TW201035574A - LED light bar inspection method and inspection apparatus thereof - Google Patents

Abstract

The present invention discloses an inspection method and inspection apparatus for rapidly inspecting an LED light bar by utilizing forward current characteristics of LED. The method provides a light emitting assembly of an LED light bar under test with a small test signal, and detects a forward voltage drop and a current change. The apparatus comprises a load-carrying device, an enabling device, a detection device and a processing device for controlling each of the devices or partial operations and comparing measured current voltage signals.

Description

201035574 VI. Description of the invention: [Technical field to which the invention pertains] The technical field to which the present invention pertains relates to a light-emitting diode, and more particularly to a light bar detecting method and the detecting machine. [Prior Art] The current LED light bar is composed of a plurality of light-emitting diodes (hereinafter referred to as LEDs) connected in series or in parallel, and the conventional positional arrangement method is interposed by LEDs interposed in groups. The method is arranged to avoid uneven distribution of LED brightness of each group of light-emitting components and affect the color rendering effect of the liquid crystal display. A common light bar 1 as shown in FIG. 1 includes a circuit board 2 and, for example, 60 LEDs 301 to 360 mounted on the circuit board 2, and in this example, 6 LEDs 301 to 360 are divided into six groups. For the sake of convenience, a series of 10 LEDs 301-360 is referred to as a group of light-emitting components 3, and each group of light-emitting components 3 are sequentially arranged, that is, on the circuit board 2. In the upper arrangement order, the first LED 301 belongs to the first group, and the second LED 302 belongs to the second group 'the seventh LED 307. The second LED 302 is again in the first group and is connected in series with the first LED 301, and the eighth LED 308 is in the second group. Connected in series with the second LED 302... and so on. The six sets of light-emitting components 3 cause the inputs to be independent, but the other end is commonly connected to the same ground terminal, and the input terminals are enabled as needed. In order to ensure that each manufactured light bar is not damaged by the electrostatic discharge accumulated on the operator's body or machinery, the current light bar needs to be additionally subjected to "Electrostatic Discharge" (ESD) detection, for example 4000 Volt, even 8000 volts, in a very short time (eg 1 ns), the static charge is quickly released, causing a rapid single pulse on the device under test, and then measuring whether the device under test is damaged; In the past experience, if the light bar is damaged by electrostatic shock, it is more common that one or three of the series of led particles are damaged at the most end.匕 Even if each of the LEDs 301 to 360 is determined to be a good product by the package test, there is still a problem that the warehouse b suffers from, for example, electrostatic shock, process or other accidents during the process of forming the entire light bar 1 on the circuit board 2. Damage and damage, and 201035574 is not a single form: including short circuit, open circuit, or other short circuit or open circuit, but can not emit light or insufficient intensity and instability when enabled. Although the conventional leakage current detecting method can detect whether individual particles have been damaged by static electricity when the LEDs 301 to 360 are independent, respectively, since the LEDs 301 to 360 are soldered in series in the light rod i, the illuminating in series cannot be distinguished. In component 3, is there any particle abnormality? 77

In addition, as shown in Table 1 and Figure 2, the five LEDs respectively receive a 1^ to 2 mA sigma current enable, and measure and record the forward voltage at the turn-on. LED particle voltage _ current measurement results, components B, C, D, E are deliberately damaged by static electricity, H, known problematic LED _ 〇

