JPS5835945A - Sheath for semiconductor device - Google Patents

Sheath for semiconductor device

Info

Publication number
JPS5835945A
JPS5835945A JP13511181A JP13511181A JPS5835945A JP S5835945 A JPS5835945 A JP S5835945A JP 13511181 A JP13511181 A JP 13511181A JP 13511181 A JP13511181 A JP 13511181A JP S5835945 A JPS5835945 A JP S5835945A
Authority
JP
Japan
Prior art keywords
plate
gold
holes
metal plate
opening
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13511181A
Other languages
Japanese (ja)
Inventor
Nobuo Suzuki
信雄 鈴木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP13511181A priority Critical patent/JPS5835945A/en
Publication of JPS5835945A publication Critical patent/JPS5835945A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Solid State Image Pick-Up Elements (AREA)

Abstract

PURPOSE:To obtain a high degree of airtightness for the titled sheath by a method wherein, when a plate member of metal or ceramic is airtightly sealed at one end of the opening of a square cylinder body made of ceramic and a cap is heat-sealed by fusing at the other end of the opening, two through holes are provided on the tube-shaped body, and said plate member is welded while inert gas of low temperature is being flown into the through holes. CONSTITUTION:On the back of the ceramic four-cornered tube-shaped body 1 whereon a solid- state image pickup element 5 is provided on the front, a metal plate 4 is adhered in such a manner that it is bridged to the circumferential wall, and a cooling material 8 is installed on the back of the metal plate 4. Also, on the inner circumference of the opening of the cover member, a gold-plated layer 2 is coated, and after the element 5 has been arranged on the metal plate 4 which is exposed on the inside of the opening, a rectangular glass plate 6 which will be turned to a transparent cap is placed through the intermediary of a gold-plated plate 7 which is in contact with the gold-plated layer 2. Subsequently, the gold-plated plate 7, which is exposed on the circumference of the glass plate 6, and the gold-plated layer 2 are adhered using a thermo-pressure welding head 9. At this time, an air feeding hole 10 and an air exhausting hole 11 are provided on the circumference of the four-cornered tube-shaped body 1, inert gas of low temperature is flown into these holes, and these holes are blocked up after adhesion of the plate member, using metal plates 16 and 17.

Description

【発明の詳細な説明】 不発明拡半導体装置の外囲器に係シ、特に熱圧着による
機密封止するに好適な半導体装置の外囲器に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an envelope for a semiconductor device, and more particularly to an envelope for a semiconductor device suitable for hermetically sealing by thermocompression bonding.

最近、CCDCD固体素像素子るTVカラーカメラの開
発が行われ、いわゆる単板式とか、あるいは2板式とか
があル、また固体撮像素子数を削減する手段として、固
体撮像素子の入射光路に色フィルタを設けることは周知
である。この色フ(ルタは、単色フィルタや色ストライ
プフィルタなど撮像方法によって選択される。このよう
な色フィルタを入射光路に内蔵し九固体撮像素子は、色
フィルタが通常有機物によって構成されているので、色
フィルタの温度が150℃〜200℃を超える温度にな
ると色フィルタの分光感度特性(りまシテ波波長特性)
が変化する欠点がある。さらに、微かな水分が存在して
も上記した分光感度特性が変化してしまう。
Recently, TV color cameras using CCDCD solid-state image elements have been developed, and there are so-called single-chip and two-chip types.Also, as a means to reduce the number of solid-state image sensors, a color filter is added to the incident optical path of the solid-state image sensor. It is well known to provide This color filter is selected depending on the imaging method, such as a monochromatic filter or a color stripe filter.In a solid-state image sensor that incorporates such a color filter in the incident optical path, the color filter is usually composed of an organic substance. When the temperature of the color filter exceeds 150°C to 200°C, the spectral sensitivity characteristics of the color filter (light wave wavelength characteristics)
It has the disadvantage that it changes. Furthermore, even if a slight amount of moisture is present, the above-mentioned spectral sensitivity characteristics change.

このため、色フィルタを内蔵した固体撮像素子は機密容
器内に封入されるが、この場合、機密容器の一面には入
射光に対して透明な面を必要とする丸め、外囲器の熱封
着工程が必要である。
For this reason, a solid-state image sensor with a built-in color filter is enclosed in a confidential container. A fitting process is required.

