JPS58198733A - Light source side optical system of fluorescent spectrophotometer - Google Patents
Light source side optical system of fluorescent spectrophotometerInfo
- Publication number
- JPS58198733A JPS58198733A JP20707681A JP20707681A JPS58198733A JP S58198733 A JPS58198733 A JP S58198733A JP 20707681 A JP20707681 A JP 20707681A JP 20707681 A JP20707681 A JP 20707681A JP S58198733 A JPS58198733 A JP S58198733A
- Authority
- JP
- Japan
- Prior art keywords
- spot
- light source
- xenon lamp
- light
- optical system
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 title claims description 11
- 229910052724 xenon Inorganic materials 0.000 claims abstract description 20
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 claims abstract description 19
- 230000005284 excitation Effects 0.000 claims description 6
- 201000009310 astigmatism Diseases 0.000 abstract 1
- 230000005622 photoelectricity Effects 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 238000001506 fluorescence spectroscopy Methods 0.000 description 3
- 230000007423 decrease Effects 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 230000003595 spectral effect Effects 0.000 description 2
- 102100025490 Slit homolog 1 protein Human genes 0.000 description 1
- 101710123186 Slit homolog 1 protein Proteins 0.000 description 1
- 238000012921 fluorescence analysis Methods 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 150000003736 xenon Chemical class 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0216—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using light concentrators or collectors or condensers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/024—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using means for illuminating a slit efficiently (e.g. entrance slit of a spectrometer or entrance face of fiber)
Abstract
Description
【発明の詳細な説明】
本発明は分光螢光光度針に係り、特に、分光螢光光度針
の光源測光学系に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a spectrofluorometry needle, and more particularly to a light source optical measurement system for a spectrofluorometry needle.
分光螢光光度針の励起側分光器へ光を供給する光源とし
ては連続した波長光を強力に発生するキセノンランプが
使用されるが、キセノンランプのアークは横方向に移動
することが多い。この場合普通の縦長のスリットでの中
央にミラーによって光源の［−生じさせるような光学系
を用いると励起側分光器内に取り入れる光重が大幅に変
化するので、横長に配置した入射スリットを用いて横移
動した光束も取り入れることができるようにしていた。A xenon lamp that powerfully generates continuous wavelength light is used as a light source for supplying light to the excitation side spectrometer of the spectrofluorometry needle, but the arc of the xenon lamp often moves laterally. In this case, if we use an optical system that creates a light source with a mirror in the center of a normal vertically long slit, the weight of light taken into the excitation side spectrometer will change significantly, so we use an entrance slit arranged horizontally. This makes it possible to incorporate light beams that have moved laterally.
第１図はキセノンランプの発光状態を示す正面図でめる
。陽憧１と陰極２との間にアーク３が発生するが、最も
輝度が大きいスポット４は５或いは６の位置に始終横移
動している。したがって、一般の分光器のように縦長の
入射スリットを１更用したときはスポット４の移動につ
れて入射光電は倣しく変動することになシ、精密な側光
は困難となる。これを防止するために従来も横長の入射
スリットを用いており、この点は相尚改善することがで
きた。FIG. 1 is a front view showing the light emitting state of the xenon lamp. An arc 3 is generated between the positive pole 1 and the negative pole 2, but the spot 4 with the highest brightness is always moving laterally to the position 5 or 6. Therefore, when one vertically elongated entrance slit is used as in a general spectrometer, the incident photoelectricity will vary as the spot 4 moves, making precise side illumination difficult. In order to prevent this, a horizontally long entrance slit has been used in the past, and this point has been improved considerably.
