JPS5819494Y2 - 半導体素子の特性選別装置 - Google Patents
半導体素子の特性選別装置Info
- Publication number
- JPS5819494Y2 JPS5819494Y2 JP13384278U JP13384278U JPS5819494Y2 JP S5819494 Y2 JPS5819494 Y2 JP S5819494Y2 JP 13384278 U JP13384278 U JP 13384278U JP 13384278 U JP13384278 U JP 13384278U JP S5819494 Y2 JPS5819494 Y2 JP S5819494Y2
- Authority
- JP
- Japan
- Prior art keywords
- characteristic
- diode
- classification
- terminal
- count number
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000004065 semiconductor Substances 0.000 title claims description 11
- 238000005259 measurement Methods 0.000 claims description 29
- 238000001514 detection method Methods 0.000 claims description 3
- 230000002950 deficient Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 229910000906 Bronze Inorganic materials 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- 239000010974 bronze Substances 0.000 description 1
- KUNSUQLRTQLHQQ-UHFFFAOYSA-N copper tin Chemical compound [Cu].[Sn] KUNSUQLRTQLHQQ-UHFFFAOYSA-N 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000003252 repetitive effect Effects 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13384278U JPS5819494Y2 (ja) | 1978-09-28 | 1978-09-28 | 半導体素子の特性選別装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13384278U JPS5819494Y2 (ja) | 1978-09-28 | 1978-09-28 | 半導体素子の特性選別装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5549282U JPS5549282U (enrdf_load_stackoverflow) | 1980-03-31 |
| JPS5819494Y2 true JPS5819494Y2 (ja) | 1983-04-21 |
Family
ID=29102672
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13384278U Expired JPS5819494Y2 (ja) | 1978-09-28 | 1978-09-28 | 半導体素子の特性選別装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5819494Y2 (enrdf_load_stackoverflow) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5930847U (ja) * | 1982-08-20 | 1984-02-25 | ダイセル化学工業株式会社 | 複合袋 |
| JP2013242250A (ja) * | 2012-05-22 | 2013-12-05 | Hioki Ee Corp | ダイオード検査装置及びダイオード検査方法 |
-
1978
- 1978-09-28 JP JP13384278U patent/JPS5819494Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5549282U (enrdf_load_stackoverflow) | 1980-03-31 |
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