JPH0651036A - Short line fault testing device - Google Patents

Abstract

PURPOSE:To perform tests continuously by connecting a breaking resistance in parallel between two terminals of a simulation line, and eliminating shortage of the wave height in the transient recovery voltage. CONSTITUTION:When a shortcircuit current i1 is fed from a current source 2, a start gap 5 is closed at a time immediately before the time To when the current i1 goes the final zero value, and electric charges on a voltage source capacitor 4 are discharged. With this discharge, a high frequency current i2 is generated, and a current i1+i2 flows in a breaker to be tested 11. Because the current i1 goes zero at the time T0, only current i2 flows thereafter through the main breaking part 11a. The breaker 11 is broken at a time half wave after the time To, and between its terminals a voltage VA appears which bears such a waveform that the oscillative voltage VA-B (voltage between points A, B) in the simulation line 9 is superposed over the transient recovery voltage VB. Therein the voltage VA-B takes approx. the same value as where the breaking resistance 11b is in parallel connection with the main breaking part 11a, and there is no risk of the electric charges being discharged to permit the wave height of the voltage VB to be maintained satisfactorily. Thus continuous tests are carried out.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a short-distance line fault tester used for verifying short-distance line fault interruption performance of a resistance interruption type circuit breaker.

[0002]

2. Description of the Related Art FIG. 3 is a circuit diagram showing a short-distance line fault interrupting synthetic test circuit for a circuit breaker according to the conventional Wiroud-Puke method shown in JEC-2300, for example. In the figure,
Reference numeral 1 is a test circuit breaker, which comprises a main circuit breaker 1a and a circuit breaker resistance 1b connected in parallel. Reference numeral 2 denotes a current power source that is connected in series to the auxiliary circuit breaker 3 and supplies a short-circuit current i ₁ and forms a current source circuit 10 together with the auxiliary circuit breaker 3 and
Are connected in parallel.

Reference numeral 4 is a voltage source capacitor for supplying a transient recovery voltage, 5 is a starting gap for closing the circuit immediately before the final zero value of the short circuit current i ₁ , and 6 is a series connection with the starting gap 5 to the voltage source capacitor 4. The reactors 7 and 8 are resistors and capacitors for power supply side transient recovery voltage waveform adjustment which are connected in series, and are connected in parallel to the voltage source capacitor 4, the starting gap 5 and the reactor 6 which are connected in series. Then, with these 4 to 8, the voltage source circuit 20
Are configured. Reference numeral 9 is a simulated line that is connected in series to the voltage source circuit 20 and is approximated to a short-distance line by combining, for example, a reactor and a capacitor, and is connected in parallel to the circuit breaker 1 under test together with the voltage source circuit 20.

Next, the operation of the conventional short-distance line fault testing apparatus configured as described above will be described. First, the voltage source capacitor 4 is previously charged with a predetermined charge by another power source. Then, when the short-circuit current i ₁ is supplied from the current power supply 2, the starting gap 5 is closed at a time point T ₁ immediately before the time point T ₀ of the final zero value of the short-circuit current i ₁ , as shown in FIG. The electric charge charged in the voltage source capacitor 4 is discharged. Due to this discharge, a high frequency current i ₂ having a frequency and a magnitude determined by the reactor in the voltage source capacitor 4, the reactor 6 and the simulated line 9 and the charging voltage of the voltage source capacitor 4 is generated.

Therefore, a current of i ₁ + i ₂ flows through the main breaker 1a of the test breaker 1. Of this current, short circuit current i
_{Since 1} has a zero value at time T ₀ and is interrupted by the auxiliary circuit breaker 3, only the high-frequency current i ₂ flows through the main circuit breaker 1a after time T ₀ . Then, the test breaker 1 is cut off at a time point T ₂ which is a half wave after the time point T ₀ when the short circuit current i ₁ is cut off by the auxiliary breaker 3, and the voltage source capacitor 4 is provided between the terminals of the test breaker 1. , The transient recovery voltage V _{B of the} frequency determined by the reactor 6, the resistor 7 and the capacitor 8.
(Voltage at point B in FIG. 3) is the oscillation voltage V in the simulated line 9.
A voltage V _A (voltage at point A in FIG. 3) having a waveform on which _AB (voltage between points A and B in FIG. 3) is superimposed appears. At this time, the breaking resistor 1b connected in parallel to the main breaking unit 1a is connected to the voltage source circuit 20.
Connected in parallel to form a parallel damping circuit with a cut-off resistance 1
As compared with the case where b is not connected, the peak value of voltage and the rate of voltage rise are alleviated.

[0006]

Since the conventional short-distance line failure testing apparatus is constructed as described above, the breaking resistance 1b is applied to the voltage source circuit 20 after the main breaking section 1a of the test breaker 1 is cut off. By inserting the voltage source capacitor 4
Of the voltage source capacitor 4 and the cutoff resistance 1b
Since the discharge is performed rapidly with a time constant (several msec) determined by the resistance value of the voltage, the peak value of the voltage at point B in FIG. 3, that is, the transient recovery voltage V _B is insufficient, and the subsequent recovery voltage cannot be applied. However, there was a problem that tests could not be performed continuously.

