JPS58182569A - Verifying method of small leading current breaking performance of circuit breaker - Google Patents

Verifying method of small leading current breaking performance of circuit breaker

Info

Publication number
JPS58182569A
JPS58182569A JP57066965A JP6696582A JPS58182569A JP S58182569 A JPS58182569 A JP S58182569A JP 57066965 A JP57066965 A JP 57066965A JP 6696582 A JP6696582 A JP 6696582A JP S58182569 A JPS58182569 A JP S58182569A
Authority
JP
Japan
Prior art keywords
voltage
breaker
point
impulse voltage
circuit breaker
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57066965A
Other languages
Japanese (ja)
Other versions
JPH0461312B2 (en
Inventor
Atsushi Ozawa
小沢 淳
Rikizo Ishikawa
石川 力三
Yoshio Yoshioka
芳夫 吉岡
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP57066965A priority Critical patent/JPS58182569A/en
Publication of JPS58182569A publication Critical patent/JPS58182569A/en
Publication of JPH0461312B2 publication Critical patent/JPH0461312B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327Testing of circuit interrupters, switches or circuit-breakers
    • G01R31/333Testing of the switching capacity of high-voltage circuit-breakers ; Testing of breaking capacity or related variables, e.g. post arc current or transient recovery voltage
    • G01R31/3333Apparatus, systems or circuits therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Relating To Insulation (AREA)

Abstract

PURPOSE:To obtain an interelectrode dielectric breakdown voltage of a circuit breaker under operation in opening state at plural points, by applying one shot of impulse voltage with a >=10ms long trailing edge once after the breaker is opened. CONSTITUTION:To obtain a >10ms long trailing edge, at an impulse voltage generating device 10, the values of a neutral point resistance 17 and a trail edge adjusting resistance 19 are made large, and the device 10 is provided with a charging switch 15, and after an capacitor 16 is charged up to a specific voltage, the opening point of the switch 15 is made different. When electrodes start parting at time T1 and a impulse voltage with a >=10ms long trailing edge is applied at time T2, an interelectrode dielectric breakdown occurs at point P1. If a discharging circuit is oscillatory, a discharging current is oscillatory and a current zero point is obtained. Then, a circuit breaker 3 obtains dielectric recovery and the voltage is applied again from the generating device for the impulse voltage with the long trailing edge to apply a voltage shown by point S2 to the breaker, causing a dielectric breakdown shown by point P2. Then, dielectric breakdowns occur similarly as shown by points P3-P6 to obtain plural measurement points by applying one shot of the impulse voltage.

Description

【発明の詳細な説明】 本発明はしゃ断器の進み小電流しゃ断性能の検証方法に
係り、特に長波尾のインパルス電圧発生装置を使うしゃ
断器の進み小電流しゃ断性能の検証方法に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for verifying the advanced small current interrupting performance of a circuit breaker, and more particularly to a method for verifying the advanced small current interrupting performance of a breaker using a long-wave tail impulse voltage generator.

従来のしゃ断器の進み小電流しゃ断性能の検証試験等価
回路は第1図のようであった。すなわち、交流電源1と
コンデンサ2との間に供試しゃ断器3が接続されている
。交流電源1には発電機と変圧器等の内部インピーダン
ス4が含まれている。
The equivalent circuit for verification testing of the advanced small current breaking performance of a conventional circuit breaker is shown in Figure 1. That is, a test breaker 3 is connected between the AC power supply 1 and the capacitor 2. The AC power supply 1 includes an internal impedance 4 such as a generator and a transformer.

第1図のような試験を行う場合、発電機を使用するので
多大な試験費用と回路構成のための時間を要するという
欠点があった。
When conducting a test as shown in FIG. 1, a generator is used, which has the disadvantage of requiring a large amount of testing cost and time for circuit configuration.

本発明の目的はしゃ断器の進み小電流しゃ断性能が短絡
発電機を使わないで行なえる試験方法を提供することに
ある。
SUMMARY OF THE INVENTION An object of the present invention is to provide a test method for testing the advanced small current breaking performance of a circuit breaker without using a short-circuit generator.

本発明はしゃ断器の進み小電流しゃ断性能を短絡発電機
を使わないで検証するために、10ms以上の波尾長の
インパルス電圧発生装置を使うようにした。すなわち、
しゃ断器を開極してから長波尾のインパルス電圧を印加
し、1回の印加で開極動作中のしゃ断器の極間絶縁破壊
電圧を複数点得ようとするものである。インパルス電圧
が10ms以上の長波尾であるために複数点の破壊電圧
が一挙に得られる。
The present invention uses an impulse voltage generator with a wave length of 10 ms or more in order to verify the advanced small current breaking performance of the breaker without using a short-circuit generator. That is,
After opening the circuit breaker, a long wave tail impulse voltage is applied, and with one application, the interelectrode breakdown voltage of the circuit breaker in operation is obtained at multiple points. Since the impulse voltage has a long wave tail of 10 ms or more, breakdown voltages at multiple points can be obtained at once.

以下本発明の一実施を第2図により説明する。An embodiment of the present invention will be explained below with reference to FIG.

