JPS5847203A - Device for measuring a sectional configuration of an object with uneven surface - Google Patents

Device for measuring a sectional configuration of an object with uneven surface

Info

Publication number
JPS5847203A
JPS5847203A JP14551381A JP14551381A JPS5847203A JP S5847203 A JPS5847203 A JP S5847203A JP 14551381 A JP14551381 A JP 14551381A JP 14551381 A JP14551381 A JP 14551381A JP S5847203 A JPS5847203 A JP S5847203A
Authority
JP
Japan
Prior art keywords
probe
stylus
peak value
oscillator
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14551381A
Other languages
Japanese (ja)
Inventor
Hidenori Kubota
久保田 英範
Akihiko Oota
昭彦 太田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Research Institute for Metals
Original Assignee
National Research Institute for Metals
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by National Research Institute for Metals filed Critical National Research Institute for Metals
Priority to JP14551381A priority Critical patent/JPS5847203A/en
Publication of JPS5847203A publication Critical patent/JPS5847203A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/20Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures

Abstract

PURPOSE:To enable measurement of a shape of an object without a probe being caught in the uneven surface of the object by means of a structure wherein a probe movable in contact with the surface of an object under measurement is raised at a certain interval and a lower peak value of the probe's locus per interval is electrically output, said peak value being magnified and recorded. CONSTITUTION:The probe 11 with its radius of about 2mm. is movable cross-wise in accordance with the shape of the object under measurement. Another probe 9 with a sharpened end is connected to a raising string 15 which is securted to an oscillator 19 via a pulley 17. By turning the eccentric axis of the oscillator 19 by means of a motor 18, the probe 9 is cyclically raised by the oscillator 19 in the vertical direction so that fine unevenness of the surface of the object can be measured without the probe being caught in the unevenness. Also, the lower peak value of the probe's locus per interval is electrically output and is magnified and recorded whereby fine variation in surface level can be scribed out.

Description

【発明の詳細な説明】 本発明は不規則な表面形状を有する三次元物体の断面形
状を二次元図形に描かせる装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an apparatus for drawing a cross-sectional shape of a three-dimensional object having an irregular surface shape into a two-dimensional figure.

従来、不規則な表面形状を有する三次元物体の断面形状
を測定する方法としては、(1)シリコンゴム等で形取
りを行い、得られた形取り物の切断面を投影器などによ
り観察する方法。(2)針を針圧数gで物体表面に接触
させながら、針の自動送シを行って針先の移動軌跡を記
録する方法。(3)作業者が物体表面を触針でなぞシ、
触針とリンクして動作する検出器により、触針の移動軌
跡を記録する方法等がある。
Conventionally, methods for measuring the cross-sectional shape of a three-dimensional object with an irregular surface shape include (1) making a shape with silicone rubber, etc., and observing the cut surface of the obtained shape with a projector, etc. Method. (2) A method in which the needle is brought into contact with the surface of an object with a needle pressure of several grams, and the needle is automatically fed to record the movement trajectory of the needle tip. (3) The worker traces the surface of the object with a stylus,
There is a method of recording the movement trajectory of the stylus using a detector that operates in conjunction with the stylus.

前記(1)の方法は、自動測定ができないこと。Method (1) above does not allow automatic measurement.

測定しようとする断面の正確な位置が定まらないこと。The exact location of the cross section to be measured cannot be determined.

断面が平で々い時は焦点が投影面の場所によって異なる
ために、像がほやはてし壕うことおよび像を人の視覚に
よシ写すために、測定者によル断面形状が微妙に異って
くる欠点がある。第(2)の方法は、被測定物の表面の
凹凸の激しいところでは針がひっかかり、測定できない
欠点がある。また(3)の方法は、主として太きなうね
多のある表面形状を測定する方法であり、%o ミ!j
メートル以上の分解能がなく、しかも作業員が表面をガ
ぞる必要があシ、自動測定できない欠点がある。
When the cross section is flat and large, the focal point differs depending on the location on the projection surface, so the image becomes uneven, and the cross-sectional shape is difficult for the measurer to see because the image is clearly visible to the human eye. There are different drawbacks. The second method has the disadvantage that the needle gets caught in areas where the surface of the object to be measured is severely uneven, making it impossible to measure. In addition, method (3) is a method that mainly measures surface shapes with thick ridges, and %o mi! j
It does not have a resolution of meters or higher, requires a worker to scrape the surface, and has the drawback of not being able to measure automatically.

本発明は前記の如き欠点を解消し、触針が物体表面に引
かかることがなく、凹凸の激しい表面を有する物体の断
面形状も正確に容易に画像として描くことが可能な装置
を提供するにある。
The present invention solves the above-mentioned drawbacks, and provides an apparatus that prevents the stylus from getting caught on the surface of an object and that can accurately and easily draw an image of the cross-sectional shape of an object having a highly uneven surface. be.

