JPS5838875A - Device to test insulation between turns - Google Patents

Device to test insulation between turns

Info

Publication number
JPS5838875A
JPS5838875A JP56136776A JP13677681A JPS5838875A JP S5838875 A JPS5838875 A JP S5838875A JP 56136776 A JP56136776 A JP 56136776A JP 13677681 A JP13677681 A JP 13677681A JP S5838875 A JPS5838875 A JP S5838875A
Authority
JP
Japan
Prior art keywords
voltage
waveform
impulse
windings
difference
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56136776A
Other languages
Japanese (ja)
Inventor
Yoshiyuki Inoue
良之 井上
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP56136776A priority Critical patent/JPS5838875A/en
Publication of JPS5838875A publication Critical patent/JPS5838875A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/34Testing dynamo-electric machines
    • G01R31/346Testing of armature or field windings

Abstract

PURPOSE:To detect good or no good of the insulation between turns easily and accurately by applying impulse voltage only to one group of windings and grounding the other groups of windings and judging good or no good based on the difference of applied voltage wave shapes and so on. CONSTITUTION:An impluse voltage is applied to the U-phase windings of a plurality of groups of windings 3 through an impulse voltage generator 1, wave shaping circuit 2 and a switch 6, and the other V- and W-phase windings are grounded. The wave shape of this applied voltage wave shape is stored in a memory 8 through a frequency divicer 7, etc. Next, when the impulse voltage is applied only to the V-phase windings by changing over a switch 6, the difference of the wave shape and the previous applied voltage wave shape is displayed on a display device 5, and with the defect in insulation which is judges by a difference over a specified value an output for alarming or warning display is generated from a wave shape comparator 9. This also applies when seeing the sum of wave shapes of impulse voltages that have different polarities and using current wave shapes in place of the actual voltage wave shapes, and the sensitivity does not drop in the case of unbalance due to induction among the windings. Good or no good of insulation among turns can be, therefore, easily and accurately detected.

Description

【発明の詳細な説明】 本発明は、電気機器巻線にインパルス電圧を印加し、巻
線の絶縁のうち特にターン間絶縁の良否を判定する試験
装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a test device that applies an impulse voltage to a winding of an electrical device and determines the quality of the insulation of the winding, particularly the insulation between turns.

多数の絶縁線輪が直凋又は直並列に接続された巻線の両
端にインパルス電圧を印加して、そのターン間絶鎌の良
否を判定する場合、その中の1ターンが短絡しても電圧
印加端子の電圧波形又は電流波形の変化は小さく、不良
検出が困難な場合が多い。そこで従来から種々の方法が
検討されてきているが、それらの多くは対称な2巻線グ
ループを用いることが特徴であり、大別すると次の二つ
になる。即ち一つは、対称2回路:二交互にインノ(ル
ミ圧を印加して、両波形をオシミスコープのブラウン管
上で重ね合せて、両波形が一致するかどうかを観測する
方法である。両巻線グループのどこにも異常がなければ
、両波形は一致し、異常があれば一方の波形が少し変化
をする。ところが場合によっては、その変化があまりに
小さくて、両波形が相対的にずれたかどうか判定できな
いことがある。この欠点を補うため、対称2巻線グルー
プに、同時にインパルス電圧を印加して、両印加電圧の
差の波形又は両印加電流の差の波形をオシミスコープで
観測する゛ことが行なわれている。一方の巻線グループ
中に不良個所があれば、その回路の波形が変化するので
、両回路の波形の差分を増幅して観測すれば、感度良く
、巻線の良否が判別できる。この方法を実施する従来の
!!置を第1gに示す、11)はインパルス電圧発生器
、0はインパルス電圧を2分し、波形を調整する波形調
整回路、13)は回転電機の固定子巻線であって星形に
接続され、ty、v、wの端子を有しており、端子U。
When applying an impulse voltage to both ends of a winding in which a large number of insulated wire rings are connected directly or in series and parallel to determine the quality of the winding between the turns, even if one of the turns is short-circuited, the voltage will not increase. Changes in the voltage waveform or current waveform at the application terminal are small, and it is often difficult to detect defects. Therefore, various methods have been studied in the past, but most of them are characterized by the use of symmetrical two-winding groups, and can be broadly classified into the following two. That is, one method is to apply two symmetrical circuits: Inno (luminium pressure) alternately, superimpose both waveforms on the cathode ray tube of an oscilloscope, and observe whether the two waveforms match.Both windings If there is no abnormality anywhere in the group, the two waveforms will match, and if there is an abnormality, one waveform will change slightly.However, in some cases, the change is so small that it is difficult to judge whether the two waveforms have shifted relative to each other. To compensate for this drawback, impulse voltages are simultaneously applied to two symmetrical winding groups, and the waveform of the difference between the two applied voltages or the waveform of the difference between the two applied currents is observed using an oscilloscope. If there is a defect in one of the winding groups, the waveform of that circuit will change, so by amplifying and observing the difference between the waveforms of both circuits, it is possible to determine with good sensitivity whether the winding is good or bad. .A conventional system for implementing this method is shown in 1g, 11) is an impulse voltage generator, 0 is a waveform adjustment circuit that divides the impulse voltage into two and adjusts the waveform, and 13) is a stator of a rotating electric machine. It is a winding wire connected in a star shape and has terminals ty, v, and w, and a terminal U.

