JPS5826396A - Refresh system for dynamic random access memory - Google Patents

Refresh system for dynamic random access memory

Info

Publication number
JPS5826396A
JPS5826396A JP56125612A JP12561281A JPS5826396A JP S5826396 A JPS5826396 A JP S5826396A JP 56125612 A JP56125612 A JP 56125612A JP 12561281 A JP12561281 A JP 12561281A JP S5826396 A JPS5826396 A JP S5826396A
Authority
JP
Japan
Prior art keywords
refresh
address
memory
circuit
cycle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56125612A
Other languages
Japanese (ja)
Inventor
Takayuki Taniguchi
谷口 孝之
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP56125612A priority Critical patent/JPS5826396A/en
Publication of JPS5826396A publication Critical patent/JPS5826396A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/406Management or control of the refreshing or charge-regeneration cycles

Abstract

PURPOSE:To perform refresh without decreasing the processing efficiency of a CPU, by performing refresh at the 1st half of one machine cycle and performing access at the latter half. CONSTITUTION:One cycle of the machine cycle is divided into a refresh mode for the prior half and a normal mode for the latter half at refresh and this time of division is controlled with normal/refresh switching signals NOR/REF. When the level of the signals NOR/REF is at L, RAS and CAS signals are risen at the same time, and when the RAS signal drops, a refresh address is given at a switching circuit ADSW as a system address, the row of an RAM only is designated for refresh operation. In the normal mode, a memory control circuit MEM.CONT controls leading and trailing of the RAS signal again.

Description

【発明の詳細な説明】 X発Li、i+ iすマシンサイクルのNil半BE、
 (’Fたは後手部)のみでリフレッシュをTj]能と
Tるランダムアクセスメモリのリフレッシュ回wrK 
t9j T ル。
[Detailed description of the invention]
Refresh times of random access memory that can be refreshed only with ('F or rear part) Tj]
t9j T le.

ダイナミック・ランダムアクセスメモリ(以下本明鹸曹
においてダイナζツクRAνと略H1Tる)のメモリセ
ルは電源・牛涛体章子・キャパシタの自列接に・2回路
で(1龜成され、キャパシタの宜荷歓゛ついてその有無
をビット“1″“0”と対応さ、y 1Htl和n;枦
を行なっている。キャパシタCの重荷はh・曲経鍋と共
に消失Tるかr−)、↑^報lイ呆持T/)ため一定時
1111以内に和光’iE+’、−iる必要がゐり、こ
わンリフレッシュという。通常は2ミリ秒の周JiJ+
でリフレッシユしている。RA′M は行X列のアレイ
材量となっている力1ら、1個のメモリセルケ選択して
リフレッシュTるとぎ材と列ン指定Tる必要がある。集
積回路化されたRAM ではそのメモTJセル選択に・
【ろ妄なアドレスのλカビン数がメモリ選択に必シFア
ドレス数の手分で同一の人力ビンに賄分割で行・列アド
レスに入力Tる。行×列の大きさは容り土により異なり
16にビットで128行×128列、64にビットで1
28行×512列となっている。1定初数のセルについ
て、rr7I:′同じくTるものは共通接続されていて
、−挙に17レツシユされるため、(lIIII別セル
に対して行なうのでは1p(、各行について行なえは浪
い。そのたぬ前述の集積回路では64行の場合32マイ
クロ秒(2ξり秒の1/64 ) t  12B行の場
合16マイクロ秒に1回のリフレッシュ動作7行7jう
ことになる。第1Nは従来のリフレッシュ回路の枦成図
ケ示70n・OLK はリフレッシュ用クロック発生回
路で前述のように32マイクロ秒Vいは16マイクロ秒
の族11Jlヶもち、甲央処畑装島CアU用のクロック
φ1.φ2とは非同期である。
The memory cell of a dynamic random access memory (hereinafter referred to as DYNAζTSUKRAν and H1T in the present invention) consists of a power supply, a capacitor, and two circuits connected in parallel to each other. The presence or absence of Yi Huan corresponds to the bits "1" and "0", y 1 Htl sum n; For this reason, Wako 'iE+' and -i must be refreshed within 1111 at a certain time, which is called a stiff refresh. Usually around 2 ms JiJ+
I'm refreshing. RA'M is the amount of array material in rows and columns, and it is necessary to select one memory cell and specify the refresh T and column T. In integrated circuit RAM, the memory TJ cell selection
[The number of λ bins of delusional addresses is necessary for memory selection.The number of λ bins of delusional addresses is input to the row/column addresses in the same manual bin by the number of F addresses. The size of the rows and columns varies depending on the soil, 128 rows x 128 columns with 16 bits and 1 bit with 64 bits.
It has 28 rows x 512 columns. For cells with a constant initial number of 1, rr7I:' are also commonly connected, and 17 retries are made at once. Otherwise, in the above-mentioned integrated circuit, in the case of 64 rows, the refresh operation for 7 rows 7j is 32 microseconds (1/64 of 2ξ seconds) t, and in the case of 12B rows, once every 16 microseconds.The 1st N is 70n/OLK is a refresh clock generation circuit, which has a clock generation circuit of 32 microseconds or 16 microseconds, and has a frequency of 32 microseconds or 16 microseconds. It is asynchronous with clocks φ1 and φ2.

