effect of improving the adhesion between the metal base 1 and the radiation fins 12 at the center of the module. . In the method of making the metal base 1 sufficiently thick and having rigidity, the amount of warpage of the metal base 1 can be suppressed, but the thermal resistance of the module increases as the metal base 1 becomes thicker. In addition, the weight of the module increases. For this reason, the maximum usable loss and the mounting method are limited.

【0007】また、特許平9−27590号,特許平7−16990
6 号の方法では中央部の穴でモジュールを固定する場
合、ケース樹脂を介してボルトをしめつける必要があ
り、樹脂の強度が十分確保されていないと取り付け時の
締め付けトルクを強くすることができず、結果としてベ
ース材の反り量を抑えることができない。
Further, Japanese Patent Application Laid-Open Nos. 9-27590 and 7-16990
In the method of No. 6, when fixing the module with the hole in the center, it is necessary to tighten the bolts through the case resin, and if the strength of the resin is not enough, the tightening torque at the time of installation can not be increased. As a result, the amount of warpage of the base material cannot be suppressed.

【0008】[0008]

【課題を解決するための手段】前記課題を考慮し本発明
によるパワー半導体モジュールにおいては、次のような
手段を用いた。
In view of the above-mentioned problems, the power semiconductor module according to the present invention employs the following means.

【0009】実装時のモジュール固定用の取付け穴をモ
ジュールの周辺部以外に1つ以上設け、ボルトによって
直接ベース材を固定する。
At least one mounting hole for fixing the module at the time of mounting is provided at a portion other than the peripheral portion of the module, and the base material is directly fixed by bolts.

【0010】取付け穴をモジュールの周辺部以外に1つ
以上設けるボルトによって直接ベース材を固定すること
により、モジュール実装時の反り量を低減し、熱放散を
向上させることができる。
[0010] By directly fixing the base member with bolts having one or more mounting holes other than the peripheral portion of the module, the amount of warpage at the time of mounting the module can be reduced and the heat dissipation can be improved.

【0011】[0011]

【発明の実施の形態】以下本発明の実施例を図面を用い
て説明する。
Embodiments of the present invention will be described below with reference to the drawings.

【0012】図1は本発明を適用したモジュールの断面
構造図、図2はその平面図を示す。絶縁基板3に半導体
素子4を半田15により接合し、電極引き出しの為に、
半導体素子4と絶縁基板3の電極上にAlワイヤー6で
ボンディング接続される。この絶縁基板3を金属ベース
1に半田2で接続する。本実施例では、金属ベース10
1の周辺部以外の位置にモジュール固定用の取付け穴1
02が形成されている。次に絶縁基板3を接合した金属
ベース101に有機樹脂製ケース11を接着剤13で接
合し同時に金属ベース101の周辺部以外の取付け穴1
02位置に筒状の有機樹脂製ケース103を接合する。
この時金属ベース101と有機樹脂ケース103の剥離
を防止する為、両材料をボルトなどで機械的に固定して
接着強度を確保する方法が望ましい。金属ベース101
の材料としてはCu板,Mo板及び複合材AlSiCな
どが挙げられるがCu板,Mo板では穴加工を機械加工
で行わなければならず、特にMo板では硬度が高い為に
機械加工が困難とされる。このため、AlSiCやCU
SiCなどの鋳造で形成される材料が望ましい。これら
の材料であれば金型の成形により穴部形成は金属ベース
101形成時に一体成形される為、機械加工が不要とな
り、容易に製作が可能である。次にモジュールの外部端
子と一体となっている端子ブロック104を絶縁基板3
上の電極部に半田5で接合する。端子ブロック104に
はあらかじめ金属ベース101の取付け穴102の同一
垂直面上に穴が形成されている。続いてモジュール内部
にゲル9を注入し硬化させる。そして、モジュール内部
の気密性確保の為にゲル9上にエポキシ樹脂10を充填
する構造となっている。上記で説明した半導体モジュー
ルでは、実装時にモジュール周辺部のモジュール固定用
の取付け穴16以外にモジュール周辺部以外の取付け穴
102によって金属ベース101が放熱用フィン12に
直接固定される為、モジュール裏面の反り量が低減で
き、熱抵抗の減少による冷却効率の向上が達成できる。
また、温度変化に伴うモジュールの変形量が抑制される
為、有機樹脂製ケース11や絶縁基板3にかかる応力が
緩和され半導体モジュールの信頼性を向上できる。
FIG. 1 is a sectional structural view of a module to which the present invention is applied, and FIG. 2 is a plan view thereof. The semiconductor element 4 is joined to the insulating substrate 3 by the solder 15, and in order to lead the electrodes,
The semiconductor element 4 and the electrode of the insulating substrate 3 are bonded and connected by an Al wire 6. The insulating substrate 3 is connected to the metal base 1 with the solder 2. In this embodiment, the metal base 10
Mounting holes 1 for fixing the module at positions other than the periphery of 1.
02 is formed. Next, an organic resin case 11 is bonded to the metal base 101 to which the insulating substrate 3 is bonded with an adhesive 13, and at the same time, the mounting holes 1 other than the peripheral portion of the metal base 101
The cylindrical organic resin case 103 is joined at the 02 position.
At this time, in order to prevent the metal base 101 and the organic resin case 103 from peeling off, it is desirable to secure the adhesive strength by mechanically fixing both materials with bolts or the like. Metal base 101
Examples of the material include a Cu plate, a Mo plate, and a composite material AlSiC. However, the Cu plate and the Mo plate need to be drilled by machining, and the Mo plate is particularly difficult to machine due to its high hardness. Is done. For this reason, AlSiC or CU
A material formed by casting, such as SiC, is desirable. With these materials, since the hole is formed integrally with the metal base 101 by forming a metal mold, no mechanical processing is required, and it is easy to manufacture. Next, the terminal block 104 integrated with the external terminals of the module is connected to the insulating substrate 3.
It is joined to the upper electrode portion with solder 5. A hole is formed in the terminal block 104 in advance on the same vertical plane as the mounting hole 102 of the metal base 101. Subsequently, the gel 9 is injected into the module and hardened. The structure is such that the epoxy resin 10 is filled on the gel 9 in order to secure airtightness inside the module. In the semiconductor module described above, since the metal base 101 is directly fixed to the heat dissipating fins 12 by mounting holes 102 other than the module peripheral portion in addition to the module fixing mounting holes 16 in the module peripheral portion during mounting, The amount of warpage can be reduced, and the cooling efficiency can be improved by reducing the thermal resistance.
Further, since the amount of deformation of the module due to the temperature change is suppressed, the stress applied to the organic resin case 11 and the insulating substrate 3 is reduced, and the reliability of the semiconductor module can be improved.

