JPS58205802A - Illuminating device - Google Patents
Illuminating deviceInfo
- Publication number
- JPS58205802A JPS58205802A JP8790982A JP8790982A JPS58205802A JP S58205802 A JPS58205802 A JP S58205802A JP 8790982 A JP8790982 A JP 8790982A JP 8790982 A JP8790982 A JP 8790982A JP S58205802 A JPS58205802 A JP S58205802A
- Authority
- JP
- Japan
- Prior art keywords
- light
- lens
- pinhole
- hole
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
【発明の詳細な説明】
本発明は、基板に形成された穴等の位置を検出するため
の照明装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an illumination device for detecting the position of a hole or the like formed in a substrate.
従来、第1図に示すように基板5に隣接して設けられた
基板穴6.7の位置を例えば4分割受光素子8を用いて
検出する場合、照明装置はレンズランプ1と3の前面に
設けられた拡散板2とによって構成されていた。Conventionally, when detecting the position of a board hole 6.7 provided adjacent to a board 5 as shown in FIG. It was configured by a diffuser plate 2 provided.
しかしながら上記従来の照明装置では、レンズ2ンプ1
から照射された光を拡散板2によって均一な光に変換し
て直接基板穴6.7に照明しているので、光の広がりに
より多数の穴6. 。However, in the above-mentioned conventional lighting device, the lens 2 lamp 1
Since the light irradiated from the substrate is converted into uniform light by the diffuser plate 2 and directly illuminates the holes 6.7 of the substrate, the spread of the light causes a large number of holes 6.7 to be illuminated. .
7より受光素子8に光が入るため、受光素子8で各基板
穴6.7の位置を検出することが出来ない欠点を有した
。Since light enters the light receiving element 8 from the light receiving element 7, there is a drawback that the position of each board hole 6 and 7 cannot be detected by the light receiving element 8.
本発明の目的は、上記した従来技術の欠点をなくし、基
板穴等が隣接していても、基板穴等の位置を正しく検出
できるようにした照明装置を提供することにある。SUMMARY OF THE INVENTION An object of the present invention is to eliminate the drawbacks of the prior art described above and to provide an illumination device that can accurately detect the positions of substrate holes, etc., even if the substrate holes, etc. are adjacent to each other.
即ち、本発明は光源よりの光を、ピンホールレンズにて
、スポット光に変換して照明できるようにして、隣接す
る基板穴等検出することを可能にすることを特徴とする
ものである。That is, the present invention is characterized in that light from a light source can be converted into spot light using a pinhole lens for illumination, thereby making it possible to detect adjacent substrate holes, etc.
以下、本発明を第2図に示す一実施例にもとづいて具体
的に説明する。The present invention will be specifically described below based on an embodiment shown in FIG.
即ち本発明に係る照明装置は、光源であるレンズランプ
1と、その先に設けられた拡散板2と、拡散板2により
拡散されて均一な光に変換された光の一部のみを通過さ
せてしぼる・ピンホール3と、該ピンホール3によって
しぼられた光を集光するレンズ4とによって構成する。That is, the lighting device according to the present invention includes a lens lamp 1 that is a light source, a diffusion plate 2 provided in front of the lens lamp 1, and only a part of the light that has been diffused by the diffusion plate 2 and converted into uniform light. It consists of a squeeze pinhole 3 and a lens 4 that condenses the light squeezed by the pinhole 3.
従ってレンズランプ10投下光は拡散板2によシむらの
ない均一な光に拡散し、ピンホール3によってスポット
光に変換し、このスポット光をレンズ4によって光量ロ
スなく集光し、基板穴6に隣接する基板穴7にかかるこ
となく、目的の基板穴6にのみ光を投影することができ
る。その結果、この基板穴6の通過光を例えば4分割受
光素子8が受光し、各受光素子から得られる信号を比較
し、それらの信号が一致するように基板5または4分割
受光素子8を移動させ、その移動量を検知手段(図示せ
ず)で検出することによシ、上記基板穴乙の位置を検出
することができる。ところで上記実施例では基板穴6の
位置を4分割受光素子8で検出するようにしたが、この
実施例に限られるものでなく、TVカメラやリニアイメ
ージセンサ等を用いてもよいことは明らかである。Therefore, the light emitted from the lens lamp 10 is diffused by the diffuser plate 2 into uniform light without any unevenness, converted into a spot light by the pinhole 3, focused by the lens 4 without any loss in light intensity, and then The light can be projected only onto the target substrate hole 6 without interfering with the substrate hole 7 adjacent to it. As a result, the light passing through the board hole 6 is received by, for example, a four-part light receiving element 8, the signals obtained from each light receiving element are compared, and the board 5 or four part light receiving element 8 is moved so that the signals match. By detecting the amount of movement by a detection means (not shown), the position of the board hole B can be detected. By the way, in the above embodiment, the position of the board hole 6 is detected by the four-split light receiving element 8, but it is obvious that the detection is not limited to this embodiment, and that a TV camera, a linear image sensor, etc. may be used. be.