この場合、色フィルタの雰囲気の温度が150℃以下の
低温で封止することが要求されている。
In this case, it is required that the temperature of the atmosphere around the color filter be sealed at a low temperature of 150° C. or lower.

そこで、従来は次のようKして機密封止していた。すな
わち、第1図に示すように、断面り字状のセラミックス
製角筒体1の上面に金属板たとえば金メッキ層its着
し、また角筒体1の側壁にリード3を接着し、さらに角
筒体1の開口部には金属板4を接着する。この金属板4
の内面上に色フイルタ内蔵の固体撮像素子5を取着する
。他方、この固体撮像素子5の入射光に対して透明なガ
ラス板60周辺に金属板たとえば金メッキ板1t−取着
する。このように形成した入射光窓部材を金メツキ板7
が金メッキ層と係合するように重ねて設ける。さらに、
底部の金属板4を冷却する冷却体8t−設け、容器内に
不活性気体を導入した後、高温の熱圧着ヘッド9f金属
板7および金メツキ層20重ね合わせ部に押し当てて溶
着すること罠より、機密容器を構成していた。
Therefore, in the past, the following K was used for hermetically sealed sealing. That is, as shown in FIG. 1, a metal plate, for example, a gold plating layer, is attached to the upper surface of a rectangular ceramic cylinder 1 having a rectangular cross-section, and a lead 3 is adhered to the side wall of the rectangular cylinder 1. A metal plate 4 is glued to the opening of the body 1. This metal plate 4
A solid-state image sensor 5 with a built-in color filter is mounted on the inner surface of the image sensor. On the other hand, a metal plate, for example, a gold-plated plate 1t, is attached around a glass plate 60 that is transparent to the incident light of the solid-state image sensor 5. The incident light window member formed in this way is attached to a gold-plated plate 7.
are overlapped so that they engage with the gold plating layer. moreover,
A cooling body 8t is provided to cool the metal plate 4 at the bottom, and after introducing an inert gas into the container, a hot thermocompression head 9f is pressed against the overlapping portion of the metal plate 7 and the gold plating layer 20 to weld them. It constituted a secret container.

ところが、冷却体8によシ金属板4を介して冷却してい
るのKもかかわらず、熱圧着ヘッド#による熱溶着時の
熱によシ金属板7、金メッキ層2およびガラス板6を介
して容器内の不活性気体が加熱され、固体撮像素子5の
表面に設けられている色フィルタの温度も上昇する。こ
のため、分光感度特性も変化してしまい、撮像し九場合
のカラー再生画倫の忠実性が悪いという欠点がある。す
なわち、色フイルタ近傍の温度が低温で熱溶着すること
は困難であった。
However, although the cooling body 8 is cooled through the metal plate 4, the heat during thermal welding by the thermocompression head # is not applied through the metal plate 7, the gold plating layer 2, and the glass plate 6. The inert gas inside the container is heated, and the temperature of the color filter provided on the surface of the solid-state image sensor 5 also rises. For this reason, the spectral sensitivity characteristics also change, and there is a drawback that the fidelity of color reproduction is poor when an image is taken. That is, it was difficult to thermally weld the color filters when the temperature near them was low.

本発明は上記事情に鑑みてなされたもので、その目的と
するところは、セラミックス製筒体の一方の開口端に金
属t7’hはセラミックス製の板体を機密封着し、他方
の開口端にキャップを熱溶着できるように、上記筒体に
少なくとも2個の貫通孔を設け、この貫通孔に°よシ低
温の手性気体を流通できるように構成することによって
、熱溶着時の温度上昇を抑制し、機密性が高く、シかも
きわめて低温で封止できる半導体装置の外囲器を提供す
ることにある。
The present invention has been made in view of the above circumstances, and its purpose is to hermetically seal a ceramic plate with a metal t7'h on one open end of a ceramic cylindrical body, and At least two through holes are provided in the cylindrical body so that the cap can be heat welded to the cap, and the structure is such that low-temperature gas can be circulated through the through holes, thereby reducing the temperature rise during heat welding. It is an object of the present invention to provide an envelope for a semiconductor device that suppresses air leakage, has high airtightness, and can be sealed at extremely low temperatures.