The present invention has been made in order to solve the above problems, and is a short-distance line failure test device capable of continuous testing without the peak value of the transient recovery voltage being insufficient. It is intended to provide.

[0008]

In the short-distance line fault testing apparatus according to the present invention, a breaking resistance which constitutes a test breaker together with a main breaker is connected in series to a voltage source circuit and is tested together with the voltage source circuit. It is connected in parallel between both terminals of the simulated line that is connected in parallel to the circuit breaker.

[0009]

The breaking resistance of the short-distance line fault testing apparatus according to the present invention is connected in parallel between both terminals of the simulated line to prevent the formation of a discharge circuit from the voltage source capacitor after breaking the main breaking portion.

[0010]

【Example】

Example 1. Embodiments of the present invention will be described below with reference to the drawings. 1 is a circuit diagram showing a circuit configuration of a short-distance line failure test apparatus according to a first embodiment of the present invention. In the figure,
The same parts as those of the conventional device shown in FIG. Reference numeral 11 is a circuit breaker under test, and the main breaking unit 11a is connected in parallel to the current source circuit 10 and the voltage source circuit 20 in the same manner as the main breaking unit 1a of the conventional device.
Unlike the breaking resistance 1b of the conventional device, b is connected in parallel to both terminals of the simulated line 9.

Next, the operation of the short-distance line fault testing apparatus in the first embodiment of the present invention constructed as described above will be explained. First, as in the case of the conventional device, the voltage source capacitor 4 is previously charged with a predetermined charge by another power source. When the short-circuit current i ₁ is supplied from the current power source 2,
As shown in, the starting gap 5 is closed and the electric charge stored in the voltage source capacitor 4 is discharged at time T ₁ immediately before time T ₀ when the final zero value of the short-circuit current i ₁ is reached. Due to this discharge, a high frequency current i having a frequency and magnitude determined by the voltage source capacitor 4, the reactor 6 and the reactor in the simulated line 9 and the charging voltage of the voltage source capacitor 4.
₂ occurs.

Therefore, the main breaker 11 of the test breaker 11
A current of i ₁ + i ₂ flows through a. Of this current, the short-circuit current i ₁ has a zero value at the time point T ₀ and is cut off by the auxiliary circuit breaker 3, so that after the time point T _0, only the high-frequency current i ₂ flows through the main breaker 11a. Then, the test breaker 11 has a time T ₀ when the short circuit current i ₁ is cut off by the auxiliary breaker 3.
Blocked in a more time T ₂ of the following half-wave, the test circuit breaker 1
Between the terminals of the voltage source capacitor 4, the reactor 6, the resistor 7 and the capacitor 8 to the transient recovery voltage V _B (voltage at point B in FIG. 1) and the oscillation voltage V _AB in the simulated line 9 (FIG. 1). A voltage V _A (voltage at point A in FIG. 1) having a waveform in which a voltage between points A and B in the middle is superimposed appears. At this time,
The voltage between points A and B in FIG. 1 has almost the same voltage value as when the breaking resistor 11b is connected in parallel to the main breaking portion 11a, and moreover, the formation of a circuit for discharging the electric charge of the voltage source capacitor 4 is prevented. Therefore, the electric charge is not discharged after the main cutoff portion 11a is cut off, the peak value of the transient recovery voltage V _B is sufficiently maintained, and the continuous test becomes possible.

[0013]

As described above, according to the present invention, the breaking resistance that constitutes the test breaker together with the main breaker is connected in series to the voltage source circuit and in parallel to the test breaker together with the voltage source circuit. Since it is configured to be connected in parallel between both terminals of the simulated line, it is possible to provide a short-distance line failure test device capable of continuous testing without the peak value of the transient recovery voltage being insufficient. .

[Brief description of drawings]

FIG. 1 is a circuit diagram showing a circuit configuration of a short-distance line failure test device according to a first embodiment of the present invention.

FIG. 2 is a waveform diagram showing the states of current and terminal voltage flowing through the test breaker of the short-distance line fault testing apparatus in FIG.

FIG. 3 is a circuit diagram showing a circuit configuration of a conventional short-distance line failure test device.

FIG. 4 is a waveform diagram showing the states of current and terminal voltage flowing through the test breaker of the short-distance line fault testing apparatus in FIG.

[Explanation of symbols]

 1, 11 Test breaker 1a, 11a Main breaker 1b, 11b Breaking resistance 2 Current power supply 4 Voltage source capacitor 9 Simulated line 10 Current source circuit 20 Voltage source circuit

 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Tsutomu Sugiyama 8-1-1 Tsukaguchihonmachi, Amagasaki City Mitsubishi Electric Corporation Itami Works

Claims (1)

[Claims] 1. A test breaker in which a breaking resistance is connected in parallel to a main breaker, a current source circuit connected in parallel to the test breaker, and a simulated line approximated to a short-distance line are connected in series. And, in the short-distance line failure test device comprising the simulated line and a voltage source circuit connected in parallel to the circuit breaker under test, the breaking resistance is connected in parallel between both terminals of the simulated line. Short-distance line failure test equipment.