JPS58221424A - Testing method of data - Google Patents

Testing method of data

Info

Publication number
JPS58221424A
JPS58221424A JP57103569A JP10356982A JPS58221424A JP S58221424 A JPS58221424 A JP S58221424A JP 57103569 A JP57103569 A JP 57103569A JP 10356982 A JP10356982 A JP 10356982A JP S58221424 A JPS58221424 A JP S58221424A
Authority
JP
Japan
Prior art keywords
data
level device
register
host device
counter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP57103569A
Other languages
Japanese (ja)
Inventor
Shinichi Sato
晋一 佐藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP57103569A priority Critical patent/JPS58221424A/en
Publication of JPS58221424A publication Critical patent/JPS58221424A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/221Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults

Abstract

PURPOSE:To detect a default between interfaces of a host device and a subordinate device, by returning data sent from the subordinate device to the host device reversely from the host device to the subordinate device to collate them with each other. CONSTITUTION:The data of the subordinate device which are inputted from a BUS IN by a strobe signal S1 are stored in registers 1-4 successively through a counter 16. When receiving the data, an IOC (I/O controller) host device sends the data to a BUS OUT and responds by a strobe signal S2. The signal S2 is inputted to an FF 11 and a counter 14, and a decoder 13 sends signals to open gates 5-8 successively. The returned data from the IOC are inputted to a comparator 9 and compared with the data stored in a register of which gate is opened by the specification from the decoder 13. The output of an OR circuit 10 is changed to ''1'' and ''0''. If the data of the BUS OUT are incorrect and the compared output is kept dissident the FF 11 is set up by the signal S2 and an AND circuit 12 outputs ''1'' to inform the data error.

Description

【発明の詳細な説明】 (a)  発明の技術分野 本発明は上位装置と下位装置間のデータ転送中に発生す
る誤シを検出するデータ検査方式に関する0 (b)  従来技術と問題点 上位装置と下位装置間例えばチャンネルと入出力制御装
置間又は入出力制御装置と入出力装置聞咎に於て、下位
装置より上位装置にデータを転送する場合、下位装置例
えば入出力装置はFCCチェック又はサイクリックチェ
ックを行ない、送出したデータに誤シがあると上位装置
の入出力制御装置に通知している。しかしこの場合入出
力装置内部で発生した誤フは検出出来るが、入出力制御
装置が正確にデータを受取ったかどうかは不明であシ、
従って入出力装置と入出力制御製価−間で何らかの原因
によシデータに誤シが発生した場合、その原因が分から
ず調査に多大な時間を必要とする欠点がある。
Detailed Description of the Invention (a) Technical Field of the Invention The present invention relates to a data inspection method for detecting errors occurring during data transfer between a higher-level device and a lower-level device. (b) Prior art and problems with a higher-level device When transferring data from a lower-level device to a higher-level device, such as between a channel and an input/output control device or between an input/output control device and an input/output device, the lower-level device, such as an input/output device, must undergo an FCC check or a A click check is performed, and if there is an error in the sent data, the input/output control device of the host device is notified. However, in this case, although errors occurring inside the input/output device can be detected, it is unclear whether the input/output control device received the data correctly.
Therefore, if an error occurs in the data between the input/output device and the input/output control device for some reason, there is a drawback that the cause cannot be determined and a large amount of time is required to investigate.

(e)  発明の目的 本発明の目的は上記欠点を除くため下位装置よル上位装
置に送出したデータを上位装置よシ下位装置に返送し、
照合することにより下位装置でデータの誤り発生を検出
し、上位装置と下位装置のインタフェース間の障害検出
を可能とするデータ検査方式を提供することにある。
(e) Purpose of the Invention The purpose of the present invention is to eliminate the above-mentioned drawbacks by transmitting data sent from a lower-level device to a higher-level device from the higher-level device to the lower-level device;
The object of the present invention is to provide a data inspection method that allows a lower-level device to detect the occurrence of a data error by comparing the data, and detects a failure between an interface between a higher-level device and a lower-level device.

