JPS5847273A - Method and device for measurement by high frequency - Google Patents

Method and device for measurement by high frequency

Info

Publication number
JPS5847273A
JPS5847273A JP56144627A JP14462781A JPS5847273A JP S5847273 A JPS5847273 A JP S5847273A JP 56144627 A JP56144627 A JP 56144627A JP 14462781 A JP14462781 A JP 14462781A JP S5847273 A JPS5847273 A JP S5847273A
Authority
JP
Japan
Prior art keywords
holding
measured
clamping
high frequency
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56144627A
Other languages
Japanese (ja)
Other versions
JPH0138268B2 (en
Inventor
Koichi Tamai
玉井 光一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP56144627A priority Critical patent/JPS5847273A/en
Publication of JPS5847273A publication Critical patent/JPS5847273A/en
Publication of JPH0138268B2 publication Critical patent/JPH0138268B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

PURPOSE:To perform measurement efficiently with improved reliability by measuring an object to be measured in two states, erected and inverted states, by a constitution wherein the object is held by a self-aligning holding device with insulation members arranged therein and the holding device is inverted. CONSTITUTION:A holding element 10 holding an object to be measured consists of holding plates 11 arranged opposite to each other and of insulation members 12 and 13 arranged so as to insulate the holding plates 11 electrically from other parts, and an opening lever 14 controlling the opening of the holding plates 11 by shaking is connected thereto through the intermediary of a power transmission mechanism, whereby a holding unit 15 is constituted. The holding unit 15 is connected to an inverting unit 20 containing an inversion rod 22 and a positioning cam 21, and when the holding element is inverted at an angle of 180 deg., a steel ball 24 enters one of grooves 23 provided at two opposite places of the positioning cam 21, and thereby the holding element is positioned. Since the object to be measured can be inverted for measurement while it is held by the holding unit 15, the measurement thereof can be made efficient and the reliability of the measurement can be improved.

Description

【発明の詳細な説明】 本発明は高周波測定方法とその装置に関する。[Detailed description of the invention] The present invention relates to a high frequency measurement method and apparatus.

弾性表面波フィルタのような数十MHzの高周波の処理
を行う製品について高周波測定を行うときは、はとんど
作業者により手作業にて処理されていた。このように処
理する理由は、高周波領域における測足は一般に電気的
な外乱をきらい、その影響を除去できないと測定の真値
を得にくいからである。たとえば被測定物の近傍に導体
があるとそれらの誘導によって測定値が変化する。また
被測定物と接触している開示用接触子から増幅器までの
距離はその容量変化を最小限にするように構成しないと
やはり真値は得られない。これらの理由から効率よく高
周波測定する良好な測定装置はなかなか得にくかった。
When performing high frequency measurements on products that process high frequencies of several tens of MHz, such as surface acoustic wave filters, the process is usually done manually by workers. The reason for processing in this way is that foot measurements in a high frequency range are generally sensitive to electrical disturbances, and it is difficult to obtain the true value of the measurement unless the influence can be removed. For example, if there is a conductor near the object to be measured, the measured value will change due to the induction of the conductor. Further, unless the distance from the disclosure contact in contact with the object to be measured to the amplifier is configured to minimize changes in capacitance, the true value cannot be obtained. For these reasons, it has been difficult to obtain a good measuring device that can efficiently measure high frequencies.

しかしながら高周波領域で使用する前記のような製品の
諸特性を測定する装置として種々のものがあり、これら
の測定装置において諸特性を測足するとき、被測定物を
挾持して種々の特性を測足するものであるが、種々の特
性を測足し高周波測定工程になると、挾持部から被測定
物をはずして誘導および容量変化の少ない領域に搬送し
そこで高周波測定を行い、高周波測定が終ってのちもと
の挾持部へもどすという方法がとられていた。このよう
にきわめて能率が悪かった。
However, there are various devices used in the high frequency range to measure the various characteristics of products such as those mentioned above, and when measuring the various characteristics with these measuring devices, the object to be measured is held in place and the various characteristics are measured. However, when it comes to the high-frequency measurement process after measuring various characteristics, the object to be measured is removed from the clamping part, transported to an area with little induction and capacitance change, and high-frequency measurements are performed there. The method used was to return it to its original holding area. In this way, it was extremely inefficient.