以上説明したように本発明によれば、従来不可能であっ
た隣接した基板穴等の検出が可能となる効果を奏する。As explained above, according to the present invention, it is possible to detect adjacent substrate holes, etc., which was previously impossible.
【図面の簡単な説明】
第1図は従来の基板穴等の位置を検出するための照明装
置を示した図、第2図は本発明による基板穴等の位置を
検出するための照明装置の一冥施例を示した図である。
1・・・レンズランプ(光源)
2・・・拡散板 5・・・ピンホール4・・・
レンズ 5・・・基板6.7・・・基板穴
8・・・4分割受光素子第1図
第20[BRIEF DESCRIPTION OF THE DRAWINGS] Fig. 1 is a diagram showing a conventional illumination device for detecting the position of a hole in a substrate, etc., and Fig. 2 is a diagram showing a lighting device for detecting the position of a hole in a substrate according to the present invention. It is a diagram showing an example. 1... Lens lamp (light source) 2... Diffusion plate 5... Pinhole 4...
Lens 5... Board 6.7... Board hole
8...4-division light receiving element Fig. 1 Fig. 20
Claims (1)
該拡散板によって拡散された光の一部に通過させる開口
と、該開口を通して得られる光を集光させる集光レンズ
とを備え付けたことを特徴とする照明装−〇a light source; a diffuser plate that diffuses the light output from the light source;
An illumination device characterized by being equipped with an aperture through which part of the light diffused by the diffusion plate passes, and a condensing lens that condenses the light obtained through the aperture.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8790982A JPS58205802A (en) | 1982-05-26 | 1982-05-26 | Illuminating device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8790982A JPS58205802A (en) | 1982-05-26 | 1982-05-26 | Illuminating device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS58205802A true JPS58205802A (en) | 1983-11-30 |
Family
ID=13928039
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8790982A Pending JPS58205802A (en) | 1982-05-26 | 1982-05-26 | Illuminating device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58205802A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS617404A (en) * | 1984-06-21 | 1986-01-14 | Matsushita Electric Ind Co Ltd | position detection device |
| JPH01297501A (en) * | 1988-05-26 | 1989-11-30 | Central Jidosha Kk | Measuring method and device lof light receiving for through-hole, for three dimensional position of single or plural through-hole |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5065251A (en) * | 1973-10-09 | 1975-06-02 |
-
1982
- 1982-05-26 JP JP8790982A patent/JPS58205802A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5065251A (en) * | 1973-10-09 | 1975-06-02 |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS617404A (en) * | 1984-06-21 | 1986-01-14 | Matsushita Electric Ind Co Ltd | position detection device |
| JPH01297501A (en) * | 1988-05-26 | 1989-11-30 | Central Jidosha Kk | Measuring method and device lof light receiving for through-hole, for three dimensional position of single or plural through-hole |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR100348504B1 (en) | LED lighting equipment | |
| US5909284A (en) | Method and system for measuring an inner diameter of a hole formed in an object | |
| JPH1021703A (en) | LED illuminator | |
| KR910019166A (en) | Focal plane detection method and apparatus | |
| ATE306700T1 (en) | DEVICE FOR MEASURING MAIL PIECES | |
| KR890001413A (en) | Inspection method and through-hole void of multi-layer printed wiring board | |
| JPS58205802A (en) | Illuminating device | |
| JP2818687B2 (en) | Fuse arrangement inspection device | |
| JP2005114504A (en) | Lighting device | |
| JP2002139439A (en) | Diffusion light source for inspection | |
| TWI274863B (en) | Light equipment for inspection | |
| JPS56113167A (en) | Picture exposure device | |
| JPH02293711A (en) | Illuminating optical system | |
| JP2930885B2 (en) | Lighting device for joint inspection of electronic components | |
| JPH11218406A (en) | Detection apparatus and method for position recognition mark on substrate | |
| JPS5876983A (en) | Photoelectric converter | |
| JPS6144309A (en) | Pattern detecting method | |
| KR20020063729A (en) | Apparatus for detecting a fault in glass using a spreading panel | |
| JPS57186106A (en) | Inspection device for surface | |
| JPS6245686Y2 (en) | ||
| JP2808856B2 (en) | Substrate observation device | |
| JPH07225342A (en) | Microscope lighting equipment | |
| JPH0566537U (en) | Lamp brightness measurement device | |
| JPS61186806A (en) | Fault detecting device for transparent body | |
| JP2529470B2 (en) | Illumination device for recognition camera |