(d)  発明の構成 本発明の構成は下位装置に上位装置へ送出したデータを
一時記憶する手段と、下位装置と上位装置間のデータ転
送タイミングにより該記憶手段の1アドレスを決定する
手段と、該記憶手段に記憶されたデータと上位装置よフ
返送された前記上位装置へ送出したデータとを比較する
手段と、該比較手段により検出されたデータ間の不一致
によルエ2−報告する手段とを設け、上位装置と下位装
置間のデータ転送中に発生する誤シを検出するようにし
たものである。
(d) Structure of the Invention The structure of the present invention includes means for temporarily storing data sent to a higher-level device in a lower-level device, and means for determining one address of the storage device based on data transfer timing between the lower-level device and the higher-level device. means for comparing the data stored in the storage means with the data sent back to the host device and sent back from the host device; and means for reporting a discrepancy between the data detected by the comparison means. This system is designed to detect errors that occur during data transfer between a higher-level device and a lower-level device.

(eン 発明の実施例 第1図は本発明の一実施例を示す回路のブロック図で、
第2図は第1囚の動作を説明するタイムチャートである
Embodiment of the Invention FIG. 1 is a block diagram of a circuit showing an embodiment of the invention.
FIG. 2 is a time chart explaining the actions of the first prisoner.

下位装置を例えば入出力装置(以後I10と略すンとし
上位装置を入出力制御装置(以後IOCと略す)とする
。I10側よシデータ送出を示すストローブ信号を81
とし、IOC側よりデータ受取りを示すストローブ信号
を82とする。先ずIOCよりrloに対しデータ転送
を要求するとIloはストローブ信号S1を伴いBUS
  IN上にデータを乗せIOCに送出する0又端子R
EADよpカウンタ14.16’iイネーブルとする。
For example, the lower device is an input/output device (hereinafter abbreviated as I10), and the upper device is an input/output control device (hereinafter abbreviated as IOC).
The strobe signal indicating data reception from the IOC side is assumed to be 82. First, when IOC requests data transfer to rlo, Ilo sends BUS with strobe signal S1.
0 terminal R that puts data on IN and sends it to IOC
EAD p counter 14.16'i is enabled.

端子S1より入ったストローブ信号5IU2ピツトのカ
ウンタ16とデコーダ15に入シ、カウンタ16を歩進
させデコーダ15をイネーブルとしてカウンタ16の計
数値をデコードさせ、レジスタ1より順次レジスタ2、
レジスタ3、レジスタ4とクロックを供給する。端子B
US  INよシ入った前記データは該デコード15の
指示するレジスタ1〜4の中の1つに格納される。第2
図に於てSlはストローブ信号S1でBUS  INよ
シ入ったデータ19はカウンタ16が始めは0のためレ
ジスタIK格納され、続いてデータooはレジスタ2に
、データ02はレジスタ3に、データo4はレジスタ4
に、データ08uレジスタ1にと順次ストローブ信号S
1の4パルスの間、同一レジスタ内に記憶される。
Strobe signal 5IU input from terminal S1 enters counter 16 and decoder 15, increments counter 16, enables decoder 15, decodes the counted value of counter 16, and sequentially inputs from register 1 to register 2,
Supplies register 3, register 4 and clock. Terminal B
The data entered from US IN is stored in one of the registers 1-4 pointed to by the decode 15. Second
In the figure, Sl is the strobe signal S1, and data 19 input from BUS IN is stored in register IK because the counter 16 is initially 0. Then, data oo is stored in register 2, data 02 is stored in register 3, and data o4 is stored in register IK. is register 4
Then, data 08u register 1 and strobe signal S are sequentially sent to data 08u register 1.
It is stored in the same register during the four pulses of 1.