しかるにスポット４の状態の場合は最も多量の光が分光
器内に収シ入れが、スポット５．６の位置の場合は分光
器で斜めに進行して出射スリットから取り出さｎる光電
は低下し易い。その結果光電検知器よりの出力信号がス
ポット５．６と移動するにつれて低下するという欠点を
十分に解決することができなかった。特に、キセノンラ
ンプのＩｔ極が劣化した楊会等は光電の変化が大となる
という問題をもっていた。However, in the case of spot 4, the largest amount of light enters the spectrometer, but in the case of spot 5 and 6, the photoelectric power that travels diagonally through the spectrometer and is taken out from the exit slit tends to decrease. . As a result, it has not been possible to satisfactorily solve the problem that the output signal from the photoelectric detector decreases as the spot 5.6 moves. In particular, Yang Kai, etc., in which the It pole of the xenon lamp has deteriorated, has had the problem of large photoelectric changes.
本発明は土日己匝米の欠点を解消し、アークのスポット
が移動しても入射光電の変化が少く出力の安定＃Ｌ−を
向上させることのできる分光螢光光度針の光源側光学系
を提供することを目的とし、その時畝とするところは、
励起側分光器の入射スリットを水平方向に長く形成する
と共に、キセノンランプの後方に後置集光鏡を配設し、
この後置集光鏡の反射向の曲率中心をキセノンランプの
スポットの中心位置に一致させてｍ成したことにある。The present invention eliminates the drawbacks of the Saturday-Sunday model, and provides an optical system on the light source side of the spectroscopic fluorescence needle that can improve the stability of the output by reducing the change in incident photoelectricity even if the arc spot moves. Where the purpose is to provide, and at that time, the area is
The entrance slit of the excitation side spectrometer is made long in the horizontal direction, and a rear condenser mirror is placed behind the xenon lamp.
The reason is that the center of curvature of the reflection direction of the rear condensing mirror is made to coincide with the center position of the spot of the xenon lamp.
第２図は本発明の一実施例である分光螢光光度計の光源
側光学系の平面図である。キセノンランプ９の陽極１と
陰惚２との間に生じた輝点スポット４よりの光は非点収
差を除去するトロイドミラ、、 −７に反射
して入射スリット１０に入射する。このキセノンランプ
９の背後には後置集光鏡８を設置し、その反射面の曲率
半径の中心をスポット４と一致させであるので、スポッ
ト４の反射像をスポット４の位置に重複して生じている
。FIG. 2 is a plan view of a light source side optical system of a spectrofluorophotometer which is an embodiment of the present invention. Light from a bright spot 4 generated between the anode 1 and the eclipse 2 of the xenon lamp 9 is reflected by the toroid mirror . A rear condensing mirror 8 is installed behind this xenon lamp 9, and the center of the radius of curvature of its reflecting surface is made to coincide with the spot 4, so that the reflected image of the spot 4 is overlapped with the position of the spot 4. It is occurring.
８３図は第２図の入射スリットの正面図で、スリット板
１３ａ、１３ｂが水平方向で間隔可変に設置され、左右
端Ｓを制限板１４ａ、１４ｂで被覆して入射スリット１
０を形成している。このスリット１０の中央に実線丸印
で示すスポット４のトロイドミラー７による実像を生じ
ている。従来はこの光だけを分光器内に導入していたの
であるが、本実施例においては一点鎖線で示す後置集光
鏡８によるスポット４の反射像１２を形成している。し
たがって、分光器内に導入される光電は光源像の面積が
拡大した分だけ近似的に増加する。FIG. 83 is a front view of the entrance slit in FIG. 2, in which slit plates 13a and 13b are installed at variable intervals in the horizontal direction, and the left and right ends S are covered with restriction plates 14a and 14b to form the entrance slit 1.
0 is formed. At the center of this slit 10, a real image of a spot 4 indicated by a solid circle is generated by the toroid mirror 7. Conventionally, only this light was introduced into the spectroscope, but in this embodiment, a reflected image 12 of the spot 4 is formed by the rear condenser mirror 8 shown by a dashed line. Therefore, the photoelectric power introduced into the spectroscope increases approximately by the increase in the area of the light source image.
