JPS5832157A - 材料検査方法および装置 - Google Patents

材料検査方法および装置

Info

Publication number
JPS5832157A
JPS5832157A JP57111867A JP11186782A JPS5832157A JP S5832157 A JPS5832157 A JP S5832157A JP 57111867 A JP57111867 A JP 57111867A JP 11186782 A JP11186782 A JP 11186782A JP S5832157 A JPS5832157 A JP S5832157A
Authority
JP
Japan
Prior art keywords
coil
amplifier
compensation
material inspection
output signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP57111867A
Other languages
English (en)
Japanese (ja)
Inventor
ゲルハルト・ヒユシエルラス
クラウス・アベント
ウルスラ・オルテン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nukem GmbH
Original Assignee
Nukem GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=6135748&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=JPS5832157(A) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Nukem GmbH filed Critical Nukem GmbH
Publication of JPS5832157A publication Critical patent/JPS5832157A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
JP57111867A 1981-06-30 1982-06-30 材料検査方法および装置 Pending JPS5832157A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE31257321 1981-06-30
DE19813125732 DE3125732A1 (de) 1981-06-30 1981-06-30 Verfahren und vorrichtung zur werkstoffpruefung nach dem wirbelstromprinzip

Publications (1)

Publication Number Publication Date
JPS5832157A true JPS5832157A (ja) 1983-02-25

Family

ID=6135748

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57111867A Pending JPS5832157A (ja) 1981-06-30 1982-06-30 材料検査方法および装置

Country Status (5)

Country Link
US (1) US4564809A (enExample)
EP (1) EP0068503B1 (enExample)
JP (1) JPS5832157A (enExample)
CA (1) CA1194548A (enExample)
DE (1) DE3125732A1 (enExample)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3207569C2 (de) * 1982-03-03 1986-05-28 Herbert 8553 Ebermannstadt Baumgartner Prüfgerät zur zerstörungsfreien Werkstoffprüfung
DE3213267A1 (de) * 1982-04-08 1983-10-20 Nukem Gmbh, 6450 Hanau Verfahren und vorrichtung zur pruefung von werkstoffen nach dem wirbelstromprinzip
US4709213A (en) * 1982-07-23 1987-11-24 Garrett Electronics, Inc. Metal detector having digital signal processing
DE3313820A1 (de) * 1983-04-16 1984-10-18 Institut Dr. Friedrich Förster Prüfgerätebau GmbH & Co KG, 7410 Reutlingen Einrichtung zum pruefen der oberflaeche eines metallischen pruefteiles
GB2140564B (en) * 1983-05-23 1986-10-22 Central Electr Generat Board Cable corrosion monitor
DE3525376A1 (de) * 1985-07-16 1987-01-29 Nukem Gmbh Verfahren und vorrichtung zur zerstoerungsfreien pruefung von ferromagnetischen koerpern mit oberflaechenabschnitten, die an kanten und/oder ecken aneinandergrenzen
SE456864B (sv) * 1986-08-27 1988-11-07 Toernbloms Kvalitetskontroll Anordning foer att vid virvelstroemsprovning av omagnetiska provobjekt detektera och undertrycka inverkan av stoerande magnetiska omraaden
DE3720686A1 (de) * 1987-06-23 1989-01-05 Foerster Inst Dr Friedrich Verfahren zum untersuchen eines objektes
US5055784A (en) * 1987-12-07 1991-10-08 American Research Corporation Of Virginia Bridgeless system for directly measuring complex impedance of an eddy current probe
CA2088918C (en) * 1991-06-04 1996-07-02 Seigo Ando Magnetic detecting method and apparatus therefor
DE10229735A1 (de) * 2002-07-02 2004-01-22 rinas Gerätetechnik GmbH Verfahren zum Erkennen und Lokalisieren von Materialfehlern
US9465008B2 (en) 2014-06-13 2016-10-11 General Electric Company Method and system for eddy current device dynamic gain adjustment
CN108964811A (zh) * 2018-06-07 2018-12-07 珠海格力电器股份有限公司 一种应变测试系统及方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4194149A (en) * 1977-12-15 1980-03-18 The Babcock & Wilcox Company Method for generating the eddy current signature of a flaw in a tube proximate a contiguous member which obscures the flaw signal
DE2814125C2 (de) * 1978-04-01 1986-03-20 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München Vorrichtung zur zerstörungsfreien Werkstoffprüfung
US4237419A (en) * 1978-06-07 1980-12-02 Tornbloms Kvalitetskontroll Ab Method and apparatus for non-destructive testing using a plurality of frequencies
DE2825958C2 (de) * 1978-06-14 1986-02-20 Institut Dr. Friedrich Förster Prüfgerätebau GmbH & Co KG, 7410 Reutlingen Magnetisches oder magnetinduktives Werkstoffprüfgerät mit Nullpunktkompensationseinrichtung
FR2443682A1 (fr) * 1978-12-07 1980-07-04 Commissariat Energie Atomique Circuit de correction automatique d'un signal emis par un capteur differentiel desequilibre
FR2451032A1 (fr) * 1979-03-09 1980-10-03 Commissariat Energie Atomique Appareil numerique pour le controle de pieces par courants de foucault
US4303885A (en) * 1979-06-18 1981-12-01 Electric Power Research Institute, Inc. Digitally controlled multifrequency eddy current test apparatus and method