するもので、第2図−1はその一部縦断面図、第2図−
2はその側面図、第2図−3はその平面図を示す。
Figure 2-1 is a partial vertical sectional view of the
2 shows its side view, and FIGS. 2-3 show its plan view.

1は被測定物で、これは固定用バイス2により固定され
る。3は測定器を横送如する移動台で、とれは駆動用モ
ータ4にプーリーを取付けて駆動用ワイヤー5をプーリ
ーに数回巻いて両端を固定することによシ横方向に移動
する。横方向の移動量は横方向位置検出用ワイヤー6を
横方向位置検出用可変抵抗器7の先に取付けたプーリー
にワイヤー6を数回巻いて両端を固定し、横方向の移動
量に比例して電圧が変化するようになっている。
Reference numeral 1 denotes an object to be measured, which is fixed by a fixing vise 2. Reference numeral 3 denotes a movable table for horizontally moving the measuring instrument, which is moved in the horizontal direction by attaching a pulley to the driving motor 4 and winding the driving wire 5 around the pulley several times and fixing both ends. The amount of lateral movement is determined by winding the wire 6 for lateral position detection several times around a pulley attached to the end of the variable resistor 7 for lateral position detection and fixing both ends. The voltage changes as the voltage changes.

移動台本体3の上には測定器本体8が取付けられておシ
、この測定器本体8に取付けられている触針が被測定物
1の表面を走査し、被測定物表面の縦方向位置を検出す
る。これらの縦横位置はX−Yレコーダー上に任意の倍
率で断面形状として記録される。′8.た縦横の電気信
号を〜巾変換して電子h1算機に入力し、画像処理を施
こすことによシ断面形状の自動解析を行うことができる
A measuring device main body 8 is mounted on the movable table main body 3, and a stylus attached to the measuring device main body 8 scans the surface of the object to be measured 1, and determines the vertical position of the surface of the object to be measured. Detect. These vertical and horizontal positions are recorded as a cross-sectional shape at an arbitrary magnification on an X-Y recorder. '8. Automatic analysis of the cross-sectional shape can be performed by converting the vertical and horizontal electrical signals into widths, inputting them into an electronic h1 calculator, and performing image processing.

次に測定器本体を第2図によって説明すると、該測定器
本体は被測定物を走査する触針を2個備えている。触針
11はその先端半径が約2Wであシ、被測定物の細かな
凹凸を無視し、太きなうねシ、起伏に従って横方向に移
動する。この触針11は支柱12の下方に取付けられて
おシ、支柱12の上方にはプーリー13が取付けられて
いる。他の1つの触針9は、その先端半径が約20μm
の尖った先端を有し、被測定物表面の細かな凹凸を走査
するものである。セして触針9は測定器本体に固定され
た支柱14よ)垂れ下った引上げ月光15に連結さIt
ておシ、該引上げ月光15は触針9の上方に固定された
プーリー17を通っ°C加振器19に固定されている。
Next, the main body of the measuring instrument will be explained with reference to FIG. 2. The main body of the measuring instrument is equipped with two stylus probes that scan the object to be measured. The tip radius of the stylus 11 is approximately 2W, and it moves in the lateral direction following thick ridges and undulations, ignoring the fine irregularities of the object to be measured. The stylus 11 is attached below the column 12, and a pulley 13 is attached above the column 12. The other stylus 9 has a tip radius of approximately 20 μm.
It has a sharp tip and scans fine irregularities on the surface of the object to be measured. Then, the stylus 9 is connected to the lifting moonlight 15 hanging down from the support 14 fixed to the main body of the measuring instrument.
The pulled moonlight 15 passes through a pulley 17 fixed above the stylus 9 and is fixed to a °C vibrator 19.

加振器19は偏心軸をモータ18により回転させること
によシ振動し中心からの距離を変えるだけで引上げ甘が
容易に調整できるようになっている。従って、触針9は
加振器19によって周期的に縦方向に引上げられ、これ
により微細で急峻な凹凸変化に対しても引がかることが
なく計測することができる。
The vibrator 19 is vibrated by rotating an eccentric shaft by a motor 18, and the pulling strength can be easily adjusted by simply changing the distance from the center. Therefore, the stylus 9 is periodically pulled up in the vertical direction by the vibrator 19, thereby making it possible to measure even minute and steep unevenness changes without getting stuck.