2.981V (light) 1-1 such as Ι·2· tear cover p

In the case of this type of LED granules, the qualifiers will slightly illuminate when they pass through, in order to reach the current = 4~7 amps (mA) mA current; however, the above chart can be used to reduce the 'requires access to 10 ~40 ° 'P makes it possible to illuminate the low-pass 201035574 in the current range, and still need to apply a voltage value close to the normal enabling luminescence on both sides of the good LED particle A to drive it on, so the maximum potential difference The difference between the minimum potential differences is only about 0.404 volts, especially the closer the current value is closer to 2 mA, and the potential difference changes more and more stably to a stable value of 2.999V without any change. In contrast, since particles B, C, D, and E have been damaged, even if the voltage applied at both ends is only, for example, several hundred millivolts (mV), the particles ^, D, and E can be tested at 1 mA. The current passes, although the particle b can finally emit light intensity close to the normal particle, but in the low current test, it can still be found that the minimum potential difference can be turned on only about 1 volt, which is significantly smaller than the normal particle A, 'and the abnormal particles are respectively The difference between the maximum and minimum potential difference is above 4V; in which the particles C, D can not emit enough light for the naked eye even if the current reaches 20mA; while the particles B and E can be bright, but The luminescence is far less bright than normal particles and less stable. Therefore, even if the LED particles are allowed to emit light at a current of 10 mA which is applied as a predetermined enable signal in this example, there may be a problem of quality. Another method for detecting whether the light-emitting component in the light bar is qualified is a light field distribution detecting method using the light-emitting component brightness and angular distribution as a test standard, but since each group of light-emitting components includes a plurality of LED particles, if static electricity The degree of damage is not high, and the change in brightness attenuation is not obvious. The deviation of the brightness of a single particle may not be detected by the system, making the detection effect of this method ineffective. In particular, the light field distribution detection method needs to place the measured light source into the integrating sphere. When the object to be measured is, for example, a narrow-shaped light rod of several tens of centimeters, the corresponding integral sphere control needs to be about -meter, thus Limit the minimum size of the integrating sphere, and its cost is extremely high f, the speed of the object to be tested can not be improved, and the measurement result is still not easy to be accurate. 'All kinds of conditions are not conducive to the rapid detection of mass production, not to mention the size of the liquid crystal display. Big, the trend of this job, the light bar itself is bound to grow gradually, will not be able to bear the current score ball. If the LED particles are soldered to the light bar and the test is repeated using a single test, the production capacity will be further slowed down and it will not be accepted by the industry. Therefore, if you can use the LED characteristics and special ordering on the circuit board, the 201035574 type of 'providing-age speed _ is the money static broken wire and a low-cost, simple structure, light bar detection method detection machine, Not only can the speed of the light bar be detected, the quality of the surface can be shipped, but also the cost of the machine needed for better detection in the future can be reduced. SUMMARY OF THE INVENTION An object of the present invention is to provide a light bar detecting method capable of accurately detecting whether or not an overall characteristic meets a demand. Another object of the present invention is to provide a light bar detecting method for rapidly detecting defective products by providing electrical characteristics of the Xiang LED axis. Still another object of the present invention is to provide a detecting machine capable of accurately detecting whether or not the overall characteristics are suitable. The present invention is also directed to providing a detection machine that is simple in structure, convenient in operation, and quick in operation.

CJ, therefore, a light bar detecting device according to the present invention detects a light bar to be tested via a light detecting machine, the circuit board includes a circuit board and at least one group includes a plurality of circuit boards disposed on the circuit board and serially connected to each other a light-emitting component of the die, and the at least one group of light-emitting components can be illuminated by a predetermined enable signal, wherein the machine comprises a set of carrying devices for carrying and fixing the light bar to be tested; , enabling at least the nostalgic component of the light bar; - detecting the enabling device to input the current data of the group of light emitting components and the detecting device across the data; and - storing the group with _ metering Rod_data, and for receiving current and electricity from the detecting device'. The detecting method includes a top step: a) when the group of light-emitting groups/1% devices are electrically connected, '卩- is much lower than the enabling signal The micro-infrared supply and the light-emitting group receive the sensing from the detecting device, the frequency number; the deviation between the current and the electric current and the standard current _ and /ΐίϊ' and c) when the deviation reaches a predetermined ugly Marked as 'the invention · LED compliant Electrically and in combination with the arrangement of the light-emitting components, a light bar detecting method and the detecting machine are proposed; 201035574 The method adopts a test electric energy input far less than the enabling current to improve the discrimination and can quickly screen the test object To avoid using expensive devices such as integrating spheres. The above and other technical contents, features, and advantages of the present invention will be apparent from the following detailed description of the preferred embodiments of the invention. For convenience of explanation, the predetermined enabling signal of the present invention is exemplified as a current of 10 mA, and a small test signal is exemplified as a current of 1 〇μ A.