F・OI、にはリフレッシェ制徊1回路 PKF・C0
NTとりフレッシュアドレスカウンタFT−(!0UI
J’Tに入力される。リフレッシュ?IIII御回路n
Ey−cONT はリフレッシュ用クロックREF−(
!LXケ受けてリフレッシュ箒求伽号P・EKQを出力
Tり。)l−REQはCPU用クロりク発住回路MPI
l−CLKに人力Tる。クロック発止回路MPσ−0L
Kではメモリクロックイr4%MatKの立下りで、F
l−BKQ伯号信号Lmを検出1く)と、ト・REQ 
(h4WWr、伯’i3゛R−()RAM7 4出力下
る。R−GRANT  48号がH” ノJill l
’d1だけφ1の“H”IFJy間が延長さ」(る。こ
わがりフレッシ瓢サイクルとなる。F−GRANT  
信号はR11;F−CONTに人力し。
F・OI, 1 circuit of refresher control PKF・C0
NT fresh address counter FT-(!0UI
It is input to J'T. refresh? III control circuit n
Ey-cONT is the refresh clock REF-(
! After receiving the LX, output the refresh Houkikyukage P/EKQ. )l-REQ is the CPU clock generation circuit MPI
Human power is applied to l-CLK. Clock start circuit MPσ-0L
At the falling edge of memory clock Ir4% MatK, F
Detection of l-BKQ signal Lm) and g-REQ
(h4WWr, H'i3゛R-()RAM7 4 outputs fall.R-GRANT No. 48 is H"ノJill l
The "H" IFJy interval of φ1 is extended by 'd1.' (The period becomes a scary fresh gourd cycle.F-GRANT
The signal is manually input to R11; F-CONT.

そのたぬR−REQはリセットされる。したがって次の
MOLK (メモ+7クロツク)信号の立下りではR−
1’lEQ伯綺“H”ケ検出して辿′イサイクルにもど
る。RFP−CLK はまたリフレッシュ行アドレス用
カウンタB−00UNT の入力とT、Cつて行アドレ
スケカウントアップTる。カウンタの土限値は64或い
は12Bに設定されていて。
The other R-REQ is reset. Therefore, at the falling edge of the next MOLK (memo+7 clock) signal, R-
1'1EQ Detects "H" and returns to cycle. RFP-CLK also connects with the input of the refresh row address counter B-00UNT to count up the row address. The limit value of the counter is set to 64 or 12B.

連列出力はアドレス切換回路ADEIWに入力される。The serial output is input to the address switching circuit ADEIW.

