JPS58225302A - 光学式機械量測定装置 - Google Patents
光学式機械量測定装置Info
- Publication number
- JPS58225302A JPS58225302A JP57108726A JP10872682A JPS58225302A JP S58225302 A JPS58225302 A JP S58225302A JP 57108726 A JP57108726 A JP 57108726A JP 10872682 A JP10872682 A JP 10872682A JP S58225302 A JPS58225302 A JP S58225302A
- Authority
- JP
- Japan
- Prior art keywords
- light
- target
- mechanical quantity
- measured
- axis
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/70—Using polarization in the interferometer
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57108726A JPS58225302A (ja) | 1982-06-24 | 1982-06-24 | 光学式機械量測定装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57108726A JPS58225302A (ja) | 1982-06-24 | 1982-06-24 | 光学式機械量測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS58225302A true JPS58225302A (ja) | 1983-12-27 |
JPH0141204B2 JPH0141204B2 (enrdf_load_stackoverflow) | 1989-09-04 |
Family
ID=14491986
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57108726A Granted JPS58225302A (ja) | 1982-06-24 | 1982-06-24 | 光学式機械量測定装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58225302A (enrdf_load_stackoverflow) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01209431A (ja) * | 1988-02-17 | 1989-08-23 | Kokusai Denshin Denwa Co Ltd <Kdd> | 偏波ダイバーシティ光受信方式 |
JP2010151572A (ja) * | 2008-12-25 | 2010-07-08 | Ojima Shisaku Kenkyusho:Kk | 偏光分離型干渉計の偏光分離部及び偏光分離型干渉計及び偏光分離干渉計型測長器 |
-
1982
- 1982-06-24 JP JP57108726A patent/JPS58225302A/ja active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01209431A (ja) * | 1988-02-17 | 1989-08-23 | Kokusai Denshin Denwa Co Ltd <Kdd> | 偏波ダイバーシティ光受信方式 |
JP2010151572A (ja) * | 2008-12-25 | 2010-07-08 | Ojima Shisaku Kenkyusho:Kk | 偏光分離型干渉計の偏光分離部及び偏光分離型干渉計及び偏光分離干渉計型測長器 |
Also Published As
Publication number | Publication date |
---|---|
JPH0141204B2 (enrdf_load_stackoverflow) | 1989-09-04 |
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