以下、本発明の一実施例について図面を参照して説明す
る。なお、第1図と同一部分には同一符号を付して説明
する。
An embodiment of the present invention will be described below with reference to the drawings. Note that the same parts as in FIG. 1 will be described with the same reference numerals.

第2図(A)において、セラミックス製の筒体、たとえ
ば断面り字状で長方形状のセラミックス製角筒体1の一
方の開口側上面(つまシ筒体1の周囲全体)に角環状金
属板たとえば金メッキ層2を設け、また筒体1の側壁に
リード3を接着し、さらに筒体1の他方の開口部には金
属板4を接着する。そして、この金属板4の内面上に色
フイルタ内蔵の固体撮像素子5t−取着する。
In FIG. 2(A), a rectangular annular metal plate is attached to the upper surface of one opening side (the entire circumference of the slat cylinder 1) of a ceramic cylindrical body, for example, a rectangular ceramic cylindrical body 1 with a rectangular cross-section. For example, a gold plating layer 2 is provided, a lead 3 is bonded to the side wall of the cylindrical body 1, and a metal plate 4 is bonded to the other opening of the cylindrical body 1. Then, a solid-state image sensor 5t with a built-in color filter is mounted on the inner surface of the metal plate 4.

一方、上記筒体1の他方の開口部には、固体撮像素子5
の入射光に対して透明なキャップたとえば方形状ガラス
板6を設ける。この場合、ガラス板6の周辺には角環状
の金属板たとえば金メツキ板1が取着される。このよう
に形成した入射光窓部材を金メツキ板7が筒体1の金メ
ッキ層2と係合するように重ねて設ける。
On the other hand, the other opening of the cylindrical body 1 is provided with a solid-state image sensor 5.
A cap, for example a rectangular glass plate 6, is provided which is transparent to the incident light. In this case, a rectangular ring-shaped metal plate, for example, a gold-plated plate 1, is attached around the glass plate 6. The incident light window members formed in this manner are stacked so that the gold-plated plate 7 engages with the gold-plated layer 2 of the cylinder 1.

このような構成は従来と同様であるが、本発明の外囲器
は次のように構成した点で大きく異にする。すなわち、
第2図ω)(C’)に示すように、筒体10対向する短
辺部には、不活性気体の給気孔10および排気孔11が
きわめて小さい孔径でそれぞれ設けられている。この給
気孔10および排気孔11は金メッキ層2の外側に位置
して形成されており、これら孔10.11の周辺部分で
筒体11の表面には金メッキ層12゜13が取着され、
さらに給気孔1oおよび排気孔11にはそれぞれ給入/
ぐイブ14および排気/fイデ15が結合される。
Although this configuration is similar to the conventional one, the envelope of the present invention differs greatly in the following configuration. That is,
As shown in FIG. 2 ω) (C'), inert gas supply holes 10 and exhaust holes 11 with extremely small diameters are provided in the opposite short sides of the cylinder 10, respectively. The air supply hole 10 and the exhaust hole 11 are formed outside the gold plating layer 2, and gold plating layers 12 and 13 are attached to the surface of the cylindrical body 11 around these holes 10 and 11,
Furthermore, the air supply hole 1o and the exhaust hole 11 are filled with air/air, respectively.
An exhaust pipe 14 and an exhaust/f pipe 15 are coupled.

