JPS5825348Y2 - conductive contact pin - Google Patents
conductive contact pinInfo
- Publication number
- JPS5825348Y2 JPS5825348Y2 JP1979043819U JP4381979U JPS5825348Y2 JP S5825348 Y2 JPS5825348 Y2 JP S5825348Y2 JP 1979043819 U JP1979043819 U JP 1979043819U JP 4381979 U JP4381979 U JP 4381979U JP S5825348 Y2 JPS5825348 Y2 JP S5825348Y2
- Authority
- JP
- Japan
- Prior art keywords
- head
- pin
- conductive contact
- recess
- screw
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Measuring Leads Or Probes (AREA)
Description
【考案の詳細な説明】
本考案は、スイッチングレギュレータのような比較的大
電流を取扱う機器を検査するチェッカーに用いられる導
電接触ピンに関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a conductive contact pin used in a checker that inspects equipment that handles relatively large currents, such as switching regulators.
一般にスイッチングレギュレータの各出力端子は先頭ネ
ジによって形成されているが、このレギュレータの出力
電圧または出力電流を測定するには、各端子ネジの頭部
にそれぞれ同時に接触する多数の導電接触ピンをもつチ
ェッカーが使用されている。Generally, each output terminal of a switching regulator is formed by a head screw, but to measure the output voltage or output current of this regulator, a checker with a number of conductive contact pins that simultaneously contact the head of each terminal screw is used. is used.
従来、この種の導電接触ピンには、第1図に示したよう
に頭部に円錐状の凹部を形成したものが用いられている
が、このピンによれば、スイッチングレギュレータの各
端子ネジの頭部にそれぞれピンをあてがう場合、端子ネ
ジ相互の取付位置に多少のバラツキがあっても、各ピン
の円錐壁面がガイドとして働くので、それぞれのピンは
適確に対応するネジの頭部に導かれるという利点をもっ
ている。Conventionally, this type of conductive contact pin has a conical recess formed in the head as shown in Figure 1, but according to this pin, each terminal screw of a switching regulator When placing pins on each head, even if there are slight variations in the mounting positions of the terminal screws, the conical wall surface of each pin acts as a guide, so each pin can be accurately guided to the head of the corresponding screw. It has the advantage of being easy to use.
しかし、この場合、各ピンの円錐壁面とネジ頭部との接
触部分は環状の線接触となるのであるから、両者間の接
触面積は小さいものであった。However, in this case, since the contact portion between the conical wall surface of each pin and the screw head is an annular line contact, the contact area between the two is small.
このため、比較的大きな電流(IOA以上)が通電され
ている端子ネジの頭部にこのようなピンを長時間接触さ
せておくときにはジュール熱量が大きくなり、ピンは5
0〜60℃位に加熱されてし1うので、これに起因する
測定誤差やピンの材質劣化などが指摘されている。For this reason, when such a pin is left in contact with the head of a terminal screw through which a relatively large current (more than IOA) is being applied for a long time, the amount of Joule heat increases, and the pin
Since the pin is heated to a temperature of about 0 to 60°C, it has been pointed out that measurement errors and deterioration of the pin material are caused by this.
したがって、本考案の目的は、比較的大きな電流を長時
間通電しても加熱するおそれの少ない導電接触ピンを提
供しようとするにある。Therefore, an object of the present invention is to provide a conductive contact pin that is less likely to heat up even when a relatively large current is applied for a long period of time.
以下、本考案の実施例を添付図面にもとすいて説明する
。Embodiments of the present invention will be described below with reference to the accompanying drawings.
第2図および第3図を参照すると、この導電接触ピン1
は、ステム2と、このステム2に連設された拡径状の頭
部3とを備えている。Referring to FIGS. 2 and 3, this conductive contact pin 1
includes a stem 2 and an enlarged-diameter head 3 connected to the stem 2.
ステム2および頭部3ともたとえば真ちゅうのような電
気良導体からなり、頭部3の端面には、半球面状の凹部
4が形成されている。Both the stem 2 and the head 3 are made of a good electrical conductor such as brass, and a hemispherical recess 4 is formed in the end face of the head 3.