このような光電増加の効果は第１図においてスポット４
がスポット５，６と横移動した時に良く発揮される。第
４図は第１図のスポットが横移動した時の入射スリット
の正面図である。この場合はトロイドミラー７による直
接のスポット像１１と後置反射鏡８による反射スポット
像１２のトロイドミラー７による像１２とが間隔を置い
て生じている。したがって、入射スリット１０の殆んど
全開口に光源の光が導入され、従来のスポット像１１だ
けの場合に比較して５側根度増加する。The effect of this increase in photoelectricity can be seen at spot 4 in Figure 1.
is best demonstrated when moving horizontally to spots 5 and 6. FIG. 4 is a front view of the entrance slit when the spot in FIG. 1 is moved laterally. In this case, the spot image 11 directly formed by the toroid mirror 7 and the image 12 of the spot image 12 reflected by the rear reflecting mirror 8 formed by the toroid mirror 7 are generated with an interval between them. Therefore, the light from the light source is introduced into almost the entire opening of the entrance slit 10, and the 5-sided radius is increased compared to the conventional case where only the spot image 11 is used.
このことはキセノンランプ９の明るいスポット４が左右
に横移動しても分光器内に導入される光電の変化は大幅
に減少することを示し、電気的な佃号処理梢度が向上す
るという結果をもたらしている。This shows that even if the bright spot 4 of the xenon lamp 9 moves laterally from side to side, the change in the photoelectricity introduced into the spectrometer is significantly reduced, resulting in an improvement in the degree of electrical processing. is bringing about.
本実施例の分光螢光光度計の光源側光学系は、キセノン
ランプのアークの輝点像を入射スリット上に結像させる
トロイドミラーの中心とキセノンランプ中心ヲ顧ぷ線の
反対側に、キセノンランプ中心を曲率半径の中心とする
後置反射鏡を設置することによって、キセノンランプの
輝点が横移動した時の分光器内に嘔り入れる光量の変動
を大幅に減少させ、よシ梢密な分光側光を可能にすると
いう効果が得られる。The optical system on the light source side of the spectrofluorophotometer of this example has xenon on the opposite side of the line from the center of the toroid mirror that forms a bright spot image of the arc of the xenon lamp onto the entrance slit and the center of the xenon lamp. By installing a rear reflector whose radius of curvature is centered at the lamp center, fluctuations in the amount of light entering the spectrometer when the bright spot of the xenon lamp moves laterally can be greatly reduced, and the field density can be improved. This has the effect of enabling spectral side light.
第４図におい又はスポット像１１が入射スリットｌＯの
左側に移動した場合でおるが、これとは反射にスポット
ｆａｌｌが入射スリット１０の右側に移動したときは、
後置反射鏡８で反射したスポット像１２は左側に移動す
る。即ち、スリット１０の中心部に結像した場合は両者
が一致するが、それ以外では反灼方向に互いに分離し、
中心をはずれる程両者の間隔は大となる。In FIG. 4, the spot image 11 moves to the left side of the entrance slit 10, but this is different from the case where the spot image 11 moves to the right side of the entrance slit 10 due to reflection.
The spot image 12 reflected by the rear reflecting mirror 8 moves to the left. That is, when the images are focused on the center of the slit 10, the two coincide, but otherwise they are separated from each other in the anti-cautery direction.
The further away from the center the distance between the two becomes.
本発明の分光螢光光度計の光源測光学系は、トロイドミ
ラーの反対側に後置反射鏡を設置するという簡単な改良
によって、螢光分析精度を大幅に向上させるという効果
が得られる。The light source optical measurement system of the spectrofluorophotometer of the present invention has the effect of greatly improving the accuracy of fluorescence analysis by a simple modification of installing a rear reflecting mirror on the opposite side of the toroid mirror.