又、製品を測定するとき、たとえば第1図に示すような
製品のときには、被測定物(1)が囚の状態か(BJの
状態か何れか1方の状態にて全製品の高周波測定が行わ
れるものである。図の(2)はリードである。したがっ
て被測定物の内部にリントなどの微細物が残留している
ときは、たとえば前記(4)の状態のときは内部に配設
されている部材たとえばチップ部パターン上に前記の微
細物が付着していなくて特性測定結果が良となっても、
製品出荷後運搬にて或は装置にとりつけられるなどして
前記(B)の状態になったとき管内の微細物が管内部材
上に付着して不良となることがある。
Furthermore, when measuring a product, for example, a product as shown in Figure 1, high-frequency measurement of the entire product is performed when the object to be measured (1) is either in a captive state (BJ state) or in one of the following states. (2) in the figure is a lead. Therefore, if fine particles such as lint remain inside the object to be measured, for example in the state (4) above, it is necessary to Even if the characteristics measurement result is good because the fine particles are not attached to the chip part pattern,
When the product reaches the condition (B) during transportation after shipping or when it is attached to a device, fine particles inside the tube may adhere to the inner material of the tube, resulting in a defect.

このように従来の高周波測定においては種々の欠点があ
って、高周波測定を適確かつ能率的に行うことがむつか
しかった。
As described above, conventional high frequency measurements have various drawbacks, making it difficult to perform high frequency measurements appropriately and efficiently.

本発明はこの点にかんがみなされたものであって、被測
定物を高周波測定するにあたり、被測定物を測定装置に
とりつけて自動式ζこて信頼性を向上させるように効率
よく測置することのできる高周波測定方法とその装置を
提供するものである。
The present invention has been made in consideration of this point, and is an object of the present invention to efficiently measure the object to be measured by attaching it to a measuring device and improving the reliability of the automatic ζ trowel when performing high-frequency measurements on the object to be measured. The purpose of the present invention is to provide a high frequency measurement method and device that can perform the same.

すなわち被測定物を正立と倒立の2状態にて測定し、測
定装置は被測定物を脱着することなく容易に正立と倒立
の状態にして測定することのできる測定装置であること
を特徴とする。ここに正立と倒立の状態とはたとえば前
記第1図の(AJ状態と同図(旬状態をいう。
In other words, the measurement device measures the object in two states, upright and inverted, and the measuring device is capable of easily measuring the object in the upright and inverted states without removing or attaching the object. shall be. Here, the erect and inverted states refer to, for example, the AJ state and the inverted state shown in FIG.

以下N面を参照して本発明の実施例について説明する。Examples of the present invention will be described below with reference to the N-side.

第2図〜第4図に本発明の測定装置を示す。被測定物を
挾持する挾持部q1は、互に対向して配設された挾持板
(11)と、この挾持根羽)を測定装置の他の部分と電
気的に絶縁するように配設された絶縁部材(121、0
31からなり、前記挾持板(11)の開閉量を揺動によ
り制御する開閉レバー01が動力伝達機構(詳細は後記
)を介して接続されていて、被測定物の自動調心挾持装
置(轡が形成されている。
The measuring device of the present invention is shown in FIGS. 2 to 4. The clamping part q1 that clamps the object to be measured is arranged so as to electrically insulate the clamping plates (11) and the clamping blades arranged to face each other from other parts of the measuring device. Insulating member (121, 0
31, and an opening/closing lever 01 that controls the opening/closing amount of the clamping plate (11) by swinging is connected via a power transmission mechanism (details will be described later), and is connected to a self-aligning clamping device (holder) for the object to be measured. is formed.