この凹部4の球面形状の全体的な曲率は、スイッチング
レギュレータの端子ネジ5の頭部6が有する曲率に略等
しいように選定されるが、その口縁部分の曲率は頭部6
の裾部分の曲率よりもやや大きめになされている。The overall curvature of the spherical shape of this recess 4 is selected to be approximately equal to the curvature of the head 6 of the terminal screw 5 of the switching regulator, but the curvature of the mouth edge portion is
The curvature is slightly larger than that of the hem.
この結果、端子ネジ5の頭部6にピン1の頭部3の凹部
4を接触させた場合、その凹部4の開口縁部分に、わず
かにギャップを残して両者はほぼぴったシと適合する。As a result, when the head 6 of the terminal screw 5 is brought into contact with the recess 4 of the head 3 of the pin 1, the two fit together almost perfectly, leaving a slight gap at the opening edge of the recess 4.
この場合、図面に示された例では凹部4の中心部には、
頭部3の軸方向にのびるテーパー状の孔7が穿設されて
いるが、これは頭部4の中心部の放熱効果を意図するも
のである。In this case, in the example shown in the drawing, in the center of the recess 4,
A tapered hole 7 extending in the axial direction of the head 3 is bored, and this is intended to provide a heat dissipation effect from the center of the head 4.
スイッチングレギュレータの回路検査にあたっては、こ
のレギュレータの各端子ネジの頭部のもつ曲率と直径に
適応する導電接触ピン1をチェッカーの所定個所に装着
し、各ピン1を対応する端子ネジ5の頭部6に当接させ
て、それぞれ所望の端子ネジに卦ける出力をピン1を介
してチェッカーに入力する。When inspecting the circuit of a switching regulator, conductive contact pins 1 that match the curvature and diameter of the head of each terminal screw of this regulator are attached to predetermined locations on the checker, and each pin 1 is connected to the head of the corresponding terminal screw 5. 6, and input the output to each desired terminal screw to the checker via pin 1.
この操作にかいて、頭部3に形成された半球面状凹部4
は、ネジ頭部6の曲率と略等しい曲率をもつものである
から、四部4の球面壁は広い範囲にわたってネジ頭部6
表面と面接触することになる。Through this operation, the hemispherical recess 4 formed in the head 3
has a curvature that is approximately equal to the curvature of the screw head 6, so the spherical wall of the four parts 4 has a curvature that is approximately equal to the curvature of the screw head 6.
It will come into face-to-face contact with the surface.
したがって、比較的大きな電流が通電されている端子ネ
ジに長時間接触させておいても接触面積が大きいことか
ら発生するジュール熱は少なくなり、ピン1は加熱する
ことがない。Therefore, even if the pin 1 is kept in contact with a terminal screw to which a relatively large current is applied for a long time, the Joule heat generated due to the large contact area is reduced, and the pin 1 will not be heated.
また、凹部4の中心部にテーパー状の孔Tを設けたこと
により、ピン1内に熱が蓄積されることもなく、より効
果的にピン1を常温付近に保つことができる。Furthermore, by providing the tapered hole T in the center of the recess 4, heat is not accumulated within the pin 1, and the pin 1 can be more effectively maintained at around room temperature.
他方、凹部4の口径はネジ頭部6の直径よりもやや大き
く形成されているため、端子ネジの取付位置に多少のバ
ラツキがあってもピン1は、凹部4の球面壁をガイドと
して確実にネジ頭部6上に案内されることになる。On the other hand, since the diameter of the recess 4 is formed to be slightly larger than the diameter of the screw head 6, the pin 1 can be reliably mounted using the spherical wall of the recess 4 as a guide even if there is some variation in the mounting position of the terminal screw. It will be guided onto the screw head 6.
な卦、凹部4の球面形状の曲率は、凹部4の球面壁の少
なくとも約50〜70多の部分がネジ頭部60表面と接
触するように選定されることが好ましい。However, the curvature of the spherical shape of the recess 4 is preferably selected such that at least about 50 to 70 parts of the spherical wall of the recess 4 are in contact with the surface of the screw head 60.