アドレス切琳回路には甲夫如坤装置次からのメモリアド
レスが入力さねていり。R−GRANT伯号とは信号イ
シドなノーマル/リフレッシュ切換イー号NOR/RE
Fにより、j出席サイクルではメモリアドレスが、リフ
レッシュサイクルではリフレッシュアドレスがシステム
アドレスバストシて出力される。また第2図は動作タイ
ムチャートで通常サイクルでは行アドレスと夕11アド
レスの彌択Gj号WTf’W/COLによりメモリアド
レス7行アドレスと列アドレスに時分割して出力Tる。
The memory address from the next device is input to the address circuit. What is R-GRANT? Normal/refresh switching signal NOR/RE
Due to F, the memory address is output in the j attendance cycle, and the refresh address is output as the system address bus in the refresh cycle. FIG. 2 is an operation time chart. In a normal cycle, the memory address 7 is time-divided and outputted to the 7th row address and the column address by the selection Gj WTf'W/COL of the row address and the 11th address.

下記の衣にシステムアドレスの内芥ン示T09TアFL
/スストロープ伯号FAB、列アドレスストローブ信号
CA8はそれぞれFtAl(に入力された行アドレスと
列アドレスケ内1S1!にラッチTく)ための信号で、
 RABIJ行アドレスが確足しているliに立下り、
CABld列アドレスが穏定している曲に立下るように
タイミング割付されている。′51′たりフレッシュの
とぎ竹だけが指定されaたぬ0AEIはリフレッシュサ
イクルでは立下らないように制御されている。WK4y
j号目曹込み可(呂号)Jllち読出し魯込み信号、C
BはRAM5積回路を選択Tるたぬのイル号である。こ
れらRA M  1lIIJ御イハ号はメモリクロック
信号から生成される。リフレッシュサイクルはしたかつ
て161には32のノーマルサイクルのうち1回宛発生
している力)ら、甲央舛坤装!i!tOPUから見ると
メ41川′のできないデッドタイムとなり、如坤匁I率
の低下Tる原因となっている。
Please indicate the system address in the box below.T09TAFL
/Sstrope signal FAB and column address strobe signal CA8 are signals for latching the row address input to FtAl and the column address input to 1S1!, respectively.
Falling to li where the RABIJ row address is certain,
Timing is assigned so that the CABLd column address falls in a stable song. Only '51' or fresh Togitake is specified, and 0AEI is controlled so that it does not fall during the refresh cycle. WK4y
No. J can be inserted (Ro No.) Jllchi readout signal, C
B is the number that selects the RAM 5 product circuit. These RAM 11IIJ numbers are generated from the memory clock signal. The refresh cycle used to be 161, but the power generated was 1 out of 32 normal cycles), and the power that was generated was 161. i! From the point of view of tOPU, this becomes an impossible dead time, which causes a decrease in the rate of death.

本発明の目的は前−di5の欠点を改善し、中央如坤装
いの如坤効案ケ低下させず、リフレッシュ和1作は11
11常のとおり可能とTるダイナミックRAM(hリフ
レッシュ回路を得ずj(Tることにあo0以下図面に示
T本発明の来2IIrI例1についてH(?明Tな。第
3図は本発明の実施例ン示1ブロックlfi’t Ij
l l!/Jで、リフレッシュ用クロック発生回路かT
x < 、  クロックパルスはCPTJ用クロッり発
生回路M P U −CL Kたら受ルリ、メモリfj
ii制御回路1[DM−CONTにおいてもイー号乞イ
←るよう例動作ゴー6゜リフレッシュ!1ヒ;作e(つ
い又は、弔4図に示T動作タイムチャートのように、マ
シンサイクルの1サイクルケ前牛のリフレッシュモード
部分と後手のノーマルモード部とに分割Tる。
The purpose of the present invention is to improve the shortcomings of the previous di5, without reducing the effectiveness of the central design, and to refresh the 11
11 As usual, it is possible to create a dynamic RAM (without obtaining a refresh circuit). Embodiments of the invention 1 block lfi't Ij
l l! /J, refresh clock generation circuit or T
If x <, the clock pulse is received by the CPTJ clock generation circuit MPU-CLK, and the memory fj
ii Control circuit 1 [DM-CONT also requires E ← Example operation Go 6° Refresh! 1st; Creation (Finally, as shown in the T operation time chart shown in Figure 4, one cycle of the machine cycle is divided into a refresh mode part of the front cow and a normal mode part of the rear part.