この挾持装置を反転させる、すなわち第3図に示すよう
に被測定物(1)を挾持した挾持部を図に点線で示す位
置(B)まで180度回転させる反転装置@が前記挾持
装置[相]に接続して配設されている。この反転装置■
は一端が前記挾持装置鯵に接続し、他端ζこ位置決めカ
ム(!1)が配設された反転棒C力からなり、前記位置
決めカム011には図示しない反転装置ドライバが嵌入
する溝(2:1が180度方向に2個所設けられている
A reversing device @ that inverts this clamping device, that is, rotates the clamping part that clamps the object to be measured (1) 180 degrees to the position (B) indicated by the dotted line in the figure as shown in FIG. ]. This reversing device■
is a reversing rod C having one end connected to the clamping device and a positioning cam (!1) at the other end, and the positioning cam 011 has a groove (2) into which a reversing device driver (not shown) is fitted. :1 is provided at two locations in the 180 degree direction.

このような測定装置によって、被測定物の高周波測定を
行うには次のようにして行う。
High-frequency measurements of an object to be measured can be performed using such a measuring device as follows.

被測定物を挾持板にはさむため挾持板の開閉を行うには
、開閉レバー(1力からの挾持板011への動力伝達に
より行われる。すなわち開閉レバーf14)、駆動棒0
6)、開閉腕α力、挟持板支持腕(181、挾持板0旧
こて行われ、開閉レバー0滲を図に示す点線の位置(1
45tこ移動させ、この開閉レバーに連結されている駆
動棒tteが回転し、この駆動棒(161に固定されて
いる開閉腕071が点線のように回動するので、挾持板
支持腕(壇がその間隔を広げるように動き、挾持板0]
Jは図の点線のように開き、被測定物が挿入されて、次
に前記と逆の動作にて被測定物は相対向する一対の挾持
板にかたく挾持される。このように挾持された被測定物
の高周波測定を行う。
To open and close the clamping plates in order to sandwich the object to be measured between the clamping plates, an opening/closing lever (1 force is transmitted to the clamping plate 011, that is, opening/closing lever f14), a drive rod 0
6), opening/closing arm α force, clamping plate support arm (181, clamping plate 0) is performed, opening/closing lever 0 is at the dotted line position (1) shown in the figure.
45t, the drive rod tte connected to this opening/closing lever rotates, and the opening/closing arm 071 fixed to this driving rod (161) rotates as shown by the dotted line. Move to widen the gap, clamping plate 0]
J is opened as shown by the dotted line in the figure, the object to be measured is inserted, and then the object to be measured is firmly clamped by a pair of opposing clamping plates by the reverse operation. High frequency measurements of the object to be measured held in this manner are performed.

前記開閉腕07)は両端部に精密に溝(11が加工して
形成されていて、その溝(13にはピンC30)が挿入
され、このピンと溝との間隙は極めて小さくしてあり、
かつピンの中心と駆動棒の中心とは常に一直線になるよ
うに配設されている。このために自動調心効果が得られ
、被測定物の外径が多少変っても常に中心が得られ位置
精度保障の高い保持が出来る。
The opening/closing arm 07) has precisely machined grooves (11) at both ends, into which the pin C30 is inserted, and the gap between the pin and the groove is extremely small.
Moreover, the center of the pin and the center of the drive rod are always arranged in a straight line. For this reason, a self-centering effect is obtained, and even if the outer diameter of the object to be measured changes slightly, the center can always be obtained and the object can be held with high position accuracy.

した、かって高周波測定するときに被測定物のリード(
2)と測定用の接触子(図示せず)が一定の位置になり
、かつ挾持部には前記したように絶縁スペーサ(1渇と
P3縁スリーブ(13)とからなる絶縁部材が配設され
ているC・′)で、装置に装着したまま測定ができ、常
に安定した開示値が得られる。
In the past, when making high-frequency measurements, the leads of the object under test (
2) and the measuring contact (not shown) are in a fixed position, and as described above, an insulating member consisting of an insulating spacer (1) and a P3 edge sleeve (13) is provided in the clamping part. With C・'), measurements can be taken while attached to the device, and stable disclosure values can always be obtained.