■にインパルス電圧を印加するように接続し、@子Wは
接地する。(4)は両印加電王の差分波形を求める回路
、(5)は波形表示器である。この従来の装置で波形の
差分な観測するとき、まったく対称な回路ならばU及び
V相の端子電圧の差分は殆ど零になるはずである。勿論
そうなる固守子巻線も多いが、しかし、2相のバランス
が悪いものもある。
Connect so as to apply an impulse voltage to ①, and connect @W to ground. (4) is a circuit for obtaining a differential waveform between both applied voltages, and (5) is a waveform display. When observing waveform differences using this conventional device, if the circuit is completely symmetrical, the difference between the U and V phase terminal voltages should be almost zero. Of course, there are many fixed child windings that do this, but there are also cases where the balance between the two phases is poor.

これは、絶縁線輪に異常がなくても、次めような理由に
より生ずることがある。第1図の固定子巻線内に線輪間
の電磁誘導の一例として、線路側に一番近い線輪(以下
第1線輪とする)と、その第1線輪が最も強い影響を及
ぼす線輪、例えば同ニスaットに挿入されている上コイ
ルと下コイルとの関係になる線輪との間には強力な誘導
作用がある。この誘導を第1図に破線矢印で示すが、こ
の誘導まで考慮に入れると、U相とV相は対称回路でな
くなる場合がある。このような現象が強く現われる回転
電機固定子巻線のターン絶縁の良否の判断をするには、
第1図の従来装置では若干難しくなる。
This may occur for the following reasons even if there is no abnormality in the insulated wire. As an example of electromagnetic induction between the wires in the stator winding in Figure 1, the wire closest to the track side (hereinafter referred to as the first wire) and the first wire have the strongest influence. There is a strong inductive effect between the wire rings, for example, the wire rings that are inserted in the same nist and are connected to the upper coil and the lower coil. This induction is shown by a broken line arrow in FIG. 1, but if this induction is taken into account, the U-phase and V-phase may no longer be symmetrical circuits. To judge the quality of the turn insulation of the stator winding of a rotating electrical machine where this phenomenon occurs strongly,
This becomes somewhat difficult with the conventional device shown in FIG.

本発明の目的は、容易かつ確実に電気機器巻線のターン
間絶縁不良の有無を検出する試験ii!置を提供するこ
とにある。
An object of the present invention is to easily and reliably detect the presence or absence of insulation defects between turns of electrical equipment windings.ii! The aim is to provide a

以下、本発明の一実施例について、112図を参照して
説明する。口)はインパルス電圧発生器、(2)はその
インパルス電圧発生器口)で発生した電圧波形を調整す
る波形調整回路、ts)は供試回転電機の固定子巻線で
あって星形に接続され、U、V、Wの端子を有しており
、端子Wは接地されている。
Hereinafter, one embodiment of the present invention will be described with reference to FIG. 112. (2) is a waveform adjustment circuit that adjusts the voltage waveform generated by the impulse voltage generator (2), and ts) is the stator winding of the rotating electric machine under test, which is connected in a star shape. It has U, V, and W terminals, and terminal W is grounded.