【0013】図3,図4は第2の実施例を示したもので
ある。図3,図4中図1,図2と同一符号は同一要素を
示す。本実施例では金属ベース105の裏面にモジュー
ル実装の際にモジュールを固定する為の取付け穴106
が形成されている構造となっている。この方法でモジュ
ールを裏面からフィン12に固定することにより実装時
の反り量の低減が可能となる。本実施例では、金属ベー
ス105の形状は変わるもののモジュール内部のレイア
ウトや、製造プロセスは従来のものと変更せずに反り量
を低減でき、熱放散を大幅に向上することができる。
FIGS. 3 and 4 show a second embodiment. 3 and 4, the same reference numerals as those in FIGS. 1 and 2 indicate the same elements. In this embodiment, mounting holes 106 for fixing the module at the time of module mounting are provided on the back surface of the metal base 105.
Is formed. By fixing the module to the fins 12 from the back surface by this method, the amount of warpage during mounting can be reduced. In the present embodiment, although the shape of the metal base 105 changes, the amount of warpage can be reduced without changing the layout inside the module and the manufacturing process, and the heat dissipation can be greatly improved.

【0014】上記実施例では、IGBTモジュールを例
にして説明したがこれに限定されものでは無く、他のパ
ワートランジスタ,GTOサイリスタ等でも良いことは
勿論である。
In the above embodiment, an IGBT module has been described as an example. However, the present invention is not limited to this, and it is a matter of course that another power transistor, a GTO thyristor, or the like may be used.

【0015】[0015]

【発明の効果】本発明によれば、モジュールの反り量が
抑制され熱放散に優れた高信頼性なパワー半導体モジュ
ールを提供できる。
According to the present invention, it is possible to provide a highly reliable power semiconductor module having a reduced amount of module warpage and excellent heat dissipation.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の第1の実施例を示す断面図。FIG. 1 is a sectional view showing a first embodiment of the present invention.

【図2】図1に示す本発明の平面図。FIG. 2 is a plan view of the present invention shown in FIG.

【図3】本発明の第2の実施例を示す断面図。FIG. 3 is a sectional view showing a second embodiment of the present invention.

【図4】図3に示す本発明の平面図。FIG. 4 is a plan view of the present invention shown in FIG. 3;

【図5】従来構造を示す断面図。FIG. 5 is a sectional view showing a conventional structure.

【図6】図5に示す従来構造の平面図。FIG. 6 is a plan view of the conventional structure shown in FIG.

【符号の説明】[Explanation of symbols]

1,101,105…金属ベース、2,5,15…半
田、3…絶縁基板、4…半導体素子、6…Alワイヤ
ー、7,8…銅リード、9…ゲル、10…エポキシ樹
脂、11,103…有機樹脂製ケース、12…フィン、
13…接着剤、14…ボルト、17,104…端子ブロ
ック、16,102,106…モジュール取付け穴。
1, 101, 105: metal base, 2, 5, 15: solder, 3: insulating substrate, 4: semiconductor element, 6: Al wire, 7, 8: copper lead, 9: gel, 10: epoxy resin, 11, 103: organic resin case, 12: fin,
13: adhesive, 14: bolt, 17, 104: terminal block, 16, 102, 106: module mounting hole.