この分割時期は第2図と同様にノーマル/リフレッシュ
切換伯号VOR/RBFにより飴:・御Tる。
This division timing is controlled by the normal/refresh switching number VOR/RBF as in FIG.

メモリ制御回路MKM−0ONT  においてはノーマ
ηリフレッシ二切換信号によりFIAS、 OAS伯号
信号上り・立下りケ制御して出力Tる。
In the memory control circuit MKM-0ONT, the rising and falling edges of the FIAS and OAS signals are controlled and outputted by the normal η refresh switching signal.

ffl チノーマル/リフレッシェ切換信帰が“L”の
1侍がリフレッシュモードであるとしてRAEI、CA
s両イ【号ン同時に立上らせ2次にFARが立下ったと
きには、リフレッシュアドレスがアドレス切換回路AD
8W においてシステムアドレスとして与えられている
からRAMの行だけ7指フ ′jJフしてリフレッシュ動作が行なわれる。次にノー
マルモードに入るとメモリh用彷1回路は再びRAS!
立止り・立下りのi1i制御ンTる。立下ったとぎには
、メモリアドレスのうち行アドレスか、次にCABも立
下ったとき列アドレスか指定さ名ているためFAMの訪
出し/曹込み動作が行なわれる。このときwE、asの
画伯崎は第1図と同様のものである。
ffl Assuming that one samurai whose normal/refresh switching signal is “L” is in refresh mode, RAEI, CA
When both s signals rise at the same time and the 2nd FAR falls, the refresh address is set to the address switching circuit AD.
Since it is given as a system address in 8W, the refresh operation is performed by moving only seven rows of RAM. Next, when the normal mode is entered, the memory h circuit 1 will return to RAS!
i1i control of stopping and falling. When the signal falls, the row address of the memory address is specified, and when CAB also falls next, the column address is specified, so the FAM visit/fill operation is performed. At this time, the painter's slope of wE, as is the same as that shown in FIG.

次に第5図は6800糸8ビツトマイクロコンピユータ
の4KBメモリについてオ・発明ケ適用−,r 、6と
ぎの第3図と対応下る構成図を第5図A・第5図Bと示
している。図において苦印はイド崎名林の頭に付けて徐
信号の反転信号であることを示している。寸た第5図I
Aか第3図のメモリ制御1回路Mll:M−CoλT 
に略対応し、第5図Bの下方CNTが第3図のリフレッ
シュカウンタR−COU′NT  に、′#3″J5図
Bの残金か第3図のアドレス!/l換回路AI)8Wと
対地している。各図においてA15〜AOはメモリアド
レスン示し。
Next, Fig. 5 shows the 4KB memory of a 6800-thread 8-bit microcomputer. . In the figure, the mark is placed on Idozaki Nabayashi's head to indicate that it is an inverted signal of the slow signal. Figure 5 I
A or memory control 1 circuit Mll in Fig. 3: M-CoλT
Approximately corresponding to , the lower CNT in FIG. 5B is applied to the refresh counter R-COU'NT in FIG. In each figure, A15 to AO indicate memory addresses.