次に挾持部を180度反転するには反転装置により行う
。反転棒(221の他端に配設された位置決めカム12
11には180度方向に2個所位置決め溝C23)が設
けてあり、反転装置のドライバーが位置決めカムの溝内
に入り回転すると、反転棒(221の一端に接続されて
いる被測定物が挾持された挾持装置0は被測定物を挾持
したまま反転して図の点線の位置(BJに反転される。
Next, the clamping portion is reversed 180 degrees using a reversing device. The positioning cam 12 provided at the other end of the reversing rod (221)
11 is provided with two positioning grooves C23) in a 180 degree direction, and when the driver of the reversing device enters the groove of the positioning cam and rotates, the object to be measured connected to one end of the reversing rod (221) is clamped. The holding device 0 is inverted while holding the object to be measured, and is inverted to the position indicated by the dotted line (BJ) in the figure.

この様に180度反転させたあとの精度保証は位置決め
カム(211外面に設けられた前記位置決め溝困に鋼球
C1!ルが入ることによって行う。この鋼球(241は
常に圧縮はね(25)によって位置決めカムCOD外面
に力がかかるようになっており、反転時には位置決め溝
から圧縮ばねが作用し鋼球がはずれる。この鋼球を保持
している保持具Cに)の内径と鋼球C1!力の外径の間
隙が挟持装置に)の回転方向の精度に効くので最小に押
えておくことが必要である。
Accuracy after the 180 degree inversion is ensured by inserting the steel ball C1 into the positioning groove provided on the outer surface of the positioning cam (211). ) applies force to the outer surface of the positioning cam COD, and when the positioning cam COD is reversed, a compression spring acts from the positioning groove and the steel ball comes off. !The gap between the outer diameters of the force affects the accuracy of the rotating direction of the clamping device, so it is necessary to keep it to a minimum.

このように挾持部に被測定物を挾持したまま180度反
転させてのち前記と同じようlこ高周波測定を行う。し
たがってもしも前記したようなふたの冠着された被測定
物の内部にごみや内部に装着された部材の小破片などが
あった場合には正立と倒立の2つの状態で測定するので
、従来のように何れか一つの状態で測定するのに比べ良
否の選別が格段に向上し、不良品であるのに良品と判定
されることはなくなり、また絶縁部材が配設されている
ので装置に挾持させたままで高周波測定をすることが出
来て、より厳選された製品が能率よく選別できるもので
ある。
After the object to be measured is held in the holding portion and turned over 180 degrees, high-frequency measurement is performed in the same manner as described above. Therefore, if there is dust or small pieces of parts attached to the lid inside the object to be measured, as described above, the measurement is carried out in two positions: upright and inverted. Compared to measuring only one state, the selection of pass/fail is much improved, and it is no longer judged as a good product when it is a defective product.In addition, since an insulating member is installed, High-frequency measurements can be made while the device is held in place, allowing more carefully selected products to be sorted out efficiently.

なお、測定装置が量産時には多数配列され、それぞれ番
こ被測定物が挾持されて測定が行オ〕れるものであるが
、この場合には各装置ともその挾持板の開き具合が一様
でなければならない。つまり被測定物と挾持板との間隔
が一足でなければならない。この理由は前記のような方
向性のある被測定物の場合は、挾持板を少し開き、被測
定物を回転させて足位置法めを行い、位置決め後は挾持
板を閉め、その位置を不動のものとしている。これらの
開き具合がばらばらであると量産時の測定を能率よく行
うことが出来ない。したがって本発明では、従来行って
いた手間のかかるAl1記の開閉レバー041を微調整
することによって行っていた調整を次のようにして精度
よく簡素化させて行っている。
In addition, during mass production, a large number of measuring devices are arranged, and the measurement is performed by holding the object to be measured in each one. In this case, the opening of the clamping plates of each device must be uniform. Must be. In other words, the distance between the object to be measured and the clamping plate must be one foot. The reason for this is that in the case of a directional object as mentioned above, the clamping plate is slightly opened and the object is rotated to determine the foot position, and after positioning, the clamping plate is closed and the position is fixed. It belongs to If these openings vary, measurements during mass production cannot be carried out efficiently. Therefore, in the present invention, the conventionally time-consuming and labor-intensive adjustment by finely adjusting the opening/closing lever 041 of Al1 is simplified and performed with accuracy as follows.