Further, three sets of light-emitting components consisting of ten LED particles connected in series are formed. The ones listed in Table 2 are all qualified LED particles. The groups A and B listed in Table 3 deliberately select some particles to be electrostatically charged. Destroyer, sequentially pass different test currents to each illuminating component for detection, and record the forward voltages on both sides of the whole group and individual LED granules in Tables 2 and 3: CE 御 i 目 1 1 ) 1 1 1 〇 lop lopuk 漱 withdrawal vr («3U6VF tender survey vr (mum move Vf (wmrn (3l88i6Vf (hot survey Vf (m〇mv £ whole flight Vf I 2 i 3 I 4 Is ΙΟΟιιΑ 200uA 300uA ~ 1mA 2.489 2.518 2.536 2.602 2.38 2.486 2.517 2.535 2-6 2.385 2.489 2.519 2.537 2.602 2.338 2.472 2.512 2.534 2.617 2.363 2.479 2.513 2.533 2.607 2.372 2.483 2.514 2.533 2.601 2.368 2.481 2.513 2.532 2.6 2.384 2.488 2.519 2.538 2.605 2.38 2.488 2.519 2.538 2.606 2.401 2.497 2.524 2.541 2.603 23.756 24J852 25.168 25357 26.043 Table 2

16-706 lSf-31 20.235 2Ϊ6 The whole army VF 21.081 — ^26 22576 22.767 23·54 Table 3 Comparing Table 3 with Table 2, it can be found that the A and B sets of LED components are LED particles at the end. It is more susceptible to electrostatic damage 'and the degree of damage is different'. The number of damaged particles is different; however, the smaller the forward current is introduced during the test. The total potential difference between the two groups of A and B light-emitting components The more the deviation from the normal conditions listed in Table 2, especially in the case of 1正常#A electricity 201035574 flow test of one thousandth of the normal enable current, the potential difference between all the broken LED particles is closer to zero, the situation and A potential difference of more than 2 volts required for normal particles produces a distinct region. In summary, the smaller the current value applied to the object to be tested, the more the difference in the forward potential difference can be highlighted. On the other hand, since a wafer can be cut into nearly 20,000 grains, and there are process variations in each die during the manufacturing process, each LED particle produces a slight difference in potential difference when it is energized. Is there a mixture of 9 original electricity and 1 damaged granule, can it be mistaken for the combination of 7led particles in series? De, Γ doubt, in the point-by-point measurement of the wafers divided by three wafers, the distribution of hides and hides. That is to say, the maximum difference of the latitudinal potential is 0.4 volts, but in the three groups of nearly 20,000 (four) grains, Ϊίίt? 17 volts (12 to 17 drinks. According to the standard deviation, the threshold is up to four standards) The difference (about 60mV) of the filaments will be less than the total number of f. (1 ^. Γ〆 0 of the * will converge within the four standard deviations on both sides of the average is to achieve exactly 9 above average The probability of a motorized test of 60 mV + _ grain is (3/1 〇〇〇) 9 is about 2 χι〇_23. In the assembly, 9 particles with too high a potential difference are caused at the same time.