このように構成された外囲器の封着は次のようにして行
う、すなわち、金属板4の外表面に、この金属板4を冷
却する冷却体8ft設け、容器内に不活性気体を導入す
、る。そして、給気孔10から冷却された低温の不活性
気体を給入し、排気孔11から不活性気体を排出するこ
とにより、不活性気体が流通している状態で、高温の熱
圧着ヘラ「9を筒体1の周囲全体に設けられている金属
板1および金メッキ層2の重ね合わせ部に押し当てて溶
着することによシ、機密容器を構成する。この溶着後、
金属板7、金メッキ層2およびガラス板6の熱が定常状
態になっ要項に不活性気体の流動を停止する。すなわち
、金属板7、金メッキ層2およびガラス板6に蓄積され
た熱エネルギを吸収する。その後、第2図(ロ)に示す
ように1給入ノ4イデ14および排気ノ4イブ15をそ
れぞれ取脱して金属板16゜11を設け、この金属板1
6.17と金属メッキ層12.13とを熱圧着ヘッド1
8を押圧して熱圧着する。この熱圧着工程は、金属板1
および金メッキ層2(つまり筒体1の周囲全体)の熱圧
着に比較して封止面積が孔10.11の部分のみと小さ
いため、熱容量も小さい状態で熱圧着ができる。
The envelope constructed in this way is sealed in the following manner. That is, an 8 ft cooling body is provided on the outer surface of the metal plate 4 to cool the metal plate 4, and an inert gas is introduced into the container. do. Then, by supplying cooled low-temperature inert gas from the air supply hole 10 and discharging the inert gas from the exhaust hole 11, the high-temperature thermocompression spatula "9" is placed in a state where the inert gas is circulating. A sealed container is constructed by pressing and welding the metal plate 1 and the gold plating layer 2 provided around the entire periphery of the cylinder body 1 to the overlapping portion of the metal plate 1 and the gold plating layer 2. After this welding,
The heat of the metal plate 7, gold plating layer 2, and glass plate 6 reaches a steady state, and the flow of the inert gas is stopped. That is, the heat energy accumulated in the metal plate 7, the gold plating layer 2, and the glass plate 6 is absorbed. Thereafter, as shown in FIG. 2(B), the 1st intake pipe 14 and the 1st exhaust pipe 4 pipe 15 are removed, a metal plate 16° 11 is provided, and this metal plate 1
6.17 and metal plating layer 12.13 are bonded by thermocompression head 1
Press 8 to bond with heat. This thermocompression bonding process consists of metal plate 1
Compared to thermocompression bonding of the gold plating layer 2 (that is, the entire periphery of the cylindrical body 1), the sealing area is small, ie only the hole 10.11, so thermocompression bonding can be performed with a small heat capacity.

なお、上記実施例では、固体撮像素子の外囲器に適用し
た場合について説明したが、高温あ五 るいFi暮度によシ特性劣下金きたす半導体装置の外囲
器であれば、何れの半導体装置にも適用できる。また、
キャップとしてガラス板を用いた場合について説明した
が、用途に応じて金属板であってもよい。また、固体撮
像素子の底部に金属板を設けた場合について説明したが
、金属板に限らず、たとえば薄いセラミックス板を用い
てもよい。さらに1貫通孔として給気孔および排気孔を
筒体の上面に貫通した構造について説明し九が、側面で
もあるいは下面でも何れの面く形成してもよい。
In the above embodiments, the case where the case is applied to the envelope of a solid-state image sensor is explained, but it can be applied to any envelope of a semiconductor device whose characteristics deteriorate due to high temperature and low temperature. It can also be applied to semiconductor devices. Also,
Although a case has been described in which a glass plate is used as the cap, a metal plate may be used depending on the purpose. Furthermore, although a case has been described in which a metal plate is provided at the bottom of the solid-state image sensor, the present invention is not limited to a metal plate, and for example, a thin ceramic plate may be used. Furthermore, a structure in which an air supply hole and an exhaust hole are penetrated through the upper surface of the cylindrical body as one through hole will be described.