すなわちカムフロア−c31)に使用するポル) u’
aを偏心ボルトにして配設しである。これにより挾持板
の開き量を精度よくすべてについて一定とすることが出
来、作業を簡素化できる開閉量微調整装置となる。
In other words, the pol used for cam floor-c31) u'
A is arranged as an eccentric bolt. As a result, the amount of opening of the clamping plate can be kept constant for all the openings with high precision, resulting in an opening/closing amount fine adjustment device that can simplify the work.

なお挾持板(ill、挾持板支持腕08cまスライドボ
ールo3とそのガイドレールc’+t+ 、 osによ
って摺動が可能である。
The clamping plate (ill) and the clamping plate support arm 08c can be slid by the slide ball o3 and its guide rails c'+t+ and os.

前記したように本発明の測定装置lこよって被測定物を
高周波測定すれば、測定装置に挾持したままで測定が可
能となり、反転させての測だがあわせ行えるので従来に
比べ能率が向上し生産性があがり、かつ見過ごされてい
た不良品の選別が出来て、厳選された信頼性の高い製品
を供給することが出来る。
As mentioned above, by performing high-frequency measurements on the object to be measured using the measuring device of the present invention, it is possible to measure the object while it is held in the measuring device, and it is also possible to perform measurements while inverting the object at the same time, improving efficiency and increasing productivity compared to conventional methods. This improves quality and allows the selection of overlooked defective products, making it possible to supply carefully selected and highly reliable products.

なお被測定物を挾持する挟持部に配設された挟持板には
、第2図に示すように被測定物を良好に挾持できるよう
に互に対向してそれぞれ三角形状の切りこみ((2)が
設けられているが、この角度はほぼ120度であるもの
が好適である。
As shown in Fig. 2, the clamping plates installed in the clamping section that clamps the object to be measured are provided with triangular notches ((2)) facing each other so that the object to be measured can be held well. is provided, but this angle is preferably approximately 120 degrees.

【図面の簡単な説明】[Brief explanation of drawings]

第1図いJ、(Blは高周波測定される被測定物の正面
図、第2図は本発明装置の1実施例の平面図、第3図は
同じく側面図、第4図は同じく反転装置部分の拡大説明
図である。 1・・被測定物、2・・−リード、 朋・・・挾持部、
11・・挾持板、12 、13・・絶縁部材、 14・
・・開閉レバー、独・・・自動調心挾持装置、岨・・反
転装置、21・・位置決めカム、16・・・駆動棒、1
7・・開閉腕、18・・−挾持板支持腕、22・・・反
転棒、31・・・カムフロア−132・・−ボルト、3
6・・・挾持板の切りこみ。 代理人 弁理士 井 上 −男 手続補正書(自発) 昭和 年 月  日 特許庁長官 島 1)春 樹 殿 1、事件の表示 昭和56年特許願第144627号。 2、発明の名称 高周波測定方法とその装置 3、補正をする者 事件との関係 特許出願人 (307)東京芝浦電気株式会社 4、代理人 〒144 東京都大田区蒲田4丁目41番11号 第−津野田ビル 弁上特許事務所内 5、補正の対象 図  面 6、補正の内容 図  面 第2図、第3図および第4図を別紙のとおり補正する。 以上
Figure 1 (Bl) is a front view of the object to be measured by high frequency measurement, Figure 2 is a plan view of an embodiment of the device of the present invention, Figure 3 is a side view, and Figure 4 is a reversing device. It is an enlarged explanatory view of the parts. 1. Object to be measured, 2. - Lead, Friend... Holding part.
11. Holding plate, 12, 13. Insulating member, 14.
・・Opening/closing lever, ・・・Self-aligning clamp device, ・・Reversing device, 21・・Positioning cam, 16・・Drive rod, 1
7...Opening/closing arm, 18...-Holding plate support arm, 22...Reversing rod, 31...Cam floor-132...-Bolt, 3
6... Notch in the clamping board. Agent: Patent Attorney Inoue - Male Procedural Amendment (spontaneous) Date: Month, Showa, Director General of the Patent Office Shima 1) Haruki Tono 1, Indication of Case Patent Application No. 144627 of 1982. 2. Name of the invention: High-frequency measurement method and its device 3. Relationship with the person making the amendment Patent applicant (307) Tokyo Shibaura Electric Co., Ltd. 4, Agent 4-41-11 Kamata, Ota-ku, Tokyo 144 Japan -Tsunoda Building Benjo Patent Office 5, drawing subject to amendment 6, content of amendment drawings 2, 3 and 4 are amended as shown in the attached sheet. that's all

