JPS5827043A - Forming method for sample for spectroscopic analysis - Google Patents

Forming method for sample for spectroscopic analysis

Info

Publication number
JPS5827043A
JPS5827043A JP12574881A JP12574881A JPS5827043A JP S5827043 A JPS5827043 A JP S5827043A JP 12574881 A JP12574881 A JP 12574881A JP 12574881 A JP12574881 A JP 12574881A JP S5827043 A JPS5827043 A JP S5827043A
Authority
JP
Japan
Prior art keywords
sample
spectroscopic analysis
concavities
film
separator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12574881A
Other languages
Japanese (ja)
Inventor
Yukihiko Namiki
並木 幸彦
Takeshi Sekiguchi
関口 武
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SWCC Corp
Original Assignee
Showa Electric Wire and Cable Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Showa Electric Wire and Cable Co filed Critical Showa Electric Wire and Cable Co
Priority to JP12574881A priority Critical patent/JPS5827043A/en
Publication of JPS5827043A publication Critical patent/JPS5827043A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3563Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To prevent the occurrence of a false peak at a measuring time, by a method wherein, when a sample, such as rubbers, plastics, is formed in a film, a flatform material, having minute convexites and concavities in its surface, is brought into contact with one side of the sample through the medium of a separator. CONSTITUTION:A flatform material 5, such as paper files, having convexities and concavities in its surface, is placed on one of flat molds 1, and a sample 3 is placed thereon through the medium of a separator 6. The other flat mold 1' is placed the thereover and the lamination is placed between heating plates 4 and 4' of a press to heat and compress it by means of a pressing device. This enables to form a sample having minute convexities and concavities in one side. When measuring infrared spectrum, light interference is created resulting from the reflection of a part of light transmission between the surfaces, and this enables to prevent the occurrence of a false peak.

Description

【発明の詳細な説明】 本発明は、ゴム・ブチスナックのフィルムの分光測定に
於て表面間反射を減少させ、干渉を無視出来る程4・さ
くする分光分析用試料作成方法に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for preparing a sample for spectroscopic analysis in which reflection between surfaces is reduced and interference is made negligible in spectroscopic measurements of films of rubber and spotted snacks.

従来より、ゴム・プラスチック等をフィルム状にして赤
外線分光分析や紫外線分光分析を行なう場合、フィルム
試料の作成はプレス成形法により行なわれている。
Conventionally, when infrared spectroscopic analysis or ultraviolet spectroscopic analysis is performed using a film made of rubber, plastic, etc., the film sample is prepared by a press molding method.

例えば第1図に示すように、一方の平板金型1の上に適
当な厚さを有する枠2を重ね、枠の中に成形しようとす
るゴム・プラスチツタ材料3を置き、更にその上にもう
一方の平板金型1′を重ね、これをプレスの熱板4,4
′の間に置き適当な温度に加熱圧縮成形する。必要によ
り平板金型と試料の間にセパレーターを入れる。通常平
板金型は試キス“ 料に基1をつけないよう平滑に仕上げである。
For example, as shown in Fig. 1, a frame 2 having an appropriate thickness is placed on top of one flat plate mold 1, a rubber/plastic ivy material 3 to be molded is placed inside the frame, and then another layer is placed on top of the frame 2. One flat plate mold 1' is stacked on top of the other, and this is placed on the hot plates 4, 4 of the press.
' and then heated and compression molded at an appropriate temperature. If necessary, insert a separator between the flat mold and the sample. Flat plate molds are usually finished with a smooth finish so as not to leave any marks on the sample material.

このようにして成形された試料は平滑な平行する表面を
有するため、赤外分光スペクトルを測定すると、第2図
に示す如く表面の間で透過の一部が反射することにより
光の干渉が生じ、凝似ピーク七して多数のピークがあら
れれる難点がある。
Since the sample molded in this way has smooth parallel surfaces, when measuring the infrared spectra, light interference occurs due to a portion of the transmitted light being reflected between the surfaces, as shown in Figure 2. However, the problem is that there are many similar peaks.