10ms以上の長波尾インパルス電圧発生装置10は、
正および負極性の直流充電電源11,12、充電抵抗1
3,14、充電用スイッチ15、コンデンサ16、中性
点抵抗17、放電ギャップ18、波尾長調整抵抗19で
構成されている。最下段の放電ギャップ18には電気的
トリガ電極20およびトリガ発生装置21が設けられて
いる。
The long wave tail impulse voltage generator 10 of 10 ms or more is
Positive and negative polarity DC charging power supplies 11, 12, charging resistor 1
3, 14, a charging switch 15, a capacitor 16, a neutral point resistor 17, a discharge gap 18, and a wave length adjustment resistor 19. An electric trigger electrode 20 and a trigger generator 21 are provided in the discharge gap 18 at the lowest stage.

このインパルス電圧発生装置10の動作原理は従来の装
置とほぼ同じであるが、10ms以上の長波尾を得るた
め、中性点抵抗17の値および波尾長調整抵抗19の値
を大きくすると共に充電用スイッチ15を設け、コンデ
ンサ16に所定電圧充電後はスイッチ15を開にすると
ころが異なる。
The operating principle of this impulse voltage generator 10 is almost the same as that of the conventional device, but in order to obtain a long wave tail of 10 ms or more, the value of the neutral point resistor 17 and the value of the wave length adjustment resistor 19 are increased, and the charging The difference is that a switch 15 is provided and the switch 15 is opened after charging the capacitor 16 to a predetermined voltage.

インパルス電圧の波頭長は外部に取り付けた波頭調整抵
抗22およびコンデンサ23の値により制御可能である
The wavefront length of the impulse voltage can be controlled by the values of the wavefront adjustment resistor 22 and capacitor 23 that are attached externally.

供試しゃ断器3はコンデンサ23に直接もしくはあるイ
ンピーダンスを介して接続される。直接接続しても第2
図に示すように残留インダクタンス24,抵抗25が存
在する。
The test breaker 3 is connected to the capacitor 23 either directly or via a certain impedance. Even if you connect directly, the second
As shown in the figure, a residual inductance 24 and a resistance 25 are present.

本発明の動作原理を第3図に示す。The operating principle of the present invention is shown in FIG.

供試しゃ断器3の極間距離lの時間tに対する特性が第
3図のようであったとする。完全な開放状態での極間距
離lはLoである。供試しゃ断器3の開極中における極
間の絶縁破壊電圧の時間特性が第4図の30であったと
する。
Assume that the characteristic of the distance l between poles of the test circuit breaker 3 versus time t is as shown in FIG. The distance l between poles in a completely open state is Lo. It is assumed that the time characteristic of the dielectric breakdown voltage between the electrodes during opening of the test circuit breaker 3 is 30 in FIG.

時間T1で極間が開き始め、時刻T2で10ms以上の
長波尾インパルス電圧を印加すると、まずP1で極間が
絶縁破壊する。絶縁破壊後、コンデンサ23の電荷がし
ゃ断器3を介して放電するが、放電回路が振動性にされ
ていれば、放電電流は第5図に示すように振動性となり
、電流零点が得られる。ここで、しゃ断器3は絶縁回復
し、再び長波尾インパルス電圧発生装置から電圧が加わ
り、第4図に示すようにしゃ断器にS2の電圧が加わり
、P2で絶縁破壊するようになる。
The gap between the electrodes begins to open at time T1, and when a long wave tail impulse voltage of 10 ms or more is applied at time T2, the gap between the electrodes first undergoes dielectric breakdown at P1. After dielectric breakdown, the charge in the capacitor 23 is discharged through the circuit breaker 3, but if the discharge circuit is made oscillatory, the discharge current becomes oscillatory as shown in FIG. 5, and a current zero point is obtained. Here, the breaker 3 recovers its insulation, and voltage is applied again from the long wave tail impulse voltage generator, and as shown in FIG. 4, the voltage S2 is applied to the breaker 3, causing dielectric breakdown at P2.

その後、同じ現象が繰り返し得られ、P3〜P6のよう
に絶縁破壊する。P1〜P6を結べば、極間の絶縁破壊
電圧の時間特性が得られる。すなわち、普通のインパル
ス電圧発生装置を使えば、例えばP5のように1点だけ
しか測定点は得られないが、本実施例のようにすれば、
P1〜P6の複数の測定点が1回のインパルス電圧を印
加することにより得られる。ここで、インパルス電圧の
波尾長は長い程良いが、しゃ断器の進み小電流しゃ断性
能は、開極開始から10〜40msの領域の特性で決ま
ることから最低10msは必要である。
After that, the same phenomenon is repeatedly obtained, and dielectric breakdown occurs as shown in P3 to P6. By connecting P1 to P6, the time characteristics of the dielectric breakdown voltage between the electrodes can be obtained. That is, if a normal impulse voltage generator is used, only one measurement point, such as P5, can be obtained, but if it is used as in this embodiment,
A plurality of measurement points P1 to P6 are obtained by applying one impulse voltage. Here, the longer the wave tail length of the impulse voltage is, the better; however, since the advance small current breaking performance of the breaker is determined by the characteristics in the region of 10 to 40 ms from the start of opening, a minimum of 10 ms is required.