Also Published As

Publication number Publication date
EP0068503B1 (de) 1987-03-25
EP0068503A2 (de) 1983-01-05
CA1194548A (en) 1985-10-01
DE3125732A1 (de) 1983-01-13
US4564809A (en) 1986-01-14
DE3125732C2 (enExample) 1988-09-01
EP0068503A3 (en) 1983-10-05

Similar Documents

Publication Publication Date Title
US4467281A (en) Multi frequency eddy current test apparatus with intermediate frequency processing
JPS5832157A (ja) 材料検査方法および装置
GB1521203A (en) Non-destructive testing process and apparatus
US4386318A (en) Method and apparatus to compensate a gradiometer having first and second unwanted terms
US2511564A (en) Distortion analysis
US4061968A (en) Process of and apparatus for non-destructive eddy current testing involves the suppression of displayed lobes corresponding to fault parameters to be eliminated from the display
SU1281180A3 (ru) Прибор дл вихретокового контрол издели
US4644336A (en) Color display of related parameters
JPH01272959A (ja) パルス渦電流による物体制御方法及び装置
Volkers et al. The influence of source impedance on charge amplifiers
KR0157943B1 (ko) 피씨비내의 수동소자 분리 측정회로
KR940002720B1 (ko) 파형해석장치의 레벨교정방법 및 교정장치
US3566258A (en) Eddy current flaw detector having automatically balancing bridge circuit
CN119510876A (zh) 一种微弱电流测试装置
US4750134A (en) Device for the non-destructive testing of ferromagnetic bodies and a process for producing values for adjusting the device into an initial state for testing determined by the respective test samples
US5172058A (en) Non-destructive eddy current testing device with signal compensation for signal propagation delay
US5469051A (en) Electrical defect detector for circuit lines
KR880000358B1 (ko) 와전류에 의한 비파괴 시험 방법 및 장치
US2628266A (en) Analysis of signal transfer devices
Kekelj et al. An FPGA implementation of the Goertzel algorithm in a Non-Destructive Eddy current Testing
JPH07270383A (ja) 渦流探傷装置
SU1310708A1 (ru) Устройство дл измерени составл ющих вносимого напр жени вихретокового преобразовател
SU901951A1 (ru) Устройство дл измерени параметров магнитного пол
SU1035823A1 (ru) Способ измерени временных и фазовых искажений фазоманипулированного сигнала
JPH05504616A (ja) サンプリング回路