Claims (3)

【特許請求の範囲】[Claims] (1)高周波測定される被測定物を絶縁部材の配設され
た挟持装置に挾持して高周波測定する工程と、前記挾持
装置に被測定物を挾持したまま前記挾持装置を反転させ
てのち再び高周波測定を行う工程を具備したことを特徴
とする高周波測定方法。
(1) The step of performing high frequency measurement by holding the object to be measured in a holding device provided with an insulating member, and reversing the holding device while holding the object to be measured in the holding device, and then repeating the high frequency measurement again. A high frequency measurement method characterized by comprising a step of performing high frequency measurement.
(2)高周波測定される被測定物を挾持部にて固着する
自動調心挾持装置と、この挟持装置に配設され挟持部を
電気的に絶縁する絶縁部材と、前記挾持装置の挾持部の
開閉量を微調整する調整装置と、前記挾持装置を反転さ
せる反転装置を具備したことを特徴とする高周波測定装
置。
(2) A self-aligning clamping device that fixes the object to be measured at high frequency using the clamping portion, an insulating member disposed on the clamping device to electrically insulate the clamping portion, and a clamping portion of the clamping device. A high frequency measurement device comprising: an adjustment device for finely adjusting the opening/closing amount; and a reversing device for reversing the clamping device.
(3)被測定物を固着する挾持部に互に対向して挟持板
が配設され、この挟持板の被測定物を挾持する部分に形
成された三角形状の切りこみの角度がほぼ120度であ
ることを特徴とする特許請求の範囲第2項記載の高周波
測定装置。
(3) Clamping plates are arranged opposite to each other in the clamping parts that fix the object to be measured, and the angle of the triangular notch formed in the part of the clamping plate that clamps the object to be measured is approximately 120 degrees. A high frequency measuring device according to claim 2, characterized in that:
JP56144627A 1981-09-16 1981-09-16 Method and device for measurement by high frequency Granted JPS5847273A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56144627A JPS5847273A (en) 1981-09-16 1981-09-16 Method and device for measurement by high frequency

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56144627A JPS5847273A (en) 1981-09-16 1981-09-16 Method and device for measurement by high frequency

Publications (2)

Publication Number Publication Date
JPS5847273A true JPS5847273A (en) 1983-03-18
JPH0138268B2 JPH0138268B2 (en) 1989-08-11

Family

ID=15366432

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56144627A Granted JPS5847273A (en) 1981-09-16 1981-09-16 Method and device for measurement by high frequency

Country Status (1)

Country Link
JP (1) JPS5847273A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH049277A (en) * 1990-04-26 1992-01-14 Nippon Steel Corp Plasma arc heating or surface treating method by magnetic drive

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH049277A (en) * 1990-04-26 1992-01-14 Nippon Steel Corp Plasma arc heating or surface treating method by magnetic drive

Also Published As

Publication number Publication date
JPH0138268B2 (en) 1989-08-11

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