また、孔7は、凹部4とネジ頭部6の表面との接触面積
を極端に減少させない範囲内にかいて複数個設けてもよ
い。Further, a plurality of holes 7 may be provided as long as the contact area between the recess 4 and the surface of the screw head 6 is not extremely reduced.
以上説明したように、本考案によれば比較的大きな電流
が通電されている端子ネジに長時間当接させても加熱す
ることの少ない導電接触ピンを得ることができる。As explained above, according to the present invention, it is possible to obtain a conductive contact pin that does not heat up even when brought into contact with a terminal screw through which a relatively large current is applied for a long time.
第1図は、従来の導電接触ピンと端子ネジの接触状態を
示す側面図、第2図は本考案の導電接触ピンを示す一部
切欠斜視図、第3図は本考案の導電接触ピンと端子ネジ
の接触状態を示す側面図である。
1・・・・・・導電接触ピン、2・・・・・・ステム、
3・・・・・・頭部、4・・・・・・凹部、7・・・・
・・孔。Figure 1 is a side view showing the contact state between a conventional conductive contact pin and a terminal screw, Figure 2 is a partially cutaway perspective view showing the conductive contact pin of the present invention, and Figure 3 is a conductive contact pin and terminal screw of the present invention. It is a side view which shows the contact state of. 1... Conductive contact pin, 2... Stem,
3...Head, 4...Concavity, 7...
...hole.
Claims (1)
前記頭部3には、半球面状の凹部4と、該凹部4の底部
にかいて前記頭部3の軸線方向に向って延びる放熱用の
孔7とが設けられていることを特徴とする導電接触ピン
。It has a stem 2 and a head 3 connected to the stem 2,
The head 3 is characterized by being provided with a hemispherical recess 4 and a heat radiation hole 7 extending in the axial direction of the head 3 at the bottom of the recess 4. Conductive contact pin.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1979043819U JPS5825348Y2 (en) | 1979-04-03 | 1979-04-03 | conductive contact pin |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1979043819U JPS5825348Y2 (en) | 1979-04-03 | 1979-04-03 | conductive contact pin |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS55143571U JPS55143571U (en) | 1980-10-15 |
JPS5825348Y2 true JPS5825348Y2 (en) | 1983-05-31 |
Family
ID=28918962
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1979043819U Expired JPS5825348Y2 (en) | 1979-04-03 | 1979-04-03 | conductive contact pin |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5825348Y2 (en) |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5590955U (en) * | 1978-12-20 | 1980-06-23 |
-
1979
- 1979-04-03 JP JP1979043819U patent/JPS5825348Y2/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS55143571U (en) | 1980-10-15 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS5825348Y2 (en) | conductive contact pin | |
JPS5850606Y2 (en) | Fuse disconnection inspection device | |
JPH0239205Y2 (en) | ||
JPH0342377Y2 (en) | ||
JPH02168164A (en) | Probe | |
JPH0471248A (en) | Measuring probe | |
JPS6231888Y2 (en) | ||
JP2603981Y2 (en) | Conductive contact pin | |
JPS6236137Y2 (en) | ||
JP2552198Y2 (en) | Probe for resistance measurement | |
JPH0323577Y2 (en) | ||
JPH0617082Y2 (en) | Contact pin rotation prevention structure in the contact probe unit | |
US4223444A (en) | Acoustic micrometer | |
JPH0744205B2 (en) | Probe card mounting method | |
JPH0625778B2 (en) | Contact type multi-probe | |
JPS633094Y2 (en) | ||
JPS6280333U (en) | ||
JPS61110982A (en) | Socket for semiconductor integrated circuit device | |
KR100373723B1 (en) | Connection pin of battery | |
JPS58138058A (en) | Semiconductor device | |
JPS60185263U (en) | Contact probe for inspection equipment for circuit boards, etc. | |
JPS608464Y2 (en) | electrical equipment | |
JPH0275729U (en) | ||
JPS60111243U (en) | Insulation block for resistance temperature detector | |
JPS6192884U (en) |