、４１図はキセノンランプの発光状態を示す正面図、第
２図は本発明の一実施例である分光螢光光度計の光源側
光学系の平面図、第３図は第２図の入射スリットの正面
図、第４図は第１図のスポットが横移動した時の入射ス
リットの正面図である。
１・・・陽億、２・・・陰極、３・・・アーク、４，５
．６・・・スポット、７・・・トロイドミラー、８・・
・後置集光鏡、９・・・キセノンランプ、１０・・・入
射スリット、１１・・・スポット像、１２・・・反射ス
ポット像、１３・・・スリット板、１４・・・制限板。
１．。
右２０
特許庁長官若杉和夫殿
事件の表示
昭和５６年特許願第 ２０７０７６ 号発明 の名
称 分光螢光光鹸計の光源側光学系補正をする者
事件との関係 特許出願人
名 称（５１０）株式会社 日 立製作所代 理
人
居 所（〒＋００）東京都千代田区丸の内−丁目５番
１号補正の内容
以上, Fig. 41 is a front view showing the light emitting state of the xenon lamp, Fig. 2 is a plan view of the optical system on the light source side of a spectrofluorophotometer which is an embodiment of the present invention, and Fig. 3 shows the entrance slit of Fig. 2. FIG. 4 is a front view of the entrance slit when the spot of FIG. 1 is moved laterally. 1... Yang, 2... Cathode, 3... Arc, 4,5
．． 6... Spot, 7... Toroid mirror, 8...
- Rear condenser mirror, 9... Xenon lamp, 10... Incident slit, 11... Spot image, 12... Reflection spot image, 13... Slit plate, 14... Limiting plate. 1. . Right 20 Indication of the case of Kazuo Wakasugi, Commissioner of the Japan Patent Office, 1982 Patent Application No. 207076 Name of the invention
Title: Relationship with the case involving a person who corrects the optical system on the light source side of a spectral fluorescence photometer Patent applicant name: (510) Representative, Hitachi, Ltd.
Place of residence (〒+00) 5-1 Marunouchi-chome, Chiyoda-ku, Tokyo Above the contents of the amendment
Claims (1)
度針の光源側光学系において、励起側分光器の入射スリ
ットを水平方向に長く形成すると共に、上記キセノンラ
ンプの後方に後置集光′ａを配設し、この後置果光説の
反射面の曲率中心を上記キセノンランプのスポットの中
心位置に一致させて構成し、上記スポットが横移動した
時でも上記励起側分光器に導入する光重の変化を抑制す
ることを特徴とする分光螢光光ｉｔｉの光源側光学系。1. In the light source side optical system of the spectrofluorophotometer needle that uses a xenon lamp as an excitation light source, the entrance slit of the excitation side spectrometer is formed long in the horizontal direction, and a rear condensing unit 'a is formed behind the xenon lamp. The center of curvature of the reflecting surface of this post-effect light theory is configured to match the center position of the spot of the xenon lamp, so that even when the spot moves laterally, the light introduced into the excitation side spectrometer is A light source side optical system of a spectroscopic fluorescent light iti, which is characterized by suppressing changes in light intensity.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP20707681A JPS58198733A (en) | 1981-12-23 | 1981-12-23 | Light source side optical system of fluorescent spectrophotometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP20707681A JPS58198733A (en) | 1981-12-23 | 1981-12-23 | Light source side optical system of fluorescent spectrophotometer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS58198733A true JPS58198733A (en) | 1983-11-18 |
Family
ID=16533798
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP20707681A Pending JPS58198733A (en) | 1981-12-23 | 1981-12-23 | Light source side optical system of fluorescent spectrophotometer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58198733A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4802768A (en) * | 1986-04-11 | 1989-02-07 | Sclavo, Inc. | Two light source reference system for a fluorometer |
-
1981
- 1981-12-23 JP JP20707681A patent/JPS58198733A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4802768A (en) * | 1986-04-11 | 1989-02-07 | Sclavo, Inc. | Two light source reference system for a fluorometer |
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