JPS58197271A - Sputtering method of tantalum or the like - Google Patents
Sputtering method of tantalum or the likeInfo
- Publication number
- JPS58197271A JPS58197271A JP7752682A JP7752682A JPS58197271A JP S58197271 A JPS58197271 A JP S58197271A JP 7752682 A JP7752682 A JP 7752682A JP 7752682 A JP7752682 A JP 7752682A JP S58197271 A JPS58197271 A JP S58197271A
- Authority
- JP
- Japan
- Prior art keywords
- target
- oxide
- sputtering
- tantalum
- backing plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
- C23C14/3414—Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
Abstract
Description
【発明の詳細な説明】
この発明は酸化物の方が融点、沸点の低い例えばタンタ
ルのような物質のスパッタ方法例関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an example of a method for sputtering a material such as tantalum, which has a lower melting point and boiling point than an oxide.
通常、スパッタリング装置においては、冷却効果を高め
るためターゲットはカンードのバッキングプレートにボ
ンディングされている。例えばメンタルのスパッタリン
グの場合を考えると、残留ガス成分の内酸素とタンタル
が反応してターゲット表面にタンタル酸化物が形成され
る。DCマグネトロンスパッタリングではこの酸化物が
チャージアップして異常放電を続発し、その結果、ター
ゲットがスプラッシュし、基板上のスパッター膜にピン
ホールが生じたり装置自体の運転が不能となる等の欠点
がある。特にこの異常放電現象は投入電力を増すと激し
くなる。そのためこのような異常放電を生じないように
するだめに通常は2000 i/min程度(T/S
= 60mm)のレートしか得られていない。Usually, in a sputtering apparatus, a target is bonded to a backing plate of a cand to enhance the cooling effect. For example, in the case of mental sputtering, oxygen in the residual gas components reacts with tantalum to form tantalum oxide on the target surface. In DC magnetron sputtering, this oxide charges up and causes a series of abnormal discharges, resulting in target splash, pinholes in the sputtered film on the substrate, and the equipment itself becoming inoperable. . In particular, this abnormal discharge phenomenon becomes more severe as the input power increases. Therefore, in order to prevent such abnormal discharge from occurring, the
= 60mm).
従ってこの発明の目的は、酸化物の方が融点、沸点の低
い物質、例えばタンタルから成るターゲットTh用いて
スパッタリングする際にターゲット全カンードのバッキ
ングプレートにターゲットと同じ材料から成る皿ビス等
の機械的手段を用いて固足し、ターゲットの表面全高温
に保ってスパッタリング4行ない、それにより形成され
る酸化物のチャージアップによる異常放電を阻止するよ
うにしたタンタル等のスパッタ方法を提供することにあ
る。Therefore, an object of the present invention is to mechanically attach a countersunk screw or the like made of the same material as the target to the backing plate of the entire cand of the target when performing sputtering using a target Th made of a substance whose melting point and boiling point are lower than that of an oxide, such as tantalum. It is an object of the present invention to provide a sputtering method for tantalum, etc., in which the entire surface of the target is kept at a high temperature and sputtering is performed four times, thereby preventing abnormal discharge due to charge-up of the oxide formed.
酸化物の方が融点、沸点の高い物質としては上記タンタ
ル(融点2850℃、沸点約4100°C以上、まだそ
の酸化物Ta205の融点1469℃)の他にはMo
(融点2617℃、その酸化物MoO3融点1068℃
)およびW(融点6680℃、その酸化物WO,融点1
743℃)等を挙げることができる。In addition to tantalum (melting point: 2,850°C, boiling point: approximately 4,100°C or higher, the melting point of its oxide Ta205 is 1,469°C), Mo
(Melting point 2617℃, its oxide MoO3 melting point 1068℃
) and W (melting point 6680°C, its oxide WO, melting point 1
743°C).
以下この発明による方法を実施しているターゲットの取
付方法について一例を図面を参照して説明する。An example of a method for attaching a target using the method according to the present invention will be described below with reference to the drawings.
図面にはスパッタリング装置におけるターゲットとカソ
ードとの組立体を示し、すなわち図面において1はカソ
ードのバッキングプレートであり、この上にはタンタル
から成るターゲット2がタンタルから成るビス6によっ
て固定されている。また4はアースシールドである。こ
のようにビス6でターケ゛ット2を取付けることによっ
て故意に冷却効率を下げてターゲットの表面温度を高く
保つと同時に、ターゲット2の過度の変形を防ぐように
する。まだこの発明による方法においては原則としてタ
ーゲットと同じ材料から成る機械的取付手段が用いられ
るが、ターゲットと異なる材料から成る取付手段を用い
る場合には尚然スパッタリングのエロージョン預域を避
けて取付ける必要がある。The drawing shows an assembly of a target and a cathode in a sputtering apparatus. In other words, in the drawing, reference numeral 1 is a backing plate for the cathode, and a target 2 made of tantalum is fixed onto this backing plate by screws 6 made of tantalum. Also, 4 is an earth shield. By attaching the target 2 with the screws 6 in this manner, the cooling efficiency is intentionally lowered to keep the surface temperature of the target high, and at the same time, excessive deformation of the target 2 is prevented. In the method according to the present invention, mechanical attachment means made of the same material as the target is used in principle, but when attachment means made of a different material from the target is used, it is necessary to mount it while avoiding sputtering erosion deposits. be.