このようなピークはスペクシルを解析するにあたって間
違った情報を与える事になるため、凝似ビークのあられ
れないフィルム作成方法がのぞまれていた。
Since such peaks give incorrect information when analyzing speckles, a method for producing films that does not produce condensed peaks has been desired.

本発明はこのような点に鑑みてなされたものであり、ゴ
ム・プラスチックの試料を分光分析用にフィルム状に成
形するにあたり、表面に微小な凹凸を有する平板状物質
を、前記試料の片面にセパレータ−を介して接触させ、
その状態で、試料を加熱プレスしてフィルム状に成形す
ることを特徴とする分光分析用試料作成方法に関する。
The present invention has been made in view of these points, and when molding a rubber or plastic sample into a film for spectroscopic analysis, a flat material having minute irregularities on the surface is coated on one side of the sample. contact through a separator,
The present invention relates to a method for preparing a sample for spectroscopic analysis, characterized in that the sample is heated and pressed in that state to form it into a film.

本発明の1例を第3図に基づいて説明する。一方の平板
金型1の上に紙やすり等の表面に凹凸を有する平板状物
質5を置き、七パレータ6を介して試料3を置く@更に
その上にもう一方の平板金型1′を重ね、これをプレス
の熱板4,4′の間に置き、プレス機で加熱圧縮する。
An example of the present invention will be explained based on FIG. A flat material 5 having an uneven surface, such as sandpaper, is placed on top of one of the flat molds 1, and a sample 3 is placed through a pallet 6. On top of that, the other flat mold 1' is placed. This is placed between the hot plates 4 and 4' of the press, and heated and compressed using the press.

こうして片面に微小な凹凸をもった試料を作ることが出
来る。
In this way, it is possible to create a sample with minute irregularities on one side.

なお七バレーターは厚み0.02〜0.1−であり、材
質はセW7アン、ポリエステルフィルム(商品名:マイ
ラーフィルム)等が利用できる。
Note that the thickness of the seven balator is 0.02 to 0.1 -, and the material can be Sew7an, polyester film (trade name: Mylar film), or the like.

又表面に微小な凹凸を有する平板状物質としては紙やす
りの他、金網(100〜350メツシ:L)ガラス繊維
布、布地等があり、試料より高い軟化温度を有するもの
ならばどのようなものでも使用できる。
In addition to sandpaper, flat materials with minute irregularities on the surface include wire mesh (100 to 350 mesh: L), glass fiber cloth, cloth, etc., and any material with a softening temperature higher than that of the sample can be used. But it can be used.

本発明の方法で成形したフィルム試料においては、平行
する表面の割合が非常に小さくなるので透過と同一方向
での反射の繰返しの割合は非常に小さくなり第2図に示
す如く赤外分光スペクトルに疑似ビークはでなくなる。
In the film sample formed by the method of the present invention, the ratio of parallel surfaces is extremely small, so the ratio of repetition of transmission and reflection in the same direction is extremely small, resulting in an infrared spectrum as shown in Figure 2. No more false beaks.

次に実施例について説明する。Next, an example will be described.

実施例−1 #240、#350、#400、:#800、:#10
00、#1500番のエメリー級を使用し、加熱温度1
40℃、圧力350!9/−の条件で厚さ0.1■の低
密度ポリエチレンフィルムを本発明方法により作成し、
赤外sg&収スペクトルを測定したところいずれも干渉
による疑似ビークのないスペクトルを得た。
Example-1 #240, #350, #400, : #800, : #10
Use #00, #1500 emery grade, heating temperature 1
A low-density polyethylene film with a thickness of 0.1 cm was produced by the method of the present invention under the conditions of 40°C and a pressure of 350!9/-,
When infrared sg & yield spectra were measured, spectra without any false peaks due to interference were obtained.

