JPS58214252A - Production method of shadow mask - Google Patents
Production method of shadow maskInfo
- Publication number
- JPS58214252A JPS58214252A JP9488982A JP9488982A JPS58214252A JP S58214252 A JPS58214252 A JP S58214252A JP 9488982 A JP9488982 A JP 9488982A JP 9488982 A JP9488982 A JP 9488982A JP S58214252 A JPS58214252 A JP S58214252A
- Authority
- JP
- Japan
- Prior art keywords
- shadow mask
- photosensitive
- active agent
- surface active
- boundary surface
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
- H01J9/02—Manufacture of electrodes or electrode systems
- H01J9/14—Manufacture of electrodes or electrode systems of non-emitting electrodes
- H01J9/142—Manufacture of electrodes or electrode systems of non-emitting electrodes of shadow-masks for colour television tubes
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
Abstract
Description
【発明の詳細な説明】
〔発明の技術分野〕
本発明はシャドウマスクの製造方法に係り、特に高解像
度を有するカラーブラウン管(以下単に高解像度管)に
使用するシャドウマスクの製造方法に関するものである
。[Detailed Description of the Invention] [Technical Field of the Invention] The present invention relates to a method for manufacturing a shadow mask, and particularly to a method for manufacturing a shadow mask used in a color cathode ray tube (hereinafter simply referred to as a high-resolution tube) having high resolution. .
最近コンピュータなどの普及に伴い、文字や図形の情報
表示装置として高解像度管の需要が高まっている。With the recent spread of computers, the demand for high-resolution tubes as information display devices for text and graphics is increasing.
この高解像度管においては、シャドウマスク釦穿設され
る電子通過孔部のピッチ(以下孔ピッチ)及び電子ビー
ム通過孔部の孔径が共に家庭用などに一般に使用されて
いるカラー受像管のシャドウマスクに比較して極めて微
細となりかつ厳密な寸法精度が要求されている。即ち孔
ピッチは0.2乃至Q、3m、孔径け0.08乃至0.
14諺程度のものを製作しなければならない。In this high-resolution tube, the pitch of the electron passing holes drilled in the shadow mask button (hereinafter referred to as "hole pitch") and the hole diameter of the electron beam passing holes are both similar to that of a color picture tube commonly used for home use. It is extremely fine compared to the previous model and requires strict dimensional accuracy. That is, the hole pitch is 0.2 to Q, 3m, and the hole diameter is 0.08 to 0.
You must create something with about 14 proverbs.
このような寸法精度を厳密に制御する条件としては、先
ず原板ネガパターンの寸法をいかにして感光膜を被着形
成した、例えば純鉄軟鋼板やアンバー板等のシャドウマ
スク素材に忠実に再現するかにかかつている。そしてこ
の忠実な再現はシャドウマスクの製造工程中の蝕刻工程
に入る迄の工程が大きなポイントとなっている。As a condition for strictly controlling such dimensional accuracy, first of all, how to faithfully reproduce the dimensions of the original negative pattern on the shadow mask material, such as pure iron mild steel plate or amber plate, on which the photoresist film is applied. I'm suffering from a crab. The key to this faithful reproduction is the process up to the etching process in the shadow mask manufacturing process.
そのポイントの主なものとして、シャドウマスク素材に
感光液を塗布し、乾燥成膜工程を経て感光膜を被着形成
した場合、第1に感光膜が後工程の蝕刻工程にたえる範
囲で出来る限り薄い膜厚であること、第2に感光膜がシ
ャドウマスク素材の全面に均一な膜厚であり、かつ塗り
むらが々いことがあげられる。The main point is that when a photoresist is applied to the shadow mask material and a photoresist film is deposited through a dry film formation process, firstly, the photoresist film is formed to the extent that it can withstand the subsequent etching process. The second reason is that the photoresist film has a uniform thickness over the entire surface of the shadow mask material, and there is no uneven coating.