図示実施例ではターゲット2をカソードのバッキングプ
レート1に取付ける手段としてビスが用いられているが
、代りに木ネジ形式のものやボルト形式或いはその他の
ファスニング部材形式ノモのを用いることができる。In the illustrated embodiment, screws are used as means for attaching the target 2 to the backing plate 1 of the cathode, but screws in the form of wood screws, bolts, or other fastening member types may be used instead.
このように構成することによって、ターゲット2を構成
するタンタルは、その酸化物の方が融点、沸点が低いた
め、ターゲット2をビス止めによる冷却効率の低下によ
ってその表面温度を高温に保ツト、ターゲット2の表面
に酸素とタンタルとの反応で形成されたタンタル酸化物
はターゲット表面より蒸発して消え去る。従って酸化物
がチャージアップして異常放電を誘起させることがなく
、その結果大きな電力を投入しても安定な放電状態が得
られ、すなわち5.000^/min以上でも安定して
いる。With this configuration, since the oxide of tantalum constituting the target 2 has a lower melting point and boiling point, the surface temperature of the target 2 is maintained at a high temperature by lowering the cooling efficiency by screwing the target 2. The tantalum oxide formed on the surface of the target by the reaction between oxygen and tantalum evaporates from the target surface and disappears. Therefore, the oxide does not charge up and induce abnormal discharge, and as a result, a stable discharge state is obtained even when a large amount of power is applied, that is, it is stable even at 5,000^/min or more.
以上説明してきたようにこの発明による方法は酸化物の
方が融点、沸点の低い物質に限って適応され、従来この
種のスパッタリング方法において行なわれてきたボンデ
ィングによるターゲットの回着の代りに原則としてター
ゲットと同じ物質から成るビス等の機械的取付手段を用
いてターゲットを取付けることにより、冷却効率を故意
に低下させてターゲットの表面温度を高く保ち、反応に
よって形成される酸化物を蒸発しやすくして酸化物のチ
ャージアップによる異常放電を防止すると共にターゲッ
トの過度の変形を防ぐ等の効果がある。As explained above, the method according to the present invention is applicable only to substances whose melting points and boiling points are lower than that of oxides, and as a general rule, it can be used instead of the target rotation by bonding that has been conventionally performed in this type of sputtering method. By attaching the target using mechanical attachment means such as screws made of the same material as the target, the cooling efficiency is intentionally lowered to keep the surface temperature of the target high and facilitate the evaporation of oxides formed by the reaction. This has the effect of preventing abnormal discharge due to oxide charge-up and preventing excessive deformation of the target.
図面はこの発明による方法を実施しているカソード・タ
ーゲット組立体を概略的に示す断面図である。
図中、1:カソードのバッキングプレート、2:ターゲ
ット、3:皿ビス。The drawing is a schematic cross-sectional view of a cathode target assembly implementing the method according to the invention. In the figure, 1: cathode backing plate, 2: target, 3: countersunk screw.
Claims (1)
スパッタ方法ておいて、上記物質から成るターゲットを
カンードのバッキングプレートにターゲットと同じ材料
から成る皿ビス等の機械的取付手段を用いて固定してタ
ーゲット表面を高温に保ちながらスパッタリングを行な
うことを特徴とするメンタル等のスパッタ方法。A method of sputtering a substance such as tantalum, whose oxide has a lower melting point and boiling point, is performed by attaching a target made of the above substance to the backing plate of a cand using a mechanical attachment means such as a countersunk screw made of the same material as the target. A sputtering method such as mental sputtering, which is characterized by performing sputtering while keeping the target surface at a high temperature while it is fixed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7752682A JPS58197271A (en) | 1982-05-11 | 1982-05-11 | Sputtering method of tantalum or the like |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7752682A JPS58197271A (en) | 1982-05-11 | 1982-05-11 | Sputtering method of tantalum or the like |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS58197271A true JPS58197271A (en) | 1983-11-16 |
Family
ID=13636413
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7752682A Pending JPS58197271A (en) | 1982-05-11 | 1982-05-11 | Sputtering method of tantalum or the like |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58197271A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0432565A (en) * | 1990-05-29 | 1992-02-04 | Tokuda Seisakusho Ltd | Method for fixing target of sputtering device |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55107774A (en) * | 1979-02-15 | 1980-08-19 | Fujitsu Ltd | Manufacture of tantalum film |
JPS5653770B2 (en) * | 1976-02-13 | 1981-12-21 | ||
JPS5735363B2 (en) * | 1978-03-29 | 1982-07-28 |
-
1982
- 1982-05-11 JP JP7752682A patent/JPS58197271A/en active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5653770B2 (en) * | 1976-02-13 | 1981-12-21 | ||
JPS5735363B2 (en) * | 1978-03-29 | 1982-07-28 | ||
JPS55107774A (en) * | 1979-02-15 | 1980-08-19 | Fujitsu Ltd | Manufacture of tantalum film |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0432565A (en) * | 1990-05-29 | 1992-02-04 | Tokuda Seisakusho Ltd | Method for fixing target of sputtering device |
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