IOCはデータを受は取るとBUS o’6r に該デ
ータを乗せストローブ信号S2で応答する。端子S2よ
り入ったストローブ信号S2はフリップフロ、ブ11と
2ビツトのカウンタ14に入り、カウンタ14を歩進さ
せる0デコーダ13はカウ゛ンタ14の計数値をデコー
ドし、ゲート5よシ順次ゲート6、ゲート7、ゲート8
とゲートを開く信号を送出する0端子BUS OUT 
 よυ入った前記IOCよりの返送データは比較回路9
に入シ、デコーダ13の指示するゲートの開いたレジス
タの格納データと比較される。第2図に於て、S2はス
トローブ信号S2で、BUS OUT  よシ入りたデ
ータ19はカウンタ14が始めは0のためゲート5が開
かれレジスタ1の格納データ19と比較される。続いて
BUS  OUTのデータ00はゲート6が開きレジス
タ2に格納されているデータ00と比較される。同様に
データ02はゲート7が開き、データ04はゲート8が
開いて夫々比較される。データ08になると元に戻りゲ
ート5が開いてレジスタ1に新たに格納されたデータ0
8と比較される。比較回路9の出力はストローブ信号S
2が入シ、ゲート5よυゲート6と順次切替わるがBU
S OUTのデータはすぐに切替わらぬため、一致、不
一致と反転し、OR回路10の出力は”1″、′0”と
変化するが、着しBUS OUTのデータが05と誤り
、I10送出データ04と比較された出力が不一致のま
\となると7リツプフロツプ11はFFIIで示す如く
ストローブ信号S 2’によシセットされる。AND回
路12はソリツブフロップ11の出力が1″で110よ
lOcへのデータ転送終了を表わすEND信号が1”と
なシ、データ読出し信号READがデータ読出し完了の
ため1″となると端子ERRt−″1″としてデータ転
送中にデータ誤シのあった事を報告する。端子RESE
Tよシの信号によシフリップフロップ11はリセットさ
れ警報は解除される。、 本笑施例はレジスタの数を4としカウンタ14゜16は
2ビツトのもので説明したがIloとIOCのインタフ
ェースが高速になるとストローブ信号の交換がケーブル
長や論理回路擲の遅延によシ前記ストローブ信号S1と
82のずれが大きくなる。
When the IOC receives data, it puts the data on BUS o'6r and responds with a strobe signal S2. The strobe signal S2 input from the terminal S2 enters the flip-flop block 11 and the 2-bit counter 14, and the 0 decoder 13, which increments the counter 14, decodes the count value of the counter 14, and sequentially passes the gate 5 to the gate 6. 7. Gate 8
0 terminal BUS OUT which sends the signal to open the gate.
The input data returned from the IOC is sent to the comparator circuit 9.
Then, the data is compared with the data stored in the register whose gate is opened as indicated by the decoder 13. In FIG. 2, S2 is a strobe signal S2, and since the counter 14 is initially 0, the gate 5 is opened and the data 19 input from the BUS OUT is compared with the data 19 stored in the register 1. Subsequently, the gate 6 is opened and the data 00 on the BUS OUT is compared with the data 00 stored in the register 2. Similarly, data 02 is compared with gate 7 opened, and data 04 with gate 8 opened. When the data reaches 08, it returns to the original state, gate 5 opens, and new data 0 is stored in register 1.
Compared to 8. The output of the comparison circuit 9 is the strobe signal S.
2 enters, gates 5 and υ gates 6 are switched sequentially, but BU
Since the S OUT data does not switch immediately, it is reversed as a match or mismatch, and the output of the OR circuit 10 changes to "1", '0', but the arriving BUS OUT data is incorrect as 05, and I10 is sent. If the output compared with data 04 remains inconsistent, the flip-flop 11 is reset by the strobe signal S2' as shown by FFII. When the END signal, which indicates the end of data transfer to , becomes 1", and the data read signal READ becomes 1" due to completion of data reading, the terminal ERRt becomes "1" and reports that there was a data error during data transfer. do. Terminal RESE
The flip-flop 11 is reset by the signal from T and the alarm is canceled. In this example, the number of registers is 4, and the counters 14 and 16 are 2 bits. However, as the interface between Ilo and IOC becomes faster, the exchange of strobe signals becomes more complicated due to the cable length and delay in logic circuit operation. The deviation between the strobe signals S1 and 82 increases.