(6)は”インパルス電圧なU相、■相の両巻線グルー
プの端子U、Vのうちの一つな遺んで印加するように接
続し、他の端子を接地し、更にインパルス電圧印加端子
と接地端子とを切換える切換器である。(7)はインパ
ルス電圧を観測用に分圧する分圧器である。(8)はイ
ンパルス電圧による入力波形の差又は和を求める波形記
憶装置であって、この場合、分圧器(7)に接続され、
出力側にその波形の差又は和を表示する波形表示器(瞬
と、その波形の差又は和が所定の基準値を越えた場合に
、表示又鴎警報を出す波形比較器(9)を接続する。
(6) is connected to apply impulse voltage to one of the terminals U and V of both U-phase and ■-phase winding groups, ground the other terminal, and connect the impulse voltage application terminal (7) is a voltage divider that divides the impulse voltage for observation. (8) is a waveform storage device that calculates the difference or sum of input waveforms due to the impulse voltage, In this case, it is connected to the voltage divider (7),
A waveform indicator (9) that displays the difference or sum of the waveforms on the output side and a waveform comparator (9) that displays the display or issues an alarm when the difference or sum of the waveforms exceeds a predetermined reference value are connected. do.

次に作用について説明する。Next, the effect will be explained.

この装置を使用する第1の方法として、波形の差を求め
る場合を述べる。インパルス電圧発生器(1)がインパ
ルス電圧を発生すると、インパルス電圧は波形調整回路
(2)で波頭長を所定の値例えば1μS に調整された
後、切換器16)を通り、巻線の1相に印加される。こ
の場合、他の2相の端子は接地されているので、どの1
相に電圧を印加しても、印加端子から供試回転篭aiU
IA定子巻線を見れば、全く同一であり、巻線が全く健
全であれば、印加電圧波形は同一(=なるはずである。
As a first method of using this device, a case will be described in which a difference between waveforms is determined. When the impulse voltage generator (1) generates an impulse voltage, the wavefront length of the impulse voltage is adjusted by the waveform adjustment circuit (2) to a predetermined value, for example, 1 μS, and then passes through the switch 16) to one phase of the winding. is applied to In this case, since the other two phase terminals are grounded, which phase
Even if voltage is applied to the phase, the test rotating basket aiU
If you look at the IA stator windings, they are exactly the same, and if the windings are completely sound, the applied voltage waveforms should be the same.

例えばまずU相に電圧を印加し、その電圧波形を波形記
憶装置く8)に記憶させる。次に切換器(6)を切換え
、■相に電圧を印加し、その波形を波形記憶装置(8)
にて、U相印加の波形から差し引き、その波形を増幅し
て波形表示器(5) (:表示させると共に波形比較器
19)に所定の基準値と比較させる。巻線に異常がなけ
れば、この差分波形は殆ど零レベルである。巻線に異常
があれば、差分波形は零レベルからずれるために、波形
表示器(5)に表示された波形を見れば、不良か不良で
ないかは感度良く判断することが出来るし、波形比較器
(9)も所定の基準値と比較して、この基準値を艶し、
不良であると判断した時は、その旨を表示するか又は警
報を発するから、未熟練者でも判断することができる。
For example, a voltage is first applied to the U phase, and the voltage waveform is stored in the waveform storage device 8). Next, switch the switch (6), apply voltage to the ■ phase, and store the waveform in the waveform storage device (8).
, the waveform is subtracted from the waveform of the U-phase applied, and the waveform is amplified and displayed on the waveform display (5) (: and the waveform comparator 19) compares it with a predetermined reference value. If there is no abnormality in the winding, this differential waveform is almost at zero level. If there is an abnormality in the winding, the differential waveform will deviate from the zero level, so if you look at the waveform displayed on the waveform display (5), you can judge with good sensitivity whether it is defective or not, and you can compare the waveforms. The container (9) also compares with a predetermined reference value and brightens this reference value,
When it is determined that the product is defective, a message to that effect is displayed or a warning is issued, so that even an unskilled person can make the determination.

また第2図の装置を使用する第2の方法として、波形の
和を求める場合を述べると次の通りである。
A second method using the apparatus shown in FIG. 2, in which the sum of waveforms is determined, is as follows.

まず正のインパルス電圧をU相に印加し、次に同一形状
の負のインパルス電圧なV相に印加し、両波形を波形記
憶装置(8)で加算することによって、前記第1の方法
と同じ感度でターン絶縁の不良を検出することができる
The method is the same as the first method by first applying a positive impulse voltage to the U phase, then applying a negative impulse voltage of the same shape to the V phase, and adding both waveforms in the waveform storage device (8). Sensitivity can detect defects in turn insulation.