触針9の引上げ量は、触針9に連動する支柱12とプー
リー13の作用によって定まる。急な立上シの所では加
振器19の振幅に近づき、平坦な所では小さくなる。従
って、触針9の周期的な上下動による慣性力は必要以上
に大きくとプーリー16との間には、差動トランス用コ
アー20があシ、触針9の縦方向の位置を高分触能の差
動トランス21によシ検出するようになっている。
The amount by which the stylus 9 is pulled up is determined by the action of the strut 12 and pulley 13 that are interlocked with the stylus 9. The amplitude approaches the amplitude of the vibrator 19 at steep rise points, and decreases at flat locations. Therefore, if the inertial force due to the periodic vertical movement of the stylus 9 is larger than necessary, the differential transformer core 20 is disposed between the pulley 16 and the vertical position of the stylus 9 is moved too high. Detection is performed using a differential transformer 21 of high power.

第3図は各場所での電気信号を示した図であ5− る。線Aは触針9の縦方向出力信号と移動台本体3の横
方向出力信号を数十倍に拡大したものである。線Bは投
影器によ)線Aと同倍率に拡大したものである。両者を
比較すると、1llAにおいては、急表立ち上がシの所
では振幅が大きく、平坦な所では振幅が小さく現われる
。線Aのような波形の各周期毎の下ピークをピーク検出
器22により得られた波形は11iiCのような階段状
の波形である。この段の高さと幅はいずれも数10μm
前後であるため、X −Y L/コーダー上では無視さ
れて測定断面と同様な曲線が描かれる。また各段のX−
Y座表を電子計算機に入力することによシ容易に曲線の
解析が可能である。
Figure 3 is a diagram showing the electrical signals at each location. Line A is the vertical direction output signal of the stylus 9 and the horizontal direction output signal of the movable table main body 3 magnified several tens of times. Line B is magnified to the same magnification as line A (by a projector). Comparing the two, in 1llA, the amplitude appears to be large at steep slopes and small at flat areas. The waveform obtained by the peak detector 22 from the lower peak of each cycle of the waveform as shown by line A is a stepped waveform as shown in 11iiC. The height and width of this step are both several tens of micrometers.
Since it is before and after, it is ignored on the X-Y L/coder and a curve similar to the measurement cross section is drawn. Also, each row of X-
Curves can be easily analyzed by inputting the Y coordinate table into a computer.

本装置を使用して20倍に描かした曲線と、シリコンゴ
ムによる雛形を投影器を用いて20倍に拡大し、0.5
1111の太さの線で描いた曲線は、線の太さの範囲で
一致した。
The curve drawn using this device and the silicone rubber template were enlarged 20 times using a projector, and 0.5
The curves drawn using lines with a thickness of 1111 matched within the range of line thickness.

なお、前記装置における横方向への自動送シ機構に代え
、ネジを用いる方法、ラックとピニ6− ョンとによる方法、油圧シリンダーを用いる方等によっ
てもよい。横方向位置を検出する高分解能で直線性のよ
い可変抵抗を用いたが、これに代えマグネスケール、差
動トランス笠を用いることができる。
Note that instead of the automatic lateral feeding mechanism in the above device, a method using a screw, a method using a rack and a pinion, a method using a hydraulic cylinder, etc. may be used. Although a variable resistor with high resolution and good linearity was used to detect the lateral position, a Magnescale or a differential transformer cap can be used instead.

゛また、加振器も機椋的A物でなく、マクネット、空気
圧、油圧などを用いて行ってもよい。
゛Furthermore, the vibration exciter is not a mechanical one, but may be performed using a Macnet, pneumatic pressure, hydraulic pressure, or the like.

さらに加振器による振幅を調整するために先端半径の大
きな触針11を設はだが、これを使用することなく、先
端半径の小さ万触針9の引上けの名局JIJJにおける
1周期前の下ピーク値に追白な偏麩即ち引上げ量の偏差
を与えるような機構のものとしてもよい。
Furthermore, in order to adjust the amplitude of the vibrator, a stylus 11 with a large tip radius is installed. It is also possible to use a mechanism that gives an additional deviation to the lower peak value, that is, a deviation in the amount of lifting.

