JPS5831877B2 - Ｘ線検出器 - Google Patents
Ｘ線検出器Info
- Publication number
- JPS5831877B2 JPS5831877B2 JP51113791A JP11379176A JPS5831877B2 JP S5831877 B2 JPS5831877 B2 JP S5831877B2 JP 51113791 A JP51113791 A JP 51113791A JP 11379176 A JP11379176 A JP 11379176A JP S5831877 B2 JPS5831877 B2 JP S5831877B2
- Authority
- JP
- Japan
- Prior art keywords
- ray
- detector
- anode
- gas
- cathode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000005670 electromagnetic radiation Effects 0.000 claims description 8
- 230000005855 radiation Effects 0.000 claims description 8
- 229910052724 xenon Inorganic materials 0.000 claims description 7
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 claims description 7
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical group [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims description 6
- 239000000463 material Substances 0.000 claims description 5
- 229910052786 argon Inorganic materials 0.000 claims description 3
- 229910052743 krypton Inorganic materials 0.000 claims description 2
- DNNSSWSSYDEUBZ-UHFFFAOYSA-N krypton atom Chemical compound [Kr] DNNSSWSSYDEUBZ-UHFFFAOYSA-N 0.000 claims description 2
- 239000007789 gas Substances 0.000 description 38
- 230000005684 electric field Effects 0.000 description 9
- 229910052751 metal Inorganic materials 0.000 description 8
- 239000002184 metal Substances 0.000 description 8
- 238000011084 recovery Methods 0.000 description 7
- 238000001514 detection method Methods 0.000 description 5
- 150000002500 ions Chemical class 0.000 description 5
- 230000035945 sensitivity Effects 0.000 description 5
- 238000003325 tomography Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 3
- 230000003993 interaction Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 2
- 239000003989 dielectric material Substances 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 229910052750 molybdenum Inorganic materials 0.000 description 2
- 239000011733 molybdenum Substances 0.000 description 2
- 239000000088 plastic resin Substances 0.000 description 2
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 2
- 229910052721 tungsten Inorganic materials 0.000 description 2
- 239000010937 tungsten Substances 0.000 description 2
- 238000004876 x-ray fluorescence Methods 0.000 description 2
- 229920002799 BoPET Polymers 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000000593 degrading effect Effects 0.000 description 1
- 230000002939 deleterious effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 239000010445 mica Substances 0.000 description 1
- 229910052618 mica group Inorganic materials 0.000 description 1
- 229910052756 noble gas Inorganic materials 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 125000006850 spacer group Chemical group 0.000 description 1
- -1 tankard Chemical compound 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J47/00—Tubes for determining the presence, intensity, density or energy of radiation or particles
- H01J47/02—Ionisation chambers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
- G01T1/2914—Measurement of spatial distribution of radiation
- G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
- G01T1/2935—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using ionisation detectors
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
- Electron Tubes For Measurement (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US05/616,930 US4031396A (en) | 1975-02-28 | 1975-09-26 | X-ray detector |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5270885A JPS5270885A (en) | 1977-06-13 |
| JPS5831877B2 true JPS5831877B2 (ja) | 1983-07-08 |
Family
ID=24471576
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP51113791A Expired JPS5831877B2 (ja) | 1975-09-26 | 1976-09-24 | Ｘ線検出器 |
Country Status (10)
| Country | Link |
|---|---|
| JP (1) | JPS5831877B2 (fr) |
| AU (1) | AU504372B2 (fr) |
| BE (1) | BE846449R (fr) |
| DE (1) | DE2642741A1 (fr) |
| ES (1) | ES451907A2 (fr) |
| FR (1) | FR2326032A2 (fr) |
| GB (2) | GB1561176A (fr) |
| IT (1) | IT1075856B (fr) |
| NL (1) | NL7609648A (fr) |
| SE (1) | SE426118B (fr) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3991312A (en) | 1975-11-25 | 1976-11-09 | General Electric Company | Ionization chamber |
| JPS5848874B2 (ja) * | 1976-09-25 | 1983-10-31 | 株式会社日立メディコ | Ｘ線検出装置 |
| DE3012648A1 (de) * | 1980-04-01 | 1981-10-08 | Philips Patentverwaltung Gmbh, 2000 Hamburg | Computer-tomographiegeraet |
| US4691108A (en) * | 1983-12-27 | 1987-09-01 | General Electric Company | Ionization detector |
| US11043352B1 (en) * | 2019-12-20 | 2021-06-22 | Varex Imaging Corporation | Aligned grain structure targets, systems, and methods of forming |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3614437A (en) * | 1968-04-18 | 1971-10-19 | Commissariat Energie Atomique | Neutron detection device for the position of beams of neutrons in space |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2566684A (en) * | 1950-11-02 | 1951-09-04 | Cornelius A Tobias | Segmented ionization chamber |
| US3676682A (en) * | 1968-10-30 | 1972-07-11 | Fred W Falk | Absorbed ionizing radiation measuring device |
| US3609435A (en) * | 1968-10-30 | 1971-09-28 | Randolph G Taylor | Fast-response ionization chamber for detecting ionizing radiation from 0.1 to 60 angstroms |
| FR2054433A1 (fr) * | 1969-05-23 | 1971-04-23 | Commissariat Energie Atomique | |
| FR2251830B1 (fr) * | 1973-11-20 | 1976-10-01 | Commissariat Energie Atomique | |
| AU500502B2 (en) * | 1975-02-28 | 1979-05-24 | General Electric Company | Xray detector |
-
1976
- 1976-08-23 SE SE7609342A patent/SE426118B/xx not_active IP Right Cessation
- 1976-08-30 NL NL7609648A patent/NL7609648A/xx not_active Application Discontinuation
- 1976-09-16 FR FR7627811A patent/FR2326032A2/fr active Granted
- 1976-09-22 BE BE170827A patent/BE846449R/fr not_active IP Right Cessation
- 1976-09-23 AU AU18049/76A patent/AU504372B2/en not_active Expired
- 1976-09-23 DE DE19762642741 patent/DE2642741A1/de active Granted
- 1976-09-24 JP JP51113791A patent/JPS5831877B2/ja not_active Expired
- 1976-09-24 IT IT2761576A patent/IT1075856B/it active
- 1976-09-24 GB GB35779A patent/GB1561176A/en not_active Expired
- 1976-09-24 GB GB3971376A patent/GB1561174A/en not_active Expired
- 1976-09-27 ES ES451907A patent/ES451907A2/es not_active Expired
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3614437A (en) * | 1968-04-18 | 1971-10-19 | Commissariat Energie Atomique | Neutron detection device for the position of beams of neutrons in space |
Also Published As
| Publication number | Publication date |
|---|---|
| ES451907A2 (es) | 1978-03-01 |
| FR2326032A2 (fr) | 1977-04-22 |
| DE2642741C2 (fr) | 1990-12-20 |
| IT1075856B (it) | 1985-04-22 |
| GB1561176A (en) | 1980-02-13 |
| BE846449R (fr) | 1977-01-17 |
| AU504372B2 (en) | 1979-10-11 |
| AU1804976A (en) | 1978-04-06 |
| GB1561174A (en) | 1980-02-13 |
| FR2326032B2 (fr) | 1982-02-26 |
| NL7609648A (nl) | 1977-03-29 |
| SE7609342L (sv) | 1977-03-27 |
| JPS5270885A (en) | 1977-06-13 |
| SE426118B (sv) | 1982-12-06 |
| DE2642741A1 (de) | 1977-04-07 |
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