メモリ制御・回路に対応Tる名1へ分ケ示T第5図Aに
おいてメモリアドレスのよ位4ビットA1g〜A12と
、それらを反転したイハ号苦A15〜黄A12とケデコ
ードT6゜次にプロセッサからのリードライト信号の反
転黄R/WとメモリクロックMCL K ($1えはI
M=し周波数I Mlz )とから−XCS(チップセ
レクト山号)、芳W”(v、F込み−ol伯跨)ン1停
てRAMに印加Tる。またメモリクロックMOLK O
> 2倍・4倍の周波数のクロックr7得ておき(21
1,41Aと示T)、それら!合成してRAS、CAB
のイお綺ン得る。次に第51米Bにおいて0)JTl、
0NT2と示Tカウンタによりメモリクロック!計数し
、6ビツト出力とTる。BELは選択器ン示し、77ウ
ンタの6ビツト出力!2ビツトずつ3個の選択器に入力
Tる。そしてノーマル/リフレッシュ切換信号NOR/
RBFと行・列アドレス選択信号1贈/COLとが共に
L”のとぎはリフレッシュモードであるから、前述のカ
ウンタ出力が各セレクタの出力となってシステムアドレ
スMA5〜MAD  ン形成Tる。次にNOI?/吊が
“H”、ポ)Wlool、カビL”のときは行アドレス
ケ与えるようにセレクタEJiI、が動作し2次にNO
R/FtEFと翁100 Lが共に“H”のとぎ列アド
レスを与えるようにセレクタ8KLが動作Tる。このよ
う圧してメモリクロックから取出した信号によりシステ
ムアドレスはリフレッシュアドレスと村・列アドレスを
示し、リフレッシュモードとノーマルモードとが有効に
切換えら才する。
Corresponding to the memory control/circuit T Name 1 Partition diagram T In Figure 5 A, the significant 4 bits A1g to A12 of the memory address, their inverted numbers A15 to A12, and the decode T6゜Next, the processor Inverted yellow R/W of read/write signal from R/W and memory clock MCL K ($1 is I
From M = frequency I Mlz ), -XCS (chip select number), Yoshi W" (v, F included - ol) stop and apply to RAM. Also, memory clock MOLK O
> Obtain clock r7 with double/quadruple frequency (21
1,41A and T), those! Synthesize RAS, CAB
Get the best results. Then in the 51st US B 0) JTl,
Memory clock with 0NT2 and T counter! Count and output 6 bits. BEL indicates the selector, and the 6-bit output of the 77 counter! Two bits each are input to three selectors. And normal/refresh switching signal NOR/
Since it is the refresh mode when RBF and the row/column address selection signal 1/COL are both low, the above-mentioned counter output becomes the output of each selector to form the system address MA5 to MADN.Next. When NOI?/Hanging is "H", PoWlool, Kabi L", the selector EJiI operates to give the row address, and the second NO
The selector 8KL operates so that R/FtEF and the old man 100L both give a stitching column address of "H". The system address indicates the refresh address and the village/column address by the signal extracted from the memory clock in this manner, and the refresh mode and normal mode are effectively switched.

′ICおlマシンサイクルの内リフレッシュモードケ図
示と反対にノーマルモードの抜刀に米るよう俊リゾTる
こともできる。
'In the refresh mode of the IC or machine cycle, contrary to what is shown in the illustration, it is also possible to use the refresh mode in normal mode.

このようにして本発明によると中央lJ+押装置から見
てリフレッシェサイクルという特e二石g IF、11
111かり邑返し出て来ることがないため、ダ1他効率
の低下Tることがない。またリフレッシュ[6+路とし
て外iRの取付回路か/W少Tる効果もある。
In this way, according to the present invention, the special refresh cycle, viewed from the central lJ + push device, is completed.
111 will not occur again, so there will be no reduction in efficiency. It also has the effect of reducing the external iR mounting circuit as a refresh [6+ path].

4図面のjt(+ 却T、c %’i明第1図は従来の
リフレッシュ回路の)f41tJjV lソl。
Figure 4 shows the conventional refresh circuit.