実施例−2 200メツシユのステンレス金網を使用して実施例−1
と同様にフィルムを作成し同様の好結果を得た。
Example-2 Example-1 using 200 mesh stainless wire mesh
A film was made in the same manner as above and similar good results were obtained.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来のフィルム状試料の作成方法を表わす説明
図であり、第2図は従来法及び本発明法により得られた
フィルム状試料の赤外吸収スペクトルを表わす模式図で
あり、第3図は本発明による試料の作成方法を表わす説
明図である。 1 、1’−−−一平板金型 2−−−−−−−−−−一枠 3 −−−−−−−−−−・ゴム者プラスチック材料4
 、4’  −−−一熱板 S  −−−−−−−−一表面に凹凸を有する平板状物
質゛ 8 −−−−−−−一 七パレーター 第1図 第2図 第3図
FIG. 1 is an explanatory diagram showing a conventional method for preparing film-like samples, FIG. 2 is a schematic diagram showing infrared absorption spectra of film-like samples obtained by the conventional method and the method of the present invention, and FIG. The figure is an explanatory diagram showing a method for preparing a sample according to the present invention. 1, 1'---One flat plate mold 2---One frame 3---Rubber plastic material 4
, 4' ---1 Heating plate S ------------ Flat material having unevenness on one surface 8 -------1 7 Palator Figure 1 Figure 2 Figure 3

Claims (1)

【特許請求の範囲】[Claims] 1、 ゴム・プラスチックの試料を分光分析用ニフイル
ム状に成形するにあたり、表面に微小な凹凸を有する平
板状物質を、前記試料の片面にセパレーターを介して接
触させ、その状態で試料を加熱プレスしてフィルム状に
成形することを特徴とする分光分析用試料作成方決0
1. When molding a rubber or plastic sample into a Nifilm shape for spectroscopic analysis, a flat material with minute irregularities on the surface is brought into contact with one side of the sample via a separator, and the sample is heated and pressed in this state. A method for preparing a sample for spectroscopic analysis, characterized by forming it into a film shape.
JP12574881A 1981-08-11 1981-08-11 Forming method for sample for spectroscopic analysis Pending JPS5827043A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12574881A JPS5827043A (en) 1981-08-11 1981-08-11 Forming method for sample for spectroscopic analysis

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12574881A JPS5827043A (en) 1981-08-11 1981-08-11 Forming method for sample for spectroscopic analysis

Publications (1)

Publication Number Publication Date
JPS5827043A true JPS5827043A (en) 1983-02-17

Family

ID=14917822

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12574881A Pending JPS5827043A (en) 1981-08-11 1981-08-11 Forming method for sample for spectroscopic analysis

Country Status (1)

Country Link
JP (1) JPS5827043A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102564816A (en) * 2010-12-23 2012-07-11 中国石油化工股份有限公司 Sample preparation method of viscous solid matter and one-hole sample preparation mold used by same
JP2012181174A (en) * 2011-03-03 2012-09-20 Toppan Printing Co Ltd Sample interference fringe reduction tool for infrared spectroscopic analysis
CN102721581A (en) * 2011-03-30 2012-10-10 中国石油化工股份有限公司 Sample-preparing method for viscous solid substances and multihole sample-preparing mould used therein
CN102721661A (en) * 2011-03-30 2012-10-10 中国石油化工股份有限公司 Method for determining unsaturated degree of viscous solid substance by infrared spectrum and specimen rack used in method

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102564816A (en) * 2010-12-23 2012-07-11 中国石油化工股份有限公司 Sample preparation method of viscous solid matter and one-hole sample preparation mold used by same
JP2012181174A (en) * 2011-03-03 2012-09-20 Toppan Printing Co Ltd Sample interference fringe reduction tool for infrared spectroscopic analysis
CN102721581A (en) * 2011-03-30 2012-10-10 中国石油化工股份有限公司 Sample-preparing method for viscous solid substances and multihole sample-preparing mould used therein
CN102721661A (en) * 2011-03-30 2012-10-10 中国石油化工股份有限公司 Method for determining unsaturated degree of viscous solid substance by infrared spectrum and specimen rack used in method

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