JPS5827066A - 電気測定用プロ−ブ - Google Patents

電気測定用プロ−ブ

Info

Publication number
JPS5827066A
JPS5827066A JP57128305A JP12830582A JPS5827066A JP S5827066 A JPS5827066 A JP S5827066A JP 57128305 A JP57128305 A JP 57128305A JP 12830582 A JP12830582 A JP 12830582A JP S5827066 A JPS5827066 A JP S5827066A
Authority
JP
Japan
Prior art keywords
probe
tip
pair
glove
conductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57128305A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6341497B2 (enExample
Inventor
レイモンド・アンソニ−・ザンドナツテイ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Publication of JPS5827066A publication Critical patent/JPS5827066A/ja
Publication of JPS6341497B2 publication Critical patent/JPS6341497B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06788—Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
    • H01R11/11—End pieces or tapping pieces for wires, supported by the wire and for facilitating electrical connection to some other wire, terminal or conductive member
    • H01R11/18—End pieces terminating in a probe

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
JP57128305A 1981-07-27 1982-07-22 電気測定用プロ−ブ Granted JPS5827066A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US06/286,447 US4491788A (en) 1981-07-27 1981-07-27 Miniature electrical probe
US286447 1981-07-27

Publications (2)

Publication Number Publication Date
JPS5827066A true JPS5827066A (ja) 1983-02-17
JPS6341497B2 JPS6341497B2 (enExample) 1988-08-17

Family

ID=23098648

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57128305A Granted JPS5827066A (ja) 1981-07-27 1982-07-22 電気測定用プロ−ブ

Country Status (7)

Country Link
US (1) US4491788A (enExample)
JP (1) JPS5827066A (enExample)
CA (1) CA1196960A (enExample)
DE (1) DE3228059A1 (enExample)
FR (1) FR2510263A1 (enExample)
GB (1) GB2103027B (enExample)
NL (1) NL8202612A (enExample)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4812745A (en) * 1987-05-29 1989-03-14 Teradyne, Inc. Probe for testing electronic components
DE3803270A1 (de) * 1988-02-04 1989-08-17 Buehler Ag Geb Sensorkonstruktion
US5032787A (en) * 1989-11-03 1991-07-16 Everett/Charles Contact Products, Inc. Electrical test probe having rotational control of the probe shaft
USD347187S (en) 1992-02-20 1994-05-24 Shu-Hui Chou Electric test pen
AU121313S (en) 1993-04-07 1994-08-18 Mod Tap W Corp A wire inserter tool
US5512840A (en) * 1994-01-28 1996-04-30 Nogaki; Paul V. Electrical test clips for slotted and Phillips screw heads
USD354923S (en) 1994-01-31 1995-01-31 Tektronix, Inc. Probing head for an electrical test probe
DE19652271C2 (de) * 1996-02-24 1998-04-09 Herbert Amrhein Kontaktklemme
US6252391B1 (en) * 1998-08-28 2001-06-26 International Business Machines Corporation High frequency probe
WO2002052285A1 (en) * 2000-12-22 2002-07-04 Tokyo Electron Limited Probe cartridge assembly and multi-probe assembly
US7262614B1 (en) 2005-02-10 2007-08-28 Lecroy Corporation Planar on edge probing tip with flex
US7321234B2 (en) * 2003-12-18 2008-01-22 Lecroy Corporation Resistive test probe tips and applications therefor
US9404940B1 (en) 2006-01-06 2016-08-02 Teledyne Lecroy, Inc. Compensating probing tip optimized adapters for use with specific electrical test probes
US9140724B1 (en) 2006-01-06 2015-09-22 Lecroy Corporation Compensating resistance probing tip optimized adapters for use with specific electrical test probes
US7671613B1 (en) * 2006-01-06 2010-03-02 Lecroy Corporation Probing blade conductive connector for use with an electrical test probe
EP2504671B1 (en) 2009-11-27 2020-04-08 Bruker Nano, Inc. Micro electro-mechanical heater
US8631687B2 (en) 2010-04-19 2014-01-21 Hysitron, Inc. Indenter assembly
CN102478591A (zh) * 2010-11-24 2012-05-30 富泰华工业（深圳）有限公司 测试笔
EP2780689B1 (en) 2011-11-14 2017-01-04 Hysitron, Inc. Probe tip heating assembly
WO2013082148A1 (en) * 2011-11-28 2013-06-06 Lucas Paul Keranen High temperature heating system
US9829417B2 (en) 2012-06-13 2017-11-28 Hysitron, Inc. Environmental conditioning assembly for use in mechanical testing at micron or nano-scales
WO2022259424A1 (ja) * 2021-06-09 2022-12-15 三菱電機株式会社 光半導体装置の検査装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AT211427B (de) * 1957-01-29 1960-10-10 Ernoe Reich Mit einem Anzeigegerät ausgerüsteter Meßwandler
CH420314A (de) * 1964-11-20 1966-09-15 Duerrenwaechter Werner Kontaktabgreifklemme
GB1177379A (en) * 1967-11-23 1970-01-14 Futters London Ltd Improvements in and relating to Electric Probes or Testing Devices
US4001679A (en) * 1975-02-19 1977-01-04 Cargile William P Wedge action electrical test probe
DE2514755A1 (de) * 1975-04-04 1976-10-14 Werner Riess Druckpruefspitzen fuer ic's
US4139817A (en) * 1976-09-13 1979-02-13 Tektronix, Inc. Impedance-switching connector

Also Published As

Publication number Publication date
FR2510263A1 (fr) 1983-01-28
JPS6341497B2 (enExample) 1988-08-17
DE3228059A1 (de) 1983-02-10
GB2103027B (en) 1985-02-13
US4491788A (en) 1985-01-01
NL8202612A (nl) 1983-02-16
CA1196960A (en) 1985-11-19
GB2103027A (en) 1983-02-09
FR2510263B1 (enExample) 1985-03-22

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