第2図は第、 1 lyIの動作タイムチャート、第3
図は本発明の44施例のブロック構成図、第4図は第3
図の動作タイムチャート、第5図は梁軸1111路によ
る具体的リフレッシュ仲1路■1を示T0 R−OLK・・・リフレッシュ用クロック発生回路CP
U・・・甲夫処j4!装置 RBF−(!ONT・・・リフレッシュ貯1仙・1[1
1路R弓11Q・・・リフレッシェ要求イ♂号MCLK
・・・メモリクロック信号 RAB−・・行アドレスストローブ信号CAS・・・列
アドレスストローブ信号WK・・・1込み可信号 CS・・・集積回路選択信号 特許出願人 富士通株式会社 代 期 人 弁即土鈴木栄祐
Figure 2 shows the operation time chart of 1. lyI, and 3.
The figure is a block diagram of the 44th embodiment of the present invention, and FIG.
The operation time chart in the figure, Figure 5 shows the concrete refresh path 1 by the beam axis 1111 path ■1 T0 R-OLK...Refresh clock generation circuit CP
U...Kofujo j4! Device RBF-(!ONT...Refresh storage 1x1 [1
1st route R bow 11Q... Refreshment request I female MCLK
...Memory clock signal RAB--Row address strobe signal CAS...Column address strobe signal WK...1 inclusion signal CS...Integrated circuit selection signal Patent applicant: Fujitsu Ltd. Eisuke Suzuki

Claims (1)

【特許請求の範囲】[Claims] ダイナミック・ランダムアクセスメモリヲ構成Tるメモ
リセルに対し、アドレス入力を行と列とに蒔分割してア
ク上1フ行ないりフレッンエ16ランダムアクセスメモ
リのりフレッシユ77Kにおいて2通常の1マシンサイ
クルの前半πi−(または後半部)ではリフレッシュア
ドレスと行アドレスストローブ(i号とン出力し後手部
(テには前半部)ではシステムアドレス、行アドレスス
トローブ信号2列アドレスストローブ信号をttj力T
る回路ケ設け、甲夫グl押装置用りロックケ使用してl
マシンサイクル前半部(または後手部)でリフレッシ瓢
!行ない、後半部(または前半部]でアクセスケ行なう
ことを特徴と″ir0ダイナミック・ランダムアクセス
メモリのりフレッシェ方式。
Address input is divided into rows and columns for memory cells configured in a dynamic random access memory. - (or the second half) outputs the refresh address and row address strobe (i), and the second half (or the first half) outputs the system address, row address strobe signal, and two column address strobe signals.
A circuit is provided, and a lock is used for the pushing device.
Refresh yourself in the first half (or rear) of the machine cycle! The feature is that the ir0 dynamic random access memory is accessed in the second half (or the first half).
JP56125612A 1981-08-11 1981-08-11 Refresh system for dynamic random access memory Pending JPS5826396A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56125612A JPS5826396A (en) 1981-08-11 1981-08-11 Refresh system for dynamic random access memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56125612A JPS5826396A (en) 1981-08-11 1981-08-11 Refresh system for dynamic random access memory

Publications (1)

Publication Number Publication Date
JPS5826396A true JPS5826396A (en) 1983-02-16

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ID=14914397

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56125612A Pending JPS5826396A (en) 1981-08-11 1981-08-11 Refresh system for dynamic random access memory

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Country Link
JP (1) JPS5826396A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62188095A (en) * 1986-02-14 1987-08-17 Toshiba Corp Control circuit for semiconductor memory device
JPS62188096A (en) * 1986-02-13 1987-08-17 Toshiba Corp Timing control circuit for refresh operation of semiconductor storage device
WO2001067461A1 (en) * 2000-03-08 2001-09-13 Nec Corporation Semiconductor memory

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4946346A (en) * 1972-09-06 1974-05-02

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4946346A (en) * 1972-09-06 1974-05-02

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62188096A (en) * 1986-02-13 1987-08-17 Toshiba Corp Timing control circuit for refresh operation of semiconductor storage device
JPS62188095A (en) * 1986-02-14 1987-08-17 Toshiba Corp Control circuit for semiconductor memory device
JPH056279B2 (en) * 1986-02-14 1993-01-26 Tokyo Shibaura Electric Co
WO2001067461A1 (en) * 2000-03-08 2001-09-13 Nec Corporation Semiconductor memory
US6876592B2 (en) 2000-03-08 2005-04-05 Nec Electronics Corporation Semiconductor memory device

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