この第1の条件の理由は第1に感光膜が厚いと、厚板ネ
ガパターンを感光膜に密着し露光する時、感光膜内で光
シの回り込みがあるが、感光膜を薄くすると、この現象
が小さくなυ、正確な露光即ち正確な被蝕刻部が得られ
る。第2にシャドウマスクの製造工程は感光膜の被着形
成後、露光、現像水切シ、乾燥各工程を終了したのち、
光硬化した感光膜の耐エツチング性のためバーユング工
程を行なうが、これら各工程において、感光膜中の例え
ばカゼインなどが被蝕刻部に滲み出す現象を感光膜を薄
くすることにより低減することができる。The reason for this first condition is that when the photoresist film is thick, when a thick plate negative pattern is exposed in close contact with the photoresist film, light beams wrap around within the photoresist film. Since the phenomenon is small υ, accurate exposure, that is, accurate etched areas can be obtained. Second, the manufacturing process of a shadow mask is after the photoresist film has been deposited, the exposure, development, draining, and drying steps are completed.
A burning process is performed to improve the etching resistance of the photocured photoresist film, but in each of these steps, the phenomenon in which casein, etc. in the photoresist film seeps into the etched area can be reduced by making the photoresist film thinner. .
しかるに一方シャドウマスク素材は感光膜の密着性を良
くするためにその表面粗度はR2:0.5〜2.0μ、
Rmax ” 401’以内、となされており、このよ
うな表面粗度を有するシャドウマスク素材に感光液を塗
布し、塗りむらのない感光膜を得るには、約5〜8μの
膜厚が必要である。However, in order to improve the adhesion of the photosensitive film, the surface roughness of the shadow mask material is R2: 0.5 to 2.0 μ.
Rmax" is within 401', and in order to obtain a photosensitive film without uneven coating by applying a photosensitive liquid to a shadow mask material with such surface roughness, a film thickness of approximately 5 to 8 microns is required. be.
この膜厚は一般のシャドウマスクの製造には問題なく、
良好な品位のシャドウマスクが得られるが前述したよう
々孔ピッチ、孔径を有する高解像度管に使用するシャド
ウマスクでは前述した理由によシネ適轟である問題点が
あった。This film thickness is not a problem for manufacturing general shadow masks.
Although a shadow mask of good quality can be obtained, shadow masks used in high-resolution tubes having the above-mentioned aperture pitch and diameter have the problem of poor cine performance due to the above-mentioned reasons.
本発明は前述した問題点に鑑みなされたものであシ薄い
、均一な膜厚でありかつ塗、りむらのない感光膜が形成
可能であ)、その結果極めて品位の良好なシャドウマス
クを得ることが可能なシャドウマスクの製造方法を提供
することを目的としている。The present invention was devised in view of the above-mentioned problems, and it is possible to form a thin photoresist film with a uniform thickness and no uneven coating.As a result, a shadow mask of extremely high quality can be obtained. The purpose of the present invention is to provide a method for manufacturing a shadow mask that allows for the production of shadow masks.
即ち、本発明は長尺帯状のシャドウマスク素材に感光液
を塗布し、乾燥成膜工程を経て連続的に所定厚さの感光
膜を被着形成する工程を含むシャドウマスクの製造方法
において、感光液にo、ooiチ乃至3チ界面活性剤を
添加してなることを特徴としている。That is, the present invention provides a method for manufacturing a shadow mask, which includes a step of applying a photosensitive liquid to a long strip of shadow mask material, and then continuously forming a photosensitive film of a predetermined thickness through a dry film forming process. It is characterized by adding o, ooi, to tertiary surfactants to the liquid.
次に本発明のシャドウマスクの製造方法゛の一実施例を
説明する。Next, an embodiment of the shadow mask manufacturing method of the present invention will be described.
シャドウマスク素材として0.131m厚、460n幅
の表面粗度がR2:0.5〜2.0μ、Rmax :
4.0以内の長尺帯状の純鉄軟鋼板を用意し、との純鉄
軟鋼板を清浄にしたのち、精製カゼイン1xP、重クロ
ム酸アンモニウム1(1,界面活性剤として例えばディ
スフオームCD−432(日本油脂製・商品名)2 c
c、水0.8ノからなる感光液を塗布速度3.0 Vm
i nで従来と同一条件で連続的に塗布し、乾燥成膜工
程を経て感光膜を被着形成したところ、膜厚3゜5±0
5μの感光膜を塗りむらなく塗布することができた。As a shadow mask material, the surface roughness of 0.131m thick and 460n width is R2: 0.5~2.0μ, Rmax:
Prepare a long belt-shaped pure iron mild steel plate of 4.0 or less, and after cleaning the pure iron mild steel plate, add purified casein 1xP, ammonium dichromate 1 (1), and as a surfactant, for example, Disform CD- 432 (manufactured by Nippon Oil & Fats, product name) 2 c
c, a photosensitive liquid consisting of 0.8 ml of water at a coating speed of 3.0 Vm.