—~~__VF(@lf= 1〇ua v - LMi· avg; max 0 017 2.344 2.389 ' 2.765 2.120 2.355 2.400 2.400 2434 2.844 Γθ.016 nmo Table 4 = Mingguang Bar Inspection Machine 5 (hereinafter referred to as the machine) As shown in Figure 3

Remark ΙΠΜ5υ§ΜΕ3ΕΕί^: ^ Set 5, 5 set 51, a group of succeeding 53, group detection device 59. The group of high-voltage discharge devices and a set of 51 can be interpreted as a movable base, and the device 53 includes a current source 531 which can be used by a group of switches 6 to be one by one 201035574 group of light-emitting components 3 'detecting device 55 _ Interpreted as including a galvanometer. The voltmeter 554 and the optical sensor 556, the prompting device 59 in this example instructs the processing device 57 to provide an alert according to the deviation condition of the light-emitting component 3, and the light bar detecting method proposed by the present invention is first in step 4. The two sets of the above-mentioned two kinds of the hairpins 6 having the six sets of the grade members 3 are juxtaposed in the group of the light-emitting rods 1 to be electrically connected to the current source 53 of the device 53. The current source 531 can provide at least a flow; and the processing device 57 drives the carrier 51 to move i corresponding to the position of the optical sensor 556. When θ Ο Λ step 42, the current source 531 is instructed by the processing device 57 to pass through the light-emitting component 3 connected to the current source 531 by, for example, 10 volts. As described above, the value of the signal is much lower than the current-like current value. No matter whether the LED3〇i~36〇古=疋 is normal, it will not emit light, and will not cause the LED301~360 particles to be issued. In step 43, the processing device 57 instructs the detection of the data backhaul! w 554 buildings 21, and the 57 cases are interpreted as including a microprocessor 57. And the standard current-voltage data of -===11 is used as a comparison standard. The current and voltage values that will be transferred to the processing device 57 by if44 will be raised by the ίι: At step 45, the predetermined rules are awaiting additional disposal. Conversely, after the signal is pushed, the potential difference is still in the range of the standard value, such as ϋ ϋ continuation step 47 'the command enabling device 53 gives the enable signal (for example, the test is issued and the message is 3) Enabled to emit 'and illuminate by optical sensor 556 to confirm the triggering light component 3 illuminating hybrid standard. The light strip if may include, for example, the aforementioned six groups of illuminating components, if the new detection of 3 才 is found another There are also problems with the group of light-emitting components. It is not economical to repeat the same-strip light bar. Therefore, as shown in Figure 7, the present invention is issued at 201035574. The high-voltage discharge device is used to perform the aforementioned esd detection on the light bar. All the illuminating components are subjected to the sequel to the sequel to the continuation test. Until all the illuminants on the bar are confirmed to be ^49', record the classification, no Marked light bar in ^ = 7 into the continuation of the processing / material, or in the steps of the ant turn marked ^ Ο Ο Of course, when the fortune is for example, the panel view factory, and on the second should be the light stick For the quality control of the material, it is only necessary to confirm each light. As shown, when entering the step 44, the detection _ has a higher deviation than the qualified door insert, and the light of each group of the smuggling strips has been measured and the path is step 45, directly The dip mark is marked and classified as the reject to be recovered according to the mark in step I'; otherwise, the process proceeds to step 48 to confirm whether all the light-emitting components on the light bar to be tested are detected, and step 41" The illuminating components detected by the wires are detected one by one until all the optical components pass the test, and are classified as qualified products in step 49". Since the above detection method can fully cooperate with, for example, the 帛M3459% silk type of the same type produced by the applicant. Specially known, the automation of the cake _ can achieve the '- aspect can be used for ESD detection and set the standard for more precise analysis; and more accurately determine whether the overall characteristics of each group of illuminating components in the light bar are qualified, clearly find the sputum particles, and The compatibility with the existing machine designed by the applicant is very high, the structure is not complicated, the operation convenience of the existing machine can be improved, and the added value of the detection machine is increased, thereby The foregoing is only the embodiments of the present invention, and the scope of the present invention is not limited thereto. That is, the simple equivalent change of the patent application scope and the contents of the invention description according to the present invention. And Xiudu, should still belong to the invention patent