このストローブ信号S1よpS2の遅延量をパルス数N
で表わすとレジスタの数との間に次の条件を必要とする
The delay amount of this strobe signal S1 and pS2 is the number of pulses N.
The following conditions are required between the number of registers and the number of registers.

レジスタ数 〉 N (f)  発明の詳細 な説明した如く本発W」は上位装置と下位装置とのイン
タフェース相互間で発生する転送データの誤シを検出し
得るため、データの信頼性を向上させると共に障害調査
の時間全短縮することが可能で、その効果は大なるもの
がある。
Number of registers 〉 N (f) As described in the detailed description of the invention, the present W" can detect errors in transferred data that occur between interfaces between upper and lower devices, thereby improving data reliability. At the same time, it is possible to shorten the total time required for fault investigation, which has a great effect.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例上水す回路のブロック図、第
2図は第1図の動作全説明するタイムチャートである。 1〜4はレジスタ、5〜8はゲート、9は比較回路、1
1はフリップ70ツブ、13.15はデコーダ、14,
16はカウンタである。
FIG. 1 is a block diagram of a drinking water circuit according to an embodiment of the present invention, and FIG. 2 is a time chart illustrating the entire operation of FIG. 1. 1 to 4 are registers, 5 to 8 are gates, 9 is a comparison circuit, 1
1 is a flip 70 tube, 13.15 is a decoder, 14,
16 is a counter.

Claims (1)

【特許請求の範囲】[Claims] 上位装置と下位装置との間で転送中のデータに発生する
誤シを検出する方式に於て、下位装置に上位装置へ送出
したデータ全一時記憶する手段と、下位装置と上位装置
間のデータ転送タイミングによシ該記憶手段のアドレス
を決定する手段と、該記憶手段に記憶されたデータと上
位装置よシ返送された前記上位装置へ送出したデータと
を比較する手段と、該比較手段によフ検出されたデータ
間の不一致によ)エラー報告する手段とを設け、上位装
置と下位装置間のデータ転送中に発生する誤i検出する
ことを特徴とするデータ検査方式。
In a method for detecting errors that occur in data being transferred between a higher-level device and a lower-level device, the lower-level device includes means for temporarily storing all data sent to the higher-level device, and data between the lower-level device and the higher-level device. means for determining the address of the storage means based on the transfer timing; means for comparing the data stored in the storage means with the data sent back from the host device to the host device; 1. A data inspection method, characterized in that it detects an error occurring during data transfer between a higher-level device and a lower-level device.
JP57103569A 1982-06-16 1982-06-16 Testing method of data Pending JPS58221424A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57103569A JPS58221424A (en) 1982-06-16 1982-06-16 Testing method of data

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57103569A JPS58221424A (en) 1982-06-16 1982-06-16 Testing method of data

Publications (1)

Publication Number Publication Date
JPS58221424A true JPS58221424A (en) 1983-12-23

Family

ID=14357428

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57103569A Pending JPS58221424A (en) 1982-06-16 1982-06-16 Testing method of data

Country Status (1)

Country Link
JP (1) JPS58221424A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6448156A (en) * 1987-08-19 1989-02-22 Toshiba Corp Bus abnormality check system

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6448156A (en) * 1987-08-19 1989-02-22 Toshiba Corp Bus abnormality check system
JP2645021B2 (en) * 1987-08-19 1997-08-25 株式会社東芝 Bus abnormality inspection system

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