When the photoresist film was applied continuously under the same conditions as before, and a photoresist film was formed through a dry film formation process, the film thickness was 3°5±0.
A 5 μm photoresist film could be coated evenly.
実験によれば界面活性剤の添加量としてはo、ooiチ
乃至3゜0%で良好な結果が得られ0001%以下では
感光液のぬれ特性は改善されず、塗りむらのない感光膜
が得られないし3%以上では後工程で行なわれる約20
0’C1分間のイーキング工程後に行なわれる比重1.
460±0.010の塩化第2鉄溶液を65±1°Cの
液温としスプレィ圧1.0〜2.OKpで3〜5分間行
なわれる蝕刻工程で感光膜が破壊された。According to experiments, good results were obtained when the amount of surfactant added was between 0% and 0%, and when it was less than 0001%, the wetting characteristics of the photosensitive liquid were not improved and a photosensitive film without uneven coating was obtained. If it exceeds 3%, it will be carried out in the subsequent process.
Specific gravity 1. carried out after the 0'C 1 minute baking process.
460±0.010 ferric chloride solution at a liquid temperature of 65±1°C and a spray pressure of 1.0 to 2. The photoresist film was destroyed during the etching process carried out for 3 to 5 minutes in OKp.
前記実施例では界面活性剤としてディスフオームCD−
432を使用したが、これに限定されるものではないし
、またシャドウマスク素材にアンバー板を使用してもよ
いことは説明するまでもない。In the above examples, Disform CD-
432 is used, but it is not limited to this, and it goes without saying that an amber plate may be used as the shadow mask material.
上述のように本発明のシャドウマスクの製造方法によれ
ば、蝕刻工程にたえる薄い均一な膜厚を有する感光膜を
形成することが可能であり、原板ネガパターンと同形の
被蝕刻部を形成することができるので高解像度管のみで
なく、一般に使用されているカラー受像管のシャドウマ
スクの製造にも好適であり、その工業的価値は極めて犬
である。As described above, according to the method for manufacturing a shadow mask of the present invention, it is possible to form a photoresist film having a thin and uniform thickness that can withstand the etching process, and to form an etched portion having the same shape as the negative pattern on the original plate. Therefore, it is suitable not only for high-resolution tubes but also for producing shadow masks for commonly used color picture tubes, and its industrial value is extremely high.
代理人 弁理士 井 上 −男Agent Patent Attorney Inoue - Male
Claims (1)
成膜工程を経て連続的に所定厚さの感光膜を被着形成す
る工程を含むシャドウマスクの製造方法において、前記
、感光液にo、oois乃至3チの界面活性剤を添加し
てなることを特徴とするシャドウマスクの製造方法。A method for producing a shadow mask, which includes a step of applying a photosensitive liquid to a long strip-shaped shadow mask material and continuously forming a photosensitive film of a predetermined thickness through a dry film forming process, wherein the photosensitive liquid is coated with o. , oois to 3 surfactants are added thereto.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9488982A JPS58214252A (en) | 1982-06-04 | 1982-06-04 | Production method of shadow mask |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9488982A JPS58214252A (en) | 1982-06-04 | 1982-06-04 | Production method of shadow mask |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS58214252A true JPS58214252A (en) | 1983-12-13 |
Family
ID=14122605
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9488982A Pending JPS58214252A (en) | 1982-06-04 | 1982-06-04 | Production method of shadow mask |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58214252A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1991019315A1 (en) * | 1990-06-05 | 1991-12-12 | Sony Corporation | Color cathode-ray tube |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53108429A (en) * | 1977-02-28 | 1978-09-21 | Rca Corp | Method of manufacturing corrosion resistance shading mask |
-
1982
- 1982-06-04 JP JP9488982A patent/JPS58214252A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53108429A (en) * | 1977-02-28 | 1978-09-21 | Rca Corp | Method of manufacturing corrosion resistance shading mask |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1991019315A1 (en) * | 1990-06-05 | 1991-12-12 | Sony Corporation | Color cathode-ray tube |
US5309059A (en) * | 1990-06-05 | 1994-05-03 | Sony Corporation | Color cathode ray tube |
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