Within the scope of 201035574. [Simple description of the diagram] Figure 1 is a schematic view of a light bar with sixty LCDs. In order to make the drawing simple, only a few symbolic LEDs are marked, and the rest are omitted, and the indications are inconsistent. FIG. 3 is a block diagram of the inspection circuit of the first embodiment; FIG. 3 is a diagram of the detection method of the 4 series light bar. = FIG. 3 is a detection machine reading system, an electrical connection circuit diagram Figure 7 is a flow chart of the second embodiment; Figure 8 is a flow chart of the third embodiment. [Description of main component symbols] 1...light bar 2...circuit board 3...light-emitting components 301 to 360 ...LED 41 to 47···Step 40', 4 Bu 44', 45, 46, 47, 48', 49'...Steps 41", 44", 45", 48", 49, ..... Step 5... Machine 51... Carrying device 53... Actuating device 531... Current source 55... Detection device 552. Detector 554···Voltmeter 556···Optical sensor 57...Processing device 58...High-voltage discharge device 570···Microprocessor 572···Memory 59···Prompt device 6...Switch

Claims (1)

201035574 VII. Patent application scope: 1. A light bar detecting method for testing a light bar to be tested via a light bar detecting machine, the light bar comprising a circuit board and at least one group comprising a plurality of circuit boards disposed on the circuit board and each other a light-emitting component of the LEDs connected in series, and the at least one group of light-emitting components can be illuminated by a predetermined enable signal, wherein the machine comprises a set of loads for carrying and fixing the light bar to be tested a device; a set of enabling means for enabling at least one set of light emitting components of the light bar to be tested; a set of electrical connections for detecting current input to the set of light emitting components, and across the voltage data of the set of light emitting components a detecting device; and a set of standard current_voltage data storing the light bar to be tested, and for receiving a processing device for current and voltage signals from the detecting device, the detecting method comprising the following steps: a) when the group of light emitting components When the enabling device is electrically connected, a small test signal far below the enabling signal is supplied to the group of light emitting components and received from the detecting device. Sensing the current and voltage signals; b) comparing the Lai Lai Bauer and the deviation between the current _ fresh information of voltage; and c) when the deviation reaches a predetermined threshold then be marked and / or warnings. 2. The method of claim 1, wherein the light bar has a copy 'and the method further comprises when the step b) compressing the set of light-emitting components with the standard current-voltage After the data is compared, the steps of steps a) to b) are replaced and the steps of steps 1 to 2 of the light-emitting components of the first to be tested are detected, wherein the detection machine is矽::丨;. The detector 'and the detection method further comprises comparing the t-data to the standard current/voltage data in the step b), and then receiving the transmission e by the optical sensor. The method for detecting the electrical signal output to the processing device in step 4 or claim 2 further includes the step of applying an electrostatic shock to the shame bar in step a) ί) β 12 w , I , > 1 ^ ο ❹ 之 之 , , , , 2010 2010 2010 2010 35 35 2010 2010 35 2010 2010 2010 2010 35 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 At least one group includes a plurality of light emitting components disposed on the circuit board and connected in series with each other, and the at least one light emitting component is capable of being illuminated by a predetermined enable signal, wherein the machine comprises: a set of carrying means for carrying and fixing the at least one light bar to be tested; a set of enabling means for enabling at least one set of light emitting components of the at least one light bar to be tested; a set of electrical connections for detecting the input of the enabling means a current detecting device for the light emitting component and a detecting device for crossing the voltage data of the light emitting component; and a set of standard current_voltage data storing the light bar to be tested, and for receiving the current and voltage signal from the detecting device . 6. If the machine is in the scope of patent application 帛5, it also includes a set of optical sensors for detecting the light-emitting beam of the group of light-emitting components and converting them into electrical signal outputs. Zheng Li mourning 7. If the machine is applied for the fifth item of the patent scope, it also includes a group of high-voltage discharge devices for applying the light rod. 8. The machine of claim 5, wherein the at least one of the plurality of light-emitting components, and the enabling device comprises a switch for one of the components.疋钱孩等先先9. If you apply for the patent fine item 5, the machine will be marked according to the test results and/or the prompting device will be given a set of 10. The patent scope is 5th. a machine with 6, 7, 8 or 9 items, including a set of current sources σ 13