JPS5549282U - - Google Patents

Info

Publication number
JPS5549282U
JPS5549282U JP13384278U JP13384278U JPS5549282U JP S5549282 U JPS5549282 U JP S5549282U JP 13384278 U JP13384278 U JP 13384278U JP 13384278 U JP13384278 U JP 13384278U JP S5549282 U JPS5549282 U JP S5549282U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13384278U
Other languages
Japanese (ja)
Other versions
JPS5819494Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP13384278U priority Critical patent/JPS5819494Y2/ja
Publication of JPS5549282U publication Critical patent/JPS5549282U/ja
Application granted granted Critical
Publication of JPS5819494Y2 publication Critical patent/JPS5819494Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP13384278U 1978-09-28 1978-09-28 半導体素子の特性選別装置 Expired JPS5819494Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13384278U JPS5819494Y2 (ja) 1978-09-28 1978-09-28 半導体素子の特性選別装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13384278U JPS5819494Y2 (ja) 1978-09-28 1978-09-28 半導体素子の特性選別装置

Publications (2)

Publication Number Publication Date
JPS5549282U true JPS5549282U (enrdf_load_stackoverflow) 1980-03-31
JPS5819494Y2 JPS5819494Y2 (ja) 1983-04-21

Family

ID=29102672

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13384278U Expired JPS5819494Y2 (ja) 1978-09-28 1978-09-28 半導体素子の特性選別装置

Country Status (1)

Country Link
JP (1) JPS5819494Y2 (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5930847U (ja) * 1982-08-20 1984-02-25 ダイセル化学工業株式会社 複合袋
JP2013242250A (ja) * 2012-05-22 2013-12-05 Hioki Ee Corp ダイオード検査装置及びダイオード検査方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5930847U (ja) * 1982-08-20 1984-02-25 ダイセル化学工業株式会社 複合袋
JP2013242250A (ja) * 2012-05-22 2013-12-05 Hioki Ee Corp ダイオード検査装置及びダイオード検査方法

Also Published As

Publication number Publication date
JPS5819494Y2 (ja) 1983-04-21

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