また以上は、図面上すべて星形結線の巻線について説明
したが、三角形結線の場合、またさらには同一仕様の巻
線グループを有する巻線ならば他の結線のものでも、同
様に試験することができる。
In addition, although all of the above explanations have been made for windings with star-shaped connections in the drawings, tests can be conducted in the same way for triangular-connected windings, or even other types of windings that have winding groups with the same specifications. Can be done.

次に他の実施例について、第3図を参照して説明する。Next, another embodiment will be described with reference to FIG.

第2図では電圧波形を測定したが、本実施例においては
、インパルス電圧を印加した時に流れる印加電流波形を
変流器a・により導出し、これを第2図の実施例と同様
に、別々に2相に印加した電流波形の差又は和を波形記
憶装置(8)に求めさせ、波形表示器(瞬に表示させ、
波形比較器(9)で判断させるようにしたものである。
In Fig. 2, the voltage waveform was measured, but in this example, the applied current waveform that flows when an impulse voltage is applied is derived by the current transformer a, and this is separately calculated as in the example of Fig. 2. The difference or sum of the current waveforms applied to the two phases is determined by the waveform storage device (8), and the waveform display (instantly displayed)
The determination is made using a waveform comparator (9).

このようにしても第2図の実施例の場合と同様に試験を
することができる。
Even in this case, the test can be carried out in the same manner as in the embodiment shown in FIG.

尚、本発明は上記し、かつ図面に示した実施例のみに限
定されるものではなく、例えば良、不良を判断する装置
は波形表示器停)と波形比較器(9)との両者を同時に
備えないで、片方だけ備えるようにしてもよい箒、その
要旨を変更しない範囲で、種々変形して実施できること
は勿論である。
It should be noted that the present invention is not limited to the embodiments described above and shown in the drawings; for example, the device for determining whether the device is good or bad may include both the waveform display (stopped) and the waveform comparator (9) at the same time. It goes without saying that the broom may be equipped with only one side instead of the other, and that it can be modified in various ways without changing the gist of the broom.

以上説明したように、本発明によれば、複数の同一仕様
の巻線グループを有する巻線のターン間絶縁の試験をす
る場合、1グループの巻線にだけインパルス電圧を印加
し、他の巻線は接地し、印加電圧又は印加電流を波形記
憶装置に記憶させ、次に別の1グループの巻線にだけイ
ンパルス電圧を印加し、その印加電圧または印加電流の
波形と一回記憶した11Lルの麦(−一極性のインパル
ス電圧印加の場合)又は和(逆極性のインパルス電圧印
加の場合)をとり、その波形から良、不良を判断するよ
うにしたことにより、従来の2T#A1!同時印加の場
合と違い、異なるグループ間の誘導によるバランスのず
れにより検出感度を落すことなく、確実1ニターy関絶
縁の不良を検出することができるという大きな利点があ
る。
As explained above, according to the present invention, when testing the inter-turn insulation of a winding that has a plurality of winding groups with the same specifications, an impulse voltage is applied only to the windings of one group, and the other windings are The wire is grounded, the applied voltage or applied current is stored in a waveform storage device, and then an impulse voltage is applied only to another group of windings, and the waveform of the applied voltage or applied current and the 11L loop that has been stored once are By taking the sum (in the case of − unipolar impulse voltage application) or the sum (in the case of reverse polarity impulse voltage application) and determining whether it is good or bad from the waveform, the conventional 2T#A1! Unlike the case of simultaneous application, there is a great advantage in that it is possible to reliably detect defects in insulation for one unit of insulation without reducing detection sensitivity due to imbalance due to induction between different groups.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来のターン閥絶縁試験装置を示す回路図、第
!Iaおよび第3図はそれぞれ異なる本発明のターン間
絶縁試験装置の実施例を示す回路図である。 U、V、W・・・巻線グループの端子 1・−インパルス電圧発生器 2・・・波形調整回路   3・・・巻線5・・・波形
表示器    6・・・切換器8・・・波形記憶装置 
  9・・・波形比較器代理人 弁理士 井 上 −男 第  1  図 を 第  2  図 ム 第3図
Figure 1 is a circuit diagram showing a conventional turn-type insulation testing device. Ia and FIG. 3 are circuit diagrams showing different embodiments of the inter-turn insulation testing device of the present invention. U, V, W...Terminal 1 of winding group - Impulse voltage generator 2...Waveform adjustment circuit 3...Winding 5...Waveform display 6...Switcher 8... waveform storage device
9...Waveform Comparator Agent Patent Attorney Inoue - Male Figure 1 Figure 2 Figure 3