本発明の測定装置によると、従来装置におけるような触
針が急な立ち上り部分に引かかシ正確なill定値が得
られない欠点がなく、複雑な凹凸を有する被測定物でも
、融釧を一定の周期で引上げることによシ、触針がり1
かかるようなことがなく、正確な測定値が得られる。ま
た触針光の軌跡のイ5−周期毎の下ピーク値を電気的に
取出し、それを倍率して記録させるため、微妙な凹凸も
正確に描き出すことが可能であシ、その描いた曲線の解
析は例えば電気信号を直接計算機に入力することによシ
、人の視覚などによる誤差が少なく正確な画像処理を行
うことができる優れた効果を有する。
According to the measuring device of the present invention, there is no drawback that an accurate illumination constant value cannot be obtained due to the stylus being drawn to a steeply rising part as in conventional devices, and the molten hook can be maintained at a constant temperature even when the object to be measured has complex irregularities. By pulling up the stylus at a period of 1
This does not occur and accurate measurement values can be obtained. In addition, since the lower peak value of the trajectory of the stylus light is electrically extracted for each period, and it is magnified and recorded, it is possible to accurately depict even subtle irregularities, and the curves drawn For example, by directly inputting electrical signals into a computer, analysis has the advantage of being able to perform accurate image processing with fewer errors caused by human vision.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の測定装置全体の概要を示す斜視図、第
2図は測定器本体を示すもので、第2図−1はその一部
縦断面図、第2図−2はその側面図、第2図−3はその
平面図、第3図は被測定物の各場所での電気信号を示し
た図である。 1:被測定物    2:固定用バイス3:移動台  
   4:駆動用モータ5:駆動用ワイヤー 6:位置
検出用ワイヤー7:可変抵抗器   8:測定器本体 9:11:触針   10:X−Yレコーダー12:1
4:支柱   13: 16:17:プーリー15:触
針引上げ用の糸 18:加振器駆動用モータ 19:加振器      20:差動トランス用コアー
21:差動トランス A線:差動トランスアップの出力と横方向の信号曲線 B線二投影器よシ得られた曲線 C線二下ピーク検出器の出力信号図 D:倍信号横方向の拡大図 特許出願人 科学技術庁金属材料技術研究所長9− 2 第2図−3
Fig. 1 is a perspective view showing an overview of the entire measuring device of the present invention, Fig. 2 shows the main body of the measuring device, Fig. 2-1 is a partial vertical sectional view thereof, and Fig. 2-2 is a side view thereof. 2-3 are plan views thereof, and FIG. 3 is a diagram showing electrical signals at various locations on the object to be measured. 1: Object to be measured 2: Fixing vise 3: Moving table
4: Drive motor 5: Drive wire 6: Position detection wire 7: Variable resistor 8: Measuring instrument body 9: 11: Stylus 10: X-Y recorder 12: 1
4: Strut 13: 16:17: Pulley 15: Thread for pulling up the stylus 18: Vibrator drive motor 19: Vibrator 20: Core for differential transformer 21: Differential transformer A line: Differential transformer up Output and lateral signal curve B line 2 curves obtained from the C line 2 peak detector output signal Diagram D: Enlarged view of doubled signal lateral direction Patent applicant Director, National Institute of Metals and Materials Technology, Science and Technology Agency 9-2 Figure 2-3

Claims (1)

【特許請求の範囲】[Claims] 被測定物の表面に接触して移動する触針を一定周期で引
上げるように構成し、その触針先端の軌跡の各周期毎の
下ピーク値を電気的に取出す手段を有し、該ピーク値を
倍率して記録するように構成したことを特徴とする不規
則な表面形状を有する物体の断面形状の測定装置。
A stylus that moves in contact with the surface of the object to be measured is configured to be pulled up at regular intervals, and has means for electrically extracting the lower peak value for each period of the locus of the tip of the stylus, 1. A measuring device for measuring the cross-sectional shape of an object having an irregular surface shape, characterized in that it is configured to magnify and record a value.
JP14551381A 1981-09-17 1981-09-17 Device for measuring a sectional configuration of an object with uneven surface Pending JPS5847203A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14551381A JPS5847203A (en) 1981-09-17 1981-09-17 Device for measuring a sectional configuration of an object with uneven surface

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14551381A JPS5847203A (en) 1981-09-17 1981-09-17 Device for measuring a sectional configuration of an object with uneven surface

Publications (1)

Publication Number Publication Date
JPS5847203A true JPS5847203A (en) 1983-03-18

Family

ID=15386973

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14551381A Pending JPS5847203A (en) 1981-09-17 1981-09-17 Device for measuring a sectional configuration of an object with uneven surface

Country Status (1)

Country Link
JP (1) JPS5847203A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006051344A (en) * 2004-07-16 2006-02-23 Daiwa Seiko Inc Felt shoe sole
JP2006110336A (en) * 2004-09-17 2006-04-27 Daiwa Seiko Inc Felt-made sole
JP2006175218A (en) * 2004-11-26 2006-07-06 Daiwa Seiko Inc Felt-made shoe sole

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4946762A (en) * 1972-09-07 1974-05-04

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4946762A (en) * 1972-09-07 1974-05-04

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006051344A (en) * 2004-07-16 2006-02-23 Daiwa Seiko Inc Felt shoe sole
JP2006110336A (en) * 2004-09-17 2006-04-27 Daiwa Seiko Inc Felt-made sole
JP2006175218A (en) * 2004-11-26 2006-07-06 Daiwa Seiko Inc Felt-made shoe sole

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