以上詳述したように本発明によれば、セラミックス製筒
体の一方の開口端に金属またはセラミックス製の板体を
機密封着し、他方の開口端にキャップを熱溶着できるよ
うに、上気筒体に少なくとも2個の貫通孔を設け、この
貫通孔によシ低温の不活性気体を流通できるように11
!成することによって、熱溶着時の温度上昇を抑制し、
機密性が高く、しかもきわめて低温で封止できる半導体
装置の外囲器を提供できる。
As detailed above, according to the present invention, a metal or ceramic plate is hermetically sealed to one open end of a ceramic cylinder, and a cap is heat-welded to the other open end of the upper cylinder. At least two through holes are provided in the body, and a low temperature inert gas can flow through the through holes.
! This suppresses the temperature rise during thermal welding,
It is possible to provide an envelope for a semiconductor device that has high airtightness and can be sealed at an extremely low temperature.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の半導体装置の外囲基金説明するための側
断面図、第2図(4)〜■は本発明の一実施例を説明す
るための断面図で、(4)図は一方の側面における断面
図、(B)および(ロ)図は(4)図におけるB−B矢
視断面図、(0図は(4)図におけるτ −C矢視断面
図である。 ′ 1・・・セラミックス製筒体、2・・・金メッキ層
、3・・・リード、4・・・金属板、5・・・固体撮像
素子、6・・・ガラス板、7・・・金属板、8・・・冷
却体、10・・・給気孔、11・・・排気孔、12.1
3・・・金メッキ層、14・・・給入パイプ、15・・
・排気パイプ、16.11・・・金属板、19.18−
・熱圧着ヘッド。 出願人代理人  弁理士 鈴 江 武 彦第1図 第2図 (A) 第2図 (C) CD)
FIG. 1 is a side cross-sectional view for explaining the envelope of a conventional semiconductor device, and FIG. 2 (4) to ■ are cross-sectional views for explaining an embodiment of the present invention. Figures (B) and (B) are cross-sectional views taken along the line B-B in figure (4), and Figure 0 is a cross-sectional view taken along the line τ-C in figure (4).' 1. ...Ceramic cylinder, 2...Gold plating layer, 3...Lead, 4...Metal plate, 5...Solid-state image sensor, 6...Glass plate, 7...Metal plate, 8 ... Cooling body, 10 ... Air supply hole, 11 ... Exhaust hole, 12.1
3... Gold plating layer, 14... Supply pipe, 15...
・Exhaust pipe, 16.11...Metal plate, 19.18-
・Thermocompression bonding head. Applicant's representative Patent attorney Takehiko Suzue Figure 1 Figure 2 (A) Figure 2 (C) CD)

Claims (3)

【特許請求の範囲】[Claims] (1) セラミックス族の筒体と、この筒体の一方の開
口端に取着された金属またはセラミックス族の板体と、
前記筒体の他方の開口端に取着されたキャップと、前記
筒体に少なくとも2個設けられた貫通孔と、この各貫通
孔を封じるごとく設けられた蓋体とを具備してなること
t−特徴とする半導体装置の外囲器。
(1) A cylinder made of ceramics, a plate made of metal or ceramics attached to one open end of the cylinder,
A cap attached to the other open end of the cylindrical body, at least two through holes provided in the cylindrical body, and a lid body provided so as to close each of the through holes. - An envelope of a semiconductor device characterized by:
(2)前記貫通孔は前記キャップ取着部より外側に位置
して設けられることを特徴とする特許請求の範囲第1項
記載の半導体装置の外囲器。
(2) The envelope for a semiconductor device according to claim 1, wherein the through hole is located outside the cap attachment portion.
(3)前記蓋体は金属板を熱圧着したものである特許請
求の範囲第1項記載の半導体装置の外囲器。
(3) The envelope for a semiconductor device according to claim 1, wherein the lid body is a metal plate bonded by thermocompression.
JP13511181A 1981-08-28 1981-08-28 Sheath for semiconductor device Pending JPS5835945A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13511181A JPS5835945A (en) 1981-08-28 1981-08-28 Sheath for semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13511181A JPS5835945A (en) 1981-08-28 1981-08-28 Sheath for semiconductor device

Publications (1)

Publication Number Publication Date
JPS5835945A true JPS5835945A (en) 1983-03-02

Family

ID=15144085

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13511181A Pending JPS5835945A (en) 1981-08-28 1981-08-28 Sheath for semiconductor device

Country Status (1)

Country Link
JP (1) JPS5835945A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01249637A (en) * 1988-03-26 1989-10-04 Seung Ryul Suh Production of bottom material using lightweight aggregate
US4958216A (en) * 1987-03-23 1990-09-18 Kyocera Corporation Package for housing semiconductor elements

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4958216A (en) * 1987-03-23 1990-09-18 Kyocera Corporation Package for housing semiconductor elements
JPH01249637A (en) * 1988-03-26 1989-10-04 Seung Ryul Suh Production of bottom material using lightweight aggregate

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