フロントページの続き (72)発明者 高槌 重靖 茨城県日立市弁天町三丁目10番2号 日立 原町電子工業株式会社内 (72)発明者 斎藤 高 茨城県日立市幸町三丁目1番1号 株式会 社日立製作所日立工場内Continued on the front page (72) Inventor Shigeyasu Takatsuchi 3- 10-2 Bentencho, Hitachi City, Ibaraki Prefecture Inside Hitachi Haramachi Electronics Co., Ltd. (72) Inventor Takashi Saito 3-1-1 Sachimachi, Hitachi City, Ibaraki Prefecture No.Hitachi Ltd.Hitachi Plant

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】モジュール底面を支持する金属、又は複合
材などの材質からなる放熱を兼ねたベースと、このベー
ス上に複数個の半導体素子が接合された絶縁基板が接合
され、この半導体素子を外雰囲気より遮断するための樹
脂ケースで覆われた内部絶縁型のパワー半導体モジュー
ルにおいて、モジュール周辺部以外にモジュールを固定
するための1つ以上の取付け穴があり、ボルトによって
直接ベースを固定することを特徴としたパワー半導体モ
ジュール。
1. A base for supporting a module bottom, which is made of a material such as a metal or a composite material and also serves as a heat radiator, and an insulating substrate having a plurality of semiconductor elements bonded on the base. In an internal insulation type power semiconductor module covered with a resin case for shielding from the outside atmosphere, there is one or more mounting holes for fixing the module other than around the module, and the base is directly fixed with bolts Power semiconductor module characterized by the following.
【請求項2】請求項1のパワー半導体モジュールにおい
て、前記ベースの周辺部以外の裏面にモジュールを固定
するための1つ以上の取付け穴があることを特徴とした
パワー半導体モジュール。
2. The power semiconductor module according to claim 1, wherein one or more mounting holes for fixing the module are provided on a back surface other than a peripheral portion of the base.
【請求項3】請求項1又は2に記載のパワー半導体モジ
ュールにおいて、前記ベースが前記ボルトにより放熱フ
ィンに固定されることを特徴とするパワー半導体モジュ
ール。
3. The power semiconductor module according to claim 1, wherein said base is fixed to a radiation fin by said bolt.
JP2811599A 1999-02-05 1999-02-05 Power semiconductor module Pending JP2000228490A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2811599A JP2000228490A (en) 1999-02-05 1999-02-05 Power semiconductor module

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2811599A JP2000228490A (en) 1999-02-05 1999-02-05 Power semiconductor module

Publications (1)

Publication Number Publication Date
JP2000228490A true JP2000228490A (en) 2000-08-15

Family

ID=12239824

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2811599A Pending JP2000228490A (en) 1999-02-05 1999-02-05 Power semiconductor module

Country Status (1)

Country Link
JP (1) JP2000228490A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6903457B2 (en) 2002-11-13 2005-06-07 Mitsubishi Denki Kabushiki Kaisha Power semiconductor device
JP2009147074A (en) * 2007-12-13 2009-07-02 Toyota Industries Corp Semiconductor device
DE102009002993A1 (en) * 2009-05-11 2010-11-18 Infineon Technologies Ag Power semiconductor module with spaced circuit carriers
JP2011096758A (en) * 2009-10-28 2011-05-12 Kyocera Corp Insulated radiating substrate
KR101059118B1 (en) 2009-01-22 2011-08-25 임경호 Fastening method of circuit board and heat sink with excellent mounting efficiency and light efficiency

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6903457B2 (en) 2002-11-13 2005-06-07 Mitsubishi Denki Kabushiki Kaisha Power semiconductor device
DE10331335B4 (en) * 2002-11-13 2008-10-16 Mitsubishi Denki K.K. Power semiconductor device
DE10331335C5 (en) * 2002-11-13 2014-11-20 Mitsubishi Denki K.K. Power semiconductor device
JP2009147074A (en) * 2007-12-13 2009-07-02 Toyota Industries Corp Semiconductor device
KR101059118B1 (en) 2009-01-22 2011-08-25 임경호 Fastening method of circuit board and heat sink with excellent mounting efficiency and light efficiency
DE102009002993A1 (en) * 2009-05-11 2010-11-18 Infineon Technologies Ag Power semiconductor module with spaced circuit carriers
DE102009002993B4 (en) * 2009-05-11 2012-10-04 Infineon Technologies Ag Power semiconductor module with spaced circuit carriers
US8514579B2 (en) 2009-05-11 2013-08-20 Infineon Technologies Ag Power semiconductor module including substrates spaced from each other
JP2011096758A (en) * 2009-10-28 2011-05-12 Kyocera Corp Insulated radiating substrate

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