Claims (3)

【特許請求の範囲】[Claims] (1)複数ターンの絶縁線輪を接続した複数の同一仕様
の巻線グループを有し、各巻線グループは端子を有する
と共に相互に接続された電気機器巻線のターン間絶縁試
験装置において、インパルス電圧発生器と、そのインパ
ルス電圧発生器で発生した電圧波形を調整する波彫調瞥
回路と、そのインパルス電圧を各巻線グループの端子の
うちの一つを選んで印加するように接続し、他の端子を
接地し、更にインパルス電圧印加端子と接地端子とを切
換える切換器と、この切換器によって切換える前後のイ
ンパルス電圧による印加電圧又唸印加電流の波形の差又
紘和を求める波形記憶装置と、その差又は和を表示する
波形表示器とその差又は和が所定の基準値を越えた場合
に表示又は警報を出させる波形比較器との少なくとも一
方を備えたことを特徴とするターン間絶縁試験装置0
(1) It has a plurality of winding groups of the same specification in which multiple turns of insulated wire rings are connected, each winding group has a terminal, and impulse A voltage generator, a wave-carving adjustment circuit that adjusts the voltage waveform generated by the impulse voltage generator, and a voltage generator connected to select and apply the impulse voltage to one of the terminals of each winding group; a switching device for grounding the terminal of the terminal and further switching between the impulse voltage application terminal and the grounding terminal, and a waveform storage device for determining the difference or sum of the waveforms of the applied voltage or the applied current due to the impulse voltage before and after switching by the switching device. , a waveform indicator that displays the difference or sum thereof, and a waveform comparator that displays or issues an alarm when the difference or sum exceeds a predetermined reference value. Test equipment 0
(2) 切換前後のインパルス電圧は同一大きさ間−極
性とし、波形記憶装置は波形の差を求めるようにしたこ
とを特徴とする特許請求の範囲第1項記載のターン間絶
縁試験装置。
(2) The inter-turn insulation testing device according to claim 1, wherein the impulse voltages before and after switching have the same magnitude and polarity, and the waveform storage device calculates the difference in waveforms.
(3)  切換前後のインパルス電圧は同一大きさ逆膳
性とし、波形記憶装置は波形の和を求めるようにしたこ
とを特徴とする特許請求の範囲第1項記載のターン間絶
縁試験装置。
(3) The inter-turn insulation testing device according to claim 1, wherein the impulse voltages before and after switching have the same magnitude and are reversible, and the waveform storage device calculates the sum of the waveforms.
JP56136776A 1981-08-31 1981-08-31 Device to test insulation between turns Pending JPS5838875A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56136776A JPS5838875A (en) 1981-08-31 1981-08-31 Device to test insulation between turns

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56136776A JPS5838875A (en) 1981-08-31 1981-08-31 Device to test insulation between turns

Publications (1)

Publication Number Publication Date
JPS5838875A true JPS5838875A (en) 1983-03-07

Family

ID=15183244

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56136776A Pending JPS5838875A (en) 1981-08-31 1981-08-31 Device to test insulation between turns

Country Status (1)

Country Link
JP (1) JPS5838875A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61162755A (en) * 1985-01-14 1986-07-23 Denshi Seigyo Group:Kk Impulse coil tester
ES2131024A1 (en) * 1996-12-03 1999-07-01 Samsung Electronics Co Ltd Method of manufacturing rotors and apparatus for checking the coils of such rotors used in the method
JP2015059857A (en) * 2013-09-19 2015-03-30 中国電力株式会社 Search device for ground fault position
CN113419148A (en) * 2021-06-30 2021-09-21 深圳市准点仪器有限公司 Testing method for motor winding insulation

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61162755A (en) * 1985-01-14 1986-07-23 Denshi Seigyo Group:Kk Impulse coil tester
ES2131024A1 (en) * 1996-12-03 1999-07-01 Samsung Electronics Co Ltd Method of manufacturing rotors and apparatus for checking the coils of such rotors used in the method
JP2015059857A (en) * 2013-09-19 2015-03-30 中国電力株式会社 Search device for ground fault position
CN113419148A (en) * 2021-06-30 2021-09-21 深圳市准点仪器有限公司 Testing method for motor winding insulation

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