本実施例によれば、しゃ断器の進み小電流しゃ断性能の
検証試験に10ms以上の長波尾インパルス電圧発生装
置を使用できるので1回のインパルス電圧印加によりし
ゃ断器極間の絶縁破壊電圧特性を複数点求めることがで
きる。
According to this embodiment, a long wave tail impulse voltage generator of 10 ms or more can be used for the verification test of the advanced small current breaking performance of the breaker, so that multiple dielectric breakdown voltage characteristics between the breaker poles can be measured by applying a single impulse voltage. You can find points.

第6図は本発明の他の実施例による回路図である。第2
図では供試しゃ断器の片側は接地状態であるが、第6図
では長波尾インパルス電圧とは逆極性の直流電圧がかか
っているようにした。直流高電圧電源40が抵抗41、
コンデンサ42を介してしゃ断器3の片側に接続されて
いる。
FIG. 6 is a circuit diagram according to another embodiment of the present invention. Second
In the figure, one side of the test breaker is grounded, but in Figure 6, a DC voltage of opposite polarity to the long wave tail impulse voltage is applied. DC high voltage power supply 40 is resistor 41,
It is connected to one side of the breaker 3 via a capacitor 42.

この例では、しゃ断器の進み小電流の試験により近い回
路条件になっている。
In this example, the circuit conditions are more similar to the test for the small lead current of the circuit breaker.

以上の本発明によれば、しゃ断器の進み小電流しゃ断性
能の検証試験として10ms以上の長波尾インパルス電
圧発生装置を使ったので、多大の試験費用を費用とする
短絡発電機を使わないで済む。
According to the present invention, a long-wave tail impulse voltage generator of 10 ms or more is used for the verification test of the advanced small current breaking performance of the breaker, so there is no need to use a short-circuit generator that incurs a large amount of testing costs. .

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来のしゃ断器の進み小電流しゃ断性能検証等
価回路、第2図は本発明方法を適用する長波尾インパル
ス電圧発生装置を使った試験等価回路、第3〜5図は本
発明の動作原理説明図、第6図は本発明の変形例による
試験等価回路である。 3・・・・しゃ断器、15・・・・充電用スイッチ、1
6・・・・コンデンサ、18・・・・放電ギャップ、1
9・・・・波長尾調整抵抗、22・・・・波頭長調整抵
抗、23・・・・コンデンサ。 代理人 弁理士 高橋 ■
Fig. 1 shows an equivalent circuit for verifying the advanced small current breaking performance of a conventional circuit breaker, Fig. 2 shows an equivalent circuit for testing using a long-wave tail impulse voltage generator to which the method of the present invention is applied, and Figs. FIG. 6, which is a diagram explaining the operating principle, is a test equivalent circuit according to a modification of the present invention. 3... Breaker, 15... Charging switch, 1
6... Capacitor, 18... Discharge gap, 1
9...Wavelength tail adjustment resistor, 22...Wavelength adjustment resistor, 23...Capacitor. Agent Patent Attorney Takahashi ■

Claims (1)

【特許請求の範囲】[Claims] 1、しゃ断器の一端を接地するかもしくは直流電圧を印
加しておき、しゃ断器が開極し始めてから他端に10m
s以上の長波尾のインパルス電圧を印加し、閉極中のし
ゃ断器の極間絶縁破壊特性を得ることを特徴とするしゃ
断器の進み小電流しゃ断性能検証方法。
1. Ground one end of the breaker or apply a DC voltage, and connect it to the other end for 10 m after the breaker starts to open.
1. A method for verifying the advanced small current breaking performance of a circuit breaker, the method comprising applying an impulse voltage with a long wave tail of s or more to obtain interpole dielectric breakdown characteristics of the circuit breaker during closing.
JP57066965A 1982-04-20 1982-04-20 Verifying method of small leading current breaking performance of circuit breaker Granted JPS58182569A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57066965A JPS58182569A (en) 1982-04-20 1982-04-20 Verifying method of small leading current breaking performance of circuit breaker

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57066965A JPS58182569A (en) 1982-04-20 1982-04-20 Verifying method of small leading current breaking performance of circuit breaker

Publications (2)

Publication Number Publication Date
JPS58182569A true JPS58182569A (en) 1983-10-25
JPH0461312B2 JPH0461312B2 (en) 1992-09-30

Family

ID=13331239

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57066965A Granted JPS58182569A (en) 1982-04-20 1982-04-20 Verifying method of small leading current breaking performance of circuit breaker

Country Status (1)

Country Link
JP (1) JPS58182569A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52112772A (en) * 1976-03-19 1977-09-21 Hitachi Ltd Method of testing breaker equivalent

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52112772A (en) * 1976-03-19 1977-09-21 Hitachi Ltd Method of testing breaker equivalent

Also Published As

Publication number Publication date
JPH0461